ZnO-Bi2O3系压敏陶瓷的晶界电子结构

测量了ZnO-Bi₂O₃系压敏陶瓷在不同温度下的介电频谱,基于压敏陶瓷介电特征损耗峰起源于耗尽层内本征缺陷电子松弛过程的理论,计算了ZnO的本征缺陷结构,并进一步求出了晶界的微观电参数和宏观单晶界击穿电压.单晶界击穿电压的理论值与实验测量值符合得很好,这表明本文建立的基于介电谱计算本征缺陷的方法是有效的. 关键词： ZnO压敏陶瓷 晶界电子结构 介电谱     

ZnO压敏陶瓷介电损耗的温度谱研究

利用Novocontrol宽频介电谱仪在-100—20 ℃温度范围内测量了ZnO-Bi₂O₃系压敏陶瓷的介电频谱,其频率范围为10^-2—10⁶ Hz. 研究表明： ZnO压敏陶瓷特征损耗峰的活化能分别为0.26和0.36 eV,结合实验条件、理论计算结果及其他现象的分析排除了特征损耗峰源于阴极电子注入、夹层极化和偶极子转向极化的可能.热刺激电流（TSC）谱共出现三个峰,其中高温峰对应于TSC实验加压过程引入的热离子极化,而中温峰和低温峰对应于介电损耗峰. 在分析的基础上,提出了ZnO压敏陶瓷的特征损耗峰起源于耗尽层内本征缺陷的电子弛豫过程. 关键词： ZnO压敏陶瓷 本征缺陷 介电谱 热刺激电流     

直流老化及热处理对ZnO压敏陶瓷缺陷结构的影响

在电场为3.2 kV/cm, 电流密度为50 mA/cm²条件下对ZnO压敏陶瓷进行了115 h的直流老化, 研究了直流老化对ZnO压敏陶瓷电气性能及缺陷结构的影响. 发现直流老化115 h 后ZnO压敏陶瓷的电位梯度、非线性系数分别从2845 V/cm, 38.3下降到51.6 V/cm, 1.1, 介电损耗中的缺陷松弛峰被增大的直流电导掩盖, 电模量中只观察到一个缺陷松弛峰, 低频区交流电导率急剧增大并且相应的电导活化能从0.84 eV下降到只有0.083 eV. 通过对直流老化后的ZnO压敏陶瓷在800 ℃进行12 h 的热处理, 发现其电气性能和介电性能都得到了良好的恢复并有一定的增强, 电位梯度、非线性系数恢复到3085 V/cm, 50.8, 电导活化能上升到0.88 eV. 另外, 其本征氧空位缺陷松弛峰也得到了一定的抑制. 因此, 认为热处理过程中氧在晶界处的扩散作用对ZnO压敏陶瓷的直流老化恢复起到了关键作用. 关键词： ZnO压敏陶瓷 介电性能 直流老化 热处理     

沉淀剂对ZnO压敏陶瓷缺陷结构和电气性能的影响

研究了不同沉淀剂(NH₄HCO₃和NaOH)对共沉淀法制备的ZnO压敏陶瓷性能的影响. 结果表明: 不同的沉淀剂对ZnO压敏陶瓷的微观结构及电气性能有明显的影响. 其中陶瓷微观结构的变化主要由沉淀剂本身的性质引起; 而电气性能的改变除了与微观结构相关外, 主要受不同沉淀剂对陶瓷晶界势垒参数的影响; 此外, 沉淀剂NaOH引入的Na⁺作为施主杂质离子掺杂ZnO压敏陶瓷, 增加晶粒中的自由电子浓度, 因此本征缺陷(锌填隙和氧空位)浓度受到抑制, 而锌填隙浓度相对于氧空位而言对施主离子掺杂更为敏感. 由此, 采用共沉淀法制备ZnO压敏陶瓷粉体时, 沉淀剂种类的选择很重要, 即使微量的杂质也会引起压敏陶瓷性能的较大改变, 应尽可能避免杂质离子的引入. 关键词： ZnO压敏陶瓷 缺陷结构 沉淀剂 介电性能     

ZnO压敏陶瓷缺陷结构表征及冲击老化机理研究

对多元ZnO压敏陶瓷电阻片进行了多达14000次的大电流冲击老化试验, 通过显微结构、电气性能及介电特性的测量对其缺陷结构进行了表征, 并研究了缺陷结构与大电流冲击老化之间的关系. 试验表明多次大电流冲击老化导致试样的电气性能明显下降, 发现ZnO压敏陶瓷的几何效应不仅受控于晶粒还与晶界密切相关. 另外, 通过介电谱分析观察到ZnO压敏陶瓷存在四种缺陷弛豫过程, 低温-60 ℃下的两个缺陷弛豫峰激活能约为0.24 eV和0.35 eV, 认为它们分别对应着本征的锌填隙缺陷L(Zn_i^··)和氧空位缺陷L(V_O^·)并且不受冲击老化的影响. 高温80℃以上两个松弛峰的活化能约为0.71 eV和0.84 eV, 认为它们分别对应着非本征的晶间相电子陷阱L(ingr)和晶界处界面态陷阱L(gb). 发现大电流冲击后, 仅界面态陷阱激活能从0.84 eV降低到0.76 eV, 认为界面态陷阱主要控制着ZnO压敏陶瓷的电气性能和稳定性.     

CaCu3Ti4O12 陶瓷介电模量响应特性的研究

由于CaCu₃Ti₄O₁₂巨介电常数陶瓷的低频区直流电导较大, 本文采用模量 M"-f频谱表征与分析了低频和高频的两个松弛极化过程. 研究认为, 这两个特征峰属于晶界区Schottky 势垒耗尽层边缘深陷阱的电子松弛过程, 其中高频松弛峰起源于晶粒本征缺陷的电子松弛过程, 而低频松弛峰则为与氧空位有关的松弛极化过程. 对于CaCu₃Ti₄O₁₂这类低频下具有高直流电导的陶瓷材料, 采用模量频谱能更有效地分析研究其损耗极化机理. 关键词： 3Ti₄O₁₂陶瓷')" href="#">CaCu₃Ti₄O₁₂陶瓷 模量 松弛过程 电导     

ZnO压敏陶瓷中的本征缺陷

研究了ZnO-Sb₂O₃-BaO系和ZnO-Bi₂O₃-Sb₂O₃-BaO系压敏陶瓷的介电损耗因子D(tanδ)与频率f的关系。发现不含Bi₂O₃试样在室温附近出现一新的损耗峰,峰值频率在2MHz左右,对应的电子陷阱能级为0.18eV,分析认为是由于本征缺陷Zn_i所致。设想Bi离子对Zn_i 关键词：     

低温氮化硅薄膜的介电性能研究

研究了微波电子回旋共振等离子体化学汽相沉积低温氮化硅薄膜在5—10⁶Hz频率范围内的介电性能．由于低温氮化硅薄膜为具有分形结构的纳米非晶薄膜，致使氮化硅薄膜的介电谱、损耗谱在低频区和高频区具有两种不同的分布规律．在低频区介电谱具有ε′∝ω^n－1₁的关系，ｎ₁在0.82—0.88之间，是电子跳跃导电的结果；在高频区介电谱具有ε′∝ω^n-1₂的关系，n₂在0 关键词：     

Na0.25K0.25Bi0.5TiO3无铅压电陶瓷的介电特性研究

用固相反应法制备了Na_0.25K_0.25Bi_0.5TiO₃ (NKBT50)陶瓷，研究了该陶瓷在室温至400℃温度范围内的介电性能.发现该陶瓷的介电温谱与烧结气氛、极化状态有关.在空气中烧结的未极化样品在70℃附近存在介电和损耗峰，而极化后及在氧气氛中烧结的样品并不存在该介电、损耗峰.分析认为70℃的介电和损耗峰与氧空位形成的缺陷偶极子的极化弛豫有关.热激电流显示，陶瓷的去极化温度为225℃，与此相对应的介电、损耗峰也 关键词： 介电性能 氧空位 极化弛豫 钛酸铋钠钾     

ZnO-Bi2O3系压敏陶瓷的导电过程与等效势垒高度

研究了ZnO-Bi₂O₃系压敏陶瓷等效势垒高度_eff随着归一化电压的变化规律，发现等效势垒高度_eff随着归一化电压的增加先逐渐增大，达到最大值后持续下降.由于在外加电压作用下反偏势垒高度高于正偏势垒高度，等效势垒高度_eff主要取决于反偏势垒.因此，这种变化规律说明了ZnO压敏陶瓷晶界的导电过程可能存在三个阶段.在低归一化电压区，晶界区域中的电子从正偏势垒区注入到晶界无序层的速率低于电子从晶界无序 关键词： ZnO压敏陶瓷 归一化电压 等效势垒高度 导电过程     

Physical meaning of conductivity spectra for ZnO ceramics

With the help of broadband dielectric spectroscopy in a wide temperature and frequency range, the conductivity spectra of ZnO polycrystalline ceramics are measured and the direct-current-like (DC-like) conductivity and relaxation polarization conductivity are observed successively along the frequency axis. According to the classical Debye theory and Cole-Cole equation, the physical meanings of the two conductivities are discussed. It is found that the DC-like conductivity corresponds to electron transportation over the Schottky barrier at the grainboundary. The relaxation polarization conductivity corresponds to electronic trap relaxation of intrinsic point defects (zinc interstitial and oxygen vacancy). When in the high frequency region, the relaxation conductivity obeys the universal law with the index n equal to the index α in the Cole-Cole equation as an indictor of disorder degree.     

Dielectric relaxation in LuFeO3 ceramics

LuFeO₃ ceramics were prepared, and the dielectric characteristics were investigated together with the structure. A giant dielectric constant step (8000 at 10 kHz, 7200 at 100 kHz, and 4000 at 1 MHz) very similar to that in LuFe₂O₄ was observed. The dielectric constant dropped quickly when the temperature decreased through a critical temperature which increased significantly when the frequency increased. A very high relaxor-like dielectric peak with strong frequency dispersion was also observed in a higher temperature range. Two obvious corresponding dielectric relaxation peaks were observed on the curve of dielectric loss vs temperature, and all these dielectric relaxations followed the Arrhenius law. The Fe²⁺/Fe³⁺ mixed-valence structure and the oxygen vacancy primarily governed these relxor-like dielectric behaviors. However, the present ceramics are not relaxor ferroelectric.     

巨介电常数氧化物CaCu3Ti4O12的介电和阻抗特性

采用固相烧结法合成了单相巨介电常数氧化物CaCu₃Ti₄O₁₂（CCTO）.用阻抗分析仪分析了10—420 K温度范围内的介电频谱和阻抗谱特性,并结合ZVIEW软件进行了模拟.结果表明：温度高于室温时,频谱出现两个明显的弛豫台阶,低频弛豫介电常数随温度升高而显著增大,表现出热离子极化特点;温度低于室温时,频谱表现出类德拜弛豫,且高、低平台介电常数值基本不随温度变化,表现出界面极化特点和较好的温度稳定性.频谱中依次出现的介电弛豫对应于阻抗谱中 关键词： 3Ti₄O₁₂')" href="#">CaCu₃Ti₄O₁₂ 介电频谱 阻抗谱 Cole-Cole半圆弧     

Microstructure and dielectric study of pure BST and doped BSTF ceramic materials by broadband dielectric spectroscopy

Pure BST and doped BSTF (with BSTF2: Fe₂O₃ 2 wt % and BSTF4: Fe₂O₃ 4 wt %) ceramics were prepared by solid state reaction. XRD pattern showed the different phases were formed depend on the weight percent of Fe₂O₃. The crystal size and lattice parameters increased while the lattice strain decreased. The topography of the sintered samples shows increase of the grain size with increasing Fe₂O₃ ratio and hence enhances the compaction of ceramics. Broadband dielectric spectroscopy was employed to investigate the effect of magnetite nanoparticle on the dielectric properties of the pure BST ceramic. The interfacial polarization and the conductivity contribution reflect the high values of permittivity and its gradual increase as frequency decreases. The two BSTF samples show relaxation peak dynamic originated from presence of immobile species/electrons at low temperatures and defects/vacancies results from the formation of oxygen vacancies originates from the spontaneous change in oxidation states of Fe ions (Fe ^3+/Fe²⁺) at high temperatures. The relaxation rate obeys Arrhenius law at high temperatures in case of BST sample with activation energy 225 kJ/mol. This high value of activation energy at higher temperatures reflects and confirms the slowed down of the dynamics at the interphase and the decoupling nature of the OH-dynamic and the interfacial polarization.     

Dielectric relaxation in LaSrCo1−x Al x O4 ceramics

Dielectric properties of LaSrCo_1−x Al _x O₄ (x=0, 0.1, 0.3, and 0.5) ceramics were investigated in a broad frequency and temperature range. The AC conductivity decreased with the increasing Al concentration. Dielectric constant increased at lower frequency and decreased at higher frequency when the Al concentration increased from 0.1 to 0.3, then it decreased at all frequencies as the x value was 0.5. While the dielectric loss decreased first and then increased with the increasing Al concentration. There was one dielectric relaxation in the curve of temperature dependence of dielectric properties of LaSrCo_0.7Al_0.3O₄ ceramics. The nonadiabatic small polaronic hopping process should contribute to the dielectric relaxation in the present ceramics. The AC conductivity increased in about one order of magnitude after annealing the sample in the oxygen atmosphere, and this should be attributed to the appearance of interstitial oxygen in the annealed sample.     

ZnO-Bi2O3-Sb2O3-BaO系陶瓷的晶界相与抗退降性能

在通常的ＺｎＯ－Ｂｉ₂Ｏ₃－Ｓｂ₂Ｏ₃系电压敏陶瓷中，加入能构成压敏特性的钡添加剂，发现除已知的Ｂｉ₂Ｏ₃和Ｚｎ_2．３３Ｓｂ_０．６７Ｏ₄晶界相以外，还出现新的晶界相，分析表明是固溶有微量其它成分的偏锑酸钡（ＢａＳｂ₂Ｏ₆）晶相。同时还发现，ＢａＳｂ_{2关键词：}