Review of near-field optical microscopy

This review has introduced a new near-field optical microscope (NOM)—atomic force microscope combined with photon scanning tunneling microscope (AF / PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM) has also been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM.     

扫描探针声显微镜轻敲模式中相位像的反差机理

根据扫描探针声显微镜(SPAM)轻敲工作模式中探针作周期振动的特点,以及在探针与试样相接触过程中激振力和悬臂探针自由振动的阻尼力很小的假设下,解析求解了探针与试样的碰撞运动方程,得到了最大压痕深度和碰撞时间与探针半径、等效杨氏模量以及界面吸附能等之间的关系式,较直观地说明了SPAM中轻敲模式的相位像反差机理:信号的相位与试样微区的性质、探针振幅、设置点以及试样形貌等有关。并定量预计了纳米金刚石像中的相位差值72.59°,与实验测量平均值73.2°±8.2°一致。同时,合理地解释了实验得到的光学薄膜试样相位像的反差。这些表明SPAM轻敲模式的相位成像是一种纳米分辨率测量材料表面物理性质的成像技术。      

Scanning probe microscope with interchangeable AFM-FFM and STM heads

Summary A scanning probe microscope operating in air with interchangeable atomic force-friction force (AFM-FFM) and electronic-tunnelling (STM) heads is presented. Our AFM operates in the so-called contact mode and utilizes the optical-lever detection method which allows simultaneous measurement of the topography as well as the lateral force. The set-up also contains an optical microscope to control both the sample and the probe laser spot on the cantilever. The experimental method to change from AFM to STM operation is based on the use of the probe laser beam and the optical microscope. The maximum scanning area is (24×24) μm² and it is well embraced in the optical-microscope visual field. The microscope attains atomic resolution in air in both AFM and STM configuration. Its performance is demonstrated on the surface of different samples. In honour of Prof. Fausto Fumi on the occasion of his retirement from teaching.     

Sensitivity analysis of scanning near-field optical microscope probe

In this paper, we study the dynamic modes of a scanning near-field optical microscope (SNOM) which uses an optical fiber probe; and the sensitivity of flexural and axial vibration modes for the probe were derived and the closed-form expressions were obtained. According to the analysis, as expected each mode has a different sensitivity and the first mode is the most sensitive mode of flexural and axial vibration for the SNOM probe. The sensitivities of both flexural and axial modes are greater for a material surface that is compliant with the cantilever probe. As the contact stiffness increases, the high-order vibration modes are more sensitive than the lower-order modes. Furthermore, the axial contact stiffness has a significant effect on the sensitivity of the SNOM probe, and this should be noted when designing new cantilever probes.     

热拉伸和化学腐蚀相结合制备弯曲光纤探针

提出了原子力/光子扫描隧道显微镜(AF/PSTM)系统的关键部分——双功能弯曲光纤探针的制作方法.采用热拉伸与动态、静态两步化学腐蚀相结合的方法制作出AF/PSTM弯曲光纤探针，弯曲角度约为150°，尖端曲率半径优于100nm，锥角范围为60°—90°.将这种双功能弯曲光纤探针应用在新研制的AF/PSTM系统上，同时获得了样品的光学与形貌图像，实现了图像分解. 关键词： 原子力/光子扫描隧道显微镜 光纤探针 热拉伸 化学腐蚀     

Field-enhanced scanning optical microscope

We present experimental results of an imaging technique that uses as a local probe the optical field enhanced at the junction of a scanning tunneling microscope illuminated by a p-polarized laser beam. Images of highly oriented pyrolithic graphite, recorded at a constant height mode, show a lateral optical resolution of as much as 10 nm. Approach curves exhibit sensitivity on a subnanometer scale of the optical signal to the tip-sample distance, yielding the ultrahigh vertical resolution reached in the images.     

Near-field optical microscope with a multiheight scanning imaging mode

A near-field scanning optical microscope has been developed to yield optical images with various gap distances between the probe and the sample surface. The microscope uses an apertureless metallic probe, the position of which is controlled by regulation of the tunneling-electron current from the probe to the sample and by computer-generated bias voltage. Experimental results of near-field optical imaging with the developed microscope at different gap distances are shown. Thirteen images at gap distances of 0 to 500nm demonstrate that the near-field image depends strongly on the gap distance. The imaging characteristics of a near-field imaging system are shown with the spatial-frequency spectra of images. Future investigation of the developed microscope is also discussed.     

A new positioning approach of fiber probe for near-field scanning optical microscope

A fiber probe-based positioning scan approach was established, whose precision can reach as high as 0.8 μm. And a set of modified microscope system was designed utilizing this approach, in which the scanning probe microscope (SPM) combined with an optical microscope was manipulated. The optical microscope and scanning probe can conveniently be switched through a switch panel. The observation period of samples can significantly be shortened. And more reliable images can be provided using this approach. Our design can effectively solve the inherent disadvantages of SPM technology, which makes SPM scan and image more reliably, conveniently, safely and rapidly.     

用于原子力与光子扫描隧道组合显微镜的浸油显微物镜

双功能原子力与光子扫描隧道显微镜（AF／PSTM）用π对称双光束照明方法来消除假象。为改进现有的AF／PSTM系统，提出新的照明系统方案，并设计了新方案中需要的高数值孔径的浸油显微物镜。根据具体的物镜系统参数要求，选择合适的初始结构，用ZEMAX光学设计软件对物镜进行设计、优化和像质评价，设计结果显示浸油物镜的数值孔径大约1.54，可以很好地满足照明系统的需要。     

Nano-optical image and probe in a scanning near-field optical microscope

We study a nanometer-sized optical probe and image in a scanning near-field optical microscope (SNOM). We demonstrated the potential to observe 5-nm wide optical patterns using the SNOM. The probe profile was measured by using a knife-edge method and a modulated transfer function evaluation method. An aluminum covered and pipet-pulled fiber probe used here has two optical probes, one which has a large diameter of 350 nm and one which has a small diameter of around 10 nm.     

The surface nanostructure of pure iron after combined electrochemical passivation and thermal annealing treatments

The properties of the surface oxide film on pure iron after electrochemical passivation and thermal annealing treatments were investigated using a variety of techniques. Passivation was carried out with an applied potential of 800 mV (vs Ag/AgCl) for 15 min in a pH 8.4 borate buffer solution at 30 °C, whilst annealing was carried out in air in an electric furnace at temperatures up to 300 °C. Analysis of the surface properties was then carried out using X-ray diffraction to determine oxide composition, a spectroscopic ellipsometer to measure the optical properties and oxide thickness, and a scanning probe microscope to measure the surface roughness using tapping mode AFM and to observe the nanoscale structure using constant height mode STM.     

Gold-bead scanning near-field optical microscope with laser-force position control

We have developed a scanning near-field optical microscope with an optically trapped metallic particle that has a small diameter compared to the wavelength of visible light. In this microscope we employed spot illumination to enhance the intensity of light scattered from a probe particle so we could reduce the diameter of the probe particle to 40nm. We detected slight irregularities of the surface of the cover glass near 10-nm depth. Also, we observed gold colloidal particles on the surface of the cover glass.     

Exploring the facets of “soft crystals” using an Atomic Force Microscope

We obtained monocrystalline droplets in a thermotropic cubic phase, of approximate size 100μm, deposited on a flat surface. The facets of these soft crystals are explored using both an optical microscope and an AFM. The height of individual steps on the principal facets and the lateral distance between steps in vicinal facets are measured using AFM in imaging (tapping) mode. Moreover, the elastic modulus is measured locally, using the AFM tip (in contact mode) as a local rheological probe.     

用于纳米体系电学及电光性质测量的原子分辨的四探针扫描隧道显微镜

本文介绍一套超高真空环境下的四探针扫描隧道显微镜。每个探针均可以独立的在纳米尺度上精密移动并可以进行扫描显微。此系统可以容易地操纵低维纳米体系并用四探针技术测量其电学性质。仪器可以进行不同温度（30~500开尔文）、不同磁场强度（0~1000高斯）、不同环境气氛的测量，同时还可以获得样品的阴极发光谱。对一些纳米线的试验的结果显示此系统是一个在纳米尺度探索电子输运性质的强有力的工具。     

On the operating stability of a scanning force microscope with a nanowhisker at the top of the probe

The functioning of the scanning probe microscope cantilever with a metal-carbon whisker at the top is studied. Metal-carbon whiskers grown by focused ion beam deposition in the presence of precursor gases have an aspect ratio in the range α = 10?200 and hold shape upon multiple scanning in the constant force mode. The advantage of probes with whiskers at the top in examining rough surfaces with vertical walls and narrow grooves is demonstrated experimentally. At high α, the scanning probe microscope is found to operate unstably, because the lateral surface of the whisker interacts with the specimen. It is shown that the axis of the whisker should be set normally to the specimen’s surface for the microscope to operate reliably at high aspect ratios.     

Imaging biological specimens with the confocal scanning laser microscope/macroscope

A new confocal scanning laser microscope/macroscope (cslm/M) has recently been developed. It combines in one instrument the high resolution capability of a confocal scanning beam microscope for imaging small specimens, with good resolution confocal imaging of macroscopic specimens. Some of its main features include: (a) 0.25 μm lateral resolution in the microscope mode and 5 μm lateral resolution in the macroscope mode; (b) a field of view that can vary from 25 μm × 25 μm to 75,000 μm × 75,000 μm; (c) capability for acquiring large data sets from 512 × 512 pixels to 2048 × 2048 pixels; (d) 0.5 μm depth resolution in the microscope mode and 200 μm depth resolution in the macroscope mode.

In this work the cslm/M was used to image whole biological specimens (> 5 m diameter), including insects which are ideal specimens for the macroscope. Specimens require no preparation, unlike scanning electron microscope (SEM) specimens which require a conductive coating. The specimens described in this paper are too large to be imaged in their entirety by a scanning beam laser microscope, however they can be imaged by slower scanning stage microscopes. In the macroscope mode the cslm/M was used to acquire a large number (e.g. 20–40) of confocal image slices which were then used to reconstruct a three-dimensional image of the specimen. High resolution images were collected by the cslm/M by switching to the microscope mode where high numerical aperture (NA) objectives were used to image a small area of interest. Reflected-light and fluorescence images of plant and insect specimens are presented which demonstrate the morphological details obtained in various imaging modes. A process for three-dimensional visualization of the data is described and images are shown.     

Field enhancement analysis of an apertureless near field scanning optical microscope probe with finite element method

Plasmonic field enhancement in a fully coated dielectric near field scanning optical microscope (NSOM)probe under radial polarization illumination is analyzed using an axially symmetric three-dimensional (3D)finite element method (FEM) model. The enhancement factor strongly depends on the illumination spot size, taper angle of the probe, and the metal film thickness. The tolerance of the alignment angle is investigated. Probe designs with different metal coatings and their enhancement performance are studied as well. The nanometric spot size at the tip apex and high field enhancement of the apertureless NSOM probe have important potential application in semiconductor metrology.     

High-Contrast Imaging of Nano-Channels Using Reflection Near-Field Scanning Optical Microscope Enhanced by Optical Interference

We demonstrated a contrast enhancement in a near-field scanning optical microscope (NSOM) by optical interference with an aperture probe in reflection (illumination-collection) mode operation. We observed a NiO film deposited on a sapphire substrate and clearly visualized 2-nm-deep nano-channel structures on the surface of the film. The reflection NSOM enhanced by optical interference is quite a promising instrument for high-resolution optical detection and estimation of low-contrast nanostructures.     

原子力与光子扫描隧道组合显微镜

介绍了超高分辨光于扫描隧遭显微镜（PSTM）的计冗历程,为解决第一代（单光束照明）光千扫捕隧逼显傲镜中存在人为假象和样品光学图像与形貌图像难于分离两个难题,用“对称双光束照明方法消假象,用原子力与光子扫描隧道组合显微镜（AF／PSTM）图像分解方法分离样品光学透过率、折射率与形貌图像。研制成功新一代原子力与光子扫描隧道组合显微镜（AF／PSTM）样机。该样机在一次扫描中已获得两幅原子力显微镜图像（形貌与相位）和两幅光学图像（透过率和折射率）,有效地减少了假象,分解了样品光学折射率、透过率与形貌图像。     

Observations of fission-tracks in zircons by atomic force microscope

The fission-track (FT) method is a dating technique based on the observation of damage (tracks) by spontaneous fission of ²³⁸U left in a mineral. The date is calculated from the track density and the uranium concentration in the mineral. This is possible because the number of tracks is a function of uranium concentration and time since the start of track accumulation. Usually, the number of tracks is counted under an optical microscope after etching (chemical expansion of a track). However, as FT density per unit area rises, it becomes difficult to count the number of tracks. This is due to the fact that FTs overlap one another and are unable to be readily distinguished. This research examines the potential of atomic force microscope (AFM) for FT dating using zircons, which are likely to show higher FT density than other minerals due to their high U concentrations.To obtain an AFM image for a sample prepared for FT dating, removing the static electricity of the sample is essential to avoid an unexpected movement of the cantilever. A grain should be wider than about 30 μm to bring the cantilever on the mineral surface. Polishing with a fine grained compound is very important. There is not much difference in sharpness between images by AC mode (scanning with vibrating cantilever at a constant cycle) and Contact mode (scanning with the cantilever always in close contact with the surface). To confirm how tracks can be identified with the AFM, an AFM image was compared with an image obtained with the optical microscope. When change in the number of tracks and their shapes were observed through stepwise etching, the track expanded as the etching time increased. In addition, the etching rate was slower for large tracks than those for small tracks. This implied that the AFM can be used to observe etching of zircons with different degrees of nuclear fission damage. A track that could not be seen with the optical microscope due to insufficient etching could be observed by AFM methods, indicating the possibility of FT dating with high track densities using AFM after relatively short etching periods.