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1.
The perturbation felt by181Hf probes in a181HfTa lattice loaded with 30 at% hydrogen was observed by PAC as a function of temperature. Three different interactions were identified: 1) ΝQ1=433 (6) MHz, η=0.45 2) ΝQ2=142 (9) MHz, η=0.9, and 3) ΝQ?0, σ=4–14 Μ?1 which are attributed to the Β?, ε? and α-phase in TaH system, respectively.  相似文献   

2.
The 48.7 m111m Cd activity was implanted in Zn and Be single crystals which were soldered to the cold finger of a dilution refrigerator and kept below 0.2 K during implantation. Subsequent nuclear orientation experiments allowed the determination of the quadrupole interaction frequencyv Q of the 11/2? isomeric state of111Cd in Zn and Be as ?139 (15) MHz and +43(16) MHz respectively. With these results we derive the quadrupole moment of the 5/2+ 245 keV level of111Cd including sign asQ = +0.83(13) b and the sign of the electric field gradient for Cd in Be. The half-life of111m Cd was redetermined as 48.67 (6) m.  相似文献   

3.
The time-differential perturbed angular correlation technique (TDPAC) has been applied to the 482 keV excited state of181Ta, to determine the nuclear electric quadrupole interaction (QI) at Ta in Be. Sources were prepared by ion-implantation of181Hf in Be. Particle channeling measurements have revealed that. Hf impurities implanted in Be reside primarily at the tetrahedral interstitial site. The fundamental QI frequency obtained for Ta at this interstitial site in Be is |v Q| =e 2 qQ/h = 227.0 ± 2.2 MHz which corresponds to an electric field gradient |eq|=(3.71±0.15)×1017 V/cm2. This result is discussed in terms of results for Cd impurities in the same system and the systematics of the impurity QI in metals.  相似文献   

4.
Using time differential pertubed angular correlation technique we have measured QI frequency at117In in semimetals Sb and Bi at temperatures 77 K and 300 K. The drastic difference of Q for117In and119In in these hosts suggests two sites for the probes due to different methods of sample preparation. The magnitudes of EFG deviate completely from those predicted by covalent bond model but they seem to fit in the general trend for111Cd and117In QI frequencies in metallic hosts.  相似文献   

5.
R G Pillai  S H Devare 《Pramana》1977,8(6):495-499
The quadrupole interaction (QI) of99Ru as a dilute impurity in Zn, Cd and Sn lattices was studied by using time differential perturbed angular correlation technique. The electric field gradients calculated from the measured quadrupole interaction frequencies at room temperature are 5.14 × 1017 volts/cm2 for99RuZn, 4.58 × 1017 volts/cm2 for99RuCd and 2.87 × 1099 volts/cm2 for99RuSn. The temperature dependence of the QI studied in the case99RuZn is similar to that of117InZn.  相似文献   

6.
Abstract

Antimony implantation into <111> silicon was carried out at RT with a dose of 4.5 × 1015 cm?2, energy 75 keV. For the annealing of the sample pulses of a Q-switched ruby laser were used with energy density of ~ 1.5 Joule/cm2 and duration of 15–20 nsec. Hall effect measurement was applied to determine the electrical activity of the layers. Lattice location and the depth profile of Sb was studied by RBS and channeling technique. Measurements show that after laser annealing Sb occupies mostly substitutional sites in Si with 84% electrical activity. It has been shown that after laser annealing the concentration of Sb in lattice sites is almost an order of magnitude higher than the limit of solid solubility. Isochron and isothermal annealing of these samples up to 1150°C was carried out to study the kinetics of reverse annealing of antimony.  相似文献   

7.
The electric quadrupole interaction frequencyν Q =eQV zz /h of177Lu in single crystals of Zn and In has been measured by the method of low temperature nuclear orientation. The results are $$\begin{gathered} v_Q ({}^{177}Lu\underline {Zn} ) = - 180(5)MHz \hfill \\ v_Q ({}^{177}Lu\underline {In} ) = - 19(5)MHz. \hfill \\ \end{gathered} $$ With the known quadrupole moment of177LuQ=3.39 (2) b we derive for the electric field gradientV zz (Lu Zn)=?2.20 (5)×1017 V/cm2 andV zz (Lu In)=?0.23 (6)×1017 V/cm2. The results are compared with magnetostriction measurements of silver single crystals doped with rare earth atoms.  相似文献   

8.
Bartels  J.  Noll  C.  Vianden  R. 《Hyperfine Interactions》1999,120(1-8):353-358
The perturbed angular correlation technique (PAC) was used to study the creation and development of He-induced cavities. In order to investigate the interaction of Indium atoms with cavities in Silicon the Bonn isotope separator was used to implant overlapping profiles of He (10 keV) and radioactive 111In (160 keV) into undoped FZ-silicon. To get insight into the cavity formation mechanism samples were prepared with various He-doses (0.6, 2 and 6× 1016 ions/cm2). The samples were measured directly after implantation and after different annealing steps (thold= 10 min, T = 500–1100oC). Further, different implantation and annealing sequences were used. At higher He doses (2 and 6× 1016 ions/cm2) we find a large fraction of 111In probe atoms subjected to an electric field gradient (EFG) corresponding to a quadrupole interaction frequency (QIF) of νQ= 411(6) MHz with η= 0.25(4). The corresponding defect configuration is formed most effectively after He implantation into annealed, 111In doped Si. This and the affinity of In to vacancies leads us to the assumption that, similarly to the situation in metals, the Indium atoms act as nucleation centres for vacancy clusters (cavities) and are situated on the inner walls of the cavities. This revised version was published online in August 2006 with corrections to the Cover Date.  相似文献   

9.
The perturbed angular correlation (PAC) measurements with the 111In-111Cd nuclear probe embedded into the lattice of the cubic (C15) Laves compound ZrZn2 showed that 111Cd nuclei experienced an axially symmetric electric quadrupole interaction with a frequency ν Q  = 132.4 MHz at room temperature. The samples were synthesized and doped with the probe at a pressure 8 GPa. The temperature dependence of ν Q was shown to be linear: ν Q (T) = 147(1 − 0.033 T) MHz. Since the value of ν Q is very close to that known for 111Cd in the lattice of Zn, we have checked if it could be assigned to residual Zn metal in the sample. For the Zn sample melted and doped with 111In at 8 GPa we have obtained ν Q  = 117.3 MHz at 300 K and 127 MHz at 80 K – both values considerably lower than that for 111In doped Zn samples prepared at an ambient pressure. These data, and the fact that ν Q (T) in Zn is known to follow the T 3/2 law, allow to attribute the ν Q value quoted above to 111Cd nuclei at the substitutional sites with tetrahedral symmetry in the Zn sublattice of ZrZn2.  相似文献   

10.
The hyperfine interaction of181Ta in HfP has been investigated by time differential perturbed angular correlation method which yielded interaction frequencyv Q=630.20(15) MHz. The observed electric field gradient is calculated to be 1.66(25) × 1020 V/m2.  相似文献   

11.
Using the time-differential perturbed-angular correlation technique, we have observed the nuclear electric quadrupole interaction at 181Ta (482 keV) as an impurity in the refractory compound HfB2. The measured interaction frequency is νQ=730±5 MHz which corresponds to an electric field gradient of |eq|=(1·19±0·05)×1018 V/cm2 at room temperature. By considering a second measurement at 4·2°K, which yields the same results as above, and by comparison with available results for Hf in HfB2, we conclude that the d-electron density of states at the Fermi level is quite small in agreement with trends observed by others.  相似文献   

12.
The magnitude of the electric field gradient at 57Fe probe nuclei in Zn is measured using Mössbauer effect and the value is 2.34 × 1017 V/cm2. The electric field gradients at Fe probe nuclei in Ti, Zn, Zr, Cd and Hf hosts are compared with the predictions of the conduction-electron charge-shift model.  相似文献   

13.
The local environment of implanted 111Ag (t 1/2 = 7.45 d) in single-crystalline [0001] ZnO was evaluated by means of the perturbed angular correlation (PAC) technique. Following the 60 keV low dose (1 × 1013 cm−2) 111Ag implantation, the PAC measurements were performed for the as-implanted state and following 30 min air annealing steps, at temperatures ranging from 200 to 1050°C. The results revealed that 42% of the probes are located at defect-free SZn sites (ν Q ∼ 32 MHz, η = 0) in the as-implanted state and that this fraction did not significantly change with annealing. Moreover, a progressive lattice recovery in the near vicinity of the probes was observed. Different EFGs assigned to point defects were furthermore measured and a general modification of their parameters occurred after 600°C. The 900°C annealing induced the loss of 30% of the 111Ag atoms, 7% of which were located in regions of high defects concentration.  相似文献   

14.
本文利用阻抗谱研究Ir(111)电极在HClO4和H2SO4中溶液中的氢吸附行为. 在HClO4溶液中,随着施加电位从0.2 V降到0.1 V(vs RHE),Ir(111)电极上氢吸附速率从1.74×10-8 mol·cm-2·s-1增大到 3.47×10-7 mol·cm-2·s-1 . 与相同条件下Pt(111)电极上的氢吸附速率相比,Ir(111)上的氢吸附速率要小1∽2个数量级,这是由于Ir(111)电极与H2O结合能力更强,因此位于水合氢键网络中的氢离子需要克服更高的能垒才能重新定向进而发生欠电位沉积. 在H2SO4溶液中,氢吸附电位负移了200 mV,吸附速率也下降了一个数量级,这是由于Ir(111)电极表面强吸附的硫酸根/硫酸氢根物种的阻碍作用. 结果表明,在电化学环境下,位于电极表面附近的水分子的取代和重新定向在很大程度上影响了氢吸附过程.  相似文献   

15.
Gallium antimonide (GaSb) films were deposited onto fused silica and n-Si (100) substrates by coevaporating Ga and Sb from appropriate evaporation sources. The films were polycrystalline in nature. The size and the shape of the grains varied with the change in the substrate temperature during deposition. The average surface roughness of the films was estimated to be 10 nm. Grain boundary trap states varied between 2×1012 and 2.2×1012 cm?2 while barrier height at the grain boundaries varied between 0.09 eV and 0.10 eV for films deposited at higher temperatures. Stress in the films decreased for films deposited at higher temperatures. XPS studies indicated two strong peaks located at ~543 eV and ~1121 eV for Sb 3d3/2 and Ga 2p3/2 core-level spectra, respectively. The PL spectra measured at 300 K was dominated by a strong peak located ~0.55 eV followed by two low intensity peaks ~0.63 eV and 0.67 eV. A typical n-Si/GaSb photovoltaic cell fabricated here indicated V oc~311 mV and J~29.45 mA/cm2, the density of donors (N d)~3.87×1015 cm?3, built in potential (V bi)~0.48 V and carrier life time (τ)~28.5 ms. Impedance spectroscopy measurements indicated a dielectric relaxation time ~100 μs.  相似文献   

16.
The time-differential perturbed angular correlation for 111Cd nuclei has been measured after 111In implantation into polycrystalline TiO2. The observed perturbation functions are characterized by a well-defined electric field gradient with the quadrupole coupling constant νQ = 105(1) MHz and the asymmetry parameter η = 0.18(1). We attribute these hyperfine parameters to 111Cd on the (distorted) substitutional cation site in rutile. The PAC results are compared with those in SnO2 rutile as well as with X-ray diffraction, RBS channeling experiments and point charge model calculations including relaxation of the probe atom surrounding.  相似文献   

17.
As x in Zr(In)O2?x is increased from 0.08 to 0.16 (9–19 mole per cent In2O3) the activation energy E(x) for ionic conduction increases from 1.05 to 1.51 eV; the concuctivity decreases from 2 × 10?5 to 3 × 10?6Ω?1cm?1at 400°C, is composition-independent at about 580°C, and increases from 1 × 10?2 to 4 × 10?2Ω?1cm?1 at 800°C. The pre-exponential term of the Boltzmann-type conductivity equation depends exponentially on E(x), a much stronger dependence on x than theoretically expected with a model for ionic conductivity that includes nearest-neighbor defect interactions. Analysis of reported conductivity data for Zr(M)O2?x (M = Sc, Y, Ca and rare earth metals) and other doped oxide electrolytes with fluorite-type structure reveals that the same relationship is observed with these materials when x γ0.08. It is shown that ionic conduction in these oxides is consistent with nearest neighbor vacancy-cation defect interaction forx < 0.08 but that an additional complex interaction with composition-dependent free energy ΔG(x) occurs when xγ 0.08.The lattice constant of Zr(In)O2?x with the cubic fluorite-type structure is independent of composition, 5.114 ± 0.002 Å, in agreement with ionic size considerations.  相似文献   

18.
The effects of antimony (Sb) doping on solution‐processed indium oxide (InOx) thin film transistors (TFTs) were examined. The Sb‐doped InSbO TFT exhibited a high mobility, low gate swing, threshold voltage, and high ION/OFF ratio of 4.6 cm2/V s, 0.29 V/decade, 1.9 V, and 3 × 107, respectively. The gate bias and photobias stability of the InSbO TFTs were also improved by Sb doping compared to those of InOx TFTs. This improvement was attributed to the reduction of oxygen‐related defects and/or the existence of the lone‐pair s‐electron of Sb3+ in amorphous InSbO films. (© 2014 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)  相似文献   

19.
Sebastian  K.C.  Somayajulu  D.R.S.  Varma  J. 《Hyperfine Interactions》1999,120(1-8):519-523
Probe-impurity interactions of In–Cd and In–Zn pairs in silver matrix have been studied using 111In-TDPAC measurements. The interactions are repulsive for both the pairs. For 3% alloys, the interaction energy of In–Cd pairs in Ag is 51± 2 meV and that of In–Zn pairs is 19± 1 meV. The Electric Field Gradient (EFG) at 111Cd due to a single Cd nn impurity to the In probe is found to be 0.83± 0.04× 1021 V/m2 while for a Zn impurity is 1.50± 0.05× 1021 V/m2. Cd–Cd contact interaction in silver is also found to be repulsive. This revised version was published online in August 2006 with corrections to the Cover Date.  相似文献   

20.
Ferroelectric thin films of BaTiO3 were successfully deposited on SiO2/Si substrate under the optimal rf magnetron sputtering conditions, and their electrical and ferroelectric characteristics were discussed. The memory window, capacitance, threshold voltage and leakage current density of MFIS structure under different frequencies and temperatures were also reported. The variations of ferroelectric capacitance and threshold voltage would be attributed to the as-deposited BaTiO3 films of MFIS structure as the temperature and frequency increased. Besides, the memory window, threshold voltage and leakage current density would be degraded from 4 V, 5 V and 8×10-10 A/cm2 to 2.5 V, 10 V and 5×10-4 A/cm2, respectively, as the temperature increased from 25 to 90 °C. PACS 77.84.-s; 81.15.Cd; 73.40.Qv; 51.50.+v; 67.80.Gb  相似文献   

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