晶圆键合和激光剥离工艺对GaN基垂直结构发光二极管芯片残余应力的影响

GaN基发光二极管(LED)中的残余应力状态对器件的性能和稳定性有很大影响. 通过使用三种不同的键合衬底(Al₂O₃衬底, CuW衬底和Si衬底)以及改变键合温度(290 ℃, 320 ℃, 350 ℃和380 ℃), 并且使用不同的激光能量密度(875, 945和1015 mJ·cm^-2) 进行激光剥离, 制备了不同应力状态的GaN基LED器件. 对不同条件下GaN LED进行弯曲度、Raman 散射谱测试. 实验结果表明, 垂直结构LED中的残余应力的状态是键合衬底和键合金属共同作用的结果, 而键合温度影响着垂直结构LED中的残余应力的大小. 激光剥离过程中, 一定能量密度下激光剥离工艺一般不会对芯片中的残余应力造成影响, 但是如果该工艺对GaN 层造成了微裂缝, 则会在一定程度上起到释放残余应力的作用. 使用Si衬底键合后, 外延蓝宝石衬底翘曲变大, 对应制备的GaN基垂直结构 LED中的残余应力为张应力, 并且随着键合温度的上升而变大; 而Al₂O₃和CuW衬底制备的LED中的残余应力为压应力, 但使用Al₂O₃衬底键合制备的LED中压应力随键合温度上升而一定程度变大, CuW 衬底制备的LED中压应力随键合温度上升而下降.     

Si(110)和Si(111)衬底上制备InGaN/GaN蓝光发光二极管

分别在Si(110)和Si(111)衬底上制备了In Ga N/Ga N多量子阱结构蓝光发光二极管(LED)器件.利用高分辨X射线衍射、原子力显微镜、室温拉曼光谱和变温光致发光谱对生长的LED结构进行了结构表征.结果表明,相对于Si(111)上生长LED样品,Si(110)上生长的LED结构晶体质量较好,样品中存在较小的张应力,具有较高的内量子效率.对制备的LED芯片进行光电特性分析测试表明,两种衬底上制备的LED芯片等效串联电阻相差不大,在大电流注入下内量子效率下降较小;但是,相比于Si(111)上制备LED芯片,Si(110)上LED芯片具有较小的开启电压和更优异的发光特性.对LED器件电致发光(EL)发光峰随驱动电流的变化研究发现,由于Si(110)衬底上LED结构中阱层和垒层存在较小的应力/应变而在器件中产生较弱的量子限制斯塔克效应,致使Si(110)上LED芯片EL发光峰随驱动电流的蓝移量更小.     

SiO2图形化蓝宝石衬底对GaN生长及LED发光性能的影响

为了提高氮化镓(GaN)基发光二极管(LEDs)的发光性能,采用等离子体增强化学气相沉积(PECVD)在蓝宝石衬底上沉积SiO_2薄膜,经过光刻和干法刻蚀技术制备了SiO_2图形化蓝宝石衬底(SiO_2 patterned sapphire substrate, SPSS),利用LED器件的外延生长和微纳加工技术获得了基于SPSS的GaN基LED器件。通过分析GaN外延层晶体质量、光提取效率和LED器件性能,重点研究了SPSS对GaN生长及LED发光性能的影响。实验及模拟仿真结果表明,与常规图形化蓝宝石衬底(Conventional patterned sapphire substrate, CPSS)相比,SPSS上生长的GaN外延层位错密度较低,晶体质量较高,SPSS-LED的光提取效率提高26%、光输出功率和亮度均提高约5%。     

石英衬底上GaN薄膜沉积及其光学性能的研究

GaN薄膜材料广泛应用于发光二极管(LED)，激光二极管(LD)等光电器件。但是GaN基器件的制备与应用以及器件推广很大一部分取决于其器件的价格，常用的方式是在单晶蓝宝石衬底上沉积制备GaN薄膜样品，单晶蓝宝石衬底晶向择优，可以制备出高质量的GaN薄膜样品，但是单晶蓝宝石衬底价格昂贵，一定程度上限制了其GaN基器件推广使用。如何在廉价衬底上直接沉积高质量的GaN薄膜，满足器件的要求成为研究热点。石英玻璃价格廉价，但是属于非晶体，没有择优晶向取向，很难制备出高质量薄膜样品。本研究采用等离子体增强金属有机物化学气相沉积系统在非晶普通石英衬底上改变氮气反应源流量低温制备GaN薄膜材料。制备之后采用反射高能电子衍射谱、X射线衍射光谱、室温透射光谱和光致光谱对制备的薄膜进行系统的测试分析。其结果表明：在氮气流量适当的沉积参数条件下，所制备的薄膜具有高C轴的择优取向，良好的结晶质量以及优异的光学性能。     

电致发光的完全悬空超薄硅衬底氮化镓基蓝光LED器件的制备与表征

为提升硅衬底氮化镓基LED(发光二极管)器件的光电性能和出光效率,本文提出了一种利用背后工艺实现的悬空薄膜蓝光LED器件。结合光刻工艺、深反应离子刻蚀和电感耦合等离子体反应离子刻蚀的背后工艺,制备了发光区域和大部分正负电极区域的硅衬底完全掏空,并减薄大部分氮化镓外延层的悬空薄膜LED器件。对悬空薄膜LED器件进行三维形貌表征,发现LED悬空薄膜表面平坦,变形程度小,证明背后工艺很好地解决了氮化镓外延层和硅衬底之间由于应力释放造成的薄膜变形问题。表征了LED器件的电流电压曲线和电致发光光谱等光电特性,对不同结构、不同发光区域尺寸的LED器件进行对比,发现悬空薄膜LED器件的光电性能和出光效率比普通LED器件更优越,且发光区尺寸变化对LED器件性能的影响更明显。在15 V驱动电压下,与普通LED器件相比,发光区直径为80μm的悬空LED器件的电流从4.3 mA提升至23.9 mA。在3 mA电流的驱动下,峰值光强提升了约5倍,而发光区直径为120μm的悬空器件与发光区直径为80μm的悬空器件相比,出光效率提升更为明显。本研究为发展高性能悬空氮化物薄膜LED器件提供了更多可能性。     

半导体黄光发光二极管新材料新器件新设备

在可见光范围内,半导体发光二极管(LED)发展很不平衡,黄光LED光效(光功率效率)长期远低于其他颜色光效.本文基于GaN/Si体系,从材料生长、芯片制造、器件物理和专用装备等方面进行了系统研究,解决了外延膜龟裂、位错过多、量子阱应力过大、InGaN黄光阱材料相分离、空穴浓度不足、阱材料生长温度过低、衬底吸光、电极挡光等问题,率先实现了高光效黄光LED关键性突破.所研制的黄光LED器件,在20 A/cm~2驱动下波长565 nm黄光LED光效达26.7%,对应164 lm/W;在1 A/cm~2驱动下波长577 nm黄光LED光效达42.8%,对应248 lm/W.基于高光效黄光LED,开发了无荧光粉、多基色LED照明新光源,实现了纯LED照明光源在路灯、氛围灯等方面应用.     

基于不同衬底材料高出光效率LED芯片研究进展

提高LED芯片的出光效率是解决LED光源大功率化和可靠性的根本。根据LED芯片所用衬底材料的不同,总结了近年来提高GaN基LED出光效率的研究进展,介绍了新的设计思路、工艺结构与制备方法。并从材料结构和衬底选取方面,对LED芯片未来的发展趋势进行了展望。     

氧化锌纳米棒形貌控制及其在钙钛矿太阳能电池中作为电子传输层的应用

在钙钛矿电池中, ZnO纳米棒的垂直性是影响器件效率的关键因素. AZO(ZnO:Al)玻璃作为一种廉价的透明导电衬底,由于与ZnO纳米棒无晶格失配,有望获得最佳垂直性.然而目前在大气环境下,以AZO为衬底、ZnO纳米棒为电子传输层的钙钛矿太阳能电池还鲜有报道.本文通过水热法制备ZnO纳米棒作为电子传输层,系统研究不同条件对ZnO纳米棒的形貌及结晶性能的调控规律,分析其微观生长机理.并在此基础上于大气环境下制备太阳能电池,将以AZO为衬底在大气条件下制备的钙钛矿光伏器件的最佳效率从目前文献报道的7.0%提高到9.63%.这对丰富钙钛矿电池的设计思路及进一步降低成本具有重要意义.     

制膜技术与装置

O484.12007010582δ掺杂对Si衬底GaN蓝光LED外延膜性能的影响研究=Effect ofδ-doping on performance of GaN blue LED epi-taxial fil ms on Si substrates[刊,中]/程海英(南昌大学教育部发光材料与器件工程研究中心.江西,南昌(330047)),方文卿…//光学学报.—2006,26(8).—1269-1273用X射线衍射方法通过不同晶面的ω扫描测试,分析了Si衬底GaN蓝光LED外延膜中n-型层δ掺杂Si处理对外延膜结晶性能的影响。报道了Si衬底GaN外延膜系列晶面的半峰全宽(FWHM)值。通过使用晶格-旋转(Lattice-rotation)模型拟合,计算出样品的螺位错密…     

转移基板材质对Si衬底GaN基LED芯片性能的影响

在Si衬底上生长了GaN基LED外延材料,分别转移到新的硅基板和铜基板上,制备了垂直结构蓝光LED芯片。研究了这两种基板GaN基LED芯片的光电性能。在切割成单个芯片之前,对大量尺寸为(300μm×300μm)的这两种芯片分别通高达1 A的大电流在测试台上加速老化1 h。结果显示,铜基板Si衬底GaN基LED芯片有更大的饱和电流,光输出效率更高,工作电压随驱动电流的变化不大,光输出在老化过程中衰减更小。铜基板芯片比硅基板芯片可靠性更高,在大功率半导体照明器件中前景诱人。     

Si衬底GaN基LED的结温特性

结温是发光二极管的重要参数之一,它对器件的内量子效率、输出功率、可靠性及LED的其他一些性能有很大的影响。首次报道Si衬底GaN基LED的结温特性。利用正向压降法测量Si衬底上GaN基LED的结温,通过与蓝宝石衬底上GaNLED的结温比较,发现Si衬底GaNLED有更低的结温,原因归结为Si有更好的导热性。同时也表明:用Si作GaNLED的衬底在大功率LED方面具有更大的应用潜力。     

硅衬底氮化镓基LED薄膜转移至柔性黏结层基板后其应力及发光性能变化的研究

本文将硅(Si)衬底上外延生长的氮化镓(GaN)基发光二极管(LED)薄膜转移至含有柔性黏结层的基板上, 获得了不受衬底和支撑基板束缚的LED薄膜. 利用高分辨率X射线衍射仪(HRXRD)研究了薄膜转移前后的应力变化, 同时对其光致发光(PL)光谱的特性进行了研究. 结果表明: 硅衬底GaN基LED薄膜转移至柔性基板后, GaN受到的应力会由转移前巨大的张应力变为转移后微小的压应力, InGaN/GaN量子阱受到的压应力则增大; 尽管LED薄膜室温无损转移至柔性基板其InGaN阱层的In组分不会改变, 然而按照HRXRD倒易空间图谱通用计算方法会得出平均铟组发生了变化; GaN基LED薄膜从外延片转移至柔性基板时其PL谱会发生明显红移.     

Physical analysis of normally-off ALD Al2O3/GaN MOSFET with different substrates using self-terminating thermal oxidation-assisted wet etching technique

Based on the self-terminating thermal oxidation-assisted wet etching technique, two kinds of enhancement mode Al$_{2}$O$_{3}$/GaN MOSFETs (metal-oxide-semiconductor field-effect transistors) separately with sapphire substrate and Si substrate are prepared. It is found that the performance of sapphire substrate device is better than that of silicon substrate. Comparing these two devices, the maximum drain current of sapphire substrate device (401 mA/mm) is 1.76 times that of silicon substrate device (228 mA/mm), and the field-effect mobility ($\mu_{\rm FEmax}$) of sapphire substrate device (176 cm$^{2}$/V$\cdot$s) is 1.83 times that of silicon substrate device (96 cm$^{2}$/V$\cdot$s). The conductive resistance of silicon substrate device is 21.2 $\Omega {\cdot }$mm, while that of sapphire substrate device is only 15.2 $\Omega {\cdot }$mm, which is 61% that of silicon substrate device. The significant difference in performance between sapphire substrate and Si substrate is related to the differences in interface and border trap near Al$_{2}$O$_{3}$/GaN interface. Experimental studies show that (i) interface/border trap density in the sapphire substrate device is one order of magnitude lower than in the Si substrate device, (ii) Both the border traps in Al$_{2}$O$_{3}$ dielectric near Al$_{2}$O$_{3}$/GaN and the interface traps in Al$_{2}$O$_{3}$/GaN interface have a significantly effect on device channel mobility, and (iii) the properties of gallium nitride materials on different substrates are different due to wet etching. The research results in this work provide a reference for further optimizing the performances of silicon substrate devices.     

Evaluation of current and temperature effects on optical performance of InGaAlP thin-film SMD LED mounted on different substrate packages

The relationship between the photometric, electric, and thermal parameters of light-emitting diodes(LEDs) is important for optimizing the LED illumination design. Indium gallium aluminium phosphide(InGaAlP)-based thin-film surface-mounted device(SMD) LEDs have attracted wide attention in research and development due to their portability and miniaturization. We report the optical characterization of InGaAlP thin-film SMD LED mounted on FR4, 2 W, and 5 W aluminum(Al) packages. The optical and thermal parameters of LED are determined at different injection currents and ambient temperatures by combining the T3ster(thermal transient tester) and TeraL ED(thermal and radiometric characterization of power LEDs) systems. Analysis shows that LED on a 5 W Al substrate package obtains the highest luminous and optical efficiency.     

Synthesis and characterization of silicon-doped gallium oxide nanowires for optoelectronic UV applications

Silicon-doped gallium oxide nanowires have been synthesized by thermal methods using either a mixture of gallium oxide and silicon powders or metallic gallium with silicon powder as precursor materials. The growth mechanism has been found to be a vapour–liquid–solid (VLS) or vapour–solid (VS) process, respectively, depending on the precursor used. In the former case, silicon oxide droplets at the end of the nanowires have been observed. Their possible role during the growth of the nanostructures is discussed. Structural and morphological characterization of the doped nanowires has been performed by transmission electron microscopy (TEM) and scanning electron microscopy (SEM). The results show a high crystalline quality and a uniform distribution of silicon along the nanowires. Room temperature cathodoluminescence (CL) in the SEM shows that slight variations in the composed UV–blue emission band appear due to the influence of Si impurities in the oxygen vacancy defect structure.     

Surface and interface issues in wide band gap semiconductor electronics

Wide band gap (WGB) materials are the most promising semiconductors for future electronic devices, and are candidates to replace the conventional materials (Si, GaAs, …) that are approaching their physical limits. Among WBG materials, silicon carbide (SiC) and gallium nitride (GaN) have achieved the largest advancements with respect to their material quality and device processing. Clearly, the devices performances depend on several surface and interface properties, which in turn are often crucially determined by the quality of the available material, as well as by the device processing maturity. In this paper, some surface and interface issues related to SiC and GaN devices processing are reviewed. First, the control of metal/SiC barrier uniformity and surface preparation will be discussed with respect to the performance of Schottky-based devices. Moreover, the impact of high-temperature annealing required for high-voltage Schottky diodes and MOSFETs fabrication, on the surface morphology and device performances will also be briefly presented. In the second part, it will be shown that for GaN the material quality is still the main concern, since dislocations have a severe influence on the current transport and barrier homogeneity of metal/GaN interfaces. Other practical implications of thermal annealing and surface passivation during GaN-based devices fabrication will also be addressed.     

非等温模型下LED芯片性能与衬底的关系

发光二极管(LED)中载流子的输运及复合决定了其非均匀的内热源强度及分布,而芯片温度又影响载流子的输运及复合,两者具有强烈的耦合关系。本文利用非等温多物理场耦合模型对以蓝宝石、Si及SiC为衬底的 LED芯片的内量子效率、光谱特性及光电转换效率进行了系统研究。结果表明:以SiC为衬底的LED芯片具有最小的效率下垂效应(Efficiency droop)及最高的光谱强度和光电转换效率。这是因为与其他两种衬底的LED芯片相比,以SiC为衬底的LED芯片具有最好的散热性能,因此非均匀温度场对其载流子输运及复合的影响最小,使得活性区中的载流子浓度显著增强,漏电流明显下降。     

一种测量功率型LED热阻的方法

叙述了正向电压法测量功率型LED温度系数K和热阻的原理,介绍了测试装置及具体测试过程,对蓝宝石衬底正装LED和硅衬底倒装LED的温度系数和热阻进行了测量.选用热阻已知的LED样品,对其实际值与测量值进行了比较,误差在5% 左右,证实了这种热阻测量方法是可行的.     

Dual material insulator SOI-LDMOSFET: A novel device for self-heating effect improvement

The silicon-on-insulator (SOI) power devices show good electrical performance but they suffer from inherent self-heating effect (SHE), which limits their operation at high current levels. The SHE effect is because of low thermal conductivity of the buried oxide layer. In this paper we propose a novel silicon on insulator lateral double diffused MOSFET (SOI-LDMOSFET) where the buried insulator layer under the active region consists of two materials in order to decrease the SHE. The proposed structure is called dual material buried insulator SOI-LDMOSFET (DM-SOI). Using two-dimensional and two-carrier device simulation, we demonstrate that the heat dissipation and the SHE can be improved in a conventional SOI-LDMOSFET by replacement of the buried oxide with dual material buried insulator (silicon nitride and silicon oxide) beneath the active region. The heat generated in the active silicon layer can be flowed through the buried silicon nitride layer to the silicon substrate easily due to high thermal conductivity of silicon nitride. Furthermore, the channel temperature is reduced, negative drain current slope is mitigated and electron and hole mobility is increased during high-temperature operation. The simulated results show that silicon nitride is a suitable alternative to silicon dioxide as a buried insulator in SOI structures, and has better performance in high temperature.     

Improved light extraction efficiency of GaN-based LEDs with patterned sapphire substrate and patterned ITO

To improve the light extraction efficiency of GaN-based light-emitting diodes (LEDs), periodic semisphere patterns with 3.5 μm width, 1.2 μm height, and 0.8 μm spacing were formed on sapphire substrate by dry etching using BCl₃/Cl₂ gas chemistry. The indium tin oxide (ITO) transparent conductive layer was patterned by wet etching to reduce the total internal reflection existing along between p-GaN, ITO, and air. At 350 mA injection current, the high power LED by integrating patterned sapphire substrate with patterned ITO technology exhibited a 36.9% higher light output power than the conventional LEDs.