Electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using mixed solvents of water/methanol and water/2‐propanol as projectile droplets

The electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using charged electrospray water droplets realized the atomic and molecular level etching with leaving little damage on the surface. In this work, the binary mixtures of water and alcohols (methanol and 2‐propanol) were examined as the charged electrospray droplets. The increase of desorption efficiency and softer ionization are observed for rhodamine B and bradykinin with higher content of alcohols. The etching rates for SiO₂ and polystyrene 35000 were found to be more or less the same for 100% H₂O and H₂O/MeOH projectiles. However, 60 vol.% 2‐propanol gave much lower etching rates than the water/methanol system for polystyrene 35000. This indicates that there is a marked difference in the energy dissipation processes between methanol and 2‐propanol projectiles for soft‐material target. Copyright © 2014 John Wiley & Sons, Ltd.     

Surface characterization and depth profiling of biological molecules by electrospray droplet impact/SIMS

Electrospray droplet impact (EDI) was applied to the analysis of peptides. The etching rate of bradykinin was estimated to be ~2 nm/min. This value is about one order of magnitude greater than the etching rate for SiO₂ (0.2 nm/min). Considering that the etching rate of argon cluster ions Ar₇₀₀⁺ for organic compounds is more than two orders of magnitude larger than that for inorganic materials, the rather small difference in etching rates of EDI for organic and inorganic materials is unique. When water/ethanol (1/1, vol%) solution of gramicidin S and arginine was dried in air, [gramicidin S + H]⁺ was observed as a predominant signal with little [Arg + H]⁺ right after the EDI irradiation, indicating that EDI is capable of detecting the analytes enriched on the sample surface. Copyright © 2011 John Wiley & Sons, Ltd.     

Study on the redox reactions for organic dyes and S‐nitrosylated peptide in electrospray droplet impact

Reduction of analytes in ionization processes often obscures the determination of molecular structure. The reduction of analytes is found to take place in various desorption/ionization methods such as fast atom bombardment (FAB), secondary ion mass spectrometry (SIMS), matrix‐assisted laser desorption/ionization (MALDI) and desorption ionization on porous silicon (DIOS). To examine the extent of the reduction reactions taking place in electrospray droplet impact (EDI) processes, reduction‐sensitive dyes and S‐nitrosylated peptide were analyzed by EDI. No reduction was observed for methylene blue. While methyl red has a lower reduction potential than methylene blue, the reduction product ions were detected. For S‐nitrosylated peptide, protonated molecule ion [M + H]⁺ and NO‐eliminated molecular ion [M − NO + H]^+• were observed but reduction reactions are largely suppressed in EDI compared with that in MALDI. As such, the analytes examined suffer from little reduction reactions in EDI. Copyright © 2008 John Wiley & Sons, Ltd.     

Study on ion formation in electrospray droplet impact secondary ion mass spectrometry

A new type of cluster secondary ion mass spectrometry (SIMS), named electrospray droplet impact (EDI), has been developed in our laboratory. In general, rather strong negative ions as well as positive ions can be generated by EDI compared with conventional SIMS. In this work, various aspects of ion formation in EDI are investigated. The Brønsted bases (proton acceptor) and acids (proton donor) mixed in the analyte samples enhanced the signal intensities of deprotonated molecules (negative ions) and protonated molecules (positive ions), respectively, for analytes. This suggests the occurrence of heterogeneous proton transfer reactions (i.e. M + M′ → [M+H]⁺ + [M′? H]^?) in the shockwave‐heated selvedge of the colliding interface between the water droplet and the solid sample deposited on the metal substrate. EDI‐SIMS shows a remarkable tolerance to the large excess of salts present in samples. The mechanism for desorption/ionization in EDI is much simpler than those for MALDI and SIMS because only very thin sample layers take part in the shockwave‐heated selvedge and complicated higher‐order reactions are largely suppressed. Copyright © 2007 John Wiley & Sons, Ltd.     

XPS depth analysis of metal/polymer multilayer by vacuum electrospray droplet impact

Recently, the vacuum electrospray droplet impact (V‐EDI) was developed as a cluster ion beam source in our laboratory. In this work, V‐EDI was applied to polymers [polyimide (PI) and polycarbonate (PC)] and metal/polymer multilayer samples (Au/PI and Au/PC). We compared the etching performance of V‐EDI with that obtained by the conventional atmospheric‐pressure EDI (A‐EDI). The nonselective etching was observed for organic and also inorganic samples by V‐EDI as by A‐EDI. Etching rates for the metal and polymer analysis by V‐EDI were almost the same as those observed by A‐EDI. The interlayer components were clearly observed by V‐EDI for multilayer samples of Au and synthetic polymers. Copyright © 2014 John Wiley & Sons, Ltd.     

Direct profiling of saccharides,organic acids and anthocyanins in fruits using electrospray droplet impact/secondary ion mass spectrometry

Electrospray droplet impact (EDI)/secondary ion mass spectrometry (SIMS) is a new desorption/ionization technique for mass spectrometry in which highly charged water clusters produced from atmospheric‐pressure electrospray are accelerated in vacuum by several kV and impact on the sample deposited on the metal substrate. In this study, we applied EDI/SIMS directly to fruits, such as bananas, strawberries, grapes and apples. The major components in the fruits – fructose, glucose, sucrose and organic acids – could be observed with strong signal intensities. EDI/SIMS was also applied to the analysis of different regions of strawberries and apples. Compared with matrix‐assisted laser desorption/ionization (MALDI), ion signals with lower background signals could be obtained, particularly for the low molecular weight analytes. Copyright © 2010 John Wiley & Sons, Ltd.     

The analysis of industrial synthetic polymers by electrospray droplet impact/secondary ion mass spectrometry

Electrospray droplet impact (EDI)/secondary ion mass spectrometry (SIMS) is a new desorption/ionization technique for mass spectrometry in which highly charged water clusters produced from the atmospheric‐pressure electrospray are accelerated in vacuum by several kV and impact the sample deposited on the metal substrate. In this study, several industrial synthetic polymers, e.g. polystyrene (PS) and polyethylene glycol (PEG) were analyzed by EDI/SIMS mass spectrometry. For higher molecular weight analytes, e.g. PS4000 and PEG4600, EDI/SIMS mass spectra could be obtained when cationization salts are added. For the polymers of lower molecular weights, e.g. PEG300 and PEG600, they could be readily detected as protonated ions without the addition of cationization agents. Anionized PS was also observed in the negative ion mode of operation when acetic acid was added to the charged droplet. Compared to matrix‐assisted laser desorption/ionization (MALDI), ion signal distribution with lower background signals could be obtained particularly for the low‐molecular weight polymers. Copyright © 2009 John Wiley & Sons, Ltd.     

Sputtering properties for polyimide by vacuum electrospray droplet impact (V‐EDI) using size‐selected cluster ions

Recently, the vacuum electrospray droplet impact (V‐EDI) was developed as a cluster ion beam source in our laboratory. To attain the ion beam stability and compact design of the ion source, a silica nano‐capillary with 15 µm i.d. was used as the emitter of the beam. It was found that stable electrospray was generated from the capillary tip without the use of laser heating when aqueous solution of 20% ethanol was used. The m/z distribution of electrospray droplets was measured by pulsing the primary beam. By assuming that the charged droplets contain 50% of the excess charges defined by the Rayleigh limit equation, the average mass, and charge of the droplets generated by the present V‐EDI are estimated as 2.5 × 10⁸ u and + 625 charges, respectively, i.e. [(H₂O)_14,000,000 + 625H]⁶²⁵⁺. By chopping the primary cluster beam, clusters composed of smaller m/z clusters (group 1: G1, [(H₂O)_46,000 + 36H]³⁶⁺) and those of larger m/z clusters (group 2: G2, [(H₂O)_560,000 + 125H]¹²⁵⁺) were generated. Surface analysis for polyimide (PI) film by X‐ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) was made using G1, G2, and non‐selected cluster beams. No selective etching was observed when G1, G2, and non‐selected beams were used. However, larger surface roughening was observed when smaller size cluster beams were used. This suggests that larger size clusters cure the surface damage caused by the smaller ones. Copyright © 2016 John Wiley & Sons, Ltd.     

Functional silver nanostructured surfaces applied in SERS and SIMS

Present article deals with functionality of silver nanostructured surfaces prepared by potentiostatic electrochemical deposition on the paraffin impregnated graphite electrode as template‐free substrates. The effect of the electrodeposition conditions on two silver surface functions: analytical signal enhancement in Surface‐enhanced Raman spectroscopy and pre‐ionization function, applied in secondary ion mass spectrometry (SIMS) is reported. Functional silver nanostructured substrate was prepared at a potential ?850 mV with a deposition duration of 20 min. Analytical signal enhancement factors of 3.2 ×10⁵ for Raman peak at 649 cm^?1, 3.0×10⁵ for peak at 810 cm^?1 and 2.7×10⁵ for peak at 1539 cm^?1 were determined for Rhodamine 6G at deposited surface. Slight pre‐ionization effect has been observed in SIMS, and 1.2×10⁵ fold signal enhancement was established for fragment of Rhodamine 6G with m/z 429 (M‐CH₃‐Cl). Electrochemical preparation of nanostructures represents a step towards surface integration directly into miniaturized systems and sensors. Copyright © 2013 John Wiley & Sons, Ltd.     

Direct analysis of lipids in mouse brain using electrospray droplet impact/SIMS

Electrospray droplet impact (EDI)/secondary ion mass spectrometry (SIMS) is a new desorption/ionization technique for mass spectrometry in which highly charged water clusters produced from the atmospheric‐pressure electrospray are accelerated in vacuum by 10 kV and impact the sample deposited on the metal substrate. EDI/SIMS was shown to enhance intact molecular ion formation dramatically compared to conventional SIMS. EDI/SIMS has been successfully applied to the analysis of mouse brain without any sample preparation. Five types of lipids, i.e. phosphatidylcholine (PC), phosphatidylserine, phosphatidylinositol (PI), galactocerebroside (GC) and sulfatide (ST), were readily detected from mouse brain section. In addition, by EDI/SIMS, six different regions of the mouse brain (cerebral cortex, corpus callosum, striatum, medulla oblongata, cerebellar cortex and cerebellar medulla) were examined. While GCs and STs were found to be rich in white matter, PIs were rich in gray matter. Copyright © 2010 John Wiley & Sons, Ltd.     

Primary-particle-beam-induced reduction of silver acetate in glycerol solutions to form a silver mirror

The liquid SIMS mass spectra of silver acetate dissolved in a glycerol matrix is discussed, with emphasis on the formation of a ‘silver mirror’ on the surface of the glycerol droplet owing to reduction of the silver acetate. Silver clusters containing up to three silver atoms have been observed from this mirrored surface; Ag₃⁺ cluster ions are not observed in the spectrum when conditions are such that the mirror is not formed. For example, use of a slightly oxidizing matrix (o-nitrophenyl octyl ether or m-nitrobenzylalcohol) prevents formation of the ‘mirror’; only Ag⁺ is sputtered from this surface.     

X‐ray photoelectron spectroscopy depth analysis of metal oxides by electrospray droplet impact

The electrospray droplet impact (EDI) method is a newly developed etching method using extremely large charged water cluster ions with masses of several 10⁶ u. This work presents a comparative XPS study of chemical states of the transition metal oxides, TiO₂ and Ta₂O₅, etched by Ar⁺ and EDI. Selective sputtering of oxygen was observed by Ar⁺ etching for these samples, but no chemical modification took place by EDI. This finding provided further evidence that EDI has the capability of nonselective etching for both inorganic and organic materials. Copyright © 2011 John Wiley & Sons, Ltd.     

Electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using NaF and AgF as cationization matrices

In our previous paper, it was suggested that metal fluorides may be useful as cationization matrices in Electrospray droplet impact/SIMS. In this work, NaF and AgF were used as the cationization matrices for cyclodextrin (CD), polyethylene glycol (PEG), polystyrene (PS), garlic juice, and sliced raw rice. EDI mass spectra were measured without and with the use of matrices. Enhancement of ion abundances of [M + Na]⁺ for CD and PEG with NaF matrix and that of [M + Ag]⁺ for PS with AgF matrix were observed. However, the addition of matrices was not effective for the cationization of garlic juice and sliced raw rice samples. This may be due to the Coulombic repulsion of the reagent ions of Na⁺ or Ag⁺ with the preformed K⁺ adducts of oligosaccharides already present in the samples. Copyright © 2015 John Wiley & Sons, Ltd.     

Repair of defects created by Ar+ sputtering on graphite surface by annealing as confirmed using ToF‐SIMS and XPS

Defects were created on the surface of highly oriented pyrolytic graphite (HOPG) by sputtering with an Ar⁺ ion beam, then characterized using X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) at 500°C. In the XPS C1s spectrum of the sputtered HOPG, a sp³ carbon peak appeared at 285.3 eV, representing surface defects. In addition, 2 sets of peaks, the C_x⁻ and C_xH⁻ ion series (where x = 1, 2, 3...), were identified in the ToF‐SIMS negative ion spectrum. In the positive ion spectrum, a series of C_xH₂^+• ions indicating defects was observed. Annealing of the sputtered samples under Ar was conducted at different temperatures. The XPS and ToF‐SIMS spectra of the sputtered HOPG after 800°C annealing were observed to be similar to the spectra of the fresh HOPG. The sp³ carbon peak had disappeared from the C1s spectrum, and the normalized intensities of the C_xH⁻ and C_xH₂^+• ions had decreased. These results indicate that defects created by sputtering on the surface of HOPG can be repaired by high‐temperature annealing.     

Layer‐by‐layer deposition of nitrilotris(methylene)triphosphonic acid and Zr(IV): an XPS,ToF‐SIMS,ellipsometry, and AFM study

Layer‐by‐layer assemblies consisting of alternating layers of nitrilotris(methylene)triphosphonic acid (NTMP), a polyfunctional corrosion inhibitor, and zirconium(IV) were prepared on alumina. In particular, a nine‐layer (NTMP/Zr(IV))₄NTMP stack could be constructed at room temperature, which showed a steady increase in film thickness throughout its growth by spectroscopic ellipsometry up to a final thickness of 1.79 ± 0.04 nm. At higher temperature (70 °C), even a two‐layer NTMP/Zr(IV) assembly could not be prepared because of etching of the alumina substrate by the heated Zr(IV) solution. XPS characterization of the layer‐by‐layer assembly showed a saw tooth pattern in the nitrogen, phosphorus, and zirconium signals, where the modest increases and decreases in these signals corresponded to the expected deposition and perhaps removal of NTMP and Zr(IV). Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) confirmed the attachment of the NTMP molecule to the surface through PO^?, PO₂^?, PO₃^?, and CN^? signals. Increasing attenuation of the Al signal from the substrate after deposition of each layer was observed by both XPS and ToF‐SIMS. Essentially complete etching of the alumina by the heated Zr(IV) solution was confirmed by spectroscopic ellipsometry, XPS, and ToF‐SIMS. Atomic force microscopy revealed that all the films were smooth with R_q roughness values less than 0.5 nm. Copyright © 2015 John Wiley & Sons, Ltd.     

Matrix‐enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films

In this work the effect in secondary ion mass spectrometry (SIMS) of several frequently used matrix‐assisted laser desorption/ionisation (MALDI) matrices on the secondary ion intensities of low molecular weight (m/z 400–800) organic dyes and a pharmaceutical is tested. Matrix (10^?1 M) and analyte (10^?2 M) solutions were made in methanol. Mixtures with several concentration ratios were prepared from these solutions and spincoated on Si substrates prior to time‐of‐flight (TOF)‐SIMS analysis. In some cases the presence of the MALDI matrices caused a considerable increase in the positive secondary (protonated) molecular ion signals. Enhancements of a factor of 20 and more were recorded. Generally, of the matrices used, 2,5‐dihydroxybenzoic acid and 2,4,6‐trihydroxyacetophenone brought about the highest intensity increases. It was also shown that matrix‐enhanced (ME‐)SIMS is capable of lowering the detection limits for molecule ions. However, the enhancement effect is strongly influenced by the analyte/matrix combination and its concentration ratio. As a result, finding an optimal analyte/matrix mixture can be a very time‐consuming process. Mostly, the presence of the matrices causes changes in the relative ion intensities in the TOF‐S‐SIMS spectra. Compared to the spectra recorded from samples without matrices, only a few additional peaks, such as signals that originate directly from the applied matrix or adduct ions, are observed in the mass spectra. Sometimes molecule ions and some characteristic fragments at high m/z values, that cannot be recorded without matrix, do appear in the spectrum when a matrix is present. In the negative mode no enhancement effect is observed on applying the studied MALDI matrices. The results obtained from samples treated with MALDI matrices are also compared to SIMS results for the same samples after Ag and Au metallisation (MetA‐SIMS). For three of the four tested compounds Au MetA‐SIMS resulted in higher ion yields than ME‐SIMS. For both techniques possible mechanisms that can account for the enhancement effect are proposed. Copyright © 2005 John Wiley & Sons, Ltd.     

Detection of peptides in high concentration of salts by electrospray droplet impact/secondary ion mass spectrometry

Electrospray droplet impact (EDI)/SIMS is a new desorption/ionization technique for mass spectrometry. EDI/SIMS utilizes large multiply charged water clusters produced by atmospheric pressure electrospray as primary projectiles. It was found to afford extremely soft desorption/ionization compared with conventional SIMS, and has been used for detection of peptides and proteins. In this study, EDI/SIMS was applied to the detection of peptide in a highly concentrated NaCl solution. The persistent appearance of peptide ions for 1 ppm peptides in NaCl is probably because of the segregation of peptides on the crystallized salts. The samples dried under vacuum gave better EDI/SIMS mass spectra than those under ambient atmospheric pressure. Copyright © 2011 John Wiley & Sons, Ltd.     

SIMS using O−, F−, Cl−, Br− and I− primary ion bombardment

The success of secondary ion mass spectrometry (SIMS) analyses depends largely on the ionization probability of the analyzed elements. The chemical state of the surface changes with the chemical nature and the concentration of implanted ions. The positive ionization probability can be enhanced by bombarding the surface with electronegative elements. In view of such an enhancement of the positive secondary ion yield, we present SIMS analyses carried out with O^?, F^?, Cl^?, Br^? and I^? primary ion beams. Useful yields were experimentally determined for metal (Al, Ni, Cu, Ag and Ta) and semiconductor samples (Si, Ge, InP and GaAs). For metal samples, an enhancement of the useful yield under halogen bombardment, compared with O^? bombardment, was observed for Ni, Cu and Ag under F^? bombardment (enhancement of up to two orders of magnitude). For semiconductors, lower useful yields are obtained under halogen bombardment as compared with O^? bombardment. The observed results are discussed in terms of the surface concentration of the implanted primary ion species and their electronegativity. Copyright © 2012 John Wiley & Sons, Ltd.     

ToF-secondary ion mass-spectrometric study of copper deposition and stripping on directly heated screen-printed gold electrodes

We report about a new kind of directly heated gold electrode. All electrodes including a directly heated gold loop electrode, a Ag pseudo reference, and a carbon counter electrode have been screen-printed on a ceramic alumina substrate. Thermal behaviour was studied by potentiometry using either an external or the integrated reference electrode. Stripping voltammetric copper signals were greatly improved at elevated deposition temperature. Secondary ion mass spectrometric studies (ToF-SIMS) revealed that different negative ionic species of copper complexes can be found on the gold electrode surface as a result of ion bombardment during SIMS analysis like Cu^?, CuCl^? and CuCl₂ ^?. SIMS surface imaging using a fine focussed ion beam over the surface allowed us to obtain ion images (chemical maps) of the analyzed sample. SIMS depth profile analysis of the gold loop electrode was performed after copper deposition at room temperature (23 °C) and at 60 °C. CuCl₂ ^? ion was used for the depth profile studies as it has shown the highest intensity among other observed species. Surface spectroscopic analysis, surface imaging and depth profile analysis have shown that the amount of deposited copper species on the gold loop electrode was increased upon increasing electrode temperature during the deposition step. Therefore, the presence of chloride in the solution will hinder underpotential deposition of Cu(0) and lead to badly defined and resolved stripping peaks.     

Cationization of dendritic macromolecule adsorbates on metals studied by time‐of‐flight secondary ion mass spectrometry

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) was utilized to study dendritic macromolecules with various architectures, such as dendrons, dendrimers and hyperbranched polyesters prepared from bis‐(hydroxymethyl)propionic acid (Bis‐MPA) and a series of hyperbranched polyethers based on 3‐ethyl‐3(hydroxymethyl)oxetane. The measurements were performed on spin‐coated thin films of the branched molecules (D) onto silicon, chemically etched copper foil and silver‐coated wafers. They showed weak signatures of molecular ions by proton capture (D + H)⁺ in the high mass range of the spectra (m/z > 400). On the contrary, cationization of the intact molecules with alkali or transition metal ions such as Na⁺, Cu⁺ or Ag⁺ was observed. High‐intensity quasi‐molecular ions (D + M)⁺ (with M = Na⁺, Cu⁺ or Ag⁺) allowed the studied polymers to be identified. The whole molecular species were observed for Bis‐MPA dendrons and dendrimers up to 3000 Da for hydroxyl or acetonide‐terminated derivatives. The success of the so‐called cationization experiments with metal substrates compared with analysis of molecular adsorbates on silicon is highlighted. The ToF‐SIMS sensitivity appeared useful to provide information about the molecular end‐groups or to highlight incomplete reaction occurring during some deprotection step of the synthesis. Only uncationized fragments of low masses were detected for the hyperbranched polyesters. This result suggested the effect of molecular asymmetry and/or flattening of the molecules on the substrates, which hampered the molecule lift‐off efficiency. Nevertheless, the hyperbranched polyethers were characterized based on the peak distribution of intensities, which allowed estimation of their molecular weight average. This work was intended to illustrate the capabilities of ToF‐SIMS to analyse dendritic polymers on surfaces. Copyright © 2003 John Wiley & Sons, Ltd.