共查询到19条相似文献,搜索用时 125 毫秒
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温度对四频激光陀螺零偏的影响 总被引:10,自引:0,他引:10
讨论了温度对四频陀螺零偏的影响因素 ,通过各部件对温度冲击的响应分析了相对影响大小 ,指出可通过和频变化对零偏进行补偿 ,并以增益区、法拉第室温度进行校正。 相似文献
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分析了温度测量误差对环形激光陀螺(RLG)零偏补偿精度的影响,通过仿真,在动态温度模型中,发现温度测量误差主要通过温度变化率对补偿结果产生影响,提出了该模型在陀螺零偏动态温度补偿中是否考虑温度测量误差的标准。仿真结果表明,对使用的温度补偿模型与温度传感器而言,在温度补偿精度明显小于0.001°/h时,要考虑温度测量误差的影响。 相似文献
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室温条件下温度对四频激光陀螺零漂的影响非常复杂.为尝试定性找出温度影响陀螺零漂的机理,对室温下陀螺零漂、表面温度、两路信号的光强差及光强和、两臂放电电流差以及和频进行实时监控测试,通过分析计算各个参数与温度的相关系数.得出以下结论:四频激光陀螺各个参数与温度的相关系数随陀螺运行时间的长短而不同,并且陀螺各参数与温度相关系数的逐次偏差也较大,陀螺室温下的温度补偿对四频激光陀螺性能的改善十分有限;室温下和频与温度具有较好的线性关系.但线性比例系数是变化的. 相似文献
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抖动偏频激光陀螺速率阈值特性研究 总被引:9,自引:9,他引:0
本文从理论上分析了正弦抖动偏频激光陀螺速率阈值特性,提出了一种用于测试抖动偏频激光陀螺速率阈值的试验方案,结果表明激光陀螺在零速率处存在与理论相符合的小死区,动态锁区值与陀螺速率阈值具有确定的对应关系。 相似文献
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The Kerr effect induced by temperature variation in Brillouin fiber-optical gyroscope is investigated for the first time to our knowledge. It is found that the Kerr effect induced by Brillouin walk-off effect appears with the fluctuation of temperature, even the pump frequency is locked to the resonance of the resonator. The relation between the beat frequency bias and temperature variation is obtained. 相似文献
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《中国物理 B》2020,(5)
We report on the investigation of optimal bias region of a wide-band superconducting hot electron bolometer(HEB)mixer in terms of noise temperature performance for multi-pixel heterodyne receiver application in the 5-meter Dome A Terahertz Explorer(DATE5) telescope. By evaluating the double sideband(DSB) receiver noise temperature(Trec) across a wide frequency range from 0.2 THz to 1.34 THz and with a large number of bias points, a broad optimal bias region has been observed, illustrating a good bias applicability for multipixel application since the performance of the HEB mixer is uniquely determined by each bias point. The noise temperature of the HEB mixer has been analyzed by calibrating the noise contribution of all RF components, whose transmissions have been measured by a time-domain spectroscopy. The corrected noise temperature distribution shows a frequency independence relation. The dependence of the optimal bias region on the bath temperature of the HEB mixer has also been investigated, the bath temperature has limited effect on the lowest receiver noise temperature until 7 K, however the optimal bias region deteriorates obviously with increasing bath temperature. 相似文献
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Effect of substrate bias on negative bias temperature instability of ultra-deep sub-micro p-channel metal--oxide--semiconductor field-effect transistors 下载免费PDF全文
The effect of substrate bias on the degradation during applying a negative bias temperature(NBT) stress is studied in this paper.With a smaller gate voltage stress applied,the degradation of negative bias temperature instability(NBTI) is enhanced,and there comes forth an inflexion point.The degradation pace turns larger when the substrate bias is higher than the inflexion point.The substrate hot holes can be injected into oxide and generate additional oxide traps,inducing an inflexion phenomenon.When a constant substrate bias stress is applied,as the gate voltage stress increases,an inflexion comes into being also.The higher gate voltage causes the electrons to tunnel into the substrate from the poly,thereby generating the electron-hole pairs by impact ionization.The holes generated by impact ionization and the holes from the substrate all can be accelerated to high energies by the substrate bias.More additional oxide traps can be produced,and correspondingly,the degradation is strengthened by the substrate bias.The results of the alternate stress experiment show that the interface traps generated by the hot holes cannot be annealed,which is different from those generated by common holes. 相似文献