大气压等离子体炬电子密度的光谱诊断

利用空心针-板放电装置产生了大气压等离子体炬,采用光谱法测量了其内部及表面的电子密度. 向空心针中通入氩气,在大气环境中产生了长度为1cm的等离子体炬.实验分别测量了Hα谱线和ArⅠ(696.54nm)谱线,通过反卷积方法分离出其相应的Stark展宽,并由此计算了电子密度.结果发现,采用Hα谱线和ArⅠ(696.54nm)谱线Stark展宽计算得到的等离子体的电子密度分别为1.0×10¹⁵cm^－3和3.78×10^{15关键词： 等离子体炬 电子密度 气体温度 Stark展宽}     

He2+离子和H2,O2分子碰撞过程中电子俘获和靶激发的发射截面

实验结果表明:在He²⁺和H₂,O₂碰撞过程中存在着双电子俘获而产生激发态的过程,同时也存在着单电子俘获而产生激发态的过程。在靶H₂,O₂直接激发过程中,测量到了巴耳末系H_α,H_β,H_γ和OI的发射谱。本文给出随入射离子速度变化的Hel,Hell和H_α,H_β,H_γ,O 关键词：     

Stark线形与ICF等离子体诊断

本文理论计算了ICF等离子体中离子或原子的发射谱线线形函数,该线形主要是由Stark效应产生的.我们的研究表明该谱线线形函数的宽度随电子温度变化很缓慢,而随电子密度变化很敏感.结合局部热动平衡理论,并利用实验测量的氩(Ar)和硫(S)的α线与β线的线强比,分别估算出等离子体的电子温度为885 eV和793 eV.通过理论计算的Stark线形函数与ICF实验谱线的比较,估算出ICF等离子体的电子密度Ne=1.0×1024.     

低压下直流电弧热等离子体射流电子密度的光谱法测量

采用原子发射光谱仪研究低压直流电弧热喷涂等离子体射流的特性。利用Stark展宽法采集H_β谱线,使用其Δλ_1/2来计算等离子射流中的电子密度,研究了氢气流量、输入功率和探测距离对等离子体射流中电子密度的影响。使用Saha方程计算热等离子体的电离程度,研究了功率/氢气流量与等离子体电离程度的关系。结果表明:电子密度和电离程度随着电流强度的增大而增加;氢气流量增加可以明显提高等离子体射流的能量,但对电离程度影响不大。     

1.39 μm附近H2O谱线参数测量及其在燃烧动力学中的应用

将可调谐半导体激光吸收光谱技术应用于高温气体浓度在线检测,谱线参数的准确性非常重要。为利用红外波段进行燃烧生成H₂O的浓度在线测量,需要实验校准H₂O的谱线参数,尤其是Ar加宽系数,该系数对燃烧反应速率测量和机理验证至关重要。采用半导体激光器作为光源,结合实验室搭建的谱线参数测量系统,采集了1.39 μm波段附近H₂O的4条吸收谱线信号,获得了谱线线强、自加宽系数和N₂加宽系数,与HITRAN数据库和文献结果进行了对比,均吻合较好。首次系统地获得了该波段谱线的Ar加宽系数。在谱线参数确定基础上,获得了在反射激波高温条件下H₂/O₂/Ar燃烧生成H₂O的浓度随时间的演变曲线,验证了相应燃烧动力学机理。结果为利用该波段进行含氢燃料燃烧过程H₂O浓度测量及相关高温燃烧动力学研究提供了可靠的实验依据。     

激光诱导煤样等离子体的表征

以脉冲Nd·YAG激光器泵浦的光学参量发生/放大器输出为激发源,获得了一种家庭用煤样品的激光诱导等离子体(laser induced plasma,LIP)发射光谱。谱线线型呈洛伦兹线型,表明等离子体加宽以Stark展宽为主。利用发射谱线的Stark展宽和强度,通过测量等离子体不同位置的发射光谱,确定了等离子体温度和电子密度的空间分布,发现二者在垂直等离子体发光火焰方向相对火焰中心对称分布,沿发光火焰方向不具有对称分布的特点。发光火焰中心的等离子体温度和电子密度最大,且发光强度较大,因此利用光谱技术测量等离子体特征量时,宜采集火焰中心的发射光谱。样品中有些元素的发射谱线线型显示,等离子体中存在很强的自吸收现象,自吸收程度和激发波长及激光能量密切相关,激发波长接近谱线中心波长时,自吸收现象最明显;随激光能量的增加,发射光谱强度增加的同时,自吸收的程度也增大。把这些现象归因于原子跃迁概率的增大及激光强度增加引起的等离子体中粒子数密度的增大。自吸收现象导致实验观测到的发射谱线强度小于LIP的真实辐射强度,对等离子体进行测量时,应选取不存在自吸收现象的谱线,以便于提高测量准确度。     

利用Hβ线的Stark加宽计算激光诱导Cu等离子体的电子密度

潮湿空气中,利用Nd:YAG脉冲激光烧蚀Cu靶获得等离子体发射光谱,依据谱线波长和相对强度等信息计算了等离子体的电子温度;在此基础上,分别用三种方法由Hβ线的Stark加宽计算得到电子密度,并对结果进行了比较分析,证实：对于电子密度在1015~1016cm-3范围内的等离子体,用Hβ谱线测量电子密度是可靠的. 讨论了等离子体电子温度和电子密度在垂直于靶面方向的空间分布,并从产生机制的角度解释了等离子体的传播过程.     

仪器展宽对大气压等离子体电子密度测量的影响

实验使用两台不同的单色仪,采用光谱线型法测量了大气压氩气介质阻挡放电中的电子密度.诊断结果表明,由于不同的单色仪其仪器加宽不同,仪器加宽对总的光谱线型有较大影响.通过考虑等离子体中的各种加宽机制,采用卷积和反卷积的方法对氩原子发射谱线线型进行了分析,从整个光谱线型中分离出Stark线型,排除了仪器加宽对最终诊断结果的影响.从而最终测量了大气压氩气介质阻挡放电中的电子密度.测量得到在大气压氩气介质阻挡放电中单个放电丝存在时,电子温度为10000K时,电子密度约为3.05-3.26×1021 m-3.此方法不仅可以应用在大气压介质阻挡放电中,还可以用于测量其它大气压等离子体电子密度.     

Al激光等离子体Stark加宽光谱观测

用YAG脉冲激光器产生的1.06μm激光,在高真空下轰击Al靶,观测到9条AlⅠ,AlⅡ和AlⅢ的等离子体谱线。利用高分辨率双光栅单色仪和光学多道分析仪(OMA),对谱线的Stark加宽和线型进行了测量。得到Al等离子体的电子密度沿靶面法向的分布,测得电子密度在1.0×l017～1.l×l018cm-3范围。利用谱线峰值法估算了等离子体的温度约为1.5×l05K。测量结果与半经典理论的计算基本符合     

等离子体效应对类氦氖Kα线系电偶极辐射的影响

采用离子球模型，通过自洽求解Boltzmann方程和Poisson方程，得到类氦氖离子Kα线系的两条电偶极辐射光谱能量随等离子体环境的漂移.结果显示，Kα线系电偶极谱线随等离子体电子密度增大发生红移，红移量与等离子体电子密度有近似的正比关系；随着等离子体电子温度的降低，光谱红移对等离子体电子密度的敏感性增大.另外，所研究的两条谱线间的能量间隔随等离子体电子密度的增大而减小，减小量随等离子体电子密度的变化也呈现出近似的线性规律.值得注意的是，类氦氖Kα线系中两条电偶极谱线分别为互组合线与共振谱线，而其能量差就是1s2p(³P₁)的交换能，因此进一步发现能级中交换能将随等离子体环境变化的规律.所观察到的光谱红移和精细结构分裂在高密度等离子体中都有明显的变化，对探索高密度等离子体的诊断新方法有重要意义. 关键词： 光谱漂移 交换能 等离子体 类氦离子     

Determination of the Electron Density in an Argon Laser Plasma by Spectroscopy of the Hydrogen Hα and Hβ Lines

From measurements of the H_α and H_β spectral line profiles in a plasma, a method is developed which allows to separate the contributions of Doppler and Stark broadening. This method is superior to the deconvolution of Voigt profiles, in particular, when the lines are of low intensity. The electron density in the plasma can be calculated from the Stark broadening. An example is the low pressure (p ≈ 1 hPa) arc discharge of argon ion lasers which is characteristised by electron densities of approximately 10¹⁴ cm^?3 at heavy particle temperatures of about 10⁴ K. These plasma parameters lead to a broadening of the Balmer H_α and H_β spectral lines of hydrogen, which has a low concentration within the discharge area. The spectral lines are broadened due to the electron density dependent Stark effect and the temperature responsive Doppler effect. The results are consistent with predictions of the argon ion laser modelling.     

Line broadening studies in low energy plasma focus

Optical emission spectroscopic studies were carried out to characterise the plasma leading to the estimation of two plasma parameters, electron density and temperature. These experiments were conducted on a 2 kJ plasma device which is equipped with squirrel cage electrode configuration enclosed in a glass vacuum chamber filled with hydrogen at a pressure of 5 mbar. Spectral emissions obtained from each flash were photographed in the region of 4000–6000 Å using one metre Czerny-Turner spectrograph cum monochromator. Detailed examination of the observed features showed that theH _β andH _λ lines of hydrogen showed significant broadening of the order of 35 Å FWHM which is due to Stark effect expected in high density plasmas. Further several atomic lines of Cu and Zn from the electrode material (brass) showed broadening which was due to quadratic Stark effect. A comparative study of the broadening of lines obtained in DC arc, hollow cathode and plasma focus was made. Electron density from Stark broadened hydrogen lines and quadratic Stark Coefficient C₄ for the CuI and ZnI lines were evaluated. The excitation temperature was determined from the line intensity ratio method using CuI lines.     

感应磁场压缩下氢等离子体中巴耳末系谱线的斯塔克加宽

本工作研究感应磁场压缩下,氢等离子体中的巴耳末系谱线的斯塔克加宽。电容器对围绕在放电管外部的线圈放电,产生交变轴向磁场,使放电管中氢气离化、压缩与加热。放电周期14微秒,放电电压20千伏,最大电流165千安,初始工作气压2.0×10^-1毫米汞高。用照相方法研究H_β和H_γ的轮廓。这些谱线有显著的加宽。在整个发光阶段中,H_β的平均半宽度为14—16(埃),H_γ为18—19(埃),相应的离子密度为1.7—2.5×10¹⁶厘米^-3。实验轮廓与Griem,Kolb和Shen的理论较为接近,与Holtsmark理论相差较远。光电测量进一步表明:H_β的轮廓随着时间而改变,相应的离子密度亦在改变。在放电的第三半周期初级电流极大时,离子密度最大,达到3.2×1O¹⁶厘米^-3,为初始氢原子密度的2.2倍。     

无扩散相变中界面动力学的唯象理论及其应用

固态相变中相界面或畴界面的平均运动速度V与有效相变驱动力△G＇(相变驱动力△G与相界面运动阻力△G_R之差)之间的关系可表示为V=φ(△G—△G_R)。当有单向变化的外场(场强为ξ,变化速率为ξ)作用于相变系统并能诱导相界面运动时,就会产生母相/新相间的转变。在相变过程中同时叠加一个交变应力时,则可计算得界面动力学关系V=φ(△G—△G_R)与相变过程内耗Q^-1、相关的模量亏损(△M/M)、相变速率dF/dξ、相变应变ε₀间的关系为 [d lnφ(△G-△G_R)/d(△G-△G_R)]= Q^-1ω/n²M(dF/dξ)ξ = (△M/M)ω/nMε₀(dF/dξ)ξ, 以及 (△M/M)/Q^-1=ε₀/n。此处ω为交变应力的圆频率,M为与振动模式有关的弹性模量,n为应力与界面运动的耦合因子。因此,界面动力学关系式的通解为 V = ∑(±n)/(α≠-1) A_α exp{[(△G-△G_R)/△G_α^*]^{α+ 1}/(α+ 1)} +∑(m)/(β₀) A_β[(△G-△G_R)/△G_β^*]^β 此处n,m为正整数。上式中的各项参数可由实验数据确定。此外,(△M/M)/Q^-1的等式还可用于判别相变过程的模量亏损中有无声子模软化的贡献。 关键词：     

Experimental Stark broadening studies of the CI transition 3s1P1o ? 3p1S0 at 833.5 nm

Experimental Stark broadening studies of the infrared CI transition 3s ¹ P ₁ ^o − 3p ¹ S ₀ at 833.5 nm are reported for the first time. A high-current wall-stabilized arc, operated in a mixture of helium, argon, carbon dioxide and hydrogen, was applied as the plasma source. Radiation emitted from homogeneous and optically thin plasma layers was analyzed. Stark broadening studies of the selected CI transition and the hydrogen Balmer β line were performed. As expected from theoretical considerations, the CI line width depends linearly on the electron density of the plasma. Applying theoretical Stark broadening data for the H _gb line, the measured Stark widths of the CI line were calibrated for the purpose of electron density determination in low temperature plasmas.     

高气压微波氢等离子体发射光谱诊断

在2.45GHz,800W级的高气压微波等离子体放电系统中,通过测量不同微波功率和放电气压下氢等离子体的Balmer线系的发射光谱,从测量的谱线总展宽中卷积去掉具有高斯线形的Doppler展宽和仪器展宽得到谱线的Stark展宽,并通过Stark展宽测量氢等离子体的电子数密度和电场强度。结果表明:等离子体的电子数密度和电场强度随着放电气压的升高都是先增大后减小,随着微波功率的增加呈现逐渐增大的趋势。微波功率为800W时,气压在25kPa时电子数密度和电场强度都达到最大值,等离子体的电子数密度和内部的电场强度分别为3.55×1012cm-3及4.01kV/cm。     

Measurement of the Stark broadening parameters of some singly ionized argon lines

Half-widths of fifteen Stark broadened argon II lines have been measured in argon plasma behind the reflected shock wave produced in an electromagnetically driven “T” tube. The plasma electron density was determined by the laser interferometry at three different wavelengths, while the plasma temperature was measured from relative intensities of A II lines. Temperatures were in the range 8,500–16,500 °K; electron densities varied from 1.82 to 3.94 · 10¹⁷ cm^?3. The measured A II linewidths are compared with theoretical and other experimental results. It is shown that a) the broadening of A II lines is in good agreement with the theory, b) line broadening increases linearly with electron density, and c) the Stark broadened lines follow the dispersion profile to the distance of at least three halfwidths from the line center.     

Calculation of the H α line profile in a high-temperature plasma

A new method for calculating broadening of the H _α line profile in a high-temperature plasma is proposed. Using the new program H-ALPHA, one can calculate the H _α line profile with an error smaller than 3% in a wide range of electron temperatures and densities (T _e=1–500 eV, n _e=10¹⁴?10¹⁷ cm^?3). On the basis of these calculations, a method for the measurement of plasma temperature and density from the experimental H _α line profile is developed. The experimental tests of the method showed a good agreement with the diamagnetic measurements.     

Stark broadening of isolated lines: calculation of the diagonal multiplet factor for complex configurations (n1l1 n n2l2 m n3l3 p)

Owing to the increasing sensitivity of detectors, accurate line profiles are needed for accurate stellar atmospheres modelling and for laboratory and technological plasmas as well. So, Stark broadening parameters of isolated lines of complex atoms and ions within the impact and quasistatic approximation are needed, even if the atomic abundance of the considered element is low. Angular factors of the diagonal line strength entering the quadrupole term appearing in the semi-classical expression of the width of line broadened by electron or ion perturbers, are needed. The aim of this paper is to extend the previous calculations of this diagonal multiplet factor which were obtained for configurations of the type lⁿ and l₁ ⁿl₂ ^m to more complex configurations in LS coupling. To study the Stark broadening of isolated lines in the impact and quasistatic approximation, we use the semi-classical-perturbation treatment, including both dipole and quadrupole contribution in the expansion of the electrostatic interaction between the optical electron and the perturber. We also use the Fano-Racah algebra. Angular factors of the diagonal line strength entering the quadrupole term appearing in the semi-classical expression of the width of line broadened by electron or ion perturbers, are calculated. New diagonal multiplet factor formulae for more complicated configurations such as (n₁l₁ ⁿ(L_nS_n)n₂l₂ ^m(L_mS_m)n₃l₃ ^p(L_pS_p)) are provided. These formulae can enter the computer Stark semi-classical perturbation codes.