X射线相衬成像法在线表征冷冻靶技术

阐述了冷冻靶类球面物体X射线相衬成像机理;Tracepro软件模拟研究证明了X射线相衬成像法能用于冷冻靶燃料层参数的表征;研制了在线表征冷冻靶的X射线相衬成像实验装置,利用该装置开展了二乙烯基苯泡沫球壳及实际氘氘冷冻靶的X射线相衬成像实验研究,获得了玻璃微球内氘氘冷冻层X射线相衬图像,成像分辨力达1.5 m;利用X射线相衬成像法可同时表征烧蚀球壳及冷冻燃料层,为惯性约束聚变实验提供冷冻靶参数。     

基于激光驱动等离子体X光源的X射线相衬成像

为了诊断惯性约束聚变(ICF)内爆靶丸球壳的多层信息,在神光Ⅱ激光器上对激光驱动等离子体X光源的相衬成像进行了研究。利用神光Ⅱ第9路激光驱动平面Ti靶获得X光源,在10μm的针孔约束下作为次级点光源对样品成像,用X光胶片记录。成功地将相衬成像技术应用于ICF实验,综合考虑成像放大倍数、分辨力、成像衬度和抑制烧蚀碎片等因素,选择合适的实验条件,成功获得了清晰的双层内爆靶丸球壳结构,空间分辨力优于10μm。     

X射线相衬成像技术应用于高能量密度物理条件下内爆靶丸诊断

内爆压缩过程中多层球壳靶丸变化规律的研究是惯性约束聚变的核心内容. 利用相衬成像技术可以提高低Z材料分界面成像衬度的特点在神光Ⅱ大型激光装置上开展了相关研究. 实验通过激光打Ti靶和针孔点背光的方式产生4.75 keV的X射线微点源, 针对内爆压缩过程中的靶丸样品投影成像获得了清晰的多层球壳靶丸图像, 空间分辨率优于10 μm.同时利用一维流体力学数值模拟程序分析了球壳运动的过程, 实验结果与数值模拟结果符合较好.表明了X射线相衬成像技术在高能量密度物理环境下仍然能够提高低Z材料分界面的衬度,获得高质量的物理图像,能够广泛应用于可控聚变能源、 天体物理等前沿科学领域.     

强吸收介质内部低Z材料结构的X射线显微成像研究

惯性约束核聚变靶室靶丸位置的原位无损检测是目前的研究热点和难点.针对此需求，建立了强吸收介质包裹的低Z材料X射线显微成像物理模型.通过计算机模拟和实验，较为系统地考察了光子能量、成像距离以及强吸收介质尺度等参量对成像质量的影响.结果表明，利用X射线相衬成像技术来实现惯性约束核聚变靶室靶丸的高分辨无损检测是可行的. 关键词： X射线显微 位相衬度 核聚变靶 无损检测     

微焦点源X射线相衬成像技术

 相衬成像方法利用硬X射线对低密度弱吸收物质成像，可获得高衬度图像。用菲涅尔衍射理论分析了X射线图像的形成机理。在频域中根据光学传递函数，对物像距离、样品空间频率等对图像相位衬度的影响进行了分析。分辨率和衬度是决定图像可见度的两个依据，分辨率主要依赖于光源的空间相干性，空间相干性又决定于源点尺寸，而时间相干性（单色性）是一个不重要的影响因子。利用多色微焦点源实现了X射线相衬成像技术，获得了有价值的相衬图像，如低原子序数低密度泡沫材料的硬X射线相衬图像，与吸收衬度成像相比，其图像质量得到了很大提高，能观察到泡沫材料的细微结构，分辨率可达μm量级。     

激光间接驱动内爆靶丸的X光诊断

 报道了神光Ⅱ激光聚变实验中内爆燃料靶丸区电子温度、电子密度以及燃料面密度的X光诊断结果。在电子温度诊断中，采用X射线光谱学方法，根据聚变靶丸燃料区的Ar示踪元素的Ly-β线与He-β线的强度比推断出靶丸燃料区电子温度为(950±100) eV；在电子密度诊断中，利用靶丸燃料区Ar元素的He-β线Stark展宽确定聚变靶丸芯部的电子密度为(0.9±0.2)×10²⁴ cm^-3；在燃料区面密度诊断中，利用X光单能照相技术获得了内爆靶丸的燃料面密度为（3.2±0.5） mg/cm²。     

强吸收介质内部低Z材料结构的X射线显微成像研究

惯性约束核聚变靶室靶丸位置的原位无损检测足目前的研究热点和难点.针对此需求,建立了强吸收介质包裹的低Z材料X射线显微成像物理模型.通过计算机模拟和实验,较为系统地考察了光子能量、成像距离以及强吸收介质尺度等参量对成像质量的影响.结果表明,利用X射线相衬成像技术来实现惯性约束核聚变靶室靶丸的高分辨无损检测是可行的.     

X射线相衬成像中靶丸球壳界面晕区暗区现象

在微聚焦X射线以及等离子体X射线源平台上开展了多层球壳靶丸的相衬成像实验。实验结果表明,通过相衬成像能够获得清晰的多层球壳靶丸图像并观察到球壳内外表面晕区暗区现象。根据光的折射原理解释了该晕区暗区现象产生的物理机制。实验结果与几何模型计算结果符合较好。     

X射线菲涅耳波带板成像和投影式相衬成像的数值模拟比较

通过解析分析和数值模拟,比较了钛K线（4.5 keV）与铜K线（8.0 keV）等X射线源背光透视物体情况下,菲涅耳波带板直接成像与投影式相衬成像对被透视物体的空间分辨能力。结果表明,波带板成像可实现优于1 m的高空间分辨能力,而且使用较大尺度背光源更有利于成像。对于高透射或弱吸收的透视物体,波带板难以成像,可采用投影式相衬成像实现m级空间分辨。计入了以前文献没有考虑到的更高阶影响后,解析给出了点光源照射下相衬像的强度分布与对比度。模拟了微焦点X射线源照射存在厚度起伏的薄膜靶以及密度空间调制靶的相衬成像,点光源情况下模拟结果和解析结果相符。讨论了光源大小、成像距离等参数对相衬成像对比度和空间分辨能力的影响,结果表明,通过减小光源尺度和调节物体到探测面的距离,空间分辨能力可优化到1～4 m。     

nm量级薄膜厚度测量

 为了获得nm量级薄膜样品的精确厚度，采用软X射线反射率拟合方法、Bragg衍射方程方法和反射率Fourier变换方法分析了常规Cu靶X射线衍射数据及软X射线反射率数据。对厚度测量结果进行比较，3种方法得到的结果一致性很好。其中，软X射线反射率拟合和Bragg衍射方程方法精度很高，优于1 nm，Fourier变换方法精度稍低。对于单层W薄膜样品，3种方法获得厚度分别为(15.21±0.60) nm，(14.0±1.0) nm和(13.8±1.5) nm;对于双层W/C薄膜样品，W层厚度分别为(12.64±0.60) nm，(13.0±1.0) nm和(13.9±1.5) nm。这3种方法测量结果精度主要取决于反射率数据测量精度，而Fourier变换方法精度随着能量升高而提高,随着掠入射角范围增大而提高。     

X射线相衬成像法检测内爆靶参数

理论分析了利用X射线同轴离焦相衬成像法测量金黑腔内塑料中心微球位置的可行性,在此基础上进行了实验研究。实验结果证明,由于低Z低密度材料对高能X射线有相位调制作用,因此仍能够形成一定的图像反差,这种效应并不依赖X射线的能量,因此在一定的尺度范围内,可以实现高Z高密度材料与低Z低密度材料在高能X射线下同时成像,克服了传统吸收成像的不足,最终实现了内爆靶装配参数的精密检测。     

Skin electric explosion in double-layer conductors with a low-conductivity deposited layer

The experiments on explosion of cylindrical conductors aimed at comparison of plasma formation during skin explosion of homogeneous and double-layer conductors with an external layer with a lower conductivity are carried out on a high-current MIG generator (current amplitude up to 2.5 MA and current rise time 100 ns). The generator is loaded with cylindrical copper conductors with a diameter of 3 mm on the cathode part of which a titanium layer of thickness 20, 50, and 80 μm is deposited in vacuum. This type of loading makes it possible to compare the behaviors of the homogeneous and double-layer conductors in identical conditions. It is shown that using the double-layer structure of the conductor with an external layer of thickness 20–80 μm with a lower conductivity, which is obtained by vacuum arc deposition, higher values of magnetic induction (as compared to homogeneous conductor) can be attained on its surface prior to plasma formation and spread.     

Small angle X-ray scattering by spherical particles of Polystyrene and Polyvinyltoluene

The high intensity, high resolution multiple reflection diffractometer has been applied to make accurate measurements of the small angle X-ray scattering of eight different Dow Chemical latexes with stated diameters 2.051, 1.305, 0.814, 0.557, 0.365, 0.264, 0.126, and 0.088 μm. Using thin dry samples, the measured intensities of diffraction extrema with orders higher than the third were found to agree well with the simple Rayleigh-Gans theory which neglects multiple scattering as well as interparticle interference. Orders below the fourth showed a distinct effect of interparticle interference. This effect could be demonstrated to vanish when a liquid solution sample was used instead of a dry one. Scattering curves of thick dry samples had strongly decreased contrast between maxima and minima, an effect which is known to be due to multiple scattering. The following particle diameters were determined from the measured scattering curves: 2.102±0.013 μm, 1.313±0.008 μm, 0.823±0.004 μm, 0.552±0.002 μm, 0.352±0.002 μm, 0.254±0.002 μm, 0.119±0.001 μm and 0.078±0.001 μm. The discrepancies between these and the stated sizes are larger for the smaller particles. It is believed that the X-ray measurements are more accurate than the stated sizes which are based on measurements in the electron microscope. Therefore, as secondary standards, the diameter obtained from the X-ray measurements should be used.     

基于辅助光学系统的KB显微镜瞄准方法

 研究了利用辅助可见光系统精确瞄准KB显微镜物点的方法。设计了工作能点8 keV的周期多层膜KB显微镜系统，通过光线追迹和X射线成像实验，得到5 μm空间分辨率所对应的视场和景深，进而计算出诊断实验对应的指向和景深要求。基于KB系统的物像关系和精度要求，设计了辅助的可见光成像系统，实现了可见光系统与X射线KB系统间的等效瞄准，利用耦合好的系统进行了瞄准和X射线成像实验。实验结果表明:辅助光路可以实现±20 μm的垂轴面和±300 μm的轴向定位精度，满足KB显微镜的瞄准要求。     

Study of X-ray Kirkpatrick-Baez imaging with single layer

The X-ray Kirkpatrick-Baez （KB） imaging experiment with single layer is implemented. Based on the astigmatism aberration and residual geometric aberration of a single mirror, a KB system with 16^x mean magnification and approximately 0.45°grazing incidence angle is designed. The mirrors are deposited with an Ir layer of 20-am thickness. Au grids backlit by X-ray tube of 8 keV are imaged via the KB system on scintillator charge-coupled device （CCD）. In the ±80 #m field, resolutions of less than 5 #m are measured. The result is in good agreement with the simulated imaging.     

Nitriding of Stainless Steel in Electron-Beam Plasma in the Pulsed and DC Generation Modes

The influence of electron-beam parameters on the thickness and phase composition of a hardened layer formed upon the nitriding of austenitic stainless steel 12Cr18Ni10Ti in plasma produced by a beam in a low-pressure (3 Pa) nitrogen-argon mixture is studied. The results obtained in the DC and pulse-periodic modes of beam generation with the same mean current and electron energy are compared. In this case the negative bias voltage applied to the samples is 100 V. The nitriding temperature of 400°C is maintained at a mean beam current of 2.6 A and various combinations of frequency (100–500 Hz) and current pulse durations (0.1–0.3 ms) with an amplitude of 80 A. The mean ion-plasma current densities in the DC and pulsed modes are close in magnitude (2–3 mA/cm² at 400°C). The high pulsed ion-current density (35–70 mA/cm²) creates conditions under which the surface sputtering rate during the pulse exceeds the growth rate of the nitrided layer. The nitriding of steel in the pulsed and DC modes over four hours gives the same result. Hardened layers with a thickness of 7–8 μm and a microhardness of the surface component of 15 ± 1 GPa in which the main phase is a supersaturated nitrogen solid solution (expanded austenite) are formed. A possible explanation is that nitriding in an electron-beam plasma proceeds mainly under the action of long-lived active neutral nitrogen particles rather than as a result of ion bombardment.     

密度渐变多层碳气凝胶靶型的制备

 以间苯二酚-甲醛为原料,结合自制活动式微模具成型工艺制备不同厚度和密度的碳气凝胶薄片,采用密度为10 mg·cm^-3的SiO₂溶胶为“粘合剂”,获得单元薄片厚度在100～580 μm,密度在50～400 mg·cm^-3范围内变化的5层密度渐变碳气凝胶靶型。重点研究了该特殊靶型内部C/SiO₂气凝胶层间界面情况。采用场发射扫描电镜（FESEM）,X射线相衬成像仪等对靶型整体结构及碳气凝胶单元薄片表面和内部微观结构进行了表征。结果表明：胶粘层SiO₂气凝胶厚度约为15 μm,厚度一致,远小于碳气凝胶层厚度且与碳气凝胶薄片的胶粘程度较好,界面平整,靶结构均匀。     

Study of hafnium-oxide coatings by means of nuclear backscattering spectrometry

Single-layer coatings made of hafnium oxide and double-layer structures with an intermediate nickel layer, the total thickness of which is 70 μm, are obtained via plasma spraying with a supersonic jet in a rarefied atmosphere. A nozzle extension capable of implementing a Prandtl–Meyer expansion fan is used to generate nanostructured coatings. The coatings are investigated via the nuclear backscattering of spectrometry 7.6 MeV protons, scanning electron microscopy, X-ray microanalysis, and X-ray diffraction. The studies of the surface and transverse microsection of the coatings indicate that they comprise not only deformed particles of the sprayed powder with sizes of greater than 20 μm but also layers and conglomerates of nanoparticles with sizes of 30–60 nm. Depth profiling of the elemental composition performed by means of the nuclear backscattering spectrometry of protons demonstrates that transition layers exist at the interface between the substrate and coating layers characterizing the average size of the coating microparticles. A comparison of thicknesses defined by two methods allows estimation of the overall porosity of the hafnium-oxide layer. In accordance with X-ray diffraction data, the cubic and monoclinic phases of hafnium oxide with a high fraction of the amorphous component are formed in the coating.     

X射线衍射增强相衬成像的实验结果

报道了X射线衍射增强相衬成像的最新实验结果，简要论述了其原理，证明了衍射增强X射线相衬成像是一种高信噪比的成像方法，它比普通的X射线成像和层析(CT)具有高得多的分辨力，约为10μm，这在临床医学、材料科学及其它一些生物研究领域具有巨大的应用潜力。