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1.
二元复合波片延迟相位方位效应探讨   总被引:4,自引:1,他引:3  
李华  宋连科  李国华 《光学学报》2002,22(12):438-1441
在多级波片方位效应的基础上,探讨了复合波片的方位效应问题。通过对多级波片的设计与测量,论证了入射光方位是影响波片延迟量的关键因素。  相似文献   

2.
液晶相位可变延迟器对光偏振态的调制   总被引:6,自引:5,他引:1  
利用液晶相位可变延迟器(liquid crystal variable retarder, LCVR)的延迟相位随着其驱动电压连续可调特性,实现光偏振态的可控调制.设计了旋转检偏器,对LCVR进行820nm激光波长的现场校准,获得1/4λ、3/4λ和1/2λ、1λ相位延迟所对应的驱动电压,计算机控制其驱动电压实现对光偏振态的调制,并进行了检验,给出了理论分析和实验结果.该方法具有对光子入射方向不敏感、无需机械转动、适用较宽波长范围、实时可控等优点.  相似文献   

3.
利用Jones矩阵法,理论上分析了方位角分别为0°和-45°的2个可变相位延迟器组成的偏振转换器可实现任意偏振态到水平线偏振态的转换,并推导出可变相位延迟器延迟量的表达式。利用自主研制的液晶相位可变延迟器的相位延迟,在1 V~2.7 V范围,根据驱动电压连续线性可调的特性,设计了两片液晶可变相位延迟器组成的偏振态转换器,实现了随机偏振态(Stokes参数为(-0.567,0.752,0.36))到水平偏振态(Stokes参数为(1,0,0))的可控调制,实验结果验证了理论分析结果。该偏振态转换器还可以实现其他任意偏振态到水平偏振态的调制。  相似文献   

4.
基于光弹调制技术的波片相位延迟量测量方法   总被引:2,自引:1,他引:1  
胡建明  曾爱军  王向朝 《光学学报》2006,26(11):681-1686
提出了一种基于光弹调制技术的波片相位延迟量测量方法,利用米勒矩阵对其进行了理论推导和误差分析。测量光路包括激光器、起偏器、光弹调制器、被测波片、检偏器和光电探测器,利用探测信号的归一化基频分量和二次谐波分量精确计算出被测波片的相位延迟量。该方法能测量紫外到红外光谱范围内任意相位延迟量的波片,误差分析表明其误差小于0.05°。实验验证了该测量方法的有效性,波片相位延迟量的重复测量精度为0.0048°。  相似文献   

5.
1/4波片延迟量的相位调制椭偏测量法   总被引:13,自引:7,他引:6  
利用椭偏测量术中的相位调制椭偏测量原理测量了1/4波片的延迟量。该方法预先对测量光束的偏振态进行调制,以生成随时间变化的光强信号,通过对信号中的谐变成分进行分析而获得待测波片的延迟量。测量了四个波片,其中三个波片的延迟量已经用电光调制法精确测量过,经对比测量的结果符合较好。观察到了和理论相符的云母波片延迟量的振荡现象。实验结果说明这种方法是一种有实际意义的方法。  相似文献   

6.
基于偏振调制原理,搭建了一套测量菱体型消色差相位延迟器延迟量的实验系统.利用本系统对高精度消色差相位延迟器进行了性能测试,实验结果表明特殊角入射的高精度消色差相位延迟器的设计原理正确,具有良好的消色差性能.对该系统进行误差分析表明系统测量误差小于1%,具有较高的精度,能够满足菱体型相位延迟器性能测试的使用要求,具有实际使用价值. 关键词: 偏振 消色差 延迟器 高精度  相似文献   

7.
斜入射时波片相位延迟和偏振像差的精确公式   总被引:4,自引:3,他引:1  
张为权 《光学学报》1997,17(8):121-1123
在激光技术和偏光显微镜中常常在斜入射状态下使用波片,本文提出了一个波片相位延迟和偏振像差的精确公式。这一公式对于精确计算波片的调谐曲线和偏光显微镜的偏振像差十分重要。计算表明只要适当选择晶体的方位角,波片的相位延迟和偏振光的椭圆率随入射角的改变能减少到最小。  相似文献   

8.
《光学技术》2015,(5):467-470
为了分析双折射晶体相位延迟片(即波片)的延迟量色散性质,由晶体已知的折射率数据,拟合得出光线垂直入射不同双折射晶体波片的相位延迟与波长的关系式。在此基础上针对几个常用设计波长和选定级数的波片,利用MATLAB软件拟合,得到入射光波长与波片相位延迟量的变化关系曲线。结果表明,不同双折射晶体波片其消色差特性具有很好的一致性,其原因在于晶体双折射率色散的一致性;同一设计波长的波片,其消色差效果随着波片级数的增加而变差;而对于相同的级数,设计波长越长其波片的消色差效果越好,且随波长增加,波片的消色差效果变好具有线性关系。  相似文献   

9.
LCVR和AOTF的光谱偏振测量新策略   总被引:1,自引:0,他引:1  
现有利用液晶相位可变延迟器(LCVR)和声光可调谐滤光器(AOTF)的偏振测量方法较为繁琐,故提出了一种光谱偏振测量新策略,去除了机械运动,并且相位延迟量的选取从四组减少为两组。采用两个LCVR和一个AOTF,通过两个相同型号探测器分别测量±1级衍射光,实现光谱偏振测量。电脑控制LCVR和AOTF的驱动系统分别实现所需相位延迟量和波长选择,通过扫描射频驱动整个频段得到被测光的光谱信息。叙述了方法的具体原理,分析了AOTF的偏振模型,通过理论计算LCVR和AOTF的Muller矩阵,推导出了相应的斯托克斯(Stokes)矢量中的I,Q,U的测量公式。分析并仿真了相位延迟量微小偏差对整个系统测量误差的影响,结果显示相位延迟量在±π/100范围内相对误差3%。实验验证了测量系统的可行性和准确性,测量误差总体6%。为偏振测量提供了一种简单可行且精度较高的新方法,具有重要的应用价值。  相似文献   

10.
为了更方便的测量待测波片的相位延迟量,提出了简便易行的测量任意波片相位延迟量的方法,无需标准1/4波片,而且还可以利用一套实验系统同时测量2个未知波片的相位延迟量,并从理论上推导出了通用测量公式,从实验上进行了实际测量.  相似文献   

11.
We present a new circular heterodyne interferometer with electro-optic modulation for measurement of the optical linear birefringence. It enables the measurement of not only the phase retardation but also the principal angle. The measurement procedure is carried out in two steps. In the first step of measurements, we use the electro-optic modulated circular heterodyne interferometer and the phase-lock technique to precisely measure the principal axis angle. After rotating the analyzer in the setup, the phase retardation is determined also by the phase-lock technique. The compact configuration requires only a photodetector and two simple phase-lock extractions to determine the principal axis angle and the phase retardation. The validity of the proposed design is demonstrated by measurement of the principal axis angle and phase retardation of a quarter-wave plate sample. The root-mean-square resolutions for the principal axis angle and phase retardation are found to be 0.0396° and 0.0796°, respectively, with corresponding dynamic ranges of 0–180° and 0–180°.  相似文献   

12.
This paper presents an electro-optic modulated circular heterodyne modified Mach–Zehnder interferometer and a convenient two-phase signal-processing algorithm for the measurement of variations in the magnitude of phase retardation and the angle of principal axis in optical materials. The developed method solves the problems of normalized intensity jump and limited phase retardation measurement range associated with the circular heterodyne interferometer proposed previously. The present method uses a saw-tooth wave signal to drive an electro-optic (EO) modulator, and employs a lock-in amplifier to demodulate the principal axis angle and the phase retardation. Specifically, this paper considers two main sources of measurement errors, namely the misorientation of the EO modulator and the reflection phase retardation of the beam splitter. Furthermore, the study develops calibration procedures and identifies a means to minimize measurement errors induced by the reflection phase retardation of the beam splitter.  相似文献   

13.
左芬  陈磊  徐晨 《光子学报》2008,37(11):2296-2299
通过密勒矩阵和斯托克斯参量法对一种1/4波片的相位延迟分布的测量模型进行了推导,并设计出一种空间分光移相器,取代一般测量系统中的检偏器,使得系统能于瞬间同时采集四幅具有90°移相步长的干涉图,避免了环境振动对测量的影响,从而可以对1/4波片的相位延迟分布进行动态在线测量.对一个实际标称波长632.8 nm的1/4波片进行了测量,结果显示其平均延迟量为149.36 nm,且接近75%部分其相位延迟误差在5 nm之内,显示出较好的延迟均匀性.  相似文献   

14.
Davé DP  Akkin T  Milner TE 《Optics letters》2003,28(19):1775-1777
We describe a polarization-maintaining fiber-based polarization-sensitive optical low-coherence reflectometer for measurement of depth-resolved birefringence. Unlike for other fiber-based polarization-sensitive optical low-coherence reflectometers, here the linear birefringence of a sample can be measured from data recorded in a single A scan. Simultaneous measurement of retardation and orientation of birefringent axes with mica wave plates is demonstrated. The measured retardation is insensitive to sample rotation in the plane perpendicular to ranging.  相似文献   

15.
We propose a unique optical system for measuring the retardation of birefringent films using a pair of liquid crystal (LC) gratings; that is, the examined birefringent films are inserted between two LC gratings. Because the LC grating functions as a polarization beam splitter for circularly polarized light, the proposed system is optically equivalent to the measurement system using a pair of two circular polarizers. First, the polarization splitting performance of the LC grating is discussed. It is found that a sufficiently high voltage (such that the retardation is less than a half wavelength) has to be applied for the almost pure circularly polarized diffracted light. Next, the measurement of the retardation of a homogeneous LC cell as an examined birefringent film was demonstrated using the proposed method. The proposed method is revealed to have the same measurement performance as that of the conventional method using a pair of linear polarizers and has an advantage that there is no need for the optic axis of the test birefringent specimen to be set at a specific angle.  相似文献   

16.
A simultaneous measurement method for the retardation and the fast axis angle of the eighth-wave plate in real time is proposed. The beam emitted from the laser passes through the circular polarizer and the eighth-wave plate to be measured successively, and then is split by the Dammann grating to form three sub-beams. They are analyzed by an analyzer array and detected by a detector array. Three detection signals are obtained simultaneously to calculate the retardation and the fast axis angle in real time. In experiments, a crystal quartz sample is measured at different fast axis angles. The average and standard deviation of its retardation respectively are 40.9°and 0.5°. The maximum measurement deviation of the fast axis angle is 2.1°. The usefulness of the method is verified.  相似文献   

17.
A precise method for measurement of two-dimensional birefringence distribution is described and discussed. This method can determine the relative retardation and the azimuthal angle of the fast axis in an optical component. In order to detect relative retardation with high resolution, a local-sampling phase shifting technique is proposed. This method can measure 256 × 256 values of the birefringent phase difference and azimuthal angle in a short time with ± 0.02 deg (0.03 nm) of retardation accuracy.  相似文献   

18.
The retardation of two quarter-wave plates designed for a particular wavelength decreases or increases in accordance with the wavelength of input light beam. Compensating the shifted retardation at each measurement wavelength allows us to get Mueller matrices of samples at different wavelengths without exchanging the plates. Initial orientation errors of two plates and an analyzer, which remain constant through all wavelengths, are also taken into consideration. The availability and accuracy of this polarimeter is assessed by measurement of a quarter-wave plate designed for 632.8 nm wavelength. The results show that this system is very attractive to measure optical properties and dispersion in samples.  相似文献   

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