太赫兹与远红外频段下铝质目标电磁特性与计算

在太赫兹与远红外频段,铝处于由导体到介质的过渡,研究该频段铝质目标与电磁波的相互作用机理对于实现太赫兹频段目标精确电磁散射计算具有重要意义.基于实验测量数据,设计有效误差准则模型拟合得到了太赫兹与远红外频段铝的介电系数模型;基于拟合模型通过推导过渡阶段不同损耗机理下铝中传播电磁波的空间相位系数与铝的波阻抗等参数,分析了太赫兹与远红外频段电磁波在铝中的透射与反射特性,给出了铝的反射率关于频率的变化曲线.结果表明铝中电磁波传播参数从微波向太赫兹频段过渡时具有很好的连续性与一致性;基于阻抗边界条件的雷达散射截面计算结果表明太赫兹频段光滑铝质目标可视做理想导体进行计算,太赫兹雷达散射截面测量中可利用光滑铝板或铝球做为定标体.     

合金铝表面近红外波段光学常数的反演与双向反射分布函数的计算

采用分光光度计测得了0.5~1.5μm波段抛光合金铝样片的镜反射率谱,利用常数外推法和幂函数外推法将其进行外推,获得了全波段的镜反射率谱.然后根据克拉默斯-克勒尼希(Kramers-KTonig)方法,反演获得了该样片在0.5~2.5 μm波段的复折射率和介电常数,与0.5~1.5μm波段椭偏仪的测量结果吻合良好.利用...     

几种塑料的太赫兹光谱检测

利用太赫兹时域光谱技术测量了聚乙烯、聚丙烯、聚氯乙烯、聚四氟乙烯和丙烯腈-丁二烯-苯乙烯的太赫兹透射谱,研究其在0.2~2.6 THz频段的光谱特性,得到了在室温氮气环境下这些材料的太赫兹吸收谱和折射率色散特性.发现这五种塑料在太赫兹波段的折射率和吸收系数差异显著,折射率分别在1.35~1.85之间,聚乙烯、聚丙烯、聚四氟乙烯吸收很小,相比之下聚氯乙烯、丙烯腈-丁二烯-苯乙烯吸收很大,这为塑料种类的鉴别及高太赫兹透过率塑料衬底选择提供了依据.     

几种塑料的太赫兹光谱检测

利用太赫兹时域光谱技术测量了聚乙烯、聚丙烯、聚氯乙烯、聚四氟乙烯和丙烯腈-丁二烯-苯乙烯的太赫兹透射谱,研究其在0.2～2.6THz频段的光谱特性,得到了在室温氮气环境下这些材料的太赫兹吸收谱和折射率色散特性.发现这五种塑料在太赫兹波段的折射率和吸收系数差异显著,折射率分别在1.35～1.85之间,聚乙烯、聚丙烯、聚四氟乙烯吸收很小,相比之下聚氯乙烯、丙烯腈-丁二烯-苯乙烯吸收很大,这为塑料种类的鉴别及高太赫兹透过率塑料衬底选择提供了依据.     

Kamers-Kronig关系在反射太赫兹时域光谱测量中的应用

太赫兹时域光谱技术是材料介电参数测量的重要方法,是材料研究、鉴别和分析的重要工具。太赫兹时域光谱技术是一种太赫兹频段的相干探测技术,可以同时获得太赫兹波的幅度和相位信息,通过透射测量、反射测量可获得材料的复透射率或复反射率来反演材料的电磁参数。在实际中,大多数被测材料太赫兹波无法穿透,或者不满足透射材料参数反演需要的弱吸收近似,因此反射测量更具应用价值。在已发表的研究结果中,研究人员仍普遍采用透射测量的方案,很少见使用反射测量方案获取材料参数。究其原因,在反射测量时,由于样品和参考板位置的放置误差很难消除,从而导致无法准确提取反射相位。将光学领域广泛使用的Kamers-Kronig关系应用于太赫兹时域光谱系统反射测量中,以解决反射测量中无法准确获得相位信息从而无法提取介电参数的问题。为了验证Kamers-Kronig关系的准确性,一方面,通过透射、反射方法分别测量硅材料的复透射率、复反射率并反演了其材料参数,两者的反演结果一致性较好。另一方面,利用同一组硅的反射测量数据分别用Kamers-Kronig关系和最大熵法对其材料参数进行反演,两种处理方法也可以实现相互印证,进一步确保了提取数据的可靠性。对Kamers-Kronig关系和最大熵方法所取得的结果进行了对比讨论,通过Kamers-Kriong关系和最大熵法获得的折射率、消光系数以及复介电参数结果一致性较好,且基于Kamers-Kriong反演了一种精神药物的吸收谱,与透射结果做了比对。结果表明,Kamers-Kronig关系非常适合提取材料光学参数和吸收谱,且相比最大熵法其普适性更强,甚至对于无法获取相位信息的非相干测量系统依然适用,但该方法需要整个频段的反射率幅度信息,对于没有测量的频率需要进行外推,对于反射率随频率变化不大的物质更加适用。该研究成果对于利用反射式太赫兹时域光谱系统获取材料太赫兹波段的光学参数提供了一种有效方法,可解决绝大数情况下反射测量参数提取问题,对太赫兹时域光谱技术的实际应用具有重要意义。     

硅基VO2纳米薄膜光致绝缘体—金属相变的THz时域频谱研究

利用THz时域频谱技术(THz-TDS)研究了硅基二氧化钒(VO₂)纳米薄膜的光致绝缘体—金属相变特性.在连续光激发下前后,观察到了非常明显的THz透过率变化,并通过薄膜近似计算出了THz波段金属态VO₂薄膜的电导率.根据实验结果建立了金属态VO₂薄膜的等效Drude模型,得到了复电导率,复电容率以及复折射率等相关的基本参数,并通过基于时域有限积分法模拟了THz波穿透硅基金属态VO₂薄膜的过程,验证了所建立的模型的正确 关键词： 二氧化钒 光致相变 Drude模型 THz时域频谱技术     

基于太赫兹量子阱探测器的太赫兹量子级联激光器发射谱研究

采用一个光谱匹配的太赫兹(THz)量子阱探测器(QWP)研究了一激射频率约为41 THz的THz量子级联激光器(QCL)在不同驱动电流下的发射谱,分析了测量得到的发射谱谱型和谱峰位置,根据测量的发射谱估算了太赫兹量子级联激光器发射功率随驱动电流变化的情况,从而得到了THz QCL激射的电流密度范围及其阈值电流密度.文中还研究了THz QWP在不同温度下对THz QCL 激光辐射的响应特性.研究结果表明,THz QWP在表征THz QCL的发射谱方面是一种很好的探测器,并有望成为未来THz通信中的接收装置. 关键词： 太赫兹量子阱探测器 太赫兹量子级联激光器 太赫兹通信 Fourier变换红外光谱     

Stark位移对两全同原子Tavis-Cummings模型中的原子纠缠的影响

食用香料是人们在烹饪过程中必不可少的调味品,对食用香料的鉴别和食用安全性检测也尤为重要.本文利用太赫兹时域光谱技术对食用香料进行测试,得到了黑胡椒、白胡椒、花椒、大料、姜粉、甘草、香叶以及五香粉、十三香等香料在太赫波段的吸收谱和折射率谱.结果表明,不同种类的香料都有其独特的特征吸收光谱,样品的吸收谱在0.2~1.25 THz频段内以不同的斜率单调递增,在1.25~2.0 THz频段呈现出不同的吸收峰.样品的折射率值在1.3~1.8之间变化,并且,样品的折射率在其吸收峰所对应的频率处出现了反常色散.通过对吸收系数的斜率、峰值位置以及折射率进行定标分析,太赫兹时域光谱技术可以用于不同种香料的定性检测.实验数据为食用香料的鉴别提供了依据,可以用于建立食用香料的太赫兹波谱数据库.     

食用香料的太赫兹时域光谱

食用香料是人们在烹饪过程中必不可少的调味品,对食用香料的鉴别和食用安全性检测也尤为重要.本文利用太赫兹时域光谱技术对食用香料进行测试,得到了黑胡椒、白胡椒、花椒、大料、姜粉、甘草、香叶以及五香粉、十三香等香料在太赫波段的吸收谱和折射率谱.结果表明,不同种类的香料都有其独特的特征吸收光谱,样品的吸收谱在0.2～1.25THz频段内以不同的斜率单调递增,在1.25～2.0THz频段呈现出不同的吸收峰.样品的折射率值在1.3～1.8之间变化,并且,样品的折射率在其吸收峰所对应的频率处出现了反常色散.通过对吸收系数的斜率、峰值位置以及折射率进行定标分析,太赫兹时域光谱技术可以用于不同种香料的定性检测.实验数据为食用香料的鉴别提供了依据,可以用于建立食用香料的太赫兹波谱数据库.     

基于FDTD方法的THz电磁波反等离子体隐身特性分析

本文首先建立了非磁化等离子体覆盖金属目标的一维模型,然后结合该模型采用辅助差分方程时域有限差分(ADE-FDTD)方法对太赫兹(THz)电磁波在等离子体覆盖层中传播时的衰减系数进行了计算,并根据计算结果分析了等离子体碰撞频率、电子密度以及密度分布对不同频段THz电磁波吸收效果的影响.分析结果表明,等离子体覆盖层对处于太赫兹频段范围内的入射电磁波衰减很小,THz探测技术可以作为对抗等离子体隐身技术的一种有效手段.     

Determination of the complex refractivity of Au,Cu and Al in terahertz and far-infrared regions from reflection spectra measurements

A scheme to determine the complex refractivity of gold (Au), Copper (Cu) and Aluminum (Al) from measurements of ellipsometer and spectrometer are proposed in this paper. The reflection spectra of the metals from 4 THz to 40 THz are measured with spectrometer. The determined refractivity by Kramers-Kronig (KK) algorithm coincides with the measured results from ellipsometer in far infrared region. Drude model is invited to make the wing correction on the terahertz reflection spectra, which helps to eliminate the effects of the noises from spectrometer on KK algorithm. The calculated refractive indexes from measured spectra in terahertz region are in consistent with those from corrected reflection spectra. The advantage of the scheme is to obtain terahertz dispersion properties based on limited information in infrared region.     

Measurement of the dielectric constant of thin films by terahertz time-domain spectroscopic ellipsometry

We present a reflection-type terahertz time-domain spectroscopic ellipsometry (THz-TDSE) technique for measuring the complex dielectric constants of thin-film materials without replacement of the sample. THz-TDSE provides complex dielectric constants from the ratio of the complex amplitude reflection coefficients between p- and s-polarized THz waves. The measured dielectric constants of doped GaAs thin films show good agreement with predictions of the Drude model, even though the film thickness is of the order of a tenth of the penetration depth of the THz waves. In addition, we demonstrate the measurements of soft-phonon dispersion in SrTiO(3) thin films deposited on a Pt layer. The obtained dielectric constants agree well with the predictions of a generalized harmonic oscillator model.     

Measurement of Refractive Index for High Reflectance Materials with Terahertz Time Domain Reflection Spectroscopy

A method to measure the refractive index for high reflectance materials in the terahertz range with terahertz time domain reflection spectroscopy is proposed. In this method, the THz waveforms reflected by a silicon wafer and high reflectance sample are measured respectively. The refractive index of the silicon wafer, measured with the THz time domain transmission spectroscopy, is used as a reference in the THz time domain reflective spectroscopy. Therefore, the complex refractive index of the sample can be obtained by resorting to the known reflective index of the silicon and the Fresnel law. To improve the accuracy of the phase shift, the Kramers-Kronig transform is adopted. This method is also verified by the index of the silicon in THz reflection spectroscopy. The bulk metal plates have been taken as the sample, and the experimentally obtained metallic refractive indexes are compared with the simple Drude model.     

Treatment of metal for the FDTD analysis of terahertz devices

A terahertz stop band filter and a resonator consisting of metal gratings are analyzed using the finite-difference time-domain (FDTD) method, with special attention to the treatment of metal. Numerical results based on a perfect electric conductor (PEC) approximation are compared to those with a metal dispersion being taken into account by the Drude model. It is shown that the results of the resonator for the PEC model are favorably compared with those for the Drude model at frequencies of less than 1 THz. However, care must be taken at higher frequencies, since not only the transmittance at the resonance remarkably reduces for the Drude model, but also its resonance frequency deviates, in comparison with those for the PEC model. Metal mesh structures are also investigated using the periodic FDTD. The differences are found to be relatively small, due to the weak confinement of THz waves in metal mesh structures. The results can serve as a guideline for the FDTD analysis of THz devices consisting of metal.     

Measurements of terahertz electrical conductivity of intense laser-heated dense aluminum plasmas

We report the electrical conductivity of laser-produced warm dense aluminum plasmas measured using single-shot ultrafast terahertz (THz) frequency spectroscopy. In contrast with experiments performed at optical frequencies, measurements based upon THz probe reflectivity directly determine a quasi-dc electrical conductivity, and therefore the analysis does not require a free-electron Drude model based extrapolation to recover the near zero frequency conductivity. In fact, our experimental results indicate that the Drude model breaks down for warm (>0.6 eV), moderate-dense (<1.6 g/cm(3)) aluminum at THz frequencies. A calculation of THz reflectivity over a non-Fresnel boundary in dense plasmas is also presented.     

Investigation of Ag2O Thermal Decomposition by Terahertz Time-Domain Spectroscopy

Application of terahertz time-domain spectroscopy is demonstrated to study the process of Ag2O thermal decomposition. In the process of decomposition, the time-resolved signals are characterized by broad oscillations and decreased intensity, and Tttz pulse essentially contains two broad spectral components： one centered at around 0.35 THz and a band with a maximum at around 0.81 THz shift to 0.71 THz. Optical absorption spectra of different specimens are studied in the frequency range 0.3-1.4 THz and the data are analyzed by the relevant theory of the effective medium approach combined with the Drude-Lorentz model. The analysis suggests that optical properties stem from the Drude term for the metallic phase and the Lorentz term for the insulator phase in the complex system.     

High birefringence, low loss terahertz photonic crystal fibres with zero dispersion at 0.3 THz

A terahertz photonic crystal fibre (THz-PCF) is designed for terahertz wave propagation. The dispersion property and model birefringence are studied by employing the finite element method. The simulation result reveals the changing patten of dispersion parameter versus the geometry. The influence of the large frequency band of terahertz on birefringence is also discussed. The design of low loss, high birefringence THz-PCFs with zero dispersion frequency at 0.3 THz is presented.     

太赫兹光谱技术在四氢双环戊二烯检测中的应用

研究了太赫兹光谱技术在鉴别含能材料同分异构体中的应用。首先研制了适于特定工程应用的太赫兹时域光谱仪样机，并经过振动冲击、高低温试验验证了样机的环境适应性，表明该款样机完全可以在非实验室环境下稳定可靠地工作。利用一氧化碳标准气体验证了样机测量光谱的正确性，并同时实现了对样机测量频率的校准；利用校准后的光谱仪测量了四氢双环戊二烯的两种同分异构体endo-THDCPD和exo-THDCPD的太赫兹光谱，测量结果显示两种不同构型材料的太赫兹光谱存在显著差异，endo-THDCPD的太赫兹光谱在0.23 THz和1.70 THz处呈现出明显的特征吸收，exo-THDCPD的2个最明显的特征吸收峰则位于1.41 THz和1.74 THz。该结果表明:运用太赫兹光谱技术可有效区分这两种分子结构仅存在微弱差异的材料，对太赫兹光谱在含能材料研究领域的应用具有参考意义。     

Propagation of THz plasmon pulse on corrugated and flat metal surface

We report here experiments on surface plasmon excitation and propagation along corrugated and smooth aluminum surface in the terahertz frequency range. Narrowband plasmon excitation by a subpicosecond terahertz pulse is shown to be a transient process and plasmon propagation sufficiently changes its measured time profile. Plasmon propagation during its excitation and detection changes measured signal. We suggest to use parameters T (plasmon duration) and τ (plasmon lifetime) to describe the narrowband THz plasmon pulse. Plasmon duration and lifetime were defined and plasmon propagation lengths on smooth and corrugated surface were measured. Plasmon propagation length on flat surface turned out to be much smaller than it is predicted by the Drude model.