Theoretical studies of fast He atom scattering from a W{100} surface

Theoretical calculations of the scattering of fast neutral He atoms from W{100} are presented which are directly compared to the results from recent experiments of Nielsen and Delchar. The experiments which were performed for He atom energies between 150 and 1000 eV, and for incident polar angles between 0° and 65° as measured from the surface normal, displayed peaks in the polar angle distributions at 72°, 56° and ±10°. The results from classical dynamics calculations are employed here to explain the scattering phenomena that give rise to these peaks in the polar distributions. The calculations indicate that the peak at 72° is primarily due to scattering from the first layer W atoms. The peaks at ± 10° and 56° are unusual in that there are a multitude of different collision paths that result in the He atom being scattered into the same final angle. The peaks at ± 10° result from He atoms scattering mainly from the second, third and fourth layers of W atoms. The He atoms are focused on the outward path into the near normal direction by two first and two second layer W atoms. Subsurface scattering is also responsible for the peak at 56°. In this case the channel of first and second layer W atoms that focuses the outgoing He atoms is oriented at 54.7° with respect to the surface normal. It is proposed that slight variations of the experimental data from the calculated values are due to surface reconstruction of W{100} and that a more thorough analysis could reveal the microscopic nature of this structure.     

衍射增强计算机断层技术研究

对衍射增强计算机断层技术进行了分析研究，提出了一种新方法.应用该方法只需在摇摆曲线一点处对物体进行360°范围内旋转投影成像，即可获得物体的折射率梯度分布以及吸收系数与散射系数和分布.该方法较以前的方法，大大简化了实验步骤. 关键词： 同步辐射 衍射增强 计算机断层     

Medium energy electron diffraction on aluminum

Measurements of the specular beam intensity in the medium range of energy (645 eV and 980 eV) are presented for the aluminum (001) and (110) surfaces. They have been performed with a LEED goniometer allowing to achieve high accuracy in the determination of the angular parameters of the diffraction experiment. The experimental results are displayed in the form of iso-intensity maps in (θ, φ) coordinates at a constant primary beam energy. θ denotes the colatitude angle of incidence and is varied in the range 30° to 80°. φ denotes the azimuth and is varied between 0° and 360°. Sections of the maps at constant angle of incidence are known as rotation diagrams. A model calculation ignoring intra-layer multiple scattering, but incorporating inter-layer multiple scattering processes shows the prominent role of the latter, in many cases, and the non-negligible contribution of the former in other cases. Sections of the maps at constant azimuth are called incidence-profiles. They are very sensitive to the azimuth and very hard to compute. Using the preceding model calculation, average incidence profiles have been computed, using as input parameters the refractive and absorptive potentials and the surface normal relaxation parameter obtained by a pseudo-kinematic analysis of experimental average incidence profiles as explained in another paper. The peak position and width have been compared to those obtained from the pseudo-kinematic calculation. From the result, it is shown that if averaging is performed according to a specific set of restrictive rules, the pseudokinematic analysis of the data has a semi-quantitative meaning.     

The scattering of hydrogen,deuterium, and the rare gases from silver (111) single crystals

The scattering of hydrogen, deuterium, and the rare gases from the (111) face of silver has been studied at ultrahigh vacuum. The surfaces were prepared by argon ion bombardment and high temperature annealing. Incident angles between 20° and 65° and surface temperatures between room temperature and 573°K have been investigated. The scattering data exhibit quasi-elastic scattering (He, H₂, D₂), inelastic scattering (Ne, Ar, Kr), and trapping dominated scattering (Xe). Identification of these scattering regimes correlates with D/kT_g and is consistent with similar data from Pt(111) and W(110). The separate effects of microscopic surface roughness and thermal roughening have been identified and thermal attenuation in the elastic regime correlated with dynamical interactions rather than thermal roughening. Trapping and rotational coupling are discussed. Comparison of the data with scattering from epitaxial (111) silver indicates that the epitaxial surfaces are significantly more disordered than the single crystal surfaces.     

Diffuse scattering from Ge(111) surface at high temperature

On heating a clean Ge(111) surface above 240°C, Ge(111) 2 × 8 surface structure changes to 1 × 1 one. We have first observed twofold splitting diffuse scattering in RHEED patterns from the Ge(111) 1 × 1 surface at high temperatures. A modulated 2 × 2 structure is proposed as a structural model for the diffuse scattering. The Fermi-surface instability of dangling-bond electrons at the surface is studied as an origin of the formation of the modulated structure.     

The superstructures of the clean Pt(100) and Ir(100) surfaces

The clean and reconstructed surfaces of Pt(100) and Ir(100) were investigated by low energy electron diffraction (LEED). It is shown that two superstructures can be observed in the case of platinum. The structure Pt(100)-hex, which is commonly called Pt(100)-(5 × 20), transforms to Pt(100)-hex-R0.7° above 1100 K. It is shown that this stable phase differs from the first one by a slight rotation of the hexagonal surface layer by 0.7°. For Ir(100) only the well known (1 × 5) superstructure is observed without any rotation of the outer layer. The rotation angle of 0.7° for platinum and the stability of the unrelated structure for iridium can be interpreted by simple calculations of the coordination of surface atoms with those of the second layer. The method assumes that the surface layer is of ideal hexagonal structure in the case of platinum and nearly hexagonal in the case of iridium. The results are in good agreement with the experiment.     

The observation of the localized surface plasmons and its coupling

The surface plasmons properties on gold film composed of inverted square pyramidal pits were investigated. The near‐field scanning optical microscopy image showed that the surface plasmons were mainly located in the cavity of the pits; this is consistent with the mapping image obtained using the Raman scattering intensity of Rhodamine 6G. The calculation results obtained by using the finite element method showed that the electric field mainly located in the pyramidal pits and the field distribution was not affected by the adjacent pits around it. Compared with the single pyramidal pit, the localized electric field intensity increased in the condition of the structure array because of the surface plasmons coupling effect. The surface‐enhanced Raman scattering spectra intensity decreased as the incident angle of the excited laser increased except that there are two peaks at around 5° and 17.5°, which can be attributed to the Bragg scattering of the surface plasmons. The reflectance spectra collected by a microscope at different magnifications were different. The intensity variation between surface‐enhanced Raman scattering spectra obtained using ×20 and ×50 objective illustrated that the adsorption peak in the reflectance spectra corresponded to the surface plasmons coupling effect. Copyright © 2011 John Wiley & Sons, Ltd.     

Plasmonic laser nanoablation of silicon by the scattering of femtosecond pulses near gold nanospheres

We present the fabrication of nanostructures ablated on silicon(100) by the plasmonic scattering of 780 nm, 220 fs laser pulses in the near-field of gold nanospheres. We take advantage of the enhanced plasmonic scattering of ultrashort laser light in the particle near-field to ablate well-defined nanocraters. Gold nanospheres of 150 nm diameter are deposited onto a silicon surface and irradiated with a single laser pulse. We studied the effect of laser polarization on the morphology of ablated nanostructures and estimated the minimum fluence for plasmonic nanoablation. When the polarization of the incident radiation is directed at a 45° angle into the substrate surface, a near-field enhancement of 23.1±7.6 is measured, reducing the required silicon ablation fluence from 191±14 mJ/cm² to 8.2±2.9 mJ/cm². Enhancements are also measured for laser polarizations parallel to the substrate surface when the substrate is angled 0° and 45° to the incident irradiation, giving enhancements of 6.9±0.6 and 4.1±1.3, respectively. Generated nanocrater morphologies show a direct imprint of the particle dipolar scattering region, as predicted in our theoretical calculations. The measured near-field enhancement values agree well with the maximum field enhancements obtained in our calculations. The agreement between theory and measurements supports that the nanocraters are indeed formed by the enhanced plasmonic scattering in the near-field of the nanoparticles. PACS 42.62.-b; 52.38.Mf; 81.65.Cf; 81.16.-c; 78.67.Bf     

Determination of the Disperse Composition of a PbO Suspension Containing Aggregates of Particles of Lamellar Shape by the Laser-Polarimetry Method

The results of measurements of the scattering matrix at a wavelength of 0.63 μm in the range of scattering angles of 10°–155° are presented for an aqueous suspension of lead oxide containing particles of plate form and their aggregates of monomers with dimensions of ~5 nm. The results of the measurements are compared with the results of calculations for axially symmetric scatterers (ellipsoids of rotation, cylinders). It is shown that the presence of aggregates affects the scattering properties of such a medium. The results of reconstructing the distribution of particles of a disperse medium in sizes from the measurements data of the scattering matrix are presented. The reconstruction of the distributions was carried out by solving the problem of optimizing the sum of the squared deviations of the experimental and calculated values of matrix elements in the framework of the model of axially symmetric scatterers. It is shown that the distribution of particles by sizes is more accurately reconstructed by minimizing the sum of the squares of the deviations for the sum of the diagonal elements. The obtained distribution is compared with the distribution measured by the method of dynamic light scattering.     

Investigation of surface topology of printed nanoparticle layers using wide‐angle low‐Q scattering

A new small‐angle scattering technique in reflection geometry is described which enables a topological study of rough surfaces. This is achieved by using long‐wavelength soft X‐rays which are scattered at wide angles but in the low‐Q range normally associated with small‐angle scattering. The use of nanometre‐wavelength radiation restricts the penetration to a thin surface layer which follows the topology of the surface, while moving the scattered beam to wider angles preventing shadowing by the surface features. The technique is, however, only applicable to rough surfaces for which there is no specular reflection, so that only the scattered beam was detected by the detector. As an example, a study of the surfaces of rough layers of silicon produced by the deposition of nanoparticles by blade‐coating is presented. The surfaces of the blade‐coated layers have rough features of the order of several micrometers. Using 2 nm and 13 nm X‐rays scattered at angular ranges of 5°≤θ≤ 51° and 5°≤θ≤ 45°, respectively, a combined range of scattering vector of 0.00842 Å^?1≤Q≤ 0.4883 Å^?1 was obtained. Comparison with previous transmission SAXS and USAXS studies of the same materials indicates that the new method does probe the surface topology rather than the internal microstructure.     

An optical potential description of 16O + 28Si elastic scattering

The differential cross sections for ¹⁶O + ²⁸Si elastic scattering at seven energies between 21 and 35 MeV in the centre of mass are described well over the whole angular range from 20° to 180° by an optical potential whose real part consists of a double-folded potential supplemented by a phenomenological model-independent correction term. This surface correction is predominantly attractive and has structure which depends only weakly on the energy. The associated imaginary potentials imply surface transparency and have detailed structure which varies rapidly with energy. However there is a systematic trend for the absorptive region to extend to larger radii as the energy increases. A simple parameterization of this trend allows the main features of the excitation function for 180° scattering to be reproduced.     

用于校准能见度仪的标准散射体定标系统中光学系统的设计

为了实现校准能见度仪中标准散射体的快速准确定标,建立了用于校准能见度仪的标准散射体的定标系统.研究了定标系统中全景成像折反光学系统的设计方法.根据抛物面反射镜的光学特性推导出抛物面面型的计算方法.根据定标系统对光学系统的要求,完成全景成像色度计光学系统的设计.对全景成像折反光学系统进行建模仿真并设计实验验证光学系统的设计与仿真结果的正确性.实验结果表明:全景成像折反光学系统的空间检测俯仰角范围为0°~90°,方位角范围为0°~360°,且最小角分辨率为1°,与仿真结果基本一致,满足用于校准能见度仪的标准散射体定标系统中光学系统的设计要求.     

Ultrasoft X-ray spectroscopy investigation of the model system Si-SiO2

SiO₂ surface films with different thicknesses (ranging from 20 to 630 Å), grown on a crystal silicon substrate, have been investigated by the method of reflection and scattering of ultrashoft X-rays. It is shown on the basis of a simultaneous analysis of the SiL _{2, 3} reflection spectra and the scattering indicatrix that the critical angle θ_c for total external reflection for SiO₂ at λ = 57 Å lies in the range 4.5 °–°. The angular dependence of the thickness of the surface layer that forms the specular reflection is obtained. It is shown that the surface layer, whose thickness corresponds to the penetration depth of the radiation into the material with glancing angle close to the critical value θ_c, plays a large role in the formation of the anomalous scattering peak (Yoneda peak).     

Microwave sea return at moderate to high incidence angles

Abstract

Bragg scattering is widely recognized as the dominant mechanism by which the ocean surface backscatters microwave radiation, but efforts to identify other, non-Bragg sources of this scattering have been pursued for many years. Non-Bragg backscattering from the sea surface is known to occur at incidence angles close to 0° and 90°. In this paper Bragg scattering is shown to explain most features of sea surface backscatter for incidence angles between about 20° and 80°, except when it predicts very small mean cross sections. The often-quoted evidence for non-Bragg scattering in this incidence angle range is that σ _o (HH) is occasionally found to be larger than or equal to σ _o (VV) for short integration times. We show that because of fading this is not evidence of non-Bragg scattering. For incidence angles up to about 50°, standard Bragg/composite surface scattering theory yields probabilities of finding σ _o (HH)>σ _o (VV) that are only slightly smaller than those found experimentally. As the incidence angle increases, greater differences between theoretical and experimental probabilities are found. The addition of Bragg scattering from bound, tilted waves brings theory into excellent agreement with experiment at incidence angles near 45° but still cannot account adequately for the probability of σ _o (HH)>σ _o (VV) or observed σ _o (HH) cross sections at higher incidence angles. We show that the addition of a small, non-Bragg cross section that is independent of the incidence angle and polarization, brings simulated cross sections and probability distributions into good agreement with data. A possible source of this small, non-Bragg sea return is sea spray just above the air/sea interface.     

The annealing of damage in ion implanted gallium arsenide

Photoluminescence measurements at 77°K and Rutherford scattering of 450 keV protons were used to study radiation damage and annealing in ion implanted GaAs. The characteristic band edge luminescence (8225 Å) in GaAs is completely quenched by ion implantation. Photoluminescence measurements on samples which were isochronally annealed show a single annealing stage at 600°C. A luminescence peak at 9140 Å is introduced into the spectra of all implanted and annealed samples. This peak is attributed to an acceptor level created by As vacancies. The intensity of the peak is greatly reduced by protecting the surface of implanted layers with SiO₂ during annealing. Rutherford scattering measurements on isochronally annealed samples reveal two annealing stages. A 300°C annealing stage is observed on samples which have an initial aligned yield less than random while a 650°C stage is observed on samples which have an initial aligned yield equal to random.     

Polarimetric weak-localization effect in scattering of natural light in the region of small phase angles

Results of laboratory measurements and interpretations of the polarimetric effect of weak localization (negative polarization) appearing under scattering of natural light by a dark ultradisperse surface (soot with albedo of 2.5%) are presented. The measurements were carried out in red light in a range of phase angles of 0.2°–4.2°. It was revealed that the soot, despite the low albedo, shows the polarimetric weak-localization effect inherent in bright surfaces such as the surface formed by smoked MgO. The results of measurements are interpreted using numerical simulation of multiple light scattering in a medium consisting of particles whose characteristics are close to those observed for soot. As the result of simulation, it was found that the scattering with the multiplicity exceeding two can give rise to a negative polarization branch, which becomes narrower with increasing scattering order. For the case of soot, four orders of scattering is sufficient to describe the observed polarimetric effect of weak localization with a necessary accuracy.     

Energy transfer in hyperthermal Xe-graphite surface scattering

The scattering of a hyperthermal Xe from a graphite (0001) surface has been studied using a molecular beam-surface scattering technique and molecular dynamics (MD) simulations. The angular and velocity distributions of scattered Xe atoms were measured at incidence energies from 0.45 to 3.5 eV, three incidence angles of 15°, 35° and 60° and the surface temperatures of 300 K and 550 K. The observed time-of-flight spectra exhibit a sharp velocity distribution with only one velocity component, which is ascribed to the direct inelastic scattering process. The angle-resolved energy ratios of the mean final translational energy over the mean incidence energy E_f/E_i agree well with those predicted based on the assumption of the conservation of the momentum parallel to the surface. The Hard-Cube model, where the mass of the cube is approximately 310 u, has reproduced the angle-resolved flux distributions of scattered Xe atoms. In the Hard-Cube model almost 80% of the normal component of the incidence translational energy is found to be lost in collision. The MD simulations reproduce well the experimental results by using the Brenner potential for intralayer C atoms and a Lennard-Jones potential for interlayer C–C pair interactions.     

Raman scattering from the upper and lower modes of surface phonon polaritons in ZnTe

The upper and lower modes of surface phonon polaritons have been observed in free-standing thin slabs (～7 μm) of single-crystal ZnTe by a conventional Raman-scattering technique at room temperature. The experimental dispersion relations were measured in various scattering angles (outside the sample) from 0.9° to 2.0° and agree with the theoretical dispersion relations. The main factors enabling us to observe the two surface modes are the appropriate selections of the material with a small attenuation factor for surface phonon polaritons and of the thickness of the sample slabs.