How can H content influence the tribological behaviour of W-containing DLC coatings

In this paper, the influence of the addition of W and H to pure DLC coatings on the structural, mechanical and tribological properties will be presented. The coatings were deposited by r.f. magnetron sputtering from a C target embedded with different numbers of W pellets. Working in non-reactive or reactive atmosphere allowed to deposit H-free or H-containing coatings, respectively, on steel and Si substrates. A Cr adhesion interlayer was interposed between the films and the substrate. Films with W content from 0 to 12 at.% and H incorporated up to a maximum value close to 40 at.% were deposited. All coatings had an amorphous structure, although vestiges of crystallinity could be detected in W-containing films. The addition of W led to a significant hardening of the DLC coating (from ～10 to 18 GPa); inversely, with H incorporation the hardness drop down to values even lower than that of pure DLC films. It was possible to establish a good correlation between the hardness and the residual stresses. In spite of decreasing friction and wear coefficients when alloying DLC with W, almost no difference was found among the W–DLC films whatever the W content was. A similar trend was achieved with the H addition. However, in this case a decrease in the friction coefficient was registered whereas the wear rate increased. The best performance concerning the friction was obtained for an H-containing coating (0.05) whereas, for the wear resistance, H-free W–DLC films were better performing (0.3 × 10^?16 m³ N^?1 m^?1).     

At-edge minima in elastic photon scattering amplitudes for dilute aqueous ions

Elastic photon scattering and absorption in the vicinity of core atomic orbital energies give rise to resonances in the elastic photon scattering cross-section. Of interest is whether a dilute-ion aqueous system provides an environment suitable for testing independent particle approximation (IPA) predictions. Predictions of the energy of these resonances have been determined for a Dirac–Slater exchange potential with a Latter tail. At BM28 (ESRF), tuneable X-rays were obtained at eV resolution using a 1 1 1 Si monochromator. From target systems including Cu²⁺ and Zn²⁺, the X-rays were scattered through high angle from an aqueous medium contained in a thin Perspex cell provided with 8 μm kaplan windows. An energy resolution of ∼500 eV from the HPGe detector was adequate to separate the elastic scattering signal from K_α radiation but not from Compton or K_β contributions. The Compton contribution from the medium was removed assuming validity of the relativistic impulse approximation. The contribution due to K_β fluorescence and the resonant X-ray Raman scattering process were handled by assuming the branching ratio for K_α and K_β contributions to be constant and to be accurately described by fluorescent yields measured above edge. At ionic concentrations ranging from 0.01 to 0.1 mol/l, resonance structures accord with predictions of elastic scattering cross-sections calculated within IPA. Amplitudes calculated using modified form-factors and anomalous scatter factors computed from a Dirac–Slater exchange potential were convolved with a Lorentzian of several eV (FWHM).     

Carbon based Si- and Cr-containing thin films: Chemical and nanomechanical properties

Si- and Cr-containing C films were deposited by magnetron sputtering combined with CVD onto silicon wafers. The composition and chemical structure were characterized by X-ray Photoelectron Spectroscopy (XPS) and nanomechanical properties by depth-sensing hardness and scratch techniques.The incorporated Si and Cr are preferentially bonded to carbon, in accordance with simplified thermodynamic calculations and as manifested by the XPS chemical shifts. At relatively high Cr- and low Si-content silicides (Cr_xSi) may also form as indicated by X-ray induced Auger electron spectroscopy. The chromium content in the C–Si–Cr films varied between 1 and 55 at% while the silicon content in the same films between 25 and 0 at%. For comparison two-component films of Si–C and Cr–C were also deposited with Si-content up to 42 at% and Cr-content up to 55 at% by varying the input power of the magnetrons.The nanohardness (H) and reduced modulus (E) were higher for all the films than that of the silicon substrate being 10 GPa, 127 GPa, respectively. Interestingly, the H and E of the three-component CrSiC films were almost invariant of the changes of the components' concentration within the indicated range and varied between 13–16 GPa and 120–140 GPa. H and E values for the two-component Cr–C films were much higher, reaching about 22 GPa and 170 GPa, respectively.     

Characterization and source term assessments of radioactive particles from Marshall Islands using non-destructive analytical techniques

Six plutonium-containing particles stemming from Runit Island soil (Marshall Islands) were characterized by non-destructive analytical and microanalytical methods. Composition and elemental distribution in the particles were studied with synchrotron radiation based micro X-ray fluorescence spectrometry. Scanning electron microscope equipped with energy dispersive X-ray detector and with wavelength dispersive system as well as a secondary ion mass spectrometer were used to examine particle surfaces. Based on the elemental composition the particles were divided into two groups: particles with pure Pu matrix, and particles where the plutonium is included in Si/O-rich matrix being more heterogenously distributed. All of the particles were identified as nuclear fuel fragments of exploded weapon components. As containing plutonium with low ²⁴⁰Pu/²³⁹Pu atomic ratio, less than 0.065, which corresponds to weapons-grade plutonium or a detonation with low fission yield, the particles were identified to originate from the safety test and low-yield tests conducted in the history of Runit Island. The Si/O-rich particles contained traces of ¹³⁷Cs (^239 + 240Pu/¹³⁷Cs activity ratio higher than 2500), which indicated that a minor fission process occurred during the explosion. The average ²⁴¹Am/²³⁹Pu atomic ratio in the six particles was 3.7 × 10^− 3 ± 0.2 × 10^− 3 (February 2006), which indicated that plutonium in the different particles had similar age.     

Direct electrodeposition of PbTe thin films on n-type silicon

High quality lead telluride thin films were directly deposited onto n-type silicon (1 0 0) substrates by electrodeposition at room temperature. The deposition mechanism was studied using cyclic voltammetry. The films were characterized by scanning electron microscopy, energy dispersive X-ray, X-ray diffraction, and Fourier transform infrared spectroscopy. The results indicated that the deposited PbTe films exhibited a polycrystalline rock salt structure and good optical properties with a direct band gap of 0.31 eV.     

A new X-ray pinhole camera for energy dispersive X-ray fluorescence imaging with high-energy and high-spatial resolution

A new X-ray pinhole camera for the Energy Dispersive X-ray Fluorescence (ED-XRF) imaging of materials with high-energy and high-spatial resolution, was designed and developed. It consists of a back-illuminated and deep depleted CCD detector (composed of 1024 × 1024 pixels with a lateral size of 13 μm) coupled to a 70 μm laser-drilled pinhole-collimator, positioned between the sample under analysis and the CCD. The X-ray pinhole camera works in a coaxial geometry allowing a wide range of magnification values.The characteristic X-ray fluorescence is induced on the samples by irradiation with an external X-ray tube working at a maximum power of 100 W (50 kV and 2 mA operating conditions).The spectroscopic capabilities of the X-ray pinhole camera were accurately investigated. Energy response and energy calibration of the CCD detector were determined by irradiating pure target-materials emitting characteristic X-rays in the energy working-domain of the system (between 3 keV and 30 keV).Measurements were performed by using a multi-frame acquisition in single-photon counting. The characteristic X-ray spectra were obtained by an automated processing of the acquired images. The energy resolution measured at the Fe–Kα line is 157 eV.The use of the X-ray pinhole camera for the 2D resolved elemental analysis was investigated by using reference-patterns of different materials and geometries. The possibility of the elemental mapping of samples up to an area of 3 × 3 cm² was demonstrated.Finally, the spatial resolution of the pinhole camera was measured by analyzing the profile function of a sharp-edge. The spatial resolution determined at the magnification values of 3.2 × and 0.8 × (used as testing values) is about 90 μm and 190 μm respectively.     

Transparent graphene/PEDOT–PSS composite films as counter electrodes of dye-sensitized solar cells

Composite films of graphene and polystyreneslufonate doped poly(3,4-ethylenedioxythiophene) (graphene/PEDOT–PSS) were deposited on indium tin oxide (ITO) substrates by spin coating at room temperature and applied as counter electrodes of dye-sensitized solar cells (DSSCs). A 60 nm thick composite film (contained 1 wt% graphene) coated ITO electrode exhibited high transmittance (>80%) at visible wavelengths and high electrocatalytic activity. The energy conversion efficiency of the cell with this film as counter electrode reached 4.5%, which is comparable to 6.3% of the cell with platinum counter electrode under the same experimental condition.     

Structural and electrical characterization of boron-containing diamond-like carbon films deposited by femtosecond pulsed laser ablation

The present study investigates the influence of the incorporation of boron in Diamond-Like Carbon (DLC) films deposited by femtosecond laser ablation, on the structure and electrical properties of the coatings within the temperature range 70–300 K. Doping with boron has been performed by ablating alternatively graphite and boron targets. The film structure and composition have been highlighted by coupling Atomic Force Microscopy (AFM), Scanning Electron Microscopy equipped with a field emission gun (SEM-FEG) and High Resolution Transmission Electron Microscopy (HRTEM). Boron dilution ranges between 2 and 8% and appears as nanometer size clusters embedded in the DLC matrix. Typical resistivity values are 100 W cm for pure a-C films, down to few W cm for a-C:B films at room temperature. The resistance decreases exponentially when the temperature increases in the range 70–300 K. The results are discussed considering the classical model of hopping conduction in thin films. Some coatings show temperature coefficients of resistance (TCR) as high as 3.85%. TCRs decrease when the doping increases. Such high values of TCR may have interests in the use of these films as thermometer elements in micro and nanodevices.     

Polarized Raman study on the lattice structure of BiFeO3 films prepared by pulsed laser deposition

Polarized Raman spectroscopy was used to study the lattice structure of BiFeO₃ films on different substrates prepared by pulsed laser deposition. Interestingly, the Raman spectra of BiFeO₃ films exhibit distinct polarization dependences. The symmetries of the fundamental Raman modes in 50–700 cm⁻¹ were identified based on group theory. The symmetries of the high order Raman modes in 900–1500 cm⁻¹ of BiFeO₃ are determined for the first time, which can provide strong clarifications to the symmetry of the fundamental peaks in 400–700 cm⁻¹ in return. Moreover, the lattice structures of BiFeO₃ films are identified consequently on the basis of Raman spectroscopy. BiFeO₃ films on SrRuO₃ coated SrTiO₃ (0 0 1) substrate, CaRuO₃ coated SrTiO₃ (0 0 1) substrate and tin-doped indium oxide substrate are found to be in the rhombohedral structure, while BiFeO₃ film on SrRuO₃ coated Nb: SrTiO₃ (0 0 1) substrate is in the monoclinic structure. Our results suggest that polarized Raman spectroscopy would be a feasible tool to study the lattice structure of BiFeO₃ films.     

Effects of electron beam irradiation on the photoelectrochemical properties of TiO2 film for DSSCs

TiO₂ has been widely utilized for various industrial applications such as photochemical cells, photocatalysts, and electrochromic devices. The crystallinity and morphology of TiO₂ films play a significant role in determining the overall efficiency of dye-sensitized solar cells (DSSCs). In this study, the preparation of nanostructured TiO₂ films by electron beam irradiation and their characterization were investigated for the application of DSSCs. TiO₂ films were exposed to 20–100 kGy of electron beam irradiation using 1.14 MeV energy acceleration with a 7.46 mA beam current and 10 kGy/pass dose rates. These samples were characterized using X-ray diffraction (XRD), field-emission scanning electron microscopy (FE-SEM), and X-ray photoelectron spectroscopy (XPS) analysis. After irradiation, each TiO₂ film was tested as a DSSC. At low doses of electron beam irradiation (20 kGy), the energy conversion efficiency of the film was approximately 4.0% under illumination of simulated sunlight with AM 1.5 G (100 mW/cm²). We found that electron beam irradiation resulted in surface modification of the TiO₂ films, which could explain the observed increase in the conversion efficiency in irradiated versus non-irradiated films.     

In Situ Coating of Natural Rubber Film with Poly(vinyl chloride) Resin

Film formation of poly(vinyl chloride) resin (rPVC) coating on natural rubber (NR) surface in solid state was prepared and investigated. The mixtures of rPVC with NR were compressed at 170 °C for 15 min and found that the rPVC was migrated and coated on the NR surface which was proved by the images from Scanning Electron Microscope (SEM) and Atomic Force Microscope (AFM). The coated NR films with rPVC loading 5 and 10 phr are stronger and higher dielectric constant than uncoated NR film. Very high loading of rPVC for 50 and 100 phr result in decreasing of tensile strength and dielectric constant.     

Electronic structure of the Au–Si(1 1 1) interface as a function of Au coverage

We have investigated the Au–Si(1 1 1) interface as a function of the Au coverage by the core-level photoemission spectroscopy. With increasing the Au coverage, the spectral features in the Si 2p core-level changed remarkably and some fine structures in both Si 2p and Au 4f spectra were observed. Based on the curve fitting analysis, the Si 2p and Au 4f spectra at more than 20 Å Au coverage were decomposed into three chemically different components, respectively. The assignments of their components were performed. In addition, we have compared these results for the Au–Si(1 1 1) interface with our previous study for the Au–Si(1 0 0) interface. It was found that the electronic structures for the Au–Si(1 1 1) interface is essentially identical to those of the Au–Si(1 0 0) interface except at the initial Au deposition.     

Small-angle X-ray scattering from nano-Si embedded a-SiC:H deposited by hot-wire chemical vapor deposition

Nanocrystalline silicon (nc-Si) embedded a-SiC:H films were deposited by hot-wire chemical vapor deposition (HWCVD) using SiH₄, CH₄ and H₂ gas precursors. The films were characterized by small-angle X-ray scattering, X-ray diffraction (XRD) and Raman spectroscopy to analyze their structural and fractal nature. The analysis of a-SiC:H films indicated the scattering from mass fractal aggregates of amorphous and nanocrystalline domains of nano-Si. The XRD results indicated that the size and crystallite fraction of nanocrystallites decreased with increasing CH₄ flow rate. Nc-Si changed from the mass fractal to the surface fractal with increasing CH₄ flow rate. The inter-diffusion correlation length between nc-Si embedded a-SiC:H varies from 2.4 nm to 5.7 nm with a CH₄ flow rate.     

Atomic arrangement of Al-induced clusters on Si(0 0 1) surface at high temperature

The atomic structure of the Al-induced clusters on Si(0 0 1) surface formed by the annealing of 0.5 ML Al/Si(0 0 1) at 500 °C has been studied using coaxial impact collision ion scattering spectroscopy (CAICISS). CAICISS results proposed that the Al atoms occupy the cave site (T4 site) and off-centered T4 site. To determine the structure of the Al-induced clusters definitely, classical ion-scattering trajectory simulations using scattering and recoiling imaging code (SARIC) have been performed for the recently proposed most possible four different cluster models (Bunk, Zotov, Kotlyar, and Zavodinsky model). Our CAICISS spectra and simulation results show that the Bunk model is the best plausible one among the models. As the results of the simulations, it is found that Al–Si dimers has been oriented on the topmost layer of the Si(0 0 1) surface with a bonding length (Δz) of 1.00 ± 0.05 Å.     

A high performance nano-structure conductive coating on a Crofer22APU alloy fabricated by a novel spinel powder reduction coating technique

A nano-structure conductive coating was fabricated on a Crofer22APU alloy interconnect by an original coating strategy using Mn_0.9Y_0.1Co₂O₄ (MYC) novel spinel nanocrystalline powder. A unique treatment method by which the spinel powder was reduced was used to prepare the green coating. The resulting coating was about 12 μm in thickness, and was composed of MYC nanocrystalline with an average particle size of about 100 nm. The coating was well adhered with the substrate alloy. Less than 4 mΩ cm² of the area specific resistance (ASR) was obtained, and no obvious degradation was observed for a coated alloy (whose coating thickness was about 30 μm) after operated at 800 °C for 538 h under seven thermal cyclings. The coated alloy exhibited excellently electrical performance and long-term stability compared with the uncoated one. The exploration of the novel spinel powder reduction coating technique for alloy interconnect to obtain cheap coatings with excellent microstructure and performance showed a promising prospect for the practical application of solid oxide fuel cells (SOFCs).     

The energy spectrum of 662 keV photons in a water equivalent phantom

Investigation is made on the energy spectrum of photons originating from interactions of 662 keV primary gamma-ray photons emitted by a point source positioned at the centre of a water equivalent solid phantom of dimensions 19 cm×19 cm×24 cm. Peaks resulting from total energy loss (photopeak) and multiple and back scattering have been observed using a 51 mm×51 mm NaI(Tl) detector; good agreement being found between the measured and simulated response functions. The energy spectrum of the gamma photons obtained through the Monte Carlo simulation reveals local maxima at about 100 keV and 210 keV, being also observed in the experimental response function. Such spectra can be used as a method of testing the water equivalence of solid phantom media before their use for dosimetry measurements.     

Picoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples

A deposition system capable of delivering picoliter quantities of solution in programmable arrays was investigated as a method for sample preparation for total reflection X-ray fluorescence (TXRF) spectroscopy. Arrays of trace metals in solution were deposited on Si wafers. The array deposits provide a capability of depositing closely spaced (100 μm or less), typically 5–20 μm diameter droplets in an area that can be matched to the analysis spot of the TXRF detector. The dried depositions were physically characterized and the effect of deposition type and matrix on the TXRF signal was investigated.     

The influence of Se doping upon the phase change characteristics of GeSb2Te4

Se substituted GeSb₂Te₄ films have been investigated for property contrast using electrical four-point-probe measurements, in-situ X-ray diffraction (XRD), a static tester probing the optical changes and atomic force microscopy (AFM). The temperature dependent sheet resistance measurements show two transitions at 125 and 262 °C. The first transition at 125 °C is accompanied by a large resistance change of three orders of magnitude. The resistance change for the second step is less pronounced. In-situ X-ray scattering experiments evidence that the first steep change in resistance is due to an amorphous → NaCl type structural transformation. The second change is caused by the transition from the cubic structure to the stable rhombohedral phase. Power–time effect (PTE) diagrams recorded to monitor the optical contrast of the films upon laser irradiation exhibit a fast recrystallization time of about 100 ns. The change of film roughness and topography between the amorphous and crystalline phase has been determined by AFM.     

Performance of a gaseous detector based energy dispersive X-ray fluorescence imaging system: Analysis of human teeth treated with dental amalgam

Energy dispersive X-ray fluorescence (EDXRF) imaging systems are of great interest in many applications of different areas, once they allow us to get images of the spatial elemental distribution in the samples. The detector system used in this study is based on a micro patterned gas detector, named Micro-Hole and Strip Plate. The full field of view system, with an active area of 28 × 28 mm² presents some important features for EDXRF imaging applications, such as a position resolution below 125 μm, an intrinsic energy resolution of about 14% full width at half maximum for 5.9 keV X-rays, and a counting rate capability of 0.5 MHz. In this work, analysis of human teeth treated by dental amalgam was performed by using the EDXRF imaging system mentioned above. The goal of the analysis is to evaluate the system capabilities in the biomedical field by measuring the drift of the major constituents of a dental amalgam, Zn and Hg, throughout the tooth structures. The elemental distribution pattern of these elements obtained during the analysis suggests diffusion of these elements from the amalgam to teeth tissues.     

X-ray induced photocatalysis on TiO2 and TiO2 nanotubes: Degradation of organics and drug release

The photocatalytic activity of titanium dioxide under X-ray radiation is of great interest for biomedical applications. In the present work we explore the use of compact TiO₂ layers and TiO₂ nanotubes for X-ray induced photocatalysis, in particular the degradation of organics and monolayer chain scission for drug release. The radiation was done with a conventional X-ray source and doses up to 50 × 10^?3 J/kg. The results show the feasibility of X-ray catalysis on TiO₂ and X-ray induced monolayer chain scission by the release of surface attached Zn–porphyrin molecules. Furthermore, a higher efficiency for anatase films and nanotubes is obtained than for amorphous morphologies.