Determining polymer film thickness during manufacturing with broadband transmission

A novel broadband transmission method to determine polymer film thickness during manufacturing is proposed, and a measurement system is developed based on this method. The relationship between broadband optical power and film thickness is deduced according to the Lambert-Beer law. The system is composed of a halogen light and an optical power meter. Results show that the measurement error of this method is approximately 1 μm, and the resolution of the system is below 0.4 μm for polymer films with less than 100-μm thickness.     

Precision Measurement of Distribution of Film Thickness on Pendulum for Experiment of G

Distribution of film thickness coated on the pendulum of measuring the Newton gravitational constant G is determined with a weighing method by means of a precision mass comparator. The experimental result shows that the gold film on the pendulum will contribute a correction of -24.3 ppm to our G measurement with an uncertainty of 4.3 ppm, which is significant for improving the G value with high precision.     

Thickness dependence of the optical constants of oxidized copper thin films based on ellipsometry and transmittance

Thin oxidized copper films in various thickness values are deposited onto quartz glass substrates by electron beam evaporation. The ellipsometry parameters and transmittance in a wavelength range of 300 nm–1000 nm are collected by a spectroscopic ellipsometer and a spectrophotometer respectively. The effective thickness and optical constants, i.e.,refractive index n and extinction coefficient k, are accurately determined by using newly developed ellipsometry combined with transmittance iteration method. It is found that the effective thickness determined by this method is close to the physical thickness and has obvious difference from the mass thickness for very thin film due to variable density of film.Furthermore, the thickness dependence of optical constants of thin oxidized Cu films is analyzed.     

Thickness Determination for a Two-Layered Composite of a Film and a Plate by Low-Frequency Ultrasound

We present an ultrasonic method for determining the thickness of a composite consisting of a soft thin film attached to a hard plate substrate, by resonance spectra in the low frequency region, The interrogating waves can be incident only to the two-layered composite from the substrate side. The reflection spectra are obtained by FFT analysis of the compressive pulsed echoes from the composite, and the thicknesses of the film and the substrate are simultaneously inversed by the simulated annealing method from the resonant frequencies knowing other acoustical parameters in prior. The sensitivity of the method to individual thickness, its convergence and stability against experimental noises are studied, Experiment with interrogating wavelength 4 times larger than the film thickness in a sample of a polymer film （0.054mm） on an aluminium plate （6.24mm） verifies the validity of the method. The average relative errors in the measurement of the thicknesses of the film and the substrate are found to be -4.1% and -0.62%, respectively.     

Determination of Thickness of an Inaccessible Thin Film under a Multilayered System from Natural Frequencies

We investigate the relationship between natural frequencies of a multilayered system of different elastic materials and the thickness of the undermost thin film. The natural frequencies are numerically calculated from the reflection coefficient of a sample system of ＂steel-epoxy resin-aluminium-thin polymer＂ with normal incidence. Strain energy ratio is defined and calculated to give the physics explanation why some frequencies are sensitive to thickness of the thin film in certain range. Experiments of three specimens indicate that the measured natural frequencies agree well with the theoretical ones. It is found in our experiments that the ratio of the lowest film thickness to wavelength is about 1/5. The average relative errors for the inverted polymer film thicknesses are found to be 11.8%, -4.8% and -1.3%, respectively.     

Effect of coating thickness on the calibration and measurement uncertainty of a wide-band liquid crystal thermography

<正>The liquid crystal thermography is a high-resolution and non-intrusive optical technique for full-field temperature measurement.We present detailed calibration data for a wide-bandwidth thermochromic liquid crystal(TLC) to investigate the effect of the coating thickness on the hue-temperature characteristics and the measurement uncertainty of the TLC.It is found that the coating thickness has appreciable effect on the TLC hue-temperature curve.For TLC coatings with the thickness over 20μm,a thicker TLC coating shows a relatively smaller measurement uncertainty,but the effect of the coating thickness is non-distinctive on the measurement uncertainty.     

Determination of the parameters of a linear-viscoelastic thin layer using the normally-incident ultrasonic waves

This paper proposes a method of simultaneous determination of the four layer parameters (mass density,longitudinal velocity,the thickness and attenuation) of an immersed linear-viscoelastic thin layer by using the normally-incident reflected and transmitted ultrasonic waves.The analytical formula of the layer thickness related to the measured transmitted transfer functions is derived.The two determination steps of the four layer parameters are developed,in which acoustic impedance,time-of-flight and attenuation are first determined by the reflected transfer functions.Using the derived formula,it successively calculates and determines the layer thickness,longitudinal velocity and mass density by the measured transmitted transfer functions.According to the two determination steps,a more feasible and simplified measurement setups is described.It is found that only three signals (the reference waves,the reflected and transmitted waves) need to be recorded in the whole measurement for the determination of the four layer parameters.A study of the stability of the determination method against the experimental noises and the error analysis of the four layer parameters are made.This study lays the theoretical foundation of the practical measurement of a linear-viscoelastic thin layer.     

Unsteady Liquid Film Flow with a Prescribed Free-Surface Velocity

A liquid film flow over a flat plate is investigated by prescribing the unsteady interface velocity. With this prescribed surface velocity, the governing Navier–Stokes(NS) equations are transformed into a similarity ordinary differential equation, which is solved numerically. The flow characteristics is controlled by an unsteadiness parameter S and the flow direction parameter Λ. The results show that solutions only exist for a certain range of the unsteadiness parameter, i.e., S≤1 for Λ =-1 and S≤-2.815877 for Λ = 1. In the solution domain,the dimensionless liquid film thickness β decreases with S for both the cases. The wall shear stress increases with the decrease of S for Λ =-1. However, for Λ =-1 the shear stress magnitude first decreases and then increases with the decrease of S. There are no zero crossing points for the velocity profiles for both the cases. The profiles of velocity stay either positive or negative all the time, except for the wall zero velocity. Consequently,the vertical velocity becomes a monotonic function. To maintain the prescribed velocity, mass transpiration is generally needed, but for the shrinking film case it is possible to have an impermeable wall. The results are also an exact solution to the full NS equations.     

Thickness Measurement of a Film on a Substrate by Low-Frequency Ultrasound

We describe a new simple technique for the low-frequency ultrasonic thickness measurement of an air-backed soft thin layer attached on a hard substrate of finite thickness throug-h the frequency-shifts of the substrate resonances by the substrate-side insonification. A plane compressive wave impinging normally on the substrate surface from a liquid is studied. Low frequency here means an interrogating acoustical wave frequency of less than half of the ‘half-wavelength resonance frequency‘ of the thin layer depending on the acoustical impedance ratio of the coating to the substrate. Equations for the frequency-shifts are derived and solved by the Newton iterative method and the Taylor expansion method, respectively, indicating satisfactory agreement within the range of interest of thickness ratio of the thin layer to the substrate for a polymer-aluminium structure. An experimental setup is constructed to verify the validity of the technique.     

A new analytical model of high voltage silicon on insulator （SOI） thin film devices

A new analytical model of high voltage silicon on insulator(SOI) thin film devices is proposed,and a formula of silicon critical electric field is derived as a function of silicon film thickness by solving a 2D Poisson equation from an effective ionization rate,with a threshold energy taken into account for electron multiplying.Unlike a conventional silicon critical electric field that is constant and independent of silicon film thickness,the proposed silicon critical electric field increases sharply with silicon film thickness decreasing especially in the case of thin films,and can come to 141 V/μm at a film thickness of 0.1 μm which is much larger than the normal value of about 30 V/μm.From the proposed formula of silicon critical electric field,the expressions of dielectric layer electric field and vertical breakdown voltage(VB,V) are obtained.Based on the model,an ultra thin film can be used to enhance dielectric layer electric field and so increase vertical breakdown voltage for SOI devices because of its high silicon critical electric field,and with a dielectric layer thickness of 2 μm the vertical breakdown voltages reach 852 and 300V for the silicon film thicknesses of 0.1 and 5 μm,respectively.In addition,a relation between dielectric layer thickness and silicon film thickness is obtained,indicating a minimum vertical breakdown voltage that should be avoided when an SOI device is designed.2D simulated results and some experimental results are in good agreement with analytical results.     

混合物物态方程的计算

 在采用体积相加原理计算混合物物态方程的基础上,建立了一种物理模型确定混合物温度。根据混合物中各组分温度和压强平衡条件,采用压强-密度迭代方法计算给出混合物物态方程,编制了两种组分的混合物物态方程计算程序。为检验建立的温度模型的合理性及程序的有效性,分析了不同密度、温度状态的氢（H2）和钨（W）组成的混合物状态参量,计算了以下情形及其组合情形的混合物物态方程：H₂和W以不同质量比混合;质量比固定,单组分状态不同;温度区间和密度区间不同。研究表明:实际应用中在建立的混合物温度模型基础上确定的混合物物态方程是合理的。     

Infrared Quantitative Study of Acetylation of Microspheres of Polystyrene

Abstract

Fourier transform infrared spectroscopy has been used to study quantitatively the acetylation of monodisperse polystyrene microspheres with diameters ranging from 7 to 9μm. The CH₂ stretching infrared vibration mode at 2921 cm^?1 was used as the internal intensity standard. The acetylation extent could be easily measured by comparing the relative intensities of the bands of acetyl group (1678, 1415, 1359 cm^?1) or the bands due to the para-substituted benzene ring to the band at 2921 cm^?1 from the calibration curve.     

Application of the method of X-ray fluorescence analysis for determination of the degree of chlorination of copper phthalocyanin

To whom correspondence should be addressd.     

Electron microscopy study of aggregation of microclusters of sulphur

A study of aggregation of sulphur particles in colloidal suspension of sulphur in water-methanol mixture using TEM and electron diffraction is reported. From the micrographs the aggregates formed have been found to be random and tenuous indicating a fractal structure. The electron diffraction patterns of the aggregates are used to study the mechanism of diffusion and reaction limited aggregation.     

分子费米共振拉曼光谱强度分析

测量了CCl_4和CS_2分子的Raman光谱。用Bertran理论和群论等相关理论对其光谱强度进行了分析,获得了发生费米共振分子的拉曼光谱强度的特殊规律:(1)发生费米共振的基频和倍频(和频)间发生能量转移,两光谱强度大小相互接近,当发生费米共振的基频和倍频(和频)间距离很小时,两发生费米共振的光谱强度相等(R=1);(2)能出现倍频光谱强度高于其基频光谱强度;(3)也会观测到费米共振光谱,而观测不到参与费米共振的和频中的基频光谱。此研究对化学、材料科学中的分子结构、材料成分等研究中的谱线认证、归属有很好的参考价值。     

Asymptotic properties of sequences of iterates of nonlinear transformations

By considering functions defined on the unit interval with a single zero minimum and a single unit maximum we are led to a version of the doubling or universal transformation. The fixed point functions of this doubling transformation have certain invariance properties under conjugacy. These invariance properties lead to a widening of the concept of universality to power law conjugacy classes in which the Feigenbaum divergence parameter is a function only of the product of the powers with which iterating functions approach unity at the maximum and zero at the minimum. We also construct an effective method for computing the divergence parameter from iterates, and derivatives of iterates, generated by the appropriate fixed point function.On leave from Mathematics Department, University of Melbourne, Parkville, Victoria 3052, Australia.     

傅里叶望远镜外场实验性能改进和结果分析

为了实现对傅里叶望远镜成像系统更接近实际的仿真,改进了外场实验系统结构。采用反射式目标,利用准直扩束镜替代空间滤波器和准直透镜,使用大靶面电荷耦合器件作为监视器。在无大气和包含200m水平大气两种情况下,分别对2.5mm的4种不同空间频谱分布目标进行实验。实验选用9×9,17×17,33×33和65×65傅里叶分量分别进行重构。最高成像角分辨率为3.5″。结果表明含大气与无大气重构结果的Strehl比值相近,从而证明傅里叶望远镜成像系统能够克服下行链路低阶大气扰动的影响。     

Some peculiarities of deep PT-changes of physical properties of rocks

Abstract

Results of petrophysical PT-experiments are discussed. Used is a method of program modeling of experiments. Thermobaric dependence of elastic properties of acid, intermediate and basic rocks as well as elastic wave velocity anisotropy in amphibolites is studied. Deep PT-regimes effect on electrical resistance of dry and water-saturated rocks has been studied. PT-conditions of full loss of the remanent magnetization of volcanites have been established. A number of regional petrophysical lithosphere models has been constructed.     

BSA-SDS-Ag聚合物纳米微粒的制备及其水凝胶性质的研究（Ⅰ）

报道了BSA－SDS－Ag聚合物纳米微粒的制备及水凝胶的性质,用X射线衍射（XRD）、透射电镜（TEM）、傅里叶变换红外（FT－IR）光谱考察了这种聚合物微粒的结构,微粒粒径32nm左右,用UV／Vis光谱及SEM考察了冰凝胶的性,表明Ag^ 离子先与BSA产生化学键合,再学原了Ag粒,进行聚合成网状结构的聚合物。