神光Ⅲ中退偏现象对系统隔离比的影响

通过离线实验指出了神光Ⅲ主机装置联机调试阶段中限制系统隔离比提高的主要因素来自于转角体结构中反射膜引入的退偏效应。从膜系理论出发建立了神光Ⅲ主机装置中的转角体结构的反射系数的计算模型,进而通过计算指出了退偏效应的主要来源是反射膜层厚度的偏差,然后通过数值计算与离线实验结果的对比确定了转角体结构中各个反射镜的反射系数。由此得到了转角体结构的总反射系数及其造成的神光Ⅲ主机装置系统隔离比的提升上限和进一步提升系统隔离比的思路。     

电铸金属光栅中金属沉积过程的在线监测

在使用电铸方法制作金属光栅时,采用传统的计时电铸方法常常不能保证金属栅条具有精确的沉积厚度。为了能够实时监测光栅栅条的沉积厚度,以实现电铸截止时刻的精确判断,建立了基于衍射效率判断金属沉积厚度的在线监测系统。采用严格耦合波理论计算了Au在光刻胶沟槽中进行沉积时,衍射效率随Au沉积厚度的变化规律,并讨论了光刻胶占宽比、电铸电流密度对衍射效率的影响;计算了电铸池、镀液对监测激光能量造成的损耗。实验得到的效率曲线与仿真结果相一致;电铸池、镀液对光能的损耗达94. 88%。实验结果表明,采用在线监测方法实时判断金属沉积厚度是合理有效的;光刻胶占宽比对在线监测影响不大;电铸电流密度对在线监测有影响,且电流密度越高越有利于截止点的判断。     

声表面波耦合模模型参量的快速计算

根据分层介质理论精确求解压电基片和金属膜中的声波,计算了声表面波传播速度、机电耦合系数、静电容。结合陈-Haus理论,分析了短路栅阵的声表面波的传播特性,得到新的单电极栅阵栅条反射系数计算公式。计算了X-112°Y LiTaO_3上镀铝和ST石英上镀金两种情况下的耦合模模型参量,理论计算结果和国际上通用的Hashimoto程序计算结果吻合较好。实验测定了ST石英上镀金的反射系数,测试结果和理论结果更加符合。     

修正反射系数的Kirchhoff近似方法计算高斯起伏冰面三维声散射

针对随机起伏冰面的声散射计算问题,利用修正反射系数的Kirchhoff近似方法计算了高斯起伏冰面的三维声散射。在计算模型中引入了冰面局部统计平均反射系数的概念,将二维高斯起伏冰面的散射分为相干散射和非相干散射,分别得到两类散射成分的散射系数公式,计算了高斯起伏冰面三维声散射的散射强度。分析了散射强度与随机起伏冰面的均方根高度、声波入射角度及频率的关系。通过实验室水池中高斯起伏冰面的散射强度测量实验,对理论模型的计算结果进行了验证。将实验结果分别与采用冰面局部统计平均反射系数的模型计算结果和文献中采用平整冰面镜反射系数的模型计算结果进行了对比,采用冰面局部统计平均反射系数的模型计算结果与实验测量值吻合较好。      

不同晶体对称类的栅条反射系数的理论与实验研究

对四方4／mmm、六角6／mmm和三角3m等晶体栅条反射系数进行了详细理论分析,给出具体的数学表达式,不同于已有的立方m3m栅条反射系数理论计算公式。根据理论分析结果给出112°旋转X切Y传LiTaO3基片上的铝短路反射栅和沟槽的反射系数。用实验方法研究了112°LiTaO3基片上的沟槽填铝短路反射的反射特性,得到了内反射为零的条件。证明了在112°LiTaO3基片上可用沟槽填铝单指结构实现无内反射的结论。将上述结果应用于单指无内反射滤波器的研制,得到了中心频率255 MHz、带宽约10 MHz、带内畸变小于0.4 dB的带通滤波器。     

超二代像增强器光阴极膜生长的反射监控与实现

详细介绍了超二代微光夜视仪像增强器多碱光阴极薄膜生长的反射光监控原理。通过推导超二代微光夜视仪像增强器多碱光阴极膜层反射系数函数,计算并绘出了几种多碱锑化合物光阴极薄膜的反射率与薄膜厚度、入射光波长之间的关系曲线。在实际应用中对所测得的数据与超二代微光夜视仪像增强器多碱光阴极膜层的反射系数进行了比较,达到了最佳的控制效果。     

利用SPR效应测定可见光波段金膜折射率

利用金膜光纤SPR传感器测定标准试剂折射率,实现了对金膜折射率的测试.给出金膜光纤SPR传感器总反射系数与金膜折射率等参量关系表达式.采用经典金膜折射率计算结果与试验结果相比具有相当差距.为此采用一组标准试剂进行试验,对测试数据进行计算,修正了可见光波段金膜的折射率.     

工质对微通道沸腾液膜瞬态变化的影响

本文采用去离子水和无水乙醇两种工质,利用微通道流动沸腾同步测量实验系统,研究了液膜厚度的瞬态变化规律,实验发现流动沸腾形成的初始液膜厚度在毛细数Ca很宽的范围内都遵循Taylor流动原理;液膜形成后,在蒸发和蒸汽流动携带的耦合作用下,厚度迅速减薄直至蒸干;由于水的汽液黏度比小,速度梯度小,剪切作用带来的液膜厚度减少量小,且水的汽化潜热大,吸收相同热量时蒸发量小,导致水的液膜厚度变化斜率较小,通过理论分析提出了沸腾液膜厚度变化的计算模型,计算结果与实验结果的误差小于20%。     

弹流油膜彩色光干涉系统的特性研究

彩色光干涉技术是润滑油膜厚度测量的最有效的方法之一,但对其测量光学理论的研究并不十分透彻。以球-盘弹性流体动压润滑油膜测量装置为对象,建立了彩色光干涉的色度学计算模型,对该系统的干涉条纹和色彩进行了数值模拟与分析。分析结果与实验数据的一致性表明了所建立的模型和分析方法的正确。分析表明:铬膜厚度对图像的色彩和对比度有明显的影响,当其厚度为5～10nm时,能够获得对比度和色彩理想的图像;垫层厚度影响各颜色分量强度分布的初相变;LED光源可产生对比度较好的干涉条纹。     

短路金属栅对正入射瑞利波的散射

由压电晶体动力学方程等出发,用电表面边界微扰技术得到了入射声表面波在栅区激发的微扰电场及电荷分布;将这些电荷作为表面激发源,用积分变换得到了包括散射声表面波和体波的一般积分解。数值计算了YZ-LiNbO_3,表面上短路金属栅对正入射瑞利波散射的声表面波,给出了其反射系数,前向散射系数等与栅条宽度的关系;进而导出了声表面波经过金属栅时的相速变化。理论计算与实验测量结果符合较好。     

FDTD analysis on the effect of plasma parameters on the reflection coefficient of the electromagnetic wave

In this paper, the dielectric constant of dispersive medium is written as rational polynomial function, and the relationship between D and E is derived in time-domain. It is named shift operator FDTD (SO-FDTD) method. Compared to the analytical solution, the high accuracy and efficiency of this method is verified by calculating the reflection coefficient of the electromagnetic wave through a cold plasma slab. The effect on reflection coefficient is calculated by using the SO-FDTD method. The result shows that some factors effect on reflection coefficient. They are as follows: plasma thickness, electron density, electron distribution and incident frequency. And on most conditions, parabola distribution helps reduce reflection coefficient more effectively than homogeneous distribution.     

Reflection of normal acoustic waves in thin plates from a grating with a periodically distributed mechanical load

Reflection of zero-order normal acoustic waves excited in a thin piezoelectric plate from a set of conducting strips of a finite thickness is studied both theoretically and experimentally. The analysis shows that the effects produced by the short-circuiting of the plate surface and by the elastic load on the impedance ratio of adjacent plate segments are in opposition to each other. These effects can be commensurable, and, hence, for each wave type, there is a certain value of the strip thickness at which the reflection coefficient becomes equal to zero. The experimental results obtained for a shear horizontal normal wave (an SH ₀ wave) propagating in a lithium niobate plate are in good agreement with the theory and justify the use of the equivalent-circuit model in analyzing the properties of reflectors of the type under study.     

天线罩电厚度与材料电参数六端口测量系统设计

 介绍了一个可用于天线罩电厚度与介质材料介电常数测量的六端口反射计系统，它由对称波导五端口结与定向耦合器组成，其关键部件波导五端口结用HFSS软件仿真与设计。介绍了天线罩相对电厚度复反射系数的测量方法。用该系统对滑动短路器复反射系数进行了测量，测量结果表明，系统工作稳定，测试精度高。利用短路波导法测量了材料介电常数和损耗角正切，测量结果显示：介电常数测量的精度和稳定度较高，损耗正切的测量误差较大。     

Effect of the chromium layer thickness on the morphology and optical properties of heterostructures Si(111)/(CrSi<Subscript>2</Subscript> nanocrystallites)/Si(111)

Growth and the optical properties of epitaxial heterostructures Si(111)/(CrSi₂ nanocrystallites)/Si(111) based on nanosized islands of chromium disilicide (CrSi₂) on Si(111) were studied using low-energy electron diffraction, atomic-force microscopy, and optical reflection and transmission spectroscopy. The heterostructures with thicknesses of 0.1, 0.3, 0.6, 1.0, and 1.5 nm were formed by reactive epitaxy at a temperature of 500°C followed by the epitaxial growth of silicon at 750°C. The specific features of changes in the density and sizes of CrSi₂ islands on the silicon surface were determined at T = 750°C as the chromium layer thickness was increased. It was established that, in the heterostructures with chromium layer thicknesses exceeding 0.6 nm, a small part of faceted Cr₂Si₂ nanocrystallites (NCs) emerge into near-surface region of the silicon, which is confirmed by the data from optical reflectance spectroscopy and an analysis of the spectral dependence of the absorption coefficient. A critical size of NCs is shown to exist above which their shift to the silicon surface is hampered. The decreased density of emerging NCs at chromium layer thicknesses of 1.0–1.5 nm is associated with the formation of coarser NCs within a silicon layer, which is confirmed by the data from differential reflection spectroscopy.     

基于SiC材料的大长宽比长条型反射镜轻量化结构设计

介绍了一种大长宽比长条型反射镜的轻量化结构设计方法.讨论了反射镜的材料选择和轻量化结构形式,同时在轻量化设计过程中引入拓扑优化方法,以反射镜柔性变形为设计约束,以最小体积为设计目标,经过迭代计算得到最优结果.根据优化结果,建立反射镜的三维实体模型,并利用MSC.Patran软件建立反射镜的有限元模型,对影响反射镜自重变...     

Characteristics of backing impacts on the performance of the thickness mode piezoelectric transducer

The impacts of the thickness, the specific acoustic impedance and the mechanical loss factor of the backing on the performance of the thickness mode piezoelectric transducer are systemically studied, which are focused on the effective electromechanical coupling coefficient and the mechanical quality factor near the center frequency. The results show that with contin?uous increasing of the backing thickness, the effective electromechanical coupling coefficient and the mechanical quality factor are found rapidly declined by oscillation way. With the increase of the difference value of the acoustic impedance between the backing material and the piezoelec?tric material, the effective electromechanical coupling coefficient deceases and the mechanical quality factor increases. Under condition that the thickness of the piezoelectric material is fixed, the effective electromechanical coupling coefficient is found declined with the increase of the mechanical loss factor by monotonous way. The mechanical quality factor has minimum value and the electric characteristic curve tends to be smooth in a given frequency range. The equivalent circuit theory result is in good agreement with the ones by finite element method and the experimental results. The work mentioned above provides a theoretical guidance for the design and experimental fabrication of the thickness mode piezoelectric transducer.     

Bifurcation in reflection spectra of holographic diffraction grating recorded on dicromated pullulan

Volume diffraction gratings were created holographically on a dichromated pullulan (polysaccharide doped with chromium). Specific and very rare multi-peak structure in the reflection spectra is observed. It was found that multiple peaks are consequence of non-ideal structure of volume diffraction grating. Theoretical analysis and numerical simulations confirm that the observed behavior arise from a slight randomness of grating parameters: refractive index, grating period, film thickness. The results of calculation are in agreement with experimental results.     

特征光谱吸收法测量人血清前列腺特异性抗原浓度的研究

采用免疫层析金标试纸配合特征光谱吸收法检测前列腺特异性抗原(PSA,prostate-specific anti-gen)浓度,采用合适发射光波长(520～535nm)的LED照射已用PSA标准液处理过的胶体金标记试纸,用合适接收波长(520～540nm)的光电二极管测试试纸特定区域的反射光强度,据此得出表征试纸吸光的量,再用线性拟合方法确定PSA浓度与试纸吸光度的关系。研究中采用不同浓度的PSA标准液标定了实验检测系统,发现在浓度范围为5～50ng.mL-1时,PSA的浓度与试纸的吸光度成线性关系。在该浓度范围内对不同于标定浓度的21种PSA标准液做了检测实验,检测值与真实值的相关系数为0.910。实验证明,采用特征光谱吸收法测量PSA浓度的方法是可行的。     

Acoustic method for obtaining the pressure reflection coefficient using a half-wave layer

This paper describes a method for obtaining the pressure reflection coefficient by using a half-wave layer. Two transducers were placed in reference liquid and test liquid respectively. The reference and test liquid were separated by the thin half-wave layer. Both transducers could operate in two modes. One acted as a transmitter and worked in pulse-echo mode, and the other operated in receiver mode. By adjusting the frequency of drive signal according to the thickness and material property of the half-wave layer, it was possible to generate the maximum interference signal of multiple waves reflected at the two interfaces of the layer. Therefore, the amplitude of reflection wave in steady-state depended only on the reflection coefficient at the interface between the half-wave layer and the test liquid. The effects of the signal-to-noise-ratio and the half-wave layer attenuation on the uncertainty characteristics of the pressure reflection coefficient were discussed. The experimental results showed high accuracy for measurement of reflection coefficient.     

The structure of electrodeposits – a computer simulation study

Polycrystalline higher manganese silicide (MnSi_1.73) films with addition of chromium were prepared on thermally oxidized silicon substrates by magnetron sputtering. A cap layer of chromium disilicide was used as the doping source. Both the Seebeck coefficient and the resistivity were strongly dependent on the amount of chromium added to the film. When the thickness ratio of chromium disilicide to manganese silicide increased from 2.4% to 9.8%, the Seebeck coefficient at room temperature decreased from 121 to 100 μV/K. However, the temperature at which the maximum value of the Seebeck coefficient occurred increased from 343 to 633 K. When the thickness ratio was about 2.4%, the resistivity increased to 33×10^-3 Ω cm. Otherwise, the resistivity decreased from 13×10^-3 to 5.2×10^-3 Ω cm by increasing the thickness ratio. As a result, the thermoelectric power factor increased greatly at high temperatures. Several activation energies (0.021–0.383 eV) were observed from the curves of the logarithm of resistivity versus reciprocal temperature. PACS 72.20.Pa; 72.80.Ga; 72.15.Jf; 73.50.Lw; 73.61.Le