Rectifying effect of heterojunctions between metals and doped conducting polymer nanostructure pellets

This paper reports that the Schottky junctions between low work function metals （e.g. Al and In） and doped semiconducting polymer pellets （e.g. polyaniline （PANI） microsphere pellet and polypyrrole （PPy） nanotube pellet） have been prepared and studied. Since Ag is a high work function metal which can make an ohmic contact with polymer, silver paste was used to fabricate the electrodes. The Al/PANI/Ag heterojunction shows an obvious rectifying effect as shown in I - V characteristic curves （rectifying ratio γ = 5 at ±6 V bias at room temperature）. As compared to the Al/PANI/Ag, the heterojunction between In and PANI （In/PANI/Ag） exhibits a lower rectifying ratio γ= 1.6 at ±2 V bias at room temperature. In addition, rectifying effect was also observed in the heterojunctions Al/PPy/Ag （γ = 3.2 at ±1.6 V bias） and In/PPy/Ag （γ = 1.2 at ±3.0 V bias）. The results were discussed in terms of thermoionic emission theory.     

Characteristics of p-ZnO/n-GaN heterojunction photodetector

Thin film heterojuction of the type p-ZnO/n-GaN was prepared by spray pyrolysis and electron beam evaporation technique, respectively. Hall measurements demonstrate the firm p-type conductivity of the p-doped ZnO film. The structural and electrical properties of the p-ZnO/n-GaN heterojunction are investigated by X-ray diffraction (XRD) and current-voltage (I-V) measurements. The XRD shows that the p-ZnO/n-GaN heterojunction is highly crystalline in nature with preferred orientation along the [0001] direction. The current-voltage curve of the heterojunction demonstrates obvious rectifying diode behavior in the dark and under illumination conditions. The ideality factor of the detector was determined in case of forward bias at low voltages and it was found to be 13.35. The turn-on voltage appears at about 1V under forward-biased voltage, and the reverse breakdown voltage is about 4V. It was found that the current of the illumination increases with the increase of bias voltages.     

Electro-optical properties of all-oxide p-CuAlO<Subscript>2</Subscript>/n-ZnO: Al transparent heterojunction thin film diode fabricated on glass substrate

We report on the fabrication of all transparent heterojunction thin film diodes of the form glass/n-ZnO: Al/p-CuAlO₂ produced by a combinatorial chemical and physical technique and on a study of their electro-optical properties. The n-ZnO: Al layer was deposited by a sol-gel-dip-coating process whereas the p-CuAlO₂ layer was deposited by direct current sputtering techniques. The diode structure, with a total thickness of 1100 nm showed around 60% transmittance in the visible region. The current-voltage characteristics of the device showed a rectifying nature, with a low turn-on voltage around 0.8 V, having a rectification ratio > 50 at ± 2 V. The low turn-on voltage and moderate visible transmittance of the transparent diode indicate its potential application in the field of “Transparent” or “Invisible Electronics”.      

Improved diode properties in zinc telluride thin film-silicon nanowire heterojunctions

In this study, structural and optoelectronic properties and photodedection characteristics of diodes constructed from p-zinc telluride (ZnTe) thin film/n-silicon (Si) nanowire heterojunctions are reported. Dense arrays of vertically aligned Si nanowires were successfully synthesized on (1 1 0)-oriented n-type single crystalline Si wafer using simple and inexpensive metal-assisted etching (MAE) process. Following the nanowire synthesis, p-type ZnTe thin films were deposited onto vertically oriented Si nanowires via radio frequency magnetron sputtering to form three-dimensional heterojunctions. A comparative study of the structural results obtained from X-ray diffraction and Raman spectroscopy measurements showed the improved crystallinity of the ZnTe thin films deposited onto the Si nanowire arrays. The fabricated nanowire-based heterojunction devices exhibited remarkable diode characteristics and enhanced optoelectronic properties and photosensitivity in comparison to the planar reference. The electrical measurements revealed that the diodes with nanowires had a well-defined rectifying behaviour with a rectification ratio of 10⁴ at ±2 V and a relatively small ideality factor of n = 1.8 with lower reverse leakage current and series resistance at room temperature in dark condition. Moreover, an open-circuit voltage of 100 mV was also observed under illumination. Based on spectral photoresponsivity measurements, the nanowire-based device exhibited a distinct responsivity and high detectivity in visible and near-infrared (NIR) wavelength regions. The device characteristics observed here offer that the fabricated ZnTe thin film/Si nanowire-based p–n heterojunction structures will find important applications in future and will be a promising candidate for high-performance and low-cost optoelectronic device applications, NIR photodedectors in particular.     

Electronic transport properties of the charge ordered manganite-based heterojunction

The charge ordered Bi_0.4Ca_0.4Sr_0.2MnO₃ (BCSMO) film has been grown on (011) SrTiO₃: Nb (STON) (0.05 wt%) substrate. The charge ordering (CO) transition is realized at ～336 K. The BCSMO/STON heterojunction shows excellent rectifying behavior. Through the capacitance measure of the junction, it is found that the built-in potential of the heterojunction is affected by the CO transition. A upward shift of the built-in potential of the junction appears around the CO transition temperature, which is ascribed to the change of the Fermi level in BCSMO film.     

Current transport in ZnO/Si heterostructure grown by laser molecular beam epitaxy

The n-ZnO/p-Si heterojunction was fabricated by depositing high quality single crystalline aluminium-doped n-type ZnO film on p-type Si using the laser molecular beam epitaxy technique. The heterojunction exhibited a good rectifying behavior. The electrical properties of the heterojunction were investigated by means of temperature dependence current density-voltage measurements. The mechanism of the current transport was proposed based on the band structure of the heterojunction. When the applied bias V is lower than 0.15 V, the current follows the Ohmic behavior. When 0.15V 0.6 V), the space charge limited effect becomes the main transport mechanism. The current-voltage characteristic under illumination was also investigated. The photovoltage and the short circuit current density of the heterojunction aproached 270 mV and 2.10 mA/cm 2 , respectively.     

Preparation and characterization of La0.5Sr0.5CoO3 /Al-doped ZnO thin film heterojunctions

In this study, p–n heterojunctions with La_0.5Sr_0.5CoO₃ (LSCO) and Al-doped ZnO (AZO) thin films were fabricated by the radio frequency (r.f.) magnetron sputtering technique. The LSCO/AZO heterojunction was obtained by stacking the p-type LSCO thin film on the annealed n-type AZO thin film under different Ar: O₂ sputter gas ratio atmosphere. The thickness of LSCO and AZO thin films are about 400 nm and 500 nm, respectively. Good crystalline match between LSCO and AZO films was observed from the SEM and XRD analysis. The heterojunction diode clearly demonstrated rectifying behavior in the range of ?8 to +8 V in reverse shape. The turn-on voltage of the diodes is obtained around 1.5 V and is in agreement with the value obtained from the difference in the work functions of LSCO and AZO. The band structure of the heterojunction was proposed based on the results of analysis.     

Photovoltaic properties in poly(3-alkylthiophene) based heterojunction cells

Photocarrier generation and photovoltaic effect have been systematically studied in single layer ITO/poly(3-alkylthiophene)(P3AT)/Al Schottky and double layer ITO/P3AT/perylene/metal heterojunction cells. It has been found that Ohmic contact formation takes place between ITO (Au) with P3AT and Au (Ag, Al) with perylene derivatives. The double layer organic heterojunction device shows strong rectifying behavior with the rectification ratio of 1000 (at ±2 V) and the ideality factor of 2.15. The maximum incident photon to electron conversion efficiency (IPCE) of 0.08% was found for the devices fabricated using regioregular poly(3-butylthiophene) (P3BT), which was 20 times higher than its regiorandom counterpart. In the case of double layer p–n junction cell IPCE was more than an order of magnitude higher than that of the single layer junction of regioregular P3BT/Al.     

Photoelectric Characteristic of La0.9Sr0.1MnO3/SrNb0.01Ti0.99O3 p-n Heterojunctions

Good rectifying current-voltage characteristics and nanosecond photoelectric effects are observed in the p-n hereto junctions of La0.9Sr0.1 MnO3/SrNb0.01 Ti0.99O3 fabricated by laser molecular beam epitaxy. The rise time is about 26ns and the full width at half maximum is about 125ns for the open-circuit, photovoltaic pulses when the La0.9Sr0.1MnO3 film in the heterojunction is irradiated by a laser operated at wavelength 308nm with pulse duration of about 25 ns. A qualitative explanation is presented, based on an analysis of the photoelectric effect of p-n hereto junction.     

(n)nc-Si：H/(p)c-Si异质结中载流子输运性质的研究

采用常规等离子体增强化学气相沉积工艺,以高H₂稀释的SiH₄作为反应气体源和PH₃作为磷原子的掺杂剂,在p型(100)单晶硅((p)c-Si)衬底上, 成功地生长了施主掺杂型纳米硅膜((n)nc-Si:H),进而制备了(n)nc-Si:H/(p)c-Si异质结,并在230—420Ｋ温度范围内实验研究了该异质结的Ｉ-Ｖ特性.结果表明,(n)nc-Si:H/(p)c- Si异质结为一典型的突变异质结构,具有良好的温度稳定性和整流特性.正向偏压下 关键词： (n)nc-Si:H/(p)c-Si异质结 能带模型 电流输运机构 温度特性     

Transparent CdO/n-GaN(0001) heterojunction for optoelectronic applications

Undoped CdO films were prepared by sol–gel method. Transparent heterojunction diodes were fabricated by depositing n-type CdO films on the n-type GaN (0001) substrate. Current–voltage (I–V) measurements of the device were evaluated, and the results indicated a non-ideal rectifying characteristic with I_F/I_R value as high as 1.17×10³ at 2 V, low leakage current of 4.88×10⁻⁶ A and a turn-on voltage of about 0.7 V. From the optical data, the optical band gaps for the CdO film and GaN were calculated to be 2.30 eV and 3.309 eV, respectively. It is evaluated that interband transition in the film is provided by the direct allowed transition. The n-GaN (0001)/CdO heterojunction device has an optical transmission of 50–70% from 500 nm to 800 nm wavelength range.     

超薄Fe(4?)膜磁特性极化中子反射研究

Ultrathin Fe film 200  V/4  Fe/900  V/MgO（100） has been prepared by molecular beam epitaxy （MBE）. The structure parameters, such as the surface and interface roughness and the thickness of each layer, were obtained by X-ray and neutron reflectivity mea 关键词： 超薄Fe膜 磁特性 极化中子反射 分子束外延     

Electronic transport in a controllably grown carbon nanotube-silicon heterojunction array

A uniform array of a new type of heterojunction formed between carbon nanotubes and silicon is studied. The heterojunction array was controllably grown with parallel and uniform nanotubes vertically aligned to the silicon substrate using a self-organized nanopore array template. The pronounced rectifying characteristics of the heterojunction were measured with an on/off ratio as high as 10(5) at 4 V. The analysis shows a large and type-I band offset at the heterojunction. The charge transport in the nanotubes is found to be strongly coupled to and limited by the dielectric charging and polarization in the hosting alumina matrix surrounding the nanotubes.     

Thermionic constants and electron reflection for Ta (100) by the shelton retarding field method

The Shelton retarding field method has been employed to determine the thermionic constants of the (100) surface of tantalum in the temperature range 1500 to 1730 K: φ* = = 4.16 ± 0.05 V, dφdT= 56 ± 5 μ V/K, and A_R = 122 ± 26 A/cm²K².φ = 4.24 ± 0.05 V at300 K. A refined analysis of the Shelton method shows the importance of four reflection coefficients, because of which, A_R cannot be identified unambiguously as the preexponental constant appearing in the Richardson equation. The dependence on incident energy of the electron reflection coefficient of Ta(100) was observed in the range 0–100 eV. The positions at 4.5, 8.0, 11.3, and 17.0 eV of relative reflection maxima agree closely with those observed by others for W(100). Advances are described in instrumentation, in experimental technique, and in acquisition and analysis of data.     

Transport and transient photovoltaic properties of La0.4Ca0.6MnO3/Nb:SrTiO3 heterojunction at high temperature

We have investigated the electronic transport and transient photovoltaic properties on the La_0.4Ca_0.6MnO₃/Nb(0.05 wt%):SrTiO₃ heterojunction at high temperatures up to 723 K. The temperature-dependent reversal of the rectifying polarity and the decrease of the photosensitivity and response time were observed in the junction with increasing temperature from 293 to 723 K. The mechanism of the energy-band structure evolvement with increasing temperature is presented to understand the experimental results.     

Mechanooptical investigations of polyimide films exposed to electrons,mechanical loads,and temperatures

Joint effect of high-energy electrons, mechanical loads, and temperature on polyimide films of thicknesses in the range 30–130 μm is investigated. The films were preliminary irradiated by electrons in air using an éLU-6 linear accelerator with energy of 2 MeV and doses D = 1, 5, 10, 20, 30, 40, and 100 MGy and then subjected to uniaxial mechanical tension at temperatures (T) from 293 to 593 K. It is established that at T = 293–450 K and D = 20–40 MGy, the mechanical load causes almost the same deformations (ε_{l max}) of nonirradiated and irradiated samples; at T = 450–550 K, deformations of films sharply increase, and the character of their dependence changes. The ε_{l max} value of the initial sample increases almost linearly with temperature by a factor of 10, whereas the character of changing ε_{l max}(T) of the irradiated films is more complex, and its value increases approximately by a factor of 4. For T > 500 K, the deformation reaches limiting values. Irradiation increases the intensity of IR-spectra by 2–6 times and essentially increases the widths of absorption bands at 720, 1380, and 1775 cm⁻¹, which is caused by the formation of hydrogen bonds and cycles with nitrogen as well as by the formation of nitrogen oxides. External loading applied to film rupture causes an increase in the EPR signal amplitude from 3·10³ to 5·10³, which is connected with an increased concentration of radicals =N-H and-NH ₂. The electron irradiation of the polyimide films with their subsequent mechanical loading causes the spectrum lines to displace from 3475.0 to 3512.5 cm⁻¹ with simultaneous reduction of the signal amplitude from 6·10³ to 4·10³. __________ Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 2, pp. 52–58, February, 2007.     

Ultraviolet electroluminescence from ZnO-based light-emitting diode with p-ZnO:N/n-GaN:Si heterojunction structure

A p-ZnO:N/n-GaN:Si structure heterojunction light-emitting diode (LED) is fabricated on c-plane sapphire by full metal organic chemical vapor deposition (MOCVD) technique. The p-type layer with hole concentration of 8.94×10¹⁶ cm⁻³ is composed of nitrogen-doped ZnO using NH₃ as the doping source with subsequent annealing in N₂O plasma ambient. Silicon-doped GaN film with electron concentration of 1.15×10¹⁸ cm⁻³ is used as the n-type layer. Desirable rectifying behavior is observed from the current-voltage (I-V) curve of the device. The forward turn on voltage is about 4 V and the reverse breakdown voltage is more than 7 V. A distinct ultraviolet (UV) electroluminescence (EL) with a dominant emission peak centered at 390 nm is detected at room temperature from the heterojunction structure under forward bias conditions. The origins of the EL emissions are discussed in comparison with the photoluminescence (PL) spectra.     

Temperature-dependent rectifying and photovoltaic characteristics of an oxygen-deficient Bi_2Sr_2Co_2O_y/Si heterojunction

A Bi2Sr2Co2Oy/Si heterojunction is obtained by growing a layer of p-type oxygen-deficient Bi2Sr2Co2Oy film on a commercial n-type silicon wafer by pulsed laser deposition. Its rectifying and photovoltaic properties are studied in a wide temperature range from 20 K to 300 K. The transport mechanism under the forward bias can be attributed to a trap- filled space-charge-limited current conduction mechanism. Under the irradiation of a 532-nm continuous wave laser, a clear photovoltaic effect is observed and the magnitude ofphotovoltage increases as the temperature decreases, The results demonstrate the potential application of a Bi2SrzCo2Oy-based heterojunction in the photoelectronic devices.     

Electronic conduction properties of Au/C60/p-Si and C60/Au/p-Si sandwich structures: I–V and transducer characteristics

Gold-fullerite [C₆₀]-silicon (p-type) sandwich structures have been fabricated in order to investigate intrinsic cross-sectional and planar electronic conductive properties, in particular the C₆₀/p-Si p–n heterojunction. The turn-on voltage of this p–n heterojunction lies in the range 0.25–0.27 V. The I–V characteristics of the Au/C₆₀/p-Si structure are mostly defined by the bulk specific resistance of the fullerite crystal film itself (6×10⁷ Ω cm). I–V curves in the C₆₀/Au/p-Si structure are shown to be ohmic. Au/C₆₀/p-Si sandwiches irradiated with swift (300 MeV) heavy ions, (⁸⁴Kr¹⁴⁺) to a total fluence 10¹⁰ ion/cm² yield structures which are sensitive to ambient air pressure, specifically in the case of a transverse contact configuration, and if one of the contacts is located on the irradiated part of the fullerite film. The sandwich-structure sensitivity to pressure is 5×10⁻⁶ Pa⁻¹. This exceeds the sensitivity of conventional silicon pressure transducers by almost three orders of magnitude.     

CVD法制备p-ZnO薄膜/n-Si异质结发光二极管及其性能研究

利用简单的化学气相沉积方法, 首先在n-Si衬底上生长Sb掺杂p-ZnO薄膜, 并在此基础上制作了p-ZnO/n-Si异质结发光二极管．对制备的Sb掺杂ZnO薄膜 在800 ℃下进行了热退火处理, 发现退火后样品的晶体质量和表面形貌都得到明显提高, 并且薄膜呈现的电导类型为p型, 载流子浓度为9.56× 10¹⁷ cm^-3. 此外, 该器件还表现出良好的整流特性, 正向开启电压为4.0 V, 反向击穿电压为9.5 V. 在正向45 mA的注入电流条件下, 器件实现了室温下的电致发光. 这说明较高质量的ZnO薄膜也可以通过简单的化学气相沉积方法来实现, 这为ZnO基光电器件的材料制备提供了一种简单可行的方法. 关键词： CVD p-ZnO 异质结 电致发光