润滑油膜双色光干涉测量系统的特性研究

基于多光束干涉理论和摄像系统的光谱响应特性,建立了润滑油膜彩色光干涉测量的色度学模型,以红绿双色光干涉测量为例设计了计算机程序复现了油膜厚度测量的干涉图像。双色光干涉的理论计算和实验测量取得了很好的一致性。进一步的计算表明,润滑油膜双色光干涉图像的色彩主要受光源双色光的半峰全宽、析光膜厚度、垫层厚度及润滑介质特性的影响。在所设定的计算参数条件下,双色光的半峰全宽较窄,析光膜厚度为4～10nm和垫层厚度较薄时图像的对比度较高。     

用迈克耳孙干涉仪测肥皂膜厚度实验的分析

利用白光干涉原理,借助迈克耳孙干涉仪对肥皂膜的厚度进行了非接触测量.在干涉条纹宽窄相同的条件下,对不同层数的肥皂膜进行对比测量;在干涉条纹宽窄不同的条件下,对相同层数的肥皂膜进行对比测量;通过计算给出了膜的中心厚度和不确定度,对比分析了各种条件下测量时误差产生的原因.结果表明:单层、双层膜适合在宽条纹下测量,四层膜适合在窄条纹下测量.     

入射角和薄片表面特性对激光干涉测温的影响

以激光干涉为理论基础,采用具有不同表面光学特性的单晶硅片和K-8光学玻璃为样品,针对不同的测量条件,研究干涉条纹对比度变化对温度测量的影响.分析了薄片干涉条纹对比度与测量光束直径、入射角、样品表面粗糙度以及表面镀膜之间的相互关系,研究了薄片的横向温度梯度对干涉对比度的影响.实验结果表明,上述各因素对温度测量参量对比度产生的影响具有规律性,并在一定对比度阈值条件下,能够满足精确测温的条件要求.     

基于CCD采集的Mach-Zehnder干涉条纹图的处理算法

Mach-Zehnder干涉仪适用于研究气体密度迅速变化的状态。由于气体折射率的变化与其密度的变化成正比,而折射率的变化将使通过气体的光线有不同的光程,因此可通过干涉臂变化对干涉条纹图像效果的影响得到气体密度。实测中,采用图像采集卡和CCD来接收Mach-Zehnder干涉仪产生的条纹图像,再通过计算机对条纹图像的条纹间距进行处理,从而得到气体密度的变化状态。从光干涉理论出发,对Mach-Zehnder干涉条纹图像特征进行了分析,建立了Mach-Zehnder干涉条纹的数学模型,并根据此模型设计了处理Mach-Zehnder干涉条纹图像的算法。算法包括图像的预处理(即图像的噪声提取)、图像的二值化及图像的细化。     

环形共光路点衍射干涉仪

建立了一种基于偏振掩膜板与环形共路结构的点衍射干涉仪,通过旋转偏振片可以改变参考光与测试光之间的相对光强,实现干涉条纹对比度的调节,能够获得最高对比度的干涉条纹,并且针对条纹对比度进行了详细的理论分析;由于系统中线性载频幅度极易调节,可以有效地改善傅里叶变换法的相位提取精度;验证性实验被完成。     

提高平板玻璃折射率测量实验中干涉条纹清晰度的方法

用分光仪测量平板玻璃折射率时,如果钠光偏离玻璃法线约25°斜入射,则能观察到清晰的干涉条纹.对上述现象分析,发现其原因在于平板玻璃透射光干涉条纹的衬比度低于反射光干涉条纹的对比度.进而,基于上述分析设计了测量平板玻璃折射率的改进方法.     

四波混频实时光学检测

分析了利用掺铁铌酸锂晶体作介质的简并四波混频及其在干涉计量术中应用的原理,描述了被测透明样品的表面各光波及其干涉形成的透射条纹及反射条纹,利用光折变晶体的介电驰豫特性,求得透射条纹和反射条纹的对比度随时间变化的公式及各参数的相互关系。对由透射条纹及反射条纹计算被测透明物体样品折射率和厚度不均匀性的方法作了数学分析,提出一种新型四波混频实时测量透明物体的光学不均匀性的方法和实验光路,对相关参数对测量过程及测量结果的影响作了探讨,得到了平板玻璃样品的干涉条纹图像,计算出实验结果。     

基于CCD采集的Math-Zehnder干涉条纹图的处理算法

Math-Zehnder干涉仪适用于研究气体密度迅速变化的状态。由于气体折射率的变化与其密度的变化成正比，而折射率的变化将使通过气体的光线有不同的光程，因此可通过干涉臂变化对干涉条纹图像效果的影响得到气体密度。实测中，采用图像采集卡和CCD来接收Math-Zehnder干涉仪产生的条纹图像，再通过计算机对条纹图像的条纹间距进行处理，从而得到气体密度的变化状态。从光干涉理论出发，对Math-Zehnder干涉条纹图像特征进行了分析，建立了Math-Zehnder干涉条纹的数学模型，并根据此模型设计了处理Math-Zehnder干涉条纹图像的算法。算法包括图像的预处理(即图像的噪声提取)、图像的二值化及图像的细化。     

汽车贴膜上出现彩色条纹的机理研究

当戴上偏光眼镜看贴有车膜的汽车前挡风玻璃时会看到一系列彩色条纹,通过理论分析和实验验证,发现汽车贴膜能够产生彩色条纹的原因类似于正交偏振光路中各向异性晶体所产生的消光干涉。在车内观察时,自然光以近似布儒斯特角入射到前挡风玻璃后透射出的光为部分偏振光,此时前挡风玻璃相当于起偏器;车膜就是具有双折射特性的各向异性晶体,部分偏振光通过车膜后形成振动方向相互垂直的o光和e光;偏光眼镜相当于检偏器,o光和e光在检偏器透振方向上的分量相互干涉,当光程差为半个波长的奇数倍时形成与该波长相对应颜色的干涉亮条纹。由于太阳光为复色光,所以随着入射角的变化会产生一系列的彩色等倾干涉圆环。在车外观察时,与在车内观察时类似,主要区别是在贴膜与空气的界面处o光和e光发生反射后再先后通过贴膜和前挡风玻璃返回到车前方,这时用偏光眼镜观察时即可看到彩色干涉条纹。有时如果观察角度和位置合适时,即使不佩戴偏光眼镜也能看到较浅的彩色条纹,这主要是因为光2次通过前挡风玻璃,此时的前挡风玻璃既是起偏镜,又是检偏镜。     

使用背照减薄型CCD的色散型超光谱成像光谱仪中近红外波段干涉条纹现象的研究与校正

使用背照减薄型CCD器件的色散型超光谱成像光谱仪在近红外波段会出现条带状干涉条纹,严重影响其在近红外波段附近的光谱分辨率。为解决该现象,建立了类似于法布里-珀罗干涉仪的多光束干涉模型,估算出700~900 nm范围内干涉条纹的强度分布并以实测数据对该模型进行了验证,分析了CCD光敏区厚度和干涉现象之间的关系。在此基础上,采用包括频域滤波在内的改进的平场校正算法,对干涉条纹的图像进行了校正,在751.83～1 010.04 nm的范围内,校正效率达到96.6%,试验结果表明,该算法可有效的消除超光谱成像光谱仪近红外波段上的干涉条纹现象,提高光谱分辨率。     

Anomalous wave interference at Z3-exciton resonance of CuCl

The transmission and the reflection spectra of a thin CuCl single crystal of 0.15μ thickness have been measured in the Z₃-exciton resonance region at 1.6K by using a weak dye-laser light as a light source. Well resolved interference fringes have been obtained over the exciton resonance. In the higher energy region than the longitudinal exciton's energy, the separation of adjacent fringes cannot be explained by interference of the lower branch polariton waves (LBP) or the upper branch polariton waves (UBP). These structures have been explained by the mutual interference effect between the UBP and LBP waves, anomalous waves. This has been confirmed by the measurements of two-photon absorption due to the excitonic molecule via respective polariton states.     

Measurement of wedge angle of a transparent parallel plate using quasi-monochromatic light source and phase shifting interferometry

A new technique (to our knowledge), for the measurement of residual wedge angle (RWA) of high optical quality transparent nearly parallel plate (PP), using a quasi-monochromatic light source, is presented. Advantages and drawbacks of the technique and the results obtained for a PP, using a filtered white light source, is discussed. A slightly modified optical setup for accurate determination of RWA, using phase shifting interferometry (PSI), has been described. Results obtained, applying PSI, for a validation experiment and for the determination of RWA of a quasi-PP is presented. The PSI based technique does not suffer from any measurement ambiguities due to limitation in effective beam aperture. Hence the technique is suitable for high accuracy measurement of RWA of PP. In both the optical setups, presented in this paper, the respective interfering beams travel the same optical circuit and are thus subject to same perturbation in optical path, due to external mechanical vibration, which finally cancels out. Thus the measurements are much less affected by external vibrations. Since the respective interfering beams undergo identical reflections and transmissions, the visibility or contrast of the interference fringes is very good.     

迈克尔逊干涉仪测透明介质厚度及折射率

提出了使用用迈克尔逊干涉仪,改变光源入射方式及观测方式以获得稳定、清晰等厚干涉现象的方法.探究了在光路中插入的被测透明介质如何对等厚干涉条纹产生影响,并导出了被测介质厚度、折射率及旋转角度与等厚干涉条纹移动量之间的关系.实现对透明介质厚度、折射率进行简练、快速的同时测量.     

Spectral domain optical coherence tomography with sub-micrometer sensitivity for measurement of central corneal thickness

We demonstrated a method for measurement of central corneal thickness(CCT) with a sub-micrometer sensitivity using a spectral domain optical coherence tomography system without needing a super broad bandwidth light source. By combining the frequency and phase components of Fourier transform, the method is capable of measurement of a large dynamic range with a high sensitivity. Absolute phases are retrieved by comparing the correlations between the detected and simulated interference fringes. The phase unwrapping ability of the present method was quantitatively tested by measuring the displacement of a piezo linear stage. The human CCTs of six volunteers were measured to verify its clinical application. It provides a potential tool for clinical diagnosis and research applications in ophthalmology.     

非接触法自动测量薄膜厚度

根据白光等厚干涉原理,基于单片机改造的迈氏干涉仪用于自动测量透明薄膜厚度,采用非接触性测量法。当迈克尔逊干涉仪静镜形成的虚像与动镜相交所成的夹角很小时,在光屏上看到彩色干涉条纹,插入薄膜后,光程差改变,彩纹消失。步进电机带动微调手轮转动,当彩纹再次出现,即可得出透明薄膜厚度。     

用数值模拟方法研究面光源劈尖干涉问题

在面光源照射下,给出了劈尖表面可观察到干涉条纹的条件,通过Matlab软件进行数值计算,分析了劈尖表面的干涉条纹数目对光源距离和尺寸的依赖关系,结果表明,对给定的光源宽度,要在劈尖表面观察到一定级数的条纹,光源距离不能低于一定的值．这种数值模拟方法对设计复杂的非平行光薄膜等厚干涉试验有参考价值．     

一个新颖的白光干涉实验的开发与研究

开发了一个获得白光条纹的新实验.把劳埃镜干涉和光栅衍射结合起来,有可能使白光源产生的不同颜色的条纹彼此重合,从而能观察到清晰的黑白条纹.讨论了有关的实验原理、装置和方法,介绍了主要的实验关键并提供了相应的测量数据.     

High sensitivity micro-displacement homodyne interferometry北大核心CSCD

Interferometry is widely used in nano-scale micro-topography measurement. In order to improve its accuracy and sensitivity, a high-sensitivity homodyne interferometry based on white light interference and laser secondary interference was proposed. A high-sensitivity homodyne interferometry system was designed, and the zero point of the laser secondary interference was used to locate the dark striation of white light interference, so that it could reach the maximum slope when optical path difference was zero. The signals of white light and laser were analyzed by using the wave principle and intensity formula of interference fringes, and a sensitivity calculation method based on the combination of white light and laser interference signal was proposed. The system and its sensitivity were simulated. Finally, the optical path was built, and the white light interference fringes were adjusted to the dark striations position, so as to locate the zero position of laser secondary interference and carry out the data acquisition. It is showed that the sensitivity of the measurement method is at least 1 832 times higher than that of the laser secondary interference, and the corresponding measurement uncertainty is only ±0.288 7 mV. The measurement system can effectively solve the problem of large amount of calculation in traditional interferometry, and has high sensitivity, stability and reliability. Copyright ©2022 Journal of Applied Optics. All rights reserved.     

一种基于F-P标准具的金属线膨胀系数测量方法

本论文提出一种基于F-P标准具的金属线膨胀系数测量方法.该方法利用光杠杆将金属棒受热膨胀时的伸长量转化为F-P标准具干涉光场中干涉条纹半径的变化,通过测量干涉条纹的间距便可实现对金属线膨胀系数的测量.由于该方法仅需测量F-P标准具干涉光场中外侧条纹的间距,并且F-P标准具的多光束等倾干涉可以产生锐利的干涉条纹,因此测量过程更加简便,实验结果的精确度更高.通过实验测量验证了该方法的可行性与可靠性.