Structure and optical properties of ZnSe/SiO<Subscript>2</Subscript> layered nanocomposites

Structure and optical properties of ZnSe/SiO₂ layered nanocomposites obtained using microwave magnetron sputtering have been studied. The nanocomposites are X-ray amorphous at relatively small thicknesses of the zinc selenide layers. When the thickness of the zinc selenide layers exceeds 20 Å, ZnSe/SiO₂ films contain SiO₂ amorphous phase and zinc selenide cubic nanocrystallites. It has been demonstrated that the thickness of zinc selenide layers affects the microstresses, refractive index, and band gap.     

Preparation and investigation of composite SiO<Subscript>2</Subscript>-TiO<Subscript>2</Subscript> films

SiO₂-TiO₂ films [Si:Ti = 1:(0.06–2.3)] are obtained by the sol-gel method. The structural and photoluminescent properties of the films and powders heat-treated at different temperatures are studied. It is shown that after 700°C the composite consists of TiO₂ crystallites that are structurally similar to anatase and distributed in an amorphous SiO₂ matrix. The photoluminescence spectra have maxima at 450–500 nm. The photoluminescence intensity depends on the treatment temperature and TiO₂ content. __________ Translated from Zhurnal Prikladnoi Spektroskopii Vol. 74, No. 3, pp. 357–361, May–June, 2007.     

Fine structure and mechanical properties of the shape-memory Ni<Subscript>50</Subscript>Ti<Subscript>32</Subscript>Hf<Subscript>18</Subscript> alloy rapidly quenched by spinning

We have reported the results of investigations of the structure and chemical and phase compositions of the amorphous Ni₅₀Ti₃₂Hf₁₈ alloy prepared by rapid quenching from melt by spinning and subjected to heat treatments. The specific features of the fine polycrystalline alloy structure formation depending on the heat-treatment mode have been studied by transmission and scanning electron microscopy, chemical microanalysis, electron diffraction, and X-ray diffraction analysis. According to the data on the temperature behavior of electrical resistivity, critical temperatures of devitrification and subsequent thermoelastic martensitic transformation B2 → B19′ have been determined. The mechanical properties in different heat-treatment modes have been investigated.     

Short-Range Order in Amorphous and Crystalline Ferroelectric Hf<Subscript>0.5</Subscript>Zr<Subscript>0.5</Subscript>O<Subscript>2</Subscript>

The microstructures of amorphous and polycrystalline ferroelectric Hf_0.5Zr_0.5O₂ films are studied by X-ray spectroscopy and ellipsometry. EXAFS spectra demonstrate that the amorphous film consists of an “incompletely mixed” solid solution of metallic oxides HfO₂ and ZrO₂. After rapid thermal annealing, the mixed Hf_0.5Zr_0.5O₂ oxide films have a more ordered polycrystalline structure, and individual Hf and Zr monoxide islands are formed in the films. These islands are several nanometers in size and have a structure that is similar to the monoclinic structure of HfO₂ and ZrO₂. The presence of the HfO₂ and ZrO₂ phases in the Hf_0.5Zr_0.5O₂ films is also detected by ellipsometry.     

Magnetic Resonance in [(CoP)<Subscript>soft</Subscript>/NiP/(CoP)<Subscript>hard</Subscript>/NiP]<Subscript><Emphasis Type="Italic">n</Emphasis></Subscript> Multilayer Magnetic Springs

The magnetic resonance properties of [(CoP)_soft/NiP/(CoP)_hard/NiP]_n multilayer films with the properties of magnetic springs have been experimentally studied. It has been found that the deposition of a NiP nonmagnetic amorphous layer on a (CoP)_soft magnetic layer induces the appearance of perpendicular interface anisotropy. The increase in the number of blocks n in the multilayer structure leads to the appearance of the third absorption peak, which is explained by the formation of a noncollinear three-sublattice magnetic structure.     

Optical and magnetooptical properties of CoFeB/SiO<Subscript>2</Subscript> and CoFeZr/Al<Subscript>2</Subscript>O<Subscript>3</Subscript> granular magnetic nanostructures

The optical and magnetooptical properties of the new granular nanocomposites (CoFeB)/(SiO₂) and (CoFeZr)/(Al₂O₃), which are grains of amorphous ferromagnetic alloys embedded in dielectric matrices, have been studied. The dependence of the optical, magnetooptical, and magnetic properties of the nanocomposites on their qualitative and quantitative composition, as well as on the conditions of their preparation, was investigated. Spectra of the dielectric functions ε = ε₁ ? iε₂ were obtained by the ellipsometric method in the range 0.6–5.4 eV. Above 4.2 eV, the absorption coefficient of the (CoFeB)/(SiO₂) composites was found to be close to zero for all magnetic-grain concentrations. The polar Kerr effect measured at a photon energy of 1.96 eV in dc magnetic fields of up to 15 kOe reaches values as high as 0.25°–0.3° for these nanocomposites and depends only weakly on the conditions of preparation. On the other hand, the (CoFeZr)/(Al₂O₃) nanostructures reveal a considerable difference in the concentration dependences of the Kerr effect between samples prepared in a dc magnetic field and in zero field.     

Large-scale potential fluctuations caused by SiO<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript> compositional inhomogeneity

The short-range order in amorphous SiO _x (0 ≤ x ≤ 2) films has been studied by high-resolution X-ray photoelectron spectroscopy. Both the random bonding and random mixture models do not describe experimental photoelectron spectra of SiO _x (x ≤ 2). An intermediate model of the SiO _x structure has been proposed. The measured photoelectron spectra of the SiO _x (x ≤ 2) valence band indicate the presence of the silicon phase and silicon oxide.     

Growth of Fe<Subscript>3</Subscript>O<Subscript>4</Subscript> films on the Si(111) surface covered by a thin SiO<Subscript>2</Subscript> layer

Magnetite polycrystalline films are grown by variously oxidizing a Fe film on the Si(111) surface covered by a thin (1.5 nm) SiO₂ layer. It is found that defects in the SiO₂ layer influence silicidation under heating of the Fe film. The high-temperature oxidation of the Fe film results in the formation of both Fe₃O₄ and iron monosilicide. However, the high-temperature deposition of Fe in an oxygen atmosphere leads to the growth of a compositionally uniform Fe₃O₄ film on the SiO₂ surface. It is found that such a synthesis method causes [311] texture to arise in the magnetite film, with the texture axis normal to the surface. The influence of the synthesis method on the magnetic properties of grown Fe₃O₄ films is studied. A high coercive force of Fe₃O₃ films grown by Fe film oxidation is related to their specific morphology and compositional nonuniformity.     

Magnetic Core/Shell Nanocomposites MgFe<Subscript>2</Subscript>O<Subscript>4</Subscript>/SiO<Subscript>2</Subscript> for Biomedical Application: Synthesis and Properties

Magnetic core/shell (CS) nanocomposites (MNCs) are synthesized using a simple method, in which a magnesium ferrite nanoparticle (MgFe₂O₄) is a core, and an amorphous silicon dioxide (silica SiO₂) layer is a shell. The composition, morphology, and structure of synthesized particles are studied using X-ray diffraction, field emission electron microscopy, transmission electron microscopy (TEM), energy-dispersive spectroscopy (EDS), scattering electrophoretic photometer, thermogravimetric analysis (TGA), and Mössbauer spectroscopy. It is found that the MgFe₂O₄/SiO₂ MNC has the core/shell structure formed by the Fe?O–Si chemical bond. After coating with silica, the MgFe₂O₄/SiO₂ MNC saturation magnetization significantly decreases in comparison with MgFe₂O₄ particles without a SiO₂ shell. Spherical particles agglomerated from MgFe₂O₄ nanocrystallites ～9.6 and ～11.5 nm in size function as cores coated with SiO₂ shells ～30 and ～50 nm thick, respectively. The total size of obtained CS MNCs is ～200 and 300 nm, respectively. Synthesized CS MgFe₂O₄/SiO₂ MNCs are very promising for biomedical applications, due to the biological compatibility of silicon dioxide, its sizes, and the fact that the Curie temperature is in the region required for hyperthermal therapy, 320 K.     

Properties of an Al<Subscript>2</Subscript>O<Subscript>3</Subscript>/Si interface

The phase chemical composition of an Al₂O₃/Si interface formed upon molecular deposition of a 100-nm-thick Al₂O₃ layer on the Si(100) (c-Si) surface is investigated by depth-resolved ultrasoft x-ray emission spectroscopy. Analysis is performed using Al and Si L_{2, 3} emission bands. It is found that the thickness of the interface separating the c-Si substrate and the Al₂O₃ layer is approximately equal to 60 nm and the interface has a complex structure. The upper layer of the interface contains Al₂O₃ molecules and Al atoms, whose coordination is characteristic of metallic aluminum (most likely, these atoms form sufficiently large-sized Al clusters). The shape of the Si bands indicates that the interface layer (no more than 10-nm thick) adjacent to the substrate involves Si atoms in an unusual chemical state. This state is not typical of amorphous Si, c-Si, SiO₂, or SiO_x (it is assumed that these Si atoms form small-sized Si clusters). It is revealed that SiO₂ is contained in the vicinity of the substrate. The properties of thicker coatings are similar to those of the 100-nm-thick Al₂O₃ layer and differ significantly from the properties of the interfaces of Al₂O₃ thin layers.     

Mössbauer studies of magnetic Fe<Subscript>2</Subscript>O<Subscript>3</Subscript>/SiO<Subscript>2</Subscript> nanocomposites

A large variety of glass and glass ceramics may be obtained by sol-gel process from hydrolysis of tetraethoxysilane. The transformation involves hydrolysis and polycondensation reactions leading to the growth of clusters that eventually collide together to form a gel. The structure and properties of the final product have been found to be strongly dependent on the initial conditions of preparation. Silica nanocomposites based on Fe₂O₃/SiO₂ were prepared with the help of ultrasonic activation and subsequent annealing in nitrogen atmosphere or air with concentrations of iron oxide of about 20 to 30wt.%.     

Ferroelectric and dielectric properties of SrBi<Subscript>4</Subscript>Ti<Subscript>4</Subscript>O<Subscript>15</Subscript> thin films grown on Bi<Subscript>4</Subscript>Ti<Subscript>3</Subscript>O<Subscript>12</Subscript> film layer

Ferroelectric and dielectric properties of bilayered ferroelectric thin films, SrBi₄Ti₄O₁₅ grown on Bi₄Ti₃O₁₂, were investigated. The thin films were annealed at 700°C under oxygen atmosphere. The bilayered thin films were prepared on a Pt(111)/Ti/SiO₂/Si substrate by a chemical solution deposition method. The dielectric constant and dielectric loss of the bilayered thin films were 645 and 0.09, respectively, at 100 kHz. The value of remnant polarization (2P _r) measured from the ferroelectric thin film capacitors was 60.5 μC/cm² at electric field of 200 kV/cm. The remnant polarization was reduced by 22% of the initial value after 10¹⁰ switching cycles. The results showed that the ferroelectric and dielectric properties of the SrBi₄Ti₄O₁₅ on Bi₄Ti₃O₁₂ ferroelectric thin films were better than those of the SrBi₄Ti₄O₁₅ grown on a Pt-coated Si substrate suggesting that the improved properties may be due to the different nucleation and growth kinetics of SrBi₄Ti₄O₁₅ on the c-axis-oriented Bi₄Ti₃O₁₂ layer or on the Pt-coated Si substrate.     

Characterization of Zn<Subscript>2</Subscript>SnO<Subscript>4</Subscript> Thin Films Prepared by RF Magnetron Sputtering

Zn₂SnO₄ (ZTO) is a stable semiconductor in ZnO–SnO₂ system and important transparent conducting oxide (TCO) predominantly used in optoelectronic devices. ZTO thin films were prepared by RF magnetron sputtering using Zn₂SnO₄ ceramic target in this paper. The effects of annealing temperatures and oxygen contents on characterization of ZTO thin films were studied. The results show that ZTO thin films prepared by RF magnetron sputtering are amorphous with an optical band gap of 3.22 eV. After annealing at 650°C in Ar atmosphere for 40 min, ZTO films possess a spinel structure with an optical band gap of 3.62 eV. The atomic force microscope (AFM) data of morphology reveals that the surface roughness of films is about 2 nm. The results of energy dispersive spectrometer (EDS) show that the concentration ratio of Zn to Sn is in the range from 1.44 to 1.57. The results of Hall-effect-measurement system reveal that the resistivity of films varies from 102 to 10–1 Ωcm, carrier concentration is about 10¹⁷ cm^–3, and mobility ranges from 10⁰ to 10¹ cm² v^–1 s^–1.     

RETRACTED ARTICLE: Refractive-index tailoring and morphological evolutions in Gd<Subscript>2</Subscript>O<Subscript>3</Subscript>–SiO<Subscript>2</Subscript> and ZrO<Subscript>2</Subscript>–SiO<Subscript>2</Subscript> composite thin films

Refractive-index tailoring and morphological evolutions in two different thin film composite systems of gadolinia–silica (Gd₂O₃:SiO₂) and zirconia–silica (ZrO₂:SiO₂) deposited through reactive electron-beam codeposition processes are discussed in this research paper. For Gd₂O₃:SiO₂ the refractive-index tuning has been achieved from 1.45 to 2.18, whereas in the case of ZrO₂:SiO₂ the achieved tunable range is from 1.45 to 2.45 in the ultraviolet region. Under certain compositional mixings with lower silica fractions both the systems demonstrated relative microstructural and morphological densifications. Such evolutions were very successfully derived through phase-modulated ellipsometry and atomic force microscopy. The composition-dependent refractive-index tailoring and microstructural densifications have been investigated by adopting Tauc–Lorentz and single-effective-oscillator models. The morphological correlation functions have also very aptly supported such evolutions in these composite films. These experimental results indicate their favourable properties and applicability down to the extreme ultraviolet wavelength region of the electromagnetic spectrum. PACS 42.79.Wc; 78.66.-w; 78.20.Ci; 61.16.Ch; 42.70.-a;68.55.-a; 68.35.Bs; 81.15.Ef     

Magnetooptical properties of Co-SiO<Subscript>2</Subscript> granular films

The structural, optical, and magnetooptical properties of Co-SiO₂ granular films are studied. It is found that the magnetooptical response is considerably enhanced in samples with a metal component concentration close to the percolation threshold. The Co nanogranules formed in the SiO₂ matrix exhibit ferromagnetic properties and are ordered into the fcc structure, which is confirmed by magnetooptical investigations. The magnetooptical properties of nanocomposites are simulated in the effective-medium approximation. It is shown that the singularities found in the magnetooptical spectra are related to the excitation of plasmon resonances in granular films.     

Structural properties of amorphous TiO<Subscript>2</Subscript> nanoparticles

Structural properties of amorphous TiO₂ spherical nanoparticles have been studied in models with different sizes of 2 nm, 3 nm, 4 nm and 5 nm under non-periodic boundary conditions. We use the pairwise interatomic potentials proposed by Matsui and Akaogi. Models have been obtained by cooling from the melt via molecular dynamics (MD) simulation. Structural properties of an amorphous nanoparticle obtained at 350 K have been analyzed in detail through the partial radial distribution functions (PRDFs), coordination number distributions, bond-angle distributions and interatomic distances. Moreover, we show the radial density profile in a nanoparticle. Calculations show that size effects on structure of a model are significant and that if the size is larger than 3 nm, amorphous TiO₂ nanoparticles have a distorted octahedral network structure with the mean coordination number Z_Ti-O ≈6.0 and Z_O-Ti ≈3.0 like those observed in the bulk. Surface structure and surface energy of nanoparticles have been obtained and presented.     

Chemical and phase compositions of multilayer nanoperiodic <Emphasis Type="Italic">a</Emphasis>-SiO<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript>/ZrO<Subscript>2</Subscript> structures subjected to high-temperature annealing

The chemical and the phase compositions of multilayer nanoperiodic SiO _x /ZrO₂ structures prepared by vacuum evaporation from separated sources and subjected to high-temperature annealing have been studied by X-ray photoelectron spectroscopy with a layer-by-layer etching. It is found that, under deposition conditions used, the silicon suboxide layers had the stoichiometric coefficient x ~1.8 and the zirconium-containing layers were the stoichiometric zirconium dioxide. It was found, using X-ray photoelectron spectroscopy, that annealing of the multilayer structures at 1000°C leads to mutual diffusion of the components and chemical interaction between ZrO₂ and SiO _x with predominant formation of zirconium silicate at heteroboundaries of the structures. The SiO _x layers of the annealed nanostructures contained ~5 at % elemental silicon as a result of the phase separation and the formation of fine silicon nanocrystals.     

Structural and optical properties of Bi<Subscript>3.25</Subscript>La<Subscript>0.75</Subscript>Ti<Subscript>3</Subscript>O<Subscript>12</Subscript> ferroelectric thin films prepared by chemical solution methods

Ferroelectric Bi_3.25La_0.75Ti₃O₁₂ (BLT) thin films have been grown on Pt/Ti/SiO₂/Si substrates by chemical solution methods. X-ray diffraction analysis shows that BLT thin films are polycrystalline with (171)-preferential orientation. Atomic force microscopy investigation shows that they have large grains about 120 nm in size. A Pt/BLT/Pt capacitor has been fabricated and showed excellent ferroelectricity, with a remnant polarization and coercive field of 24 μC/cm² and 116 kV/cm, respectively. The capacitor shows no polarization fatigue up to 10⁹ switching cycles. The optical constants (n,k) of the BLT thin films in the wavelength range 0.35–1.7 μm were obtained by spectroscopic ellipsometry measurements, and the band-gap energy was found to be about 3.25 eV. Received: 16 October 2001 / Accepted: 6 January 2002 / Published online: 3 June 2002 RID="*" ID="*"Corresponding author. Fax: +86-21/65830-734, E-mail: gswang@mail.sitp.ac.cn     

Hydrogen solubility in amorphous Mg<Subscript>0.6</Subscript>SiO<Subscript>2.6</Subscript> at high pressure

The solubility of hydrogen in amorphous Mg_0.6SiO_2.6 at a temperature of 250°C and pressures up to 75 kbar is studied using a quenching technique. The molar ratio H₂/formula unit is found to nonlinearly increase with pressure from x = 0.12 at P = 10 kbar to x = 0.303 at P = 75 kbar. An investigation of the quenched samples by Raman spectroscopy demonstrated that hydrogen dissolves in amorphous Mg_0.6SiO_2.6 in the form of H₂ molecules. X-ray diffraction and Raman studies showed that the hydrogenation of the samples is likely to be accompanied by a phase transition in the amorphous lattice of Mg_0.6SiO_2.6 at P ≈ 52.5 kbar to a denser amorphous modification.     

Structure,the lattice dynamic,and the dielectric characteristics of Sr<Subscript>0.5</Subscript>Ba<Subscript>0.5</Subscript>Nb<Subscript>2</Subscript>O<Subscript>6</Subscript> films

Solid solution Sr_0.5Ba_0.5Nb₂O₆ films have been synthesized on a (111)Pt/(001)Si substrate by rf deposition in an oxygen atmosphere. The depolarized Raman spectra, the structure, and the dielectric characteristics of the films have been studied over a wide temperature range. It is found that the films were singlephase, had the tetragonal tungsten bronze structure, and had a pronounced axial texture with axis 001 directed perpendicular to the substrate surface. It is shown that the film material undergoes a diffuse phase transition to the state of a relaxor ferroelectric in the temperature range 300–425 K. Possible reasons of the regularities observed are discussed.