神龙一号轫致辐射靶靶区回流离子测量

神龙一号直线感应加速器(LIA)产生的强流高功率的脉冲电子束与X光转换靶作用后可以产生高剂量的X光,同时由于转换靶的被烧蚀破坏在靶面产生回流离子,该回流离子的存在影响到电子束的聚焦。设计了4套法拉第筒及其对应的偏压电路,法拉第筒被放置在神龙一号X光转换靶上游不同位置,分布在电子束轴线两侧,电路设计最高偏压为1 kV;对神龙一号LIA的X光转换靶面产生的回流离子进行了实验测量,分别得到回流正离子密度约在1021/m3,离子运动速度可达2～3 mm/s。计算比较表明,该离子流强度与神龙一号靶前电子束流相差很大,只有电子束流强的0.27%,对神龙一号电子束聚焦不会造成影响。     

12MeV直线感应加速器轫致辐射靶靶面回流离子测量

强流直线感应加速器（LIA）能够产生2—3kA、10-20MeV、约80ns（FWHM）的强流高功率的脉冲电子束，经过数十米的传输、聚焦成毫米量级的束斑后打击到轫致辐射靶上，来产生高剂量的X光。同时电子束打靶使靶面沉积大量的能量导致靶面的温度骤然升高，引起靶表面物质或杂质（如碳、氢、水蒸气与靶材料等）被汽化电离而产生等离子体。强流电子束在靶前附近产生的强空间电荷电场（场强可达MV／cm）把离子从靶面拉出，以逆着电子束的方向前进，被称为回流离子。人们提出回流离子与电子束发生作用，会导致电子束被提前聚焦，在预定的靶面形成散焦。     

回流离子源特征分析

强流电子束轰击在辐射转换靶上可产生正离子. 这些离子在电子束空间电荷场作用下回流，对电子束聚焦会有影响，从而可能改变焦斑大小，影响X光机的照相分辨率. 离子种类、离子流的大小是很关注的参量. 本文分析了回流离子来源及其特征，认为回流离子以靶表面杂质热释放后被电子束直接电离生成的离子为主，离子发射受空间电荷限制而非受源限制.     

12MeV LIA轫致辐射靶面回流离子测量

 强流高功率脉冲电子束聚焦成mm量级的束斑后，打击到轫致辐射靶的过程中会产生回流离子，它会导致电子束被提前聚焦，在预定的靶面形成散焦。描述了法拉第筒对12MeV 直线感应加速器的轫致辐射靶面可能产生的离子及其参数进行的实验测量，并对实验结果进行了分析讨论。结果表明在靶前60°~70°方向未发现回流离子。     

闪光机回流离子效应及抑制方法

 采用束包络方程分析了单脉冲和多脉冲情况下回流离子对强流相对论电子束聚焦的影响。分析结果表明,单脉冲情况下通过缩短焦距,仍可以获得较小的积分焦斑,而在多脉冲情况下回流离子将导致电子束完全散焦。通过数值模拟和实验研究了利用薄膜阻挡回流离子的可行性,对不同薄膜在电子束作用下的温升及动力学行为的模拟结果表明,在1.06 μs的时间尺度内,薄膜虽然发生了不同程度的膨胀,但是仍然有足够的材料可以阻挡离子回流。在神龙一号加速器上,通过法拉第筒测量了靶前放置和不放置薄膜情况下的离子信号,实验证实了薄膜至少能够将离子约束在薄膜和转换靶之间长达数十μs。     

聚焦慢速高荷态重离子束微束斑X射线源

利用电子束离子源(EBIS)或者电子束离子陷阱(EBIT)产生的慢速高电荷态重离子束轰击金属靶面,离子束与靶面作用并复合辐射特征X射线;并将高荷态离子束采用离子光学系统会聚为微细束后再与靶面作用,能够辐射出微米甚至亚微米级、纳米级的微束斑X射线.本文介绍这一新型微束斑X射线源的结构、机理及其特性等.     

回流离子动力学行为研究

 建立了强流电子束撞击轫致辐射转换靶而使靶面产生回流离子的物理模型,得到了具有回流离子作用的轫致辐射转换靶前的空间电荷势分布,对可能产生的几种回流离子的运动尺度、回流离子对电子束束斑的影响和利用磁场补偿来消除回流离子的影响的方法进行了计算研究。     

回流离子对强流相对论电子束传输的影响

 介绍了采用双膜法测量神龙一号直线感应加速器靶区回流离子效应的实验工作,通过一片厚度数十μm的靶膜产生回流离子,并采用基于光学渡越辐射的电子束剖面测量系统记录时间分辨的束斑,首次证实了神龙一号加速器靶区存在回流离子。通过采用不同材料的靶膜,实验观测到了不同离子发射情况下回流离子对强流相对论电子束传输的影响,结果发现采用金属靶膜时,回流离子导致电子束部分汇聚、部分发散,而采用聚合物薄膜时,回流离子会导致电子束剖面出现剧烈的变化。     

用集团运动的观点来研究回流离子问题

建立在单粒子运动学基础上的回流离子理论预测: 强流电子束轰击在 辐射转换靶上可能产生正离子. 这些离子在电子束空间电荷场作用下 回流, 会造成电子束过聚焦, 改变焦斑大小, 从而影响X光机的照相分辨率. 然而大量的实验没有发现相关的现象. 本文分析认为, 电子束 打靶时, 在靶表面可能会形成离子鞘层过渡区. 该区域可以抵消束流空间 电荷场对回流离子的驱动作用, 因此, 回流离子可能以等离子体集团扩散的 方式运动. 这种物理图像得到的结论是离子对聚焦的影响可忽略, 和已有的 实验结果相吻合.     

轫致辐射转换靶靶面回流离子对电子束聚焦的影响

 分析了轫致辐射转换靶靶面回流离子产生的机制及其对电子束聚焦的影响,并提出了相应的解决方法。结果表明,H⁺和C⁺轻离子回流约60ns后,将对束聚焦产生严重影响;Ta⁺或W⁺的回流,就短脉冲而言,对束聚焦的影响很小,对长脉冲而言(如脉冲宽度大于200ns),则影响很大。     

相对论电子束在角向磁场中产生硬X射线的实验研究

 在闪光二号加速器上用相对论电子束在低压气体和角向磁场中传输打靶的方法，进行了硬X射线产生的实验研究。在47cm传输距离上，电子束与钽靶作用，获得了面积积分剂量率为2.1×10¹⁰Gy·cm²/s的硬X射线辐射（能谱范围为20～120keV），在总的辐照面积上(4π方向)面积积分剂量达1 843Gy·cm²，X射线转换率达到108Gy·cm²/kJ。     

BioCARS: a synchrotron resource for time‐resolved X‐ray science

BioCARS, a NIH‐supported national user facility for macromolecular time‐resolved X‐ray crystallography at the Advanced Photon Source (APS), has recently completed commissioning of an upgraded undulator‐based beamline optimized for single‐shot laser‐pump X‐ray‐probe measurements with time resolution as short as 100 ps. The source consists of two in‐line undulators with periods of 23 and 27 mm that together provide high‐flux pink‐beam capability at 12 keV as well as first‐harmonic coverage from 6.8 to 19 keV. A high‐heat‐load chopper reduces the average power load on downstream components, thereby preserving the surface figure of a Kirkpatrick–Baez mirror system capable of focusing the X‐ray beam to a spot size of 90 µm horizontal by 20 µm vertical. A high‐speed chopper isolates single X‐ray pulses at 1 kHz in both hybrid and 24‐bunch modes of the APS storage ring. In hybrid mode each isolated X‐ray pulse delivers up to ～4 × 10¹⁰ photons to the sample, thereby achieving a time‐averaged flux approaching that of fourth‐generation X‐FEL sources. A new high‐power picosecond laser system delivers pulses tunable over the wavelength range 450–2000 nm. These pulses are synchronized to the storage‐ring RF clock with long‐term stability better than 10 ps RMS. Monochromatic experimental capability with Biosafety Level 3 certification has been retained.     

基于倒置结构的直接体积重建

通过多个点状探测器在三维空间中的适当分布的排列,得到了基于倒置结构Ｘ射线锥形束投影的直接体积重建三维成像七锥形束边界重建相结合,针对倒置结构构造的重建算法及其数值仿真表明,新的成像模式相对于传统的锥形束边界重建,在实际存在Ｘ射线投影噪声情形下有明显的优点。     

高电荷态离子129Xe28+与Au和Mo表面作用产生的X射线谱

研究了高电荷态离子129Xe28+轰击金属Au和Mo表面产生的特征X射线谱.实验结果表明,在入射离子的电荷态和能量相同的条件下,对于核电荷数较小、原子质量较轻的靶原子,只有其内壳层的电子才能被激发而产生X射线,而核电荷数较大、原子质量较重的靶原子只有其较外壳层的电子能被激发而产生X射线.特征X射线的产额随入射离子动能的增加而增加.     

Fabrication and testing of a newly designed slit system for depth‐resolved X‐ray diffraction measurements

A new system of slits called `spiderweb slits' have been developed for depth‐resolved powder or polycrystalline X‐ray diffraction measurements. The slits act on diffracted X‐rays to select a particular gauge volume of sample, while absorbing diffracted X‐rays from outside of this volume. Although the slit geometry is to some extent similar to that of previously developed conical slits or spiral slits, this new design has advantages over the previous ones in use for complex heterogeneous materials and in situ and operando diffraction measurements. For example, the slits can measure a majority of any diffraction cone for any polycrystalline material, over a continuous range of diffraction angles, and work for X‐ray energies of tens to hundreds of kiloelectronvolts. The design is generated and optimized using ray‐tracing simulations, and fabricated through laser micromachining. The first prototype was successfully tested at the X17A beamline at the National Synchrotron Light Source, and shows similar performance to simulations, demonstrating gauge volume selection for standard powders, for all diffraction peaks over angles of 2–10°. A similar, but improved, design will be implemented at the X‐ray Powder Diffraction beamline at the National Synchrotron Light Source II.     

Influence of different mass absorption coefficient datasets on PIXE yields

Tabulated mass absorption coefficient data from the XCOM, Chantler and ion beam analysis (IBA) Handbook are compared, and differences are shown against X‐ray energy and target atomic number. Over the X‐ray energy range 1–40 keV systematic differences of several tens of percent are noted between these datasets, particularly for the earlier IBA Handbook dataset. The influence of these different mass absorption coefficients on the X‐ray yields for thick target proton‐induced X‐ray emission (PIXE) are investigated and compared as a function of X‐ray energy and target atomic number. For contemporary experimental PIXE users trying to work quantitatively over a broad range of elements and X‐ray energies, differences between PIXE results obtained using these three separate mass attenuation coefficient datasets can be larger than the typical accuracy limits of ±3% to ±5%. There are systematic differences in the mass attenuation coefficients of 5–10% between the XCOM and Chantler, while the differences for the IBA Handbook dataset can be larger (up to 40% and greater) at high X‐ray energies. At this time, we recommend the dataset of Chantler as it is more recent, and the synchrotron experimental results seem to favour it over the older XCOM and IBA Handbook data. Copyright © 2013 John Wiley & Sons, Ltd.     

Polymer electrolyte fuel cell performance degradation at different synchrotron beam intensities

The degradation of cell performance of polymer electrolyte fuel cells under monochromatic X‐ray irradiation at 13.5 keV was studied in galvanostatic and potentiostatic operation modes in a through‐plane imaging direction over a range of two orders of magnitude beam intensity at the TOMCAT beamline of the Swiss Light Source. The performance degradation was found to be a function of X‐ray dose and independent of beam intensity, whereas the degradation rate correlates with beam intensity. The cell performance was more sensitive to X‐ray irradiation at higher temperature and gas feed humidity. High‐frequency resistance measurements and the analysis of product water allow conclusions to be drawn on the dominating degradation processes, namely change of hydrophobicity of the electrode and sulfate contamination of the electrocatalyst.     

X光背光观测烧蚀面扰动引起内界面扰动的增长

 侧向背光照相能直接反映靶表面扰动幅度的变化情况。在神光Ⅱ装置上，实验利用侧向背光照相技术，对烧蚀面扰动引起的内界面扰动增长进行了观测。实验结果表明，观察到的内界面扰动幅度大于期望值。分析认为，造成内界面较大扰动增长的原因主要是2维效应。X光辐照的主要是烧蚀面的中间部分，烧蚀面扰动引起的内界面的扰动就呈现出一幅从中间的扰动区域逐渐过渡到四周的图像。由此，提出了新的靶优化设计方案，应尽可能减小沿背光方向的样品尺寸。     

Application of kinoform lens for X‐ray reflectivity analysis

In this paper the first practical application of kinoform lenses for the X‐ray reflectivity characterization of thin layered materials is demonstrated. The focused X‐ray beam generated from a kinoform lens, a line of nominal size ～50 µm × 2 µm, provides a unique possibility to measure the X‐ray reflectivities of thin layered materials in sample scanning mode. Moreover, the small footprint of the X‐ray beam, generated on the sample surface at grazing incidence angles, enables one to measure the absolute X‐ray reflectivities. This approach has been tested by analyzing a few thin multilayer structures. The advantages achieved over the conventional X‐ray reflectivity technique are discussed and demonstrated by measurements.     

Dose,exposure time and resolution in serial X‐ray crystallography

The resolution of X‐ray diffraction microscopy is limited by the maximum dose that can be delivered prior to sample damage. In the proposed serial crystallography method, the damage problem is addressed by distributing the total dose over many identical hydrated macromolecules running continuously in a single‐file train across a continuous X‐ray beam, and resolution is then limited only by the available molecular and X‐ray fluxes and molecular alignment. Orientation of the diffracting molecules is achieved by laser alignment. The incident X‐ray fluence (energy/area) is evaluated that is required to obtain a given resolution from (i) an analytical model, giving the count rate at the maximum scattering angle for a model protein, (ii) explicit simulation of diffraction patterns for a GroEL–GroES protein complex, and (iii) the spatial frequency cut‐off of the transfer function following iterative solution of the phase problem, and reconstruction of an electron density map in the projection approximation. These calculations include counting shot noise and multiple starts of the phasing algorithm. The results indicate counting time and the number of proteins needed within the beam at any instant for a given resolution and X‐ray flux. An inverse fourth‐power dependence of exposure time on resolution is confirmed, with important implications for all coherent X‐ray imaging. It is found that multiple single‐file protein beams will be needed for sub‐nanometer resolution on current third‐generation synchrotrons, but not on fourth‐generation designs, where reconstruction of secondary protein structure at a resolution of 7 Å should be possible with relatively short exposures.