Comparative analysis of characteristic electron energy loss spectra and inelastic scattering cross-section spectra of Fe

The inelastic electron scattering cross section spectra of Fe have been calculated based on experimental spectra of characteristic reflection electron energy loss as dependences of the product of the inelastic mean free path by the differential inelastic electron scattering cross section on the electron energy loss. It has been shown that the inelastic electron scattering cross-section spectra have certain advantages over the electron energy loss spectra in the analysis of the interaction of electrons with substance. The peaks of energy loss in the spectra of characteristic electron energy loss and inelastic electron scattering cross sections have been determined from the integral and differential spectra. It has been shown that the energy of the bulk plasmon is practically independent of the energy of primary electrons in the characteristic electron energy loss spectra and monotonically increases with increasing energy of primary electrons in the inelastic electron scattering cross-section spectra. The variation in the maximum energy of the inelastic electron scattering cross-section spectra is caused by the redistribution of intensities over the peaks of losses due to various excitations. The inelastic electron scattering cross-section spectra have been analyzed using the decomposition of the spectra into peaks of the energy loss. This method has been used for the quantitative estimation of the contributions from different energy loss processes to the inelastic electron scattering cross-section spectra of Fe and for the determination of the nature of the energy loss peaks.     

Inelastic scattering of slow electrons in solids

A theory of the inelastic scattering of slow electrons in solids due to excitation of interband transitions is developed. It is shown that both nondirect and direct transitions occur which can be described by a generalization of the formalism used in solid state optics. Experiments with 30–200 eV electrons scattered from Si (111) surfaces with well defined surface structures as determined by low energy electron diffraction confirm the theoretical predictions. They indicate that the inelastic scattering of slow electrons can be understood in terms of the three-dimensional band structure of solids and suggest the use of inelastic low energy electron scattering as a tool for band structure analysis.     

Focusing of electrons reflected from layered crystal

The mechanism of the formation of the diffraction patterns upon inelastic reflection of mean-energy electrons from the VSe₂(0001) layered crystal has been investigated. It is found that the strong scattering of electrons by short atomic chains of the Se-V-Se layer triads leads to the weakening of electron focusing and the enhancement of diffraction scattering in deeper layers, which gives rise to the Kikuchi lines. It is demonstrated that, at an energy of 2 keV, the diffraction pattern is adequately described by the cluster model of single scattering. The atomic structure of thin near-the-surface layer of VSe₂ has been investigated by the computer simulation of experimental data.     

Nuclear physics parallels in atomic cluster physics

This paper considers some examples of physical phenomena, manifesting themselves in electron scattering on atomic clusters, which are analogous with those known from nuclear physics. It is demonstrated that the electron diffraction plays an important role in the formation of both elastic and inelastic electron scattering cross sections. The essential role of the multipole plasmon excitations in the formation of electron energy loss spectra on clusters is elucidated. The main emphasis in the paper is laid on electron scattering on fullerenes and metal clusters, however, results are applicable to some extent to other types of clusters as well.     

Observation of interband transitions in polarized electron energy loss spectra of Gd(0001)

We have detected the 4f ⁷(5d6s)³→4f ⁸(5d6s)² interband transition in an angular-resolved, inelastic scattering experiment with spin-polarized, low-energy electrons from ferromagnetic Gd(0001). The spectrum of the inelastic scattering asymmetry clearly reveals the dominant spin-dependent energy loss mechanism involved. Furthermore its comparison with elastic scattering data allows a characterization of the combined role of diffraction and energy loss processes in inelastic electron scattering.     

Experimental observation of quantum corrections to electrical resistivity in nanocrystalline soft magnetic alloys

X-ray diffraction patterns of nanocrystalline Fe-Cu-Nb-Si-B (FINEMET) alloys reveal that bcc α-Fe/α-FeSi crystallites with the average grain size of 20(5) nm are dispersed in amorphous matrix. Enhanced electron—electron interaction (EEI) and quantum interference (QI) effects as well as electron-magnon (and/or electron-spin fluctuation) scattering turn out to be the main mechanisms that govern the temperature dependence of resistivity. Of all the inelastic scattering processes, inelastic electron-phonon scattering is the most effective mechanism to destroy phase coherence of electron wave functions. The diffusion constant, density of states at the Fermi level and the inelastic scattering time have been estimated, for the first time, for the alloys in question Article presented at the International Symposium on Advances in Superconductivity and Magnetism: Materials, Mechanisms and Devices, ASMM2D-2001, 25–28 September 2001, Mangalore, India.     

The physical significance of the mixed dynamic form factor

We show that the mixed dynamic form factor for inelastic scattering of fast electrons in crystals is closely related to the density matrix of the probe electron and to that of the scatterer. With this insight it is possible to calculate both energy filtered diffraction patterns and energy spectroscopic high-resolution images. As an example we discuss the Si-K and -L edges.     

Electron spectroscopy of iron disilicide

We have reported on the results of a complex investigation of iron disilicide FeSi₂ using characteristic electron energy loss spectroscopy, inelastic electron scattering cross section spectroscopy, and X-ray photoelectron spectroscopy. It has been shown that the main peak in the spectra of inelastic electron scattering for FeSi₂ is a superposition of two unresolved peaks, viz., surface and bulk plasmons. An analysis of the fine structure of the spectra of inelastic electron scattering cross section by their decomposition into Lorentzlike Tougaard peaks has made it possible to quantitatively estimate the contributions of individual energy loss processes to the resulting spectrum and determine their origin and energy.     

Experimental measurement of electron diffuse scattering in magnetite using energy-filter and imaging plates

We have measured the diffuse scattering in magnetite as a function of temperature using the LEO 912Ohms energy-filtering electron microscope and the imaging plates. This study takes the advantage of the Koehler illumination system, energy filtering and the imaging plates for recording electron diffraction pattern over a large dynamic range. The experiment clearly shows a quantitative change in diffuse scattering distribution, which has the characteristics of one-dimensional ordering. This study clearly demonstrates the possibility for the quantitative study of diffuse scattering using electron diffraction.     

A New Simulation of Track Structure of Low-Energy Electrons in Liquid Water:Considering the Condensed-Phase Effect on Electron Elastic Scattering

A new Monte Carlo simulation of the trade structure of low-energy electrons(10keV) in liquid water is presented.The feature of the simulation is taken into consideration of the condensed-phase effect of liquid water on electron elastic scattering with the use of the Champion model,while the dielectric response formalism incorporating the optical-data model developed by Emfietzoglou et al.is applied for calculating the electron inelastic scattering.The spatial distributions of energy deposition and inelastic scattering events of low-energy electrons with different primary energies in liquid water are calculated and compared with other theoretical evaluations.The present work shows that the condensed-phase effect of liquid water on electron elastic scattering may be of the influence on the fraction of absorbed energy and distribution of inelastic scattering events at lower primary energies,which also indicate potential effects on the DNA damage induced by low-energy electrons.     

Inelastic electron scattering observation using energy filtered transmission electron microscopy for silicon -- germanium nanostructures imaging

This paper presents a new technique using energy filtered TEM (EFTEM) for inelastic electron scattering contrast imaging of Germanium distribution in Si-SiGe nanostructures. Comparing electron energy loss spectra (EELS) obtained in both SiGe and Si single crystals, we found a spectrum area strongly sensitive to the presence of Ge in the range [50-100 eV]. In this energy loss window, EELS spectrum shows a smooth steeply shaped background strongly depending on Ge concentration. Germanium mapping inside SiGe can thus be performed through imaging of the EELS background slope variation, obtained by processing the ratio of two energy filtered TEM images, respectively, acquired at 90 and 60 eV. This technique gives contrasted images strongly similar to those obtained using STEM Z-contrast, but presenting some advantages: elastic interaction (diffraction) is eliminated, and contrast is insensitive to polycrystalline grains orientation or specimen thickness. Moreover, since the extracted signal is a spectral signature (inelastic energy loss) we demonstrate that it can be used for observation and quantification of Ge concentration depth profile of SiGe buried layers.     

Critical role of inelastic interactions in quantitative electron microscopy

A semiquantitative correlation between experimental observations and theoretical prediction in electron microscopy is achieved. Experiments conducted on amorphous silicon in the convergent beam electron diffraction mode provide measurements of the reduction of the central-disk intensity. In addition to elastic scattering the effects of multiple inelastic scattering of the probe electrons were incorporated into the theory describing beam propagation through the specimen. With incorporation of the dominant plasmon scattering a better than 10% match of the theory with experiment is observed indicating the critical role of multiple inelastic scattering in quantitative electron diffraction and imaging.     

Decisive factors for realizing atomic-column resolution using STEM and EELS

We demonstrate atomic-column imaging by scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS). The silicon atomic-columns of a β-Si₃N₄ (0 0 1) specimen are clearly resolved. The atomic-site dependence and the energy-loss dependence of the spatial resolution are elucidated on the basis of the experimental results and multislice calculations. We describe two decisive factors for realizing atomic-column imaging in terms of localization in elastic and inelastic scattering. One is the channeling of the incident probe due to dynamical diffraction, which has atomic-site dependence. The other is the localization in inelastic scattering; in addition to the energy-loss dependence of delocalization, we point out its dependence on the offset energy from the ionization energy, i.e., an additional localization factor concerning the Bethe surface. The present atomic-column observation of the Si-L core-loss image indicates that the local approximation, which can be interpreted intuitively, is achievable under appropriate experimental conditions, such as high-energy-loss, a small convergence angle and a large collection angle (e.g., 400 eV, 15 and 30 mrad, respectively).     

Exafs like oscillations in X-ray excited autoionization spectra assisted by compton process

Oscillating features have been observed in the background of the inelastic electrons excited by high energy monochromatic X-ray photons at kinetic energy above the Cr M_2,3VV Auger transition. These structures are absent when X-ray photons of are used. We suggest that these extended features are due to an autoionization process experienced by the 3p core electron assisted by a Compton scattering with the X-ray photons. Through the inelastic Compton process the incoming photons excite the core electrons towards empty states above the Fermi level in a continuous manner up to a maximum energy, which strongly depends on the incident photon energy. These excited states are modulated in energy by the crystalline structure as it has been shown by means of the EXAFS (Extended X-ray Absorption Fine Structure) spectroscopy. These oscillating structures are compared with those obtained through electron excitation for the same Auger transition in the Extended Fine Auger Structure (EXFAS) spectroscopy.     

Characteristics of secondary electron emission from few layer graphene on silicon (111) surface

As a typical two-dimensional (2D) coating material, graphene has been utilized to effectively reduce secondary electron emission from the surface. Nevertheless, the microscopic mechanism and the dominant factor of secondary electron emission suppression remain controversial. Since traditional models rely on the data of experimental bulk properties which are scarcely appropriate to the 2D coating situation, this paper presents the first-principles-based numerical calculations of the electron interaction and emission process for monolayer and multilayer graphene on silicon (111) substrate. By using the anisotropic energy loss for the coating graphene, the electron transport process can be described more realistically. The real physical electron interactions, including the elastic scattering of electron—nucleus, inelastic scattering of the electron—extranuclear electron, and electron—phonon effect, are considered and calculated by using the Monte Carlo method. The energy level transition theory-based first-principles method and the full Penn algorithm are used to calculate the energy loss function during the inelastic scattering. Variations of the energy loss function and interface electron density differences for 1 to 4 layer graphene coating GoSi are calculated, and their inner electron distributions and secondary electron emissions are analyzed. Simulation results demonstrate that the dominant factor of the inhibiting of secondary electron yield (SEY) of GoSi is to induce the deeper electrons in the internal scattering process. In contrast, a low surface potential barrier due to the positive deviation of electron density difference at monolayer GoSi interface in turn weakens the suppression of secondary electron emission of the graphene layer. Only when the graphene layer number is 3, does the contribution of surface work function to the secondary electron emission suppression appear to be slightly positive.     

The influence of abrupt electric field variations on the distribution function of hot electrons

Some analytical models of quiescent hot electron distributions are extended to the transient conditions, in order to describe the response of hot electrons to step changes in the magnitude of the electric field. These models apply to semiconductors having one or several equivalent energy minima in the conduction band, and isotropic lattice scattering due to low-energy acoustic phonons (elastic in-valley scattering) and to high energy single-level acoustic phonons (inelastic inter-valley scattering) or dispersionless optical phonons (inelastic in-valley scattering). Step changes in the field magnitude are considered with respect to the time and space (one-dimensional) variables, separately. In both cases, the spherically-symmetrical term ƒ_O of the electron distribution function may be expressed using a Laguerre polynomial expansion in the energy variable. For a positive step change in field magnitude, transient electron drift velocities in excess of the steady-state “scattering-limited” values are found in both silicon and germanium.     

Elastic and inelastic diffraction of Mössbauer γ-rays from KCN

Mössbauer γ-ray diffraction was used to discriminate between the elastic and inelastic scattering intensities from the (1 1 1) to (5 5 5) Bragg reflections of a single crystal of KCN. The energy resolution of our experiment was 28 neV. We observe pronounced inelastic peaks at each Bragg point, while the elastic scattering dies out rapidly due to a large Debye-Waller factor. Thus in case of (4 4 4) and (5 5 5) the inelastic scattering is larger in magnitude than the elastic one.     

未被俘获电子对多光子非线性Compton散射能量转换效率的影响

 应用单粒子理论和电子与光子非弹性碰撞模型，研究了未被俘获电子对多光子非线性Compton散射能量转换效率的影响。结果表明，未被俘获电子使该散射的频谱展宽随入射电子速度和与电子同时作用的光子数的增大而增大，随电子与光子非弹性碰撞成分的增大而减小，从而使能量转换效率近乎与电子入射速度正比降低。用低能电子入射，能有效地减小这种损失。     

Angular pattern of electron diffraction by reflection in the plasmon channel of energy losses

We have constructed a theory for the excitation of plasmons by a fast charged particle that undergoes diffraction in a single crystal and then is scattered elastically and incoherently through a large angle. The theory allows the 30-year-old experimental results that have seemed strange to be explained. An increase in the diffraction contrast in the channel of inelastic electron scattering related to the excitation of a bulk plasmon compared to the diffraction contrast of elastically and incoherently reflected electrons was observed in these experiments. Based on this theory, we show that the excitation of a surface plasmon affects only slightly the angular diffraction pattern, leaving it almost the same as that for elastically reflected electrons. These peculiarities of elastic and inelastic diffraction can be used to identify the type of energy plasma loss.