Fabrication and electrical characterization of thermally deposited amorphous Se0.82In0.18 on n-Si (100)

Amorphous (a-) Se_0.82In_0.18 thin films have been deposited onto n-type silicon (n-Si) single crystal, using the three-temperature technique, in the fabricated configuration of Au/a-Se_0.82In_0.18/n-Si/Al. The current density-voltage (J–V) characteristics have been measured at different isotherms in the range of 198–313 K, thus inspecting the conduction mechanisms comparing with Au/a-Se/n-Si/Al heterojunctions. The analysis proved that the forward bias is characterized by two parts: current increasing exponentially with the applied voltage (low voltage bias region, V<0.2 V), and non-exponentially in the higher voltage region (V>0.2 V). At the low bias region, the current was dominated by a multi-tunneling capture-emission process with a rather temperature-independent effect in the temperature range investigated. However, at the high voltage region, the effect of temperature becomes more pronounced with an ohmic character in the range of 198 to 273 K. For temperatures higher than 273 K, and below the glass transition temperature of a-Se_0.82In_0.18 (T _g～330 K), the high voltage region could be subdivided into two parts: an ohmic conduction range that limited at bias voltage of 0.20 V<V<0.46 V, and a space charge limited current region for bias voltage of V>0.46 V. The reverse J–V characteristics showed a deviation from that of the ideal diode behavior, analogous to that of pure a-Se/n-Si heterojunctions.     

Tunnelling current in Schottky diodes containing InAs quantum dots

Current transport mechanism in Schottky diode containing InAs quantum dots (QDs) is investigated using temperature-varying current-voltage characteristics. We found that the tunnelling emission has obvious effects on the I-V characteristics. The I-V-T measurements revealed clear effects of QDs on the overall current flow. Field emission (FE, pure tunnelling effect) was observed at low temperature and low voltages bias region. The zero-bias barrier height decreases and the ideality factor increases with decreasing temperature, and the ideality factor was found to follow the T₀-effect. When the reverse bias is varied, the ideality factors of Schottky barriers exhibit oscillations due to the tunnelling of electrons through discrete levels in quantum dots. The traps distributed within InAlAs layer can also act as a transition step for reverse bias defect-assisted tunnelling current which can phenomenologically explain the decrease of the effective barrier height with measurement temperature.     

Electrical transport studies of MBE grown InGaN/Si isotype heterojunctions

The temperature dependent electrical transport behavior of n–n InGaN/Si heterostructures grown by plasma-assisted MBE was studied. Structural characteristics of the as-grown InGaN epilayers were evaluated high resolution X-ray diffraction and composition of InGaN was estimated from photoluminescence spectra using standard Vegard's law. Current density–voltage plots (J–V–T) revealed that the ideality factor (η) and Schottky barrier height (SBH) (Φ_b) are temperature dependent and the incorrect values of the Richardson's constant (A⁷) produced, suggests an inhomogeneous barrier at the heterostructure interface. The higher value of the ideality factor compared to the ideal value and its temperature dependence suggest that the current transport is mainly dominated by thermionic field emission.     

Electroreflectance study of CuIn1−xGaxSe2 thin film solar cells

We have investigated the optical properties of CuIn_1−xGa_xSe₂ (CIGS) thin film solar cells using their electroreflectance (ER) at room temperature. The ER spectra exhibited one broad and two narrow signal regions. Using the photoluminescence (PL) and photocurrent (PC) spectra, the peaks in the low-energy region (1.02–1.35 eV) can be assigned to the CIGS thin film. The PC results implied that the peaks in the high-energy region (2.10–2.52 eV) can be assigned to the CdS band-gap energy. Using the applied bias voltage, the broad signals in the 1.35–2.09 eV region can be assigned to the Franz–Keldysh oscillation (FKO) due to the internal electric field. The ER spectra exhibited a distorted CdS signal for the CIGS thin film solar cell with low shunt resistance and efficiency.     

Analysis of electrical characteristics of Er/p-InP Schottky diode at high temperature range

We report on the temperature-dependent electrical characteristics of Er/p-InP Schottky barrier diodes. The current–voltage (I–V) and capacitance–voltage (C–V) measurements have been carried out in the temperature range of 300–400 K. Using thermionic emission (TE) theory, the zero-bias barrier height (Φ_bo) and ideality factor (n) are estimated from I–V characteristics. It is observed that there is a decrease in n and an increase in the Φ_bo with an increase in temperature. The barrier height inhomogenity at the metal/semiconductor (MS) interface resulted in Gaussian distribution of Φ_bo and n. The laterally homogeneous Schottky barrier height value of approximately 1.008 eV for the Er/p-InP Schottky barrier diodes is extracted from the linear relationship between the experimental zero-bias barrier heights and ideality factors. The series resistance (R_s) is calculated by Chenug's method and it is found that it increases with the decrease in temperature. The reverse-bias leakage current mechanism of Er/p-InP Schottky diode is investigated. Both Poole–Frenkel and Schottky emissions are described and discussed. Furthermore, capacitance–voltage (C–V) measurements of the Er/p-InP Schottky contacts are also carried out at room temperature in dark at different frequencies of 10, 100 and 1000 kHz. Using Terman's method, the interface state density is calculated for Er/p-InP Schottky diode at different temperatures.     

Photoreflectance study on the photovoltaic effect in InAs/GaAs quantum dot solar cell

To investigate the effect of quantum dot (QD) layers on the photovoltaic process of InAs/GaAs QD solar cell (QDSC), QD layers were embedded in conventional GaAs p-n junction SC (GaAs SC) structures. The photoreflectance (PR) was examined at different temperatures (T) and excitation light intensities (I_ex) to investigate the photovoltaic effects through observation of the Franz-Keldysh oscillations (FKOs) in the PR spectra. The evaluated the p-n junction electric fields (F_pn) of the InAs QDSC was different from that of the GaAs SC. Moreover, InAs QDSC show that the different photovoltaic behaviors compared with GaAs SC by varying I_ex and T. From these considerations, we suggest that the different photovoltaic behaviors are caused by the effect of the additional photo-carrier generation in InAs QD layers resulting in enhancement of the field screening effect in F_pn.     

I–V characteristics of ZnO/Cu2O thin film n–i–p heterojunction

ZnO/Cu₂O thin film n–i–p heterojunctions were fabricated by magnetron sputtering. The microstructure, optical, and electrical properties of n-type (n‐) ZnO, insulating (i‐) ZnO, and p-type (p‐) Cu₂O films deposited on glass substrates were characterized by X-Ray diffraction (XRD), spectrophotometer, and the van der Pauw method, respectively. XRD results show that the mean grain size of i-ZnO film is much larger than that of n-ZnO film. The optical band gap energies of n-ZnO, i-ZnO, and p-Cu₂O film are 3.27, 3.47, and 2.00 eV, respectively. The carrier concentration of n-ZnO film is two orders of magnitude larger than that of p-Cu₂O film. The current–voltage (I–V) characteristics of ZnO/Cu₂O thin film n–i–p heterojunctions with different i-ZnO film thicknesses were investigated. Results show that ZnO/Cu₂O n–i–p heterojunctions have well-defined rectifying behavior. All ideality factors of these n–i–p heterojunctions are larger than 2.0. The forward bias threshold voltage and ideality factor increase when i-ZnO layer thickness increases from 100 to 200 nm. An energy band diagram was proposed to analyze the I–V characteristics of these n–i–p heterojunctions.     

Simulation of output power and optical gain characteristics of self-assembled quantum-dot lasers: Effects of homogeneous and inhomogeneous broadening,quantum dot coverage and phonon bottleneck

The effects of temperature (homogeneous broadening (HB)) on output power, gain spectrum, and light–current (L–I) characteristics of self-assembled quantum-dot lasers (SAQDLs) are investigated. We also analyze the effects of inhomogeneous broadening (IHB) and QD coverage on L–I characteristics and the effects of carrier relaxation and recombination lifetimes on L–I and optical gain–current characteristics. We propose the possibility of single mode lasing for every HB that is comparable, near, or equal to IHB and for every lasing injected current. We also show that peak optical gain does not change with variations of temperature (HB) and injected current. Simulation of L–I characteristics shows that L–I curves become nonlinear as HB elevates up to near IHB. Exceeding HB from IHB and elevating IHB result in degradation of L–I characteristics. Threshold current grows as temperature (HB) enhances. It is, therefore, concluded that the SAQDL has the best L–I characteristics when HB is equal to IHB. It is also shown that there is a threshold and an optimum QD coverage. We reveal that the phonon bottleneck degrades L–I characteristics and that the maximum output power decreases significantly with enhancement of IHB. Finally, we show that the phonon bottleneck, low wetting layer and QD crystal quality reduce the differential gain, relaxation oscillation frequency and modulation bandwidth.     

Double threshold behaviour of I－V characteristics of CoSi2/Si Schottky contacts

The forward current－voltage (I－V) characteristics of polycrystalline CoSi₂/n-Si(100) Schottky contacts have been measured in a wide temperature range. At low temperatures (≤200K), a plateau-like section is observed in the I－V characteristics around 10^-4A·cm^-2. The current in the small bias region significantly exceeds that expected by the model based on thermionic emission (TE) and a Gaussian distribution of Schottky barrier height (SBH). Such a double threshold behaviour can be explained by the barrier height inhomogeneity, i.e. at low temperatures the current through some patches with low SBH dominates at small bias region. With increasing bias voltage, the Ohmic effect becomes important and the current through the whole junction area exceeds the patch current, thus resulting in a plateau-like section in the I－V curves at moderate bias. For the polycrystalline CoSi₂/Si contacts studied in this paper, the apparent ideality factor of the patch current is much larger than that calculated from the TE model taking the pinch-off effect into account. This suggests that the current flowing through these patches is of the tunnelling type, rather than the thermionic emission type. The experimental I－V characteristics can be fitted reasonably well in the whole temperature region using the model based on tunnelling and pinch-off.     

Effect of annealing temperature on the electrical properties of Au/Ta2O5/n-GaN metal–insulator–semiconductor (MIS) structure

We report on the effect of an annealing temperature on the electrical properties of Au/Ta₂O₅/n-GaN metal–insulator–semiconductor (MIS) structure by current–voltage (I–V) and capacitance–voltage (C–V) measurements. The measured Schottky barrier height (Φ _bo) and ideality factor n values of the as-deposited Au/Ta₂O₅/n-GaN MIS structure are 0.93 eV (I–V) and 1.19. The barrier height (BH) increases to 1.03 eV and ideality factor decreases to 1.13 upon annealing at 500 ^°C for 1 min under nitrogen ambient. When the contact is annealed at 600 ^°C, the barrier height decreases and the ideality factor increases to 0.99 eV and 1.15. The barrier heights obtained from the C–V measurements are higher than those obtained from I–V measurements, and this indicates the existence of spatial inhomogeneity at the interface. Cheung’s functions are also used to calculate the barrier height (Φ _bo), ideality factor (n), and series resistance (R _s ) of the Au/Ta₂O₅/n-GaN MIS structure. Investigations reveal that the Schottky emission is the dominant mechanism and the Poole–Frenkel emission occurs only in the high voltage region. The energy distribution of interface states is determined from the forward bias I–V characteristics by taking into account the bias dependence of the effective barrier height. It is observed that the density value of interface states for the annealed samples with interfacial layer is lower than that of the density value of interface states of the as-deposited sample.     

Leakage current and sub-bandgap photo-response of oxygen-plasma treated GaN Schottky barrier diodes

The effect of oxygen plasma treatment on the performance of GaN Schottky barrier diodes is studied. The GaN surface is intentionally exposed to oxygen plasma generated in an inductively coupled plasma etching system before Schottky metal deposition. The reverse leakage current of the treated diodes is suppressed in low bias range with enhanced diode ideality factor and series resistance. However, in high bias range the treated diodes exhibit higher reverse leakage current and corresponding lower breakdown voltage. The X-ray photoelectron spectroscopy analysis reveals the growth of a thin GaO_x layer on GaN surface during oxygen plasma treatment. Under sub-bandgap light illumination, the plasma-treated diodes show larger photovoltaic response compared with that of untreated diodes, suggesting that additional defect states at GaN surface are induced by the oxygen plasma treatment.     

Magnetically tunable nonlinear current–voltage characteristics in oxygen deficient manganite perovskites

La_0.667Ca_0.333Mn_1−xM_xO_3−δ (M=Mg, Li or Re) exhibit insulating behaviour and nonlinear current–voltage (J–E) relationship with voltage-limiting characteristics at temperatures below the ferromagnetic transition (T_c). The high current region is set in at field strengths <60 V/cm. Nonlinearity exponent, α in the relation J=kE^α increases inversely with temperature. In presence of an external magnetic field, the J–E curves show higher current density at lower field strengths. Microstructural studies indicate that there is no segregation of secondary phases in the grain boundary regions. There is remarkable changes in ρ(T) as well as J–E curves with the grain size. Annealing studies in lower p_O2 atmospheres indicate that there is significant out-diffusion of oxygen ions through the grain boundary layer (GBL) regions creating oxygen vacancies in the GBL regions. The concentration of Mn⁴⁺ ions is lowered at the GBL due to oxygen vacancies, reducing the probability of hopping and resulting in insulating behaviour. Therefore an insulating barrier is introduced between two conducting grains and the carrier motion between the grains is inhibited. Thus below T_c, where sufficient increase in resistivity is observed the conduction may be arising as a result of spin dependent tunneling across the barrier. External electric field lowers the barrier height and establishes carrier transport across the barrier. Above certain field strength, barrier height diminishes significantly and thereby allowing large number of carriers for conduction, giving rise to highly nonlinear conductivity.     

Optical and current transport properties of CuO/ZnO nanocoral p–n heterostructure hydrothermally synthesized at low temperature

We demonstrate the synthesis and investigate the electrical and optical characteristics of ‘nanocorals’ (NCs) composed of CuO/ZnO grown at low temperature through the hydrothermal approach. High-density CuO nanostructures (NSs) were selectively grown on ZnO nanorods (NRs). The synthesized NCs were used to fabricate p–n heterojunctions that were investigated by the current density–voltage (J–V) and the capacitance–voltage (C–V) techniques. It was found that the NC heterojunctions exhibit a well-defined diode behavior with a threshold voltage of about 1.52 V and relatively high rectification factor of ～760. The detailed forward J–V characteristics revealed that the current transport is controlled by an ohmic behavior for V≤0.15 V, whereas at moderate voltages 1.46≤V<1.5 the current follows a J? α?exp(βV) relationship. At higher voltages (≥1.5 V) the current follows the relation J? α? V ², indicating that the space-charge-limited current mechanism is the dominant current transport. The C–V measurement indicated that the NC diode has an abrupt junction. The grown CuO/ZnO NCs exhibited a broad light absorption range that is covering the UV and the entire visible parts of the spectrum.     

Experimental analysis and modeling of the IV characteristics of photovoltaic solar cells under solar spectrum spot illumination

In this paper, some models that have been put forward to explain the characteristics of a photovoltaic solar cell device under solar spot-illumination are investigated. In the experimental procedure, small areas of the cell were selected and illuminated at different solar intensities. The solar cell open circuit voltage (V_oc) and short circuit current (I_sc) obtained at different illumination intensities was used to determine the solar cell ideality factor. By varying the illuminated area on the solar cell, changes in the ideality factor were studied. The ideality factor obtained increases with decreasing illumination surface ratio. The photo-generated current at the illuminated part of the cell is assumed to act as a dc source that injects charge carriers into the p-n junction of the whole solar cell while the dark region of the solar cell operates in a low space charge recombination regime with small diffusion currents. From this analysis, a different model of a spot illuminated cell that uses the variation of ideality factor with the illuminated area is proposed.     

Modeling and simulation of experimentally fabricated QDSSC using ZnS as light absorbing and blocking layer

Abstract—Two main factors which limit the power conversion efficiency of solar cells are light absorption and recombination processes. In photovoltaic (PV) devices, low energy photons cannot be absorbed and excite electrons from valance band to conduction band, hence do not contribute to the current. On the other hand, high energy photons cannot be efficiently used due to a poor match to the energy gap. Existence of charge recombination in PV devices causes the low conversion performance, which is indicated by the low open-circuit voltage (V _OC ). Using a blocking layer in system could effectively reduce the recombination of charge carriers. In this study, we simulated a solar cell with ITO/ZnO/P3HT&PCBM/Ag structure. To prevent the charge recombination, a ZnS QD layer was used which acts as a light absorbing and a recombination blocking layer in the ITO/ZnO film/ZnS QD/P3HT&PCBM/Ag structure. The simulated J–V characteristics of solar cells showed a close match with the experimental results. Simulate data showed an increase of conversion efficiency in ZnS QDSSC from 1.71 to 3.10%, which is relatively 81.28% increase.     

Analysis of the electrical properties of p–n GaAs homojunction under dc and ac fields

In this work, the n-type GaAs films were grown on p-type GaAs single crystalline substrate by metal organic chemical vapor deposition (MOCVD). The temperature dependence of the current density–voltage (J–V) characteristics of n-GaAs/p-GaAs homojunction contacts were measured in the temperature range 293–413 K. These characteristics showed a rectifying behavior consistent with a potential barrier formed at the interface. The forward current density–voltage characteristics under low voltage biasing were explained on the basis of thermionic emission mechanism. The high values of ideality factor (n) may be ascribed to the presence of an interfacial layer. Analysis of the experimental data under the reverse voltage biasing suggests a dominant mechanism was found to be a Schottky effect. The impedance properties and the alternating current (ac) conductivity of n-GaAs/p-GaAs homojunction were investigated as a function of frequency and temperature. The ac conductivity was found to obey the universal power law. The variation of the exponent s with the temperature suggested that the conduction mechanism is an overlapping large-polaron tunneling (OLPT) model associated with correlated barrier hopping (CBH) model at the higher temperature.     

Analysis of interface states and series resistance for Al/PVA:n-CdS nanocomposite metal–semiconductor and metal–insulator–semiconductor diode structures

This paper presents the fabrication and characterization of Al/PVA:n-CdS (MS) and Al/Al₂O₃/PVA:n-CdS (MIS) diode. The effects of interfacial insulator layer, interface states (N _ss ) and series resistance (R _s ) on the electrical characteristics of Al/PVA:n-CdS structures have been investigated using forward and reverse bias I–V, C–V, and G/w–V characteristics at room temperature. Al/PVA:n-CdS diode is fabricated with and without insulator Al₂O₃ layer to explain the effect of insulator layer on main electrical parameters. The values of the ideality factor (n), series resistance (R _s ) and barrier height (? _b ) are calculated from ln(I) vs. V plots, by the Cheung and Norde methods. The energy density distribution profile of the interface states is obtained from the forward bias I–V data by taking into account the bias dependence ideality factor (n(V)) and effective barrier height (? _e ) for MS and MIS diode. The N _ss values increase from mid-gap energy of CdS to the bottom of the conductance band edge for both MS and MIS diode.     

2,7-Carbazole and thieno[3,4-c]pyrrole-4,6-dione based copolymers with deep highest occupied molecular orbital for photovoltaic cells

Three kinds of donor–acceptor (D–A) type photovoltaic polymers were synthesized based on 2,7-carbazole and thieno[3,4-c]pyrrole-4,6-dione (TPD). The conjugation of weakly electron (e)-donating 2,7-carbazole and strongly e-accepting TPD moieties yielded a deep highest occupied molecular orbital (HOMO) and its energy level was fine-controlled to be −5.72, −5.67 and −5.57 eV through the incorporation of thiophene (T), thieno[3,2-b]thiophene (TT) and bithiophene (BT) as a π-bridge. Polymer:[6,6]-phenyl-C₇₁ butyric acid methyl ester (PC₇₁BM) based bulk heterojunction solar cells exhibited a high open-circuit voltage (V_OC) in the range, 0.86–0.94 V, suggesting good agreement with the measured HOMO levels. Despite the high V_OC, the thiophene (or thienothiophene)-containing PCTTPD (or PCTTTPD) showed poor power conversion efficiency (PCE, 1.14 and 1.25%) because of the very low short-circuit current density (J_SC). The voltage-dependent photocurrent and photoluminescence quenching measurements suggested that hole transfer from PC₇₁BM to polymer depends strongly on the HOMO level of the polymer. The PCTTPD and PCTTTPD devices suffered from electron–hole recombination at the polymer/PC₇₁BM interfaces because of the insufficient energy offset between the HOMOs of the polymer and PC₇₁BM. The PCBTTPD:PC₇₁BM device showed the best PCE of 3.42% with a V_OC and J_SC of 0.86 V and 7.79 mA cm⁻², respectively. These results show that photovoltaic polymers should be designed carefully to have a deep HOMO level for a high V_OC and sufficient energy offset for ensuring efficient hole transfer from PC₇₁BM to the polymer.     

Influence of shunt conduction on determining the dominant recombination processes in CIGS thin-film solar cells

We investigated the transport and photovoltaic properties of Cu(In_1-xGa_x)Se₂ (CIGS) thin-film solar cells. The shunt-current-eliminated diode current could be obtained from the current–voltage characteristics by subtracting the parasitic shunt leakage current from the total current. The temperature dependence of the open-circuit voltage, extracted from the shunt-eliminated (total) current, suggested that the recombination activation energy is comparable to (much less than) the CIGS bandgap. The low-temperature characteristics of the diode ideality factor supported bulk-dominated recombination in the same cell. This suggests that shunt-current subtraction can provide the proper diode parameters of CIGS solar cells.     

All‐optical modulation based on silicon quantum dot doped SiOx:Si‐QD waveguide

All‐optical modulation based on silicon quantum dot doped SiO_x:Si‐QD waveguide is demonstrated. By shrinking the Si‐QD size from 4.3 nm to 1.7 nm in SiO_x matrix (SiO_x:Si‐QD) waveguide, the free‐carrier absorption (FCA) cross section of the Si‐QD is decreased to 8 × 10⁻¹⁸ cm² by enlarging the electron/hole effective masses, which shortens the PL and Auger lifetime to 83 ns and 16.5 ps, respectively. The FCA loss is conversely increased from 0.03 cm⁻¹ to 1.5 cm⁻¹ with the Si‐QD size enlarged from 1.7 nm to 4.3 nm due to the enhanced FCA cross section and the increased free‐carrier density in large Si‐QDs. Both the FCA and free‐carrier relaxation processes of Si‐QDs are shortened as the radiative recombination rate is enlarged by electron–hole momentum overlapping under strong quantum confinement effect. The all‐optical return‐to‐zero on‐off keying (RZ‐OOK) modulation is performed by using the SiO_x:Si‐QD waveguides, providing the transmission bit rate of the inversed RZ‐OOK data stream conversion from 0.2 to 2 Mbit/s by shrinking the Si‐QD size from 4.3 to 1.7 nm.