Calculation of Surface Excitation Parameters by a Monte Carlo Method

Electron inelastic mean free path (IMFP) is an important parameter for surface chemical quantification by surface electron spectroscopy techniques. It can be obtained from analysis of elastic peak electron spectroscopy (EPES) spectra measured on samples and a Monte Carlo simulation method. To obtain IMFP parameters with high accuracy, the surface excitation effect on the measured EPES spectra has to be quantified as a surface excitation parameter (SEP), which can be calculated via a dielectric response theory. However, such calculated SEP does not include influence of elastic scattering of electrons inside samples during their incidence and emission processes, which should not be neglected simply in determining IMFP by an EPES method. In this work a Monte Carlo simulation method is employed to determine surface excitation parameter by taking account of the elastic scattering effect. The simulated SEPs for different primary energies are found to be in good agreement with the experiments particularly for larger incident or emission angles above 60° where the elastic scattering effect plays a more important role than those in smaller incident or emission angles. Based on these new SEPs, the IMFP measurement by EPES technique can provide more accurate data.     

Morphology,surface roughness,electron inelastic and quasielastic scattering in elastic peak electron spectroscopy of polymers

In elastic peak electron spectroscopy (EPES), the nearest vicinity of elastic peak in the low kinetic energy region reflects electron inelastic and quasielastic processes. Incident electrons produce surface excitations, inducing surface plasmons, with the corresponding loss peaks separated by 1–20 eV energy from the elastic peak. In this work, X‐ray photoelectron spectroscopy (XPS) and helium pycnometry are applied for determining surface atomic composition and bulk density, whereas atomic force microscopy (AFM) is applied for determining surface morphology and roughness. The component due to electron recoil on hydrogen atoms can be observed in EPES spectra for selected primary electron energies. Simulations of EPES predict a larger contribution of the hydrogen component than observed experimentally, where hydrogen deficiency is observed. Elastic peak intensity is influenced more strongly by surface morphology (roughness and porosity) than by surface excitations and quasielastic scattering of electrons by hydrogen atoms. Copyright © 2007 John Wiley & Sons, Ltd.     

Monte Carlo simulation of full energy spectrum of electrons emitted from silicon in Auger electron spectroscopy

A Monte Carlo simulation including surface excitation, Auger electron‐ and secondary electron production has been performed to calculate the energy spectrum of electrons emitted from silicon in Auger electron spectroscopy (AES), covering the full energy range from the elastic peak down to the true‐secondary‐electron peak. The work aims to provide a more comprehensive understanding of the experimental AES spectrum by integrating the up‐to‐date knowledge of electron scattering and electronic excitation near the solid surface region. The Monte Carlo simulation model of beam–sample interaction includes the atomic ionization and relaxation for Auger electron production with Casnati's ionization cross section, surface plasmon excitation and bulk plasmon excitation as well as other bulk electronic excitation for inelastic scattering of electrons (including primary electrons, Auger electrons and secondary electrons) through a dielectric functional approach, cascade secondary electron production in electron inelastic scattering events, and electron elastic scattering with use of Mott's cross section. The simulated energy spectrum for Si sample describes very well the experimental AES EN(E) spectrum measured with a cylindrical mirror analyzer for primary energies ranging from 500 eV to 3000 eV. Surface excitation is found to affect strongly the loss peak shape and the intensities of the elastic peak and Auger peak, and weakly the low energy backscattering background, but it has less effect to high energy backscattering background and the Auger electron peak shape. Copyright © 2014 John Wiley & Sons, Ltd.     

Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm

The theory describing energy losses of charged non‐relativistic projectiles crossing a planar interface is derived on the basis of the Maxwell equations, outlining the physical assumptions of the model in great detail. The employed approach is very general in that various common models for surface excitations (such as the specular reflection model) can be obtained by an appropriate choice of parameter values. The dynamics of charged projectiles near surfaces is examined by calculations of the induced surface charge and the depth‐ and direction‐dependent differential inelastic inverse mean free path (DIIMFP) and stopping power. The effect of several simplifications frequently encountered in the literature is investigated: differences of up to 100% are found in heights, widths, and positions of peaks in the DIIMFP. The presented model is implemented in a Monte Carlo algorithm for the simulation of the electron transport relevant for surface electron spectroscopy. Simulated reflection electron energy loss spectra are in good agreement with experiment on an absolute scale. Copyright © 2012 John Wiley & Sons, Ltd.     

Study of temperature distribution of sliding block with asperity surface

In this study, a numerical thermal model is developed for sliding block contact under various loads, sliding velocities and surface roughness. The temperature distributions are shown for perfectly insulated thermal conditions along noncontact surfaces. For a particular five‐peaks contact model, the maximum temperature at the central peak is slightly lhigher than the others. The temperature profile decreases as the distance to the symmetry axis increases, and then decreases dramatically at the noncontact area. It is clear to see that the maximum temperature locates at the symmetry central peak of the asperity contact area instead of the leading head of the smooth surface. The maximum temperature rise parameter increases as the pressure, sliding velocity and asperity roughness increased or conductivity decreased. This phenomenon becomes obvious for cases at high pressure, velocity and roughness and low conductivity. Particularly, the influence of roughness is not significant for low velocity. Similar results are found for the maximum temperature rise parameter difference between peaks or peaks/valleys. The simulation results of this asperity surface sliding block contact model are able to provide essential information for the components of microelectro—mechanical systems (MEMS) and biochemical reaction mechanism. Copyright © 2011 John Wiley & Sons, Ltd.     

Win X-ray: a new Monte Carlo program that computes X-ray spectra obtained with a scanning electron microscope.

A new Monte Carlo program, Win X-ray, is presented that predicts X-ray spectra measured with an energy dispersive spectrometer (EDS) attached to a scanning electron microscope (SEM) operating between 10 and 40 keV. All the underlying equations of the Monte Carlo simulation model are included. By simulating X-ray spectra, it is possible to establish the optimum conditions to perform a specific analysis as well as establish detection limits or explore possible peak overlaps. Examples of simulations are also presented to demonstrate the utility of this new program. Although this article concentrates on the simulation of spectra obtained from what are considered conventional thick samples routinely explored by conventional microanalysis techniques, its real power will be in future refinements to address the analysis of sample classifications that include rough surfaces, fine structures, thin films, and inclined surfaces because many of these can be best characterized by Monte Carlo methods. The first step, however, is to develop, refine, and validate a viable Monte Carlo program for simulating spectra from conventional samples.     

Deposition at glancing angle, surface roughness, and protein adsorption: Monte Carlo simulations

To generate rough surfaces in Monte Carlo simulations, we use the 2 + 1 solid-on-solid model of deposition with rapid transient diffusion of newly arrived atoms supplied at glancing angle. The surfaces generated are employed to scrutinize the effect of surface roughness on adsorption of globular and anisotropic rodlike proteins. The obtained results are compared with the available experimental data for Ta deposition at glancing angle and for the bovine serum albumin and fibrinogen uptake on the corresponding Ta films.     

Effect of Surface Roughness on Structure and Dynamics in Thin Films

We performed Monte Carlo simulations of free‐standing, amorphous polyethylene (PE) thin films at 509 K. The three films are constructed from 9, 36, or 144 independent parent PE chains, with 100 carbon atoms per chain. The two‐dimensional periodic cross‐sectional area of the simulation box is proportional to the number of independent parent chains, with the 144‐chain film having an area four times larger than the 36‐chain film. All three films have a similar bulk density and a comparable thickness between the two free surfaces. The 144‐chain film with the largest periodic surface area has a broader density profile due to the increased roughness of its surfaces. Snapshots of its surfaces along the trajectory indicate dynamic changes in the high and low regions of the rough surfaces. Diffusion of the chains parallel to the free surfaces is suppressed in the 144‐chain film, due to increased surface roughness. The tendency of bonds to orient parallel to the free surface is less pronounced in films with higher surface roughness.     

Studies of AuNi alloys by electron spectroscopies with the aid of the line shape analysis by the pattern recognition method

The spectrum of electrons elastically backscattered from the surface and within its vicinity reflects the probability of electron elastic backscattering on the surface atoms, quasi‐elastic scattering and the inelastic scattering visible in the low energy side of the elastic peak. The method for investigating the processes of electron elastic backscattering on the surface atom is called the elastic peak electron spectroscopy (EPES). In the present work, AuNi alloys of different compositions are investigated using X‐ray photoelectron spectroscopy (XPS) and the EPES method with the aid of the line shape analysis called the fuzzy k‐nearest neighbour (fkNN) rule. The line shape analysis was found to be applicable for EPES spectroscopy. It allows distinguishing the surfaces exhibiting various surface roughness, texture and grain size, and quantifying the selected information depths. The quantitative results obtained from the XPS analysis and the EPES spectra line shape analysis indicated Au surface segregation with Au surface enriched profile. Quantitative discrepancies are discussed within the non‐uniform concentration profiles of constituents due to sputter cleaning and annealing, different diffusion coefficients for Au and Ni, differences in the information depths sampled by XPS and EPES methods and differences in electron elastic backscattering cross‐sections for Ni and Au. Copyright © 2006 John Wiley & Sons, Ltd.     

Contact of elastic solids with rough surfaces

The effect of surface roughness on the adhesion of elastic solids was examined with artificially roughened surfaces and crosslinked poly(dimethylsiloxane). The amplitudes (σ) and lateral correlation lengths (ξ) of the surface roughness were determined with the height–height correlation function calculated from atomic force microscopy images. The work of adhesion (W) did not change significantly for surfaces where σ ≤ 6 nm. However, with increasing σ and (ξ²/σ)^1/3, W increased. Maximal adhesion was found for surfaces that produced the greatest indentation. © 2001 John Wiley & Sons, Inc. J Polym Sci Part B: Polym Phys 39: 1848–1854, 2001     

Surface modification of titanium with thermally treated polydimethylsiloxane coating and the effect on resin to titanium adhesion

In this study, titanium surface modification by a thermal treatment using a polydimethylsiloxane (PDMS) coating was investigated. The surfaces of four titanium samples were surface treated by polishing, sandblasting, and coating with a PDMS with a thermal treatment at 800 and 1100 °C. The titanium surfaces were characterized by X‐ray photoelectron spectroscopy (XPS) and atomic force microscopy. The effect of the surface treatments on adhesion of resin to titanium was assessed by shear adhesion strength test. XPS analysis showed that there was a change of elemental composition of titanium surfaces after surface treatment. Binding energy shifts for Si2p and O1s were observed after sandblasting and thermally treated PDMS. Therefore, chemical states of Si and O were changed. Atomic force microscopy analysis revealed that the surface topography of the Ti samples was different, and surface roughness was increased after sandblasting and thermal treatment of PDMS coating. Shear adhesion strength test results showed that the adhesion between resin and titanium is affected by the treatment temperature of PDMS coating. The highest adhesion is obtained at 1100 °C (14.7 ± 1.57 MPa). Copyright © 2014 John Wiley & Sons, Ltd.     

Monte‐Carlo simulation of x‐ray photoelectron emission from silver

Silver 3d x‐ray photoelectron spectroscopy (XPS) spectra were simulated with the Monte‐Carlo method using an effective energy‐loss function that was derived from a reflected electron energy‐loss spectroscopy (REELS) analysis based on an extended Landau approach. After confirming that Monte‐Carlo simulation based on the use of the effective energy‐loss function can successfully describe the experimental REELS spectrum and Ag 3d XPS spectrum, we applied Monte‐Carlo simulation to predict the angular distribution of Ag 3d x‐ray photoelectrons for different x‐ray incidence angles and different photoelectron take‐off angles. The experimental photoelectron emission microscope that we are constructing was confirmed as being close to the optimum configuration, in which the x‐ray incident angle as measured from the surface normal direction is 74° and the photoelectron take‐off angle is set normal to the surface. The depth distribution functions of the Ag 3d X‐ray photoelectrons for different energy windows suggest that the photoelectron emission microscope will exhibit greater surface sensitivity for narrower photoelectron energy windows. Copyright © 2003 John Wiley & Sons, Ltd.     

Roughness effects of cellulose and paper substrates on water drop impact and recoil

The impact dynamics of water drops on sized and unsized smooth cellulose films and paper surfaces with controlled roughness levels were studied. The objective was to better understand the effect of roughness on the liquid drop impact dynamics on paper surfaces, isolating from the effect chemical heterogeneity. Drop impact in the first few milliseconds were recorded using high-speed CCD camera and the three-phase contact line movement of the water drop was analyzed. Smooth cellulose film surface and rough paper surface showed similar impact dynamics, suggesting that the surface energy plays a more dominant role than surface roughness. Significantly different dynamic contact angles of water drop on the sized and unsized surfaces were observed during drop impact. The Laplace pressure of the curved spreading front pointing to the centre of a spreading drop on these sized cellulose and paper surfaces reduces the three-phase contact line movement, and leads to smaller maximum spreading diameter. Our results suggest that the water drop spreads on the rough surface is most likely via a “roll-over” action rather than “stick and jump” movements.     

Surface topography effects on glow discharge depth profiling analysis

Glow discharge optical emission spectroscopy (GD‐OES) has been shown to be of immense value in elemental depth profiling of thin or thick films on conductive or non‐conductive substrates. For aluminium, GD‐OES has been employed to examine locations of markers and tracers in anodic films, thereby assisting understanding of transport phenomena. In order to investigate the influence of surface topography on depth profiling analysis, anodic aluminium oxide films of various thicknesses, with incorporated electrolyte species, were produced on superpure aluminium substrates of controlled roughnesses. The distributions of incorporated species in the films were subsequently probed. Surface topography modifications and consequent depth resolution degradation were examined during depth profiling analysis performed by GD‐OES. The results reveal that the sputtering process leads to the roughening or smoothing of the surface topography of the specimen for a ratio of the film thickness to the amplitude of the substrate texture less, or greater, than 1 respectively. As a consequence of the surface topography dependence of the ion bombardment, analysis of thin films over rough surfaces suffers from depth resolution limitations due to sputtering‐induced topography changes, thereby limiting quantification of the resultant spectra. Copyright © 2010 John Wiley & Sons, Ltd.     

Calculation of the surface excitation parameter for Si and Ge from measured electron backscattered spectra by means of a Monte-Carlo simulation.

A new Monte Carlo method has been developed for simulating backscattered electron spectra, and this was applied for determining the surface excitation parameter (SEP). The simulation is based on direct tracking of electron trajectories in the solid, taking into account elastic and inelastic events. The elastic scattering cross sections are taken from literature, while inelastic cross section data are obtained by a fitting procedure. After some iterations, the program produces electron spectra fitting well to the experimental ones. Si and Ge electron spectra were simulated and SEP values were calculated. The SEP values are compared to other ones from literature.     

Effect of surface morphology on measurement and interpretation of boundary slip on superhydrophobic surfaces

Highly liquid repellent surfaces have been obtained by the combination of roughness and hydrophobicity. Studies have reported that the flow over such surfaces exhibits larger boundary slip as compared to the smooth hydrophobic surfaces. However, the surface roughness can also lead to apparent slip. Thus, the effect of the two factors, that is, wettability and roughness, needs to be segregated. In this study, we have measured the slippage of water on rough hydrophilic and hydrophobic surfaces using colloidal probe atomic force microscopy technique (CP‐AFM). Results showed that the effect of surface roughness on the measured slip is dominant over that of wettability. It was also found that slip on surfaces with sparsely distributed asperities is highly local and measurements on various locations give dissimilar results. The results suggested that the main reason of the larger slip, on rough hydrophobic surfaces, is likely to be the roughness and not the hydrophobicity. Moreover, it was also found that the slip does not vary considerably with the increase or decrease in the shear rate. Most likely, this kind of slip phenomena is caused by the apparent decrease of the drag force, because the nanoasperities on the surface restrict the probe from reaching the surface properly. Copyright © 2016 John Wiley & Sons, Ltd.     

The influence of substrate surface roughness on microstrip transmission line loss using conventional analyses and length‐scale fractal analysis

Two components of conductor topography can impact conductor loss for signals in the GHz frequency range: conductor–ceramic interface roughness and conductor edge angle. This study is an experimental investigation of the influence of these conductor topographies on conductor loss in microstrip circuits produced by thick‐film technology. The aluminum nitride ceramic substrates have different surface roughnesses due to different surface finish processes. The substrate surfaces were characterized using conventional and length‐scale fractal analysis. The conductor–ceramic interface was measured with a contact profilometer. The conductor edge angle and conductor edge profile were measured optically. It was found that there is a direct correlation between conductor loss and conductor edge angle, whereas there is an inverse correlation between loss and substrate roughness or relative length of the conductor–ceramic interface. This is the opposite result to the conventional expectation of surface roughness effects on conductor loss. There is also a negative correlation between conductor edge angle and surface roughness or relative length. The loss behavior can be explained by the interaction of the conductor paste with the surfaces during processing. The paste tends to spread more on the smoother surfaces, and thus creates an elongated edge of diminishing cross‐section and a small edge angle. This leads to greater conductor loss. Copyright © 2009 John Wiley & Sons, Ltd.     

Optical emission from tetrafluoromethane plasma and its relationship to surface modification of hexatriacontane

The optical emission from tetrafluoromethane plasma (2% argon included) has been studied by emission spectroscopy. The evolution ofCF ^*,CF ₂ ^* , andF emissions has been followed during the treatment of an organic surface. An-alkane, hexatriacontane, has been used as a model for high density polyethylene surface and treated in different plasma conditions. We found that the evolution of fluorinated species emissions in the plasma gas phase is not only a measurement of the reactive species concentrations, but also an indication of the surface modifications. The surface properties, such as surface energy and surface roughness are correlated to the emission intensity of reactives species in the plasma gas phase. A mild exposure to the plasma can result in a great decrease of surface energy corresponding to the fluorination. The surface roughness only changes under drastic plasma conditions.     

Analytical applications of elastic electron backscattering from surfaces

Measurements of probability of elastic electron backscattering from surfaces can provide information on physical properties of the surface region with thickness comparable to the inelastic mean free path (IMFP) of electrons. The analytical technique, based on such measurements, is known as elastic peak electron spectroscopy (EPES). The most frequent application of EPES is the determination of the IMFP in solids. However, this technique can also be used to measure overlayer thickness, or to determine surface composition.

Quantitative applications of EPES, addressed here, require a reliable theoretical model describing the elastic backscattering probability from surfaces with a given structure and composition. Unfortunately, there is no simple analytical model which describes the elastic backscattering probability with an acceptable accuracy. Values of the elastic backscattering probability are usually estimated from Monte Carlo (MC) simulations of elastic backscattering events, since the theoretical model implemented in the MC scheme seems closest to reality, as compared with models leading to different analytical expressions. It is shown that the reliability of the theory is associated with accuracy of the parameters needed in the calculations. The most important parameters are the differential elastic scattering cross-sections which are presently known, especially in some angular regions, with limited accuracy. The IMFP values, determined in different laboratories via EPES, exhibit a considerable scatter, which may be due to the fact that different experimental geometries are used in measurements. Other sources of errors are briefly discussed.