A new laser shadowgraphy method for measurements of dynamic contact angle and simultaneous flow visualization in a sessile drop

A new laser shadowgraphy method is presented to measure the dynamic contact angle of a sessile drop on a nontransparent metal substrate and simultaneously visualize flow motions inside the drop. A collimated laser beam is refracted into the drop, then reflected on the substrate surface and finally refracted out of the drop to form a shadowgraphic image on a screen. The instant diameters of the refracted-shadowgraphic image, cooperated with the corresponding instant contact-diameters of the drop measured from the magnified top view, are used to determine the instant contact angles of the sessile drop. At the same time, flow motions, if any, in the drop can be visualized from the refracted-shadowgraphic image. The new method is demonstrated to be a very simple, accurate, and unique optical technique for simultaneous measuring of the dynamic contact angle of a liquid drop spreading on a nontransparent metal substrate with flow visualization in the drop.     

Optical waveguide effect of thermally tampered sheet and plate glasses—application to surface stress measurements

Sheet and plate glasses have refractive index inhomogeneity parallel with their surfaces. Refractive index maxima near the surfaces behave as optical waveguides. Light waves can be excited in the guides from outside and can be extracted non-destructively, using the technique popular in optical integrated circuits. Stress birefringence, caused by surface stress in thermally tempered glasses, gives different effective indices for two linearly polarized light beams which vibrate in directions vertical to and in parallel with the surfaces. Effective index observation by two polarized light beams allows non-destructive surface stress determination.     

Fizeau型偏振移相干涉仪的实验研究

研究了一种Fizeau型偏振移相干涉仪。以中心波长为650nm的多纵模半导体激光器作为光源,利用光源的短相干特性和一套偏振延迟装置分出一对偏振方向正交的参考光和测试光,采用巴比涅-索列尔补偿器作为偏振移相器。测试了一块平行平板的前表面面形,面形PV值为0.0682λ,RMS值为0.0127λ。该方法的优点是移相精度高,移相时无须推动参考镜,适用于大口径光学系统的干涉测试,可消除多表面干涉杂散条纹的影响。     

组合式力热动态载荷光学窗口的光学特性研究

针对在一定压差及温度梯度等复合环境下工作的大口径光学窗口,提出了一种由光学玻璃与亚克力板组成的光学窗口组合方案,并以热光学分析为基础,对光学窗口整体强度及热环境进行了理论分析计算,得出光学窗口玻璃最小厚度。利用有限元软件将压力场及轴向温度场映射至三维结构模型,计算得到直径为380 mm的光学窗口在不同玻璃厚度下力热耦合的面形变化及成像质量评价指标,并通过相应的环境性试验对仿真结果进行验证。实验结果表明:以K9光学玻璃为原材料的大口径光学窗口在此工作环境下的厚度不小于32.5 mm;当光学窗口厚度为35 mm时,其所受热力学影响可以忽略。因此,35 mm的大口径组合式光学窗口既能满足强度要求,又能满足多光谱相机成像质量要求,为该类窗口的设计提供了依据。     

利用白光干涉谱测定云母片的快慢轴

白光照射到透明云母薄片时,后侧内表面产生的反射光与入射光会在云母片的前表面发生干涉.利用光谱仪可以观察到由于干涉而形成的条状光谱.改变入射光的偏振方向,可以观察到由于云母薄片双折射特性引起的干涉条纹的移动.根据条纹移动的方向,可以判定出云母片两正交的光轴方向上折射率的差异,从而判定出其快轴和慢轴.     

环形光纤声发射传感器的相位调制特性研究

提出了一种基于光纤Sagnac干涉仪的环形传感器，用于固体表面传播的超声波的检测.这种传感器的特点是能够精确地检测由固体表面传播的超声波产生的微弱振动.当超声波信号通过光纤传感器的两个臂到达探测器时，干涉仪的输出光强度受到了超声信号的调制.通过检测干涉仪的输出光强度并利用Fourier变换，测得了超声信号的振幅和频率.而且对传感系统的位相调制特性进行了仿真，并对实验结果进行了分析，结果表明该系统可用于固体表面传播的超声波频率特征的识别.     

Experimental demonstration of near-field focusing of a phase micro-Fresnel zone plate (FZP) under linearly polarized illumination

A high numerical aperture binary phase micro-Fresnel zone plate (FZP) is designed and fabricated on a glass substrate by using a focused ion beam technique. Focusing characteristics of the phase micro-FZP are measured by a near-field scanning optical microscope using linearly polarized light as an illumination source. It is found that an asymmetric spot with subwavelength beam width and elongated depth of focus can be obtained from the phase micro-FZP. Furthermore, the measurement is shown to be consistent with the calculation result. Further, the tolerance in fabrication errors like tilt of side walls on focusing is discussed with numerical simulations.     

Measurement accuracy verification of aspheric surface test with computer-generated hologram

A convex aspheric surface using a computer-generated hologram(CGH) test plate fabricated with novel techniques and equipment is tested.However,the measurement result is not verified via comparison with other methods.To verify the accuracy of the measurement,a perfect sphere surface is measured by the following.The measurement result is quantified into four parts:the figure error from the tested spherical surface;the figure error from the reference spherical surface;the error from the hologram;and the adjustment error from misalignment.The measurement result,removed from the later three errors,shows agreement to 4-nm RMS with the test by Zygo interfermeter of the same surface.Analysis of the CGH test showed the overall accuracy of the 4-nm RMS,with 3.9 nm from the test plate figure,0.5 nm from the hologram,and 0.74 nm from other sources,such as random vibration,various second order effects,and so on.Thus,the measurement accuracy using the proposed CGH could be very high.CGH can therefore be used to measure aspheric surfaces accurately.     

The effect of the optical anisotropy of scattering media on the polarization state of scattered light

The effect of the optical anisotropy of scattering media on the polarization state of scattered light is studied. The study is performed using a simple polarization method based on the comparison of the spectral composition of the co-and cross-polarized components of transmitted light measured for samples differently oriented with respect to the plane of polarization of probe linearly polarized light. The experimental results obtained are interpreted theoretically in terms of ordinary methods used in optics of birefringent media. Using rat skin as an example, it is shown that surface tissues can be characterized by a high degree of orientational order of the local optical axis of a medium within large areas (with a size of 5 mm or more), which manifests itself in macroscopic optical measurements. In such measurements in the spectral range 550–700 nm, whole rat skin behaves as a partially depolarized phase plate with a difference between the principal refractive indices Δn ≈ 0.00023.     

Fiber-optic sensor for the estimation of microbial corrosion of metals

This paper presents an optical approach to estimate the degree of corrosion of metals by measuring the changes in surface texture. The principle behind this method is based on scattering of light by objects. Source fiber is used to focus the light on the biocorroded metal surface. The resultant scattered and reflected light intensities are measured individually using detector fibers placed at different angles. The degree of corrosion is estimated as a ratio of scattered and reflected light intensities of specimen surface in a relative scale from 0 to 100. The observed optical measurements correlate well with the measured corrosion rate (correlation coefficient (R²)=0.972). A consistent relationship is found between optical measurements and corrosion levels.     

易测量非球面定义及应用

本文提出了一种新型、易于用传统光学干涉仪测量的非球面。该非球面的检测主要基于Zemax光学程序软件设计的多重配置特性。第一配置为易于测量非球面,第二配置为采用平行平面玻璃板或单透镜作为零位校正器,用于检测第一配置的非球面。本文通过一些实例,说明了易测量非球面检测技术的应用和优势,证实了与圆锥或普通非球面相比,易测量非球面更易于操作与检测,同时有利于减小光学像差。     

光致聚合物全混洗光互连全息元件的制备

采用只对红光敏感的光致聚合物全息干版通过 Ｈｅ－Ｎｅ ６３２ｎｍ激光波长两次掩膜曝光,在面积为３０ｍｍ × ６０ｍｍ的全息干版上制备出全息光学元件,并成功地用于全混洗光学互连的实验演示。全息光学元件的衍射效率为 ４０～ ５２％。     

Novel method for high accuracy figure measurement of optical flat

Phase Measuring Deflectometry (PMD) is a non-contact, high dynamic-range and full-field metrology which becomes a serious competitor to interferometry. However, the accuracy of deflectometry metrology is strongly influenced by the level of the calibrations, including test geometry, imaging pin-hole camera and digital display. In this paper, we propose a novel method that can measure optical flat surface figure to a high accuracy. We first calibrate the camera using a checker pattern shown on a LCD display at six different orientations, and the last orientation is aligned at the same position as the test optical flat. By using this method, lens distortions and the mapping relationship between the CCD pixels and the subaperture coordinates on the test optical flat can be determined at the same time. To further reduce the influence of the calibration errors on measurements, a reference optical flat with a high quality surface is measured, and then the system errors in our PMD setup can be eliminated by subtracting the figure of the reference flat from the figure of the test flat. Although any expensive coordinates measuring machine, such as laser tracker and coordinates measuring machine are not applied in our measurement, our experimental results of optical flat figure from low to high order aberrations still show a good agreement with that from the Fizeau interferometer.     

Detection of Deposited Particles from the Backside of a Glass Plate

Microcontamination of product surfaces by deposited particles is an important problem in clean technologies. A most sensitive product to contamination by particles is a wafer during chip production. Therefore, methods for monitoring particle deposition on wafer surfaces have been developed in the last decade. A wafer with an unstructured and reflecting surface is inserted into the process equipment. After some time, depending on the process, this wafer is removed from the process equipment and is analysed with respect to the number of deposited particles using a wafer scanner. However, in situ particle detection in a process chamber is not possible with this technique. This would be possible if, instead of a monitor wafer, a transparent glass plate is mounted, e.g. in the housing of the process equipment. Then the illuminating and scattered light detection equipment can be mounted outside the process equipment. Since both the illuminating laser beam and the scattered light have to be transmitted through the glass plate, losses will occur, which will reduce the lower limit of detection with respect to particle size. In this article we estimate the detection possibilities theoretically and experimentally. A simple model based on Mie and vector scattering theory has been developed to describe the light-scattering behavior of a single spherical particle on a glass plate with random surface irregularities. The scattered light of individual particles of four particle sizes (1.03, 1.6, 2.92 and 4.23 μm) on the same glass surface and from the uncontaminated area of the glass plate was measured for unpolarized and normally incident light. The values of the scattered light from this model were compared with the experimental results. The comparison shows a reasonable agreement of the angular distribution of the scattered light. The developed model is used to predict the lower limit of detection for particles on a transparent surface. The theoretical estimations show that it should be possible to detect particles of a diameter down to 0.2 μm with the described measurement technique.     

Detection of corrosion beneath a paint layer by use of spectral polarization optical imaging

The spectral and polarization properties of scattered light were used to image corrosion beneath the surface of a painted aluminum plate. The quality of imaging of the corrosion on the metal surface was significantly enhanced by the spectral polarization optical imaging technique. Depolarization scattered light was used to detect and image corrosion beneath the paint layer.     

Measurement of optical rotation and phase retardance of optical samples with depolarization effects using linearly and circularly polarized probe lights

This paper presents an experimental technique for measuring the optical rotation, depolarization, and phase retardance of optical samples. In the proposed approach, the optical properties of the sample are derived using a Stokes–Mueller matrix formalism in conjunction with linearly and circularly polarized probe lights. For a compound sample comprising a half-wave plate positioned in front of glucose solutions with concentrations ranging from 0 to 1.2 g/dl, the average normalized error in the measured rotation angle is determined to be 3.11% when using a linearly polarized light. The average surviving linear and circular polarization fractions of the glucose solutions are determined to be 1.0252 and 0.9945. The average normalized error in the measured retardance of the half-wave plate is 3.45%. When measuring a compound sample comprising a half-wave plate positioned in front of the scattered glucose solutions with turbidities from 0% to 50% by the addition of milk, experimental results show that the induced rotation angle increased as the turbidity increased, whereas both surviving linear and circular polarization fractions decreased as the turbidity increased. The effect of the turbidity on rotation angle is more significant than that on both surviving linear and circular polarization fractions. The average normalized error in the measured retardance of the half-wave plate is 1.43%. Consequently, a simplified geometry of the polarimeter is proposed to independently estimate the rotation angle, surviving linear and circular polarization fractions, and retardance from the derived viable algorithm.     

光纤面板窗多碱光电阴极荧光谱特性研究

论述了光致荧光的特点以及微光像增强器多碱光电阴极光致荧光的测量原理, 测量了光纤面板输入窗多碱光电阴极的荧光谱. 测试结果表明, 光纤面板窗的多碱阴极的荧光谱不是一条光滑的高斯型曲线, 而是在一条高斯型曲线上叠加了一些小的干涉峰的曲线. 原因是光纤面板窗所传输的荧光中, 有两束特殊的光线. 一束光为准直光, 另一束光为入射角刚好等于全反射临界角的反射光. 这两束光具有固定的相位差或光程. 当这两束光的相位差相差λ的整数倍时, 它们将干涉并产生干涉加强峰;当这两束光的相位差相差1/2λ的奇数倍时, 它们将干涉并产生干涉减弱峰. 如果在荧光谱的峰值波长处刚好产生干涉加强峰, 那么所测量的峰值荧光强度较其固有的峰值荧光强度要高; 反之, 如果在荧光谱的峰值波长处刚好出现干涉减弱峰, 那么所测量的荧光强度就小于其固有的荧光强度. 另外由于受到干涉的影响, 荧光曲线半峰宽也不能精确确定,所以在分析光纤面板窗光电阴极的荧光谱时, 要考虑到干涉因素的影响.     

Wavelength dependence of the phase retardation of a quarter-wave plate

We describe an optical heterodyne polarization interferometer that can be efficiently used for the precision measurement of the change in the state of polarization of a light wave induced by polarizing optical devices. This technique is used to measure the change with wavelength of the phase retardation of a quarter-wave plate. A theoretical derivation is presented to permit computation of the wavelength dependence of the phase shift induced by a quarter-wave plate.     

惯性约束聚变装置中靶面光场特性的统计表征方法

在激光驱动的惯性约束聚变装置中,常采用多种束匀滑手段对焦斑的时空特性进行调控.光传输链路中涉及的光学元件众多、传输变换复杂,往往导致光传输模型复杂,且在运用衍射光学方法分析焦斑形态和特征时面临大量的数据处理和计算,致使出现计算量大、计算效率低等问题,亟需寻求快速而简便的新方法来描述焦斑的统计特征.本文利用光场特性的统计表征方法对靶面光场进行表征,采用圆型复数高斯随机变量直接描述靶面光场的统计特征,并基于典型焦斑评价参数对衍射光学方法和统计表征方法得到的远场焦斑进行了对比和分析.结果表明,采用衍射光学方法和统计表征方法获得的焦斑的瞬时特征基本一致,其时间积分的远场焦斑有所不同,但仍可进一步采用相关系数来表征其远场焦斑的时间变化特征.     

Simple method for simultaneous determination of the phase retardation and fast axis of a wave plate

A simple method for simultaneous determination of the phase retardation and fast axis of a wave plate is presented. In this method, double light path compare system is adopted to achieve better accuracy. In the main optical path, laser beam passes successively through a polarizer, a wave plate to be measured, an analyzer, and then is incident on a detector. In the reference optical path, another detector is used to monitor the fluctuation of the light source. With rotation of the wave plate, the maximum and minimum output light intensity, rotation angle of the wave plate are detected in the main light path; corresponding light intensity are simultaneously detected in the reference light path. Based on the light intensity and the rotation angle, the phase retardation and fast axis of the wave plate can be determined simultaneously. The main advantage of this method is its simplicity of apparatus, easy operation, low cost, and high accuracy. We believe that the method reported in this paper should be a useful approach to measure a wave plate without requiring any complex and expensive components.