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1.
In this paper we present a study of the effect of GaN capping layer thickness on the two-dimensional (2D)-electron mobility and the two-dimensional electron gas (2DEG) sheet density which is formed near the AlGaN barrier/buffer GaN layer. This study is undertaken using a fully numerical calculation for GaN/AlxGa1−xN/GaN heterostructures with different Al mole fraction in the AlxGa1−xN barrier, and for various values of barrier layer thickness. The results of our analysis clearly indicate that increasing the GaN capping layer thickness leads to a decrease in the 2DEG density. Furthermore, it is found that the room-temperature 2D-electron mobility reaches a maximum value of approximately 1.8×103 cm2 /Vs−1 for GaN capping layer thickness grater than 100 Å with an Al0.32Ga0.68N barrier layer of 200 Å thick. In contrast, for same structure, the 2DEG density decreases monotonically with GaN capping layer thickness, and eventually saturates at approximately 6×1012 cm−2 for capping layer thickness greater than 500 Å. A comparison between our calculated results with published experimental data is shown to be in good agreement for GaN capping layers up to 500 Å thickness.  相似文献   

2.
Focused ion beam implantation of gallium and dysprosium was used to locally insulate the near-surface two-dimensional electron gas of AlxGa1−xN/GaN heterostructures. The threshold dose for insulation was determined to be 2×1010 cm−1 for 90 keV Ga+ and 1×109 cm−1 for 200 keV Dy2+ at 4.2 K. This offers a tool not only for inter-device insulation but also for direct device fabrication. Making use of “open-T” like insulating line patterns, in-plane gate transistors have been fabricated by focused ion beam implantation. An exemplar with a geometrical channel width of 1.5 μm shows a conductance of 32 μS at 0 V gate voltage and a transconductance of around 4 μS, which is only slightly dependent on the gate voltage.  相似文献   

3.
A pyrochlore-related Ce2Zr2O8−x phase has been prepared in a reduction reoxidation process from Ce0.5Zr0.5O2 powders. Ce2Zr2O8−x, based on a cubic symmetry with a=1.053 nm, decomposes in nitrogen at 800 °C, but remains stable up to 900 °C in air. It shows mixed oxygen ionic and electronic conductivity. The bulk conductivity at 700 °C is 4×10−4 S cm−1 in air and 1×10−2 S cm−1 in nitrogen, and the activation energy is 1.27 eV in air. In nitrogen, the Arrhenius law is not obeyed, and a curved plot was obtained from 400 to 700 °C; then, the conductivity decreased rapidly due to the thermal decomposition of Ce2Zr2O8−x.  相似文献   

4.
An experimental study on the production of NOx as a function of dissipated energy in laser-produced plasma in air is presented. A plasma was produced by focusing a (60–180) mJ, 5 ns, 532 nm pulse from a Q-switched Nd:YAG laser. The results show that for laser energy in the range of 13–99 mJ the laser plasma generates 6.7×1016 NOx molecules per joule and 4.6×1016 NO molecules per joule. An order of magnitude estimate of the NO and NOx production per unit volume of heated gas based on a simple model show that the NOx and NO production efficiency in air are about 3×1022 and 2×1022 molecules J−1 m−3.  相似文献   

5.
The band structure of HgTe quantum wells (QWs) has been determined from absorption experiments on superlattices in conjunction with calculations based on an 8×8 k·p model. The band structure combined with self-consistent Hartree calculations has enabled transport results to be quantitatively explained.Rashba spin–orbit, (SO) splitting has been investigated in n-type modulation doped HgTe QWs by means of Shubnikov–de Haas oscillations (SdH) in gated Hall bars. The heavy hole nature of the H1 conduction subband in QWs with an inverted band structure greatly enhances the Rashba SO splitting, with values up to 17 meV.By analyzing the SdH oscillations of a magnetic two-dimensional electron gas (2DEG) in modulation-doped n-type Hg1−xMnxTe QWs, we have been able to separate the gate voltage-dependent Rashba SO splitting from the temperature-dependent giant Zeeman splitting, which are of comparable magnitudes. In addition, hot electrons and Mn ions in a magnetic 2DEG have been investigated as a function of current.Nano-scale structures of lower dimensions are planned and experiments on sub-micrometer magneto-transport structures have resulted in the first evidence for ballistic transport in quasi-1D HgTe QW structures.  相似文献   

6.
TheY2Σ+–X2Πinear-infrared electronic transition of CuO was observed at high resolution for the first time. The spectrum was recorded with the Fourier transform spectrometer associated with the McMath–Pierce Solar Telescope at Kitt Peak. The excited CuO molecules were produced in a low pressure copper hollow cathode sputter with a slow flow of oxygen. Constants for theY2Σ+states of CuO are:T0= 7715.47765(54) cm−1,B= 0.4735780(28) cm−1,D= 0.822(12) × 10−6cm−1,H= 0.46(10) × 10−10cm−1, γ = −0.089587(42) cm−1, γD= 0.1272(79) × 10−6cm−1,bF= 0.12347(22) cm−1, andc= 0.0550(74) cm−1. ImprovedX2Πiconstants are also presented.  相似文献   

7.
The Ag2O–TiO2–SiO2 glasses were prepared by Ag+/Na+ ion-exchange method from Na2O–TiO2–SiO2 glasses at 380–450 °C below their glass transition temperatures (Tg), and their electrical conductivities were investigated as functions of TiO2 content and the ion-exchange ratio (Ag/(Ag+Na)). In a series of glasses 20R2xTiO2·(80−x)SiO2 with x=10, 20, 30 and 40 in mol%, the electrical conductivities at 200 °C of the fully ion-exchanged glasses of R=Ag were in the order of 10−5 or 10−4 S cm−1 and were 1 or 2 orders of magnitude higher than those of the initial glasses of R=Na. The glass of x=30 exhibited the highest increase of conductivity from 3.8×10−7 to 1.3×10−4 S cm−1 at 200 °C by Ag+/Na+ ion exchange among them. When the ion-exchange ratio was changed in 20R2O·30TiO2·50SiO2 system, the electrical conductivity at 200 °C exhibited a minimum value of 7.6×10−8 S cm−1 around Ag/(Ag+Na)=0.3 and increased steeply in the region of Ag/(Ag+Na)=0.5–1.0. When the ion-exchange temperature was changed from 450 to 400 °C, the conductivity of the ion-exchanged glass of x=30 decreased. The infrared spectroscopy measurement revealed that the ion-exchange temperature of 450 °C induced a structural change in the glass of x=30. The Tg of the fully ion-exchanged glass of x=30 was 498 °C. It was suggested that the incorporated silver ions changed the average coordination number of titanium ions to form higher ion-conducting pathway and resulted in high conductivity in the titanosilicate glasses.  相似文献   

8.
We report on measurements of optically induced gate voltage spectroscopy in a GaAs/AlGaAs heterostructure with a high mobility 2-dimensional electron gas (2DEG) in a thin (55 nm) GaAs layer. The optically induced gate voltage between the front gate and the 2DEG is sensitive to excess electron concentrations below 107 cm−2. In the gate voltage spectrum we observe a peak below the bandgap energy of GaAs, which is not observed in the photocurrent, luminescence or excitation spectra. Due to the extremely high sensitivity of this technique we attribute this below bandgap signal to very weak absorption lines below the GaAs bandgap energy by impurity bands or defect absorption. The fall-off of the below bandgap signal varies as exp (hω/E0), where E0 is an indicative for the quality of the heterostructure.  相似文献   

9.
We have prepared a large number of high mobility two-dimensional electron gas (2DEG) structures, with undoped spacer thicknesses ranging from 9 to 3200Å. For samples with 400Å of (Al, Ga)As Si-doped at 1.3×1018 cm−3, there is a peak in the 4K mobility at spacers of 400–800Å, with a maximum value of 2×106 cm2 V−1 s−1. Increasing the thickness of the doped (Al, Ga)As to 500Å produced an increase in mobility to 3×106 cm2 V−1 s−1 for a 400Å space sample. We have compared these results with published analyses of scattering processes in 2DEG structures, and conclude that a combination of ionised impurity and acoustic phonon scattering gives a qualitative explanation of the behaviour, but that the experimental mobility values are generally higher than those predicted theoretically.  相似文献   

10.
Single-crystal ZnO has been hydrothermally grown with additional In2O3 in the solution. Schottky barrier contacts have been deposited by electron beam evaporation of Pd onto the face. Capacitance–voltage measurements have been performed to reveal the carrier concentration as a function of the In2O3 content in the solution, and secondary-ion mass spectrometry was used to measure the resulting In concentration in the samples. For an In2O3 content of 2×1019 cm−3, the average free electron concentration increased to 5×1018 cm−3 compared to 4×1017 cm−3 for the non-doped material. An increase of the In2O3 content to 4×1019 cm−3 leads to a measured carrier concentration of approximately 1×1019 cm−3; however, only up to a quarter of the incorporated In became electrically active. From thermal admittance spectroscopy measurements two prominent electronic levels are found, and compared with to the non-doped material case, the freeze-out of the shallow doping in the In-doped samples takes place at lower temperatures (below 80 K).  相似文献   

11.
Hg1−xCdxTe(x0.22) samples grown by LPE on CdZnTe(111B)-oriented substrates were exposed to various doses of thermal neutrons (1.0×1016−1.7×1016 n/cm2) and subsequently annealed for 24 h in Hg overpressure to remove damage and reduce the presence of Hg vacancies. Extensive magnetotransport measurements were performed on these samples as part of an investigation into the use of elemental transmutation for efficient p-type doping of this material. The data were analyzed using a multi-carrier approach which incorporates various scattering mechanisms and the presence of two conduction channels of differing alloy content to describe the changes in the transport properties due to neutron irradiation.  相似文献   

12.
The structural properties of a 10 μm thick In-face InN film, grown on Al2O3 (0001) by radio-frequency plasma-assisted molecular beam epitaxy, were investigated by transmission electron microscopy and high resolution x-ray diffraction. Electron microscopy revealed the presence of threading dislocations of edge, screw and mixed type, and the absence of planar defects. The dislocation density near the InN/sapphire interface was 1.55×1010 cm−2, 4.82×108 cm−2 and 1.69×109 cm−2 for the edge, screw and mixed dislocation types, respectively. Towards the free surface of InN, the density of edge and mixed type dislocations decreased to 4.35×109 cm−2 and 1.20×109 cm−2, respectively, while the density of screw dislocations remained constant. Using x-ray diffraction, dislocations with screw component were found to be 1.2×109 cm−2, in good agreement with the electron microscopy results. Comparing electron microscopy results with x-ray diffraction ones, it is suggested that pure edge dislocations are neither completely randomly distributed nor completely piled up in grain boundaries within the InN film.  相似文献   

13.
Rashba polarization in HgCdTe inversion layers at large depletion charges   总被引:1,自引:0,他引:1  
The Rashba effect in metal–insulator–semiconductor (MIS) structures based on zero-gap HgCdTe is investigated experimentally and theoretically over a wide doping range NAND=3×1015–3×1018 cm−3. Increase of doping enlarges the magnitude of the effect at the same 2D concentration and strengthens a gate-voltage dependence of the Rashba splitting. The results demonstrate values of Rashba polarization as high as PR0.5 and a capability to control the Rashba effect strength at constant electron concentration.  相似文献   

14.
The 2ν3(A1) band of 12CD3F near 5.06 μm has been recorded with a resolution of 20–24 × 10−3 cm−1. The value of the parameter (αB − αA) for this band was found to be very small and, therefore, the K structure of the R(J) and P(J) manifolds was unresolved for J < 15 and only partially resolved for larger J values. The band was analyzed using standard techniques and values for the following constants determined: ν0 = 1977.178(3) cm−1, B″ = 0.68216(9) cm−1, DJ = 1.10(30) × 10−6 cm−1, αB = (B″ − B′) = 3.086(7) × 10−3 cm−1, and βJ = (DJDJ) = −3.24(11) × 10−7 cm−1. A value of αA = (A″ − A′) = 2.90(5) × 10−3 cm−1 has been obtained through band contour simulations of the R(J) and P(J) multiplets.  相似文献   

15.
This paper reports the spectral properties and energy levels of Cr3+:Sc2(MoO4)3 crystal. The crystal field strength Dq, Racah parameter B and C were calculated to be 1408 cm−1, 608 cm−1 and 3054 cm−1, respectively. The absorption cross sections σα of 4A24T1 and 4A24T2 transitions were 3.74×10−19 cm2 at 499 nm and 3.21×10−19 cm2 at 710 nm, respectively. The emission cross section σe was 375×10−20 cm2 at 880 nm. Cr3+:Sc2(MoO4)3 crystal has a broad emission band with a broad FWHM of 176 nm (2179 cm−1). Therefore, Cr3+:Sc2(MoO4)3 crystal may be regarded as a potential tunable laser gain medium.  相似文献   

16.
We report the observation of sharp plasmon and magnetoplasmon modes in ultra-low-density 2D electron systems. Well defined dispersions for the modes are observed at densities as low as 1.1×109 cm−2 and with excitation wave vectors as large as 1.2×105 cm−1. Interestingly, both modes are found to be more easily measured in low-density systems than in high-density systems. The strength of the light scattering cross-sections at low density suggests potential applications to the study of quantum phase transitions at large rs.  相似文献   

17.
Unsuccessful attempts were made to prepare LixMo6S7.7 by direct ionic exchange of Cu2Mo6S7.7 using aqueous, acetontrille, and molten salt solvents. Li2.3Mo6S7.7 was eventually prepared by lithiation of Mo6S8 using n-butyl lithium reagent. The mass transport properties of hot-pressed samples were measured using a four-point dc technique and the following values at 415°C for the lithium ionic conductivity, .4×10−4 (ohms cm−1) and lithium chemical diffusion coefficient 3.5×10−7 cm2/s, were derived. A possible explanation for the relatively low lithium ion mobility in Li2.3Mo6S7.7 is discussed.  相似文献   

18.
In the present paper, an abrupt heterojunction photodetector based on Hg1 − xCdxTe (MCT) has been simulated theoretically for mid-infrared applications. A semi-analytical simulation of the device has been carried out in order to study the performance ratings of the photodetector for operation at room temperature. The energy band diagram, carrier concentration, electric field profile, dark current, resistance–area product, quantum efficiency and detectivity have been calculated and optimized as a function of different parameters such as device thickness, applied reverse voltage and operating wavelength. The effect of energy band offsets in conduction and valance band on the transportation of minority carriers has been studied. The influences of doping concentration, electron affinity gradient and the pn junction position within heterostructure on potential barrier have been analyzed. The optical characterization has been carried out in respect of quantum efficiency, and detectivity of the heterojunction photodetector. In present model the Johnson–Nyquist and shot noise has been considered in calculation of detectivity. The simulated results has been compared and contrasted with the available experimental results. Results of our analytical-cum-simulation study reveal that under suitable biasing condition, the photodetector offers a dark current, ID ≈ 6.5 × 10−12 A, a zero-bias resistance–area product, R0A ≈ 11.3 Ω m2, quantum efficiency, η ≈ 78%, NEP = 2 × 10−12 W Hz1/2 and detectivity D* ≈ 4.7 × 1010 mHz1/2/W.  相似文献   

19.
We report the realization of an AlGaN/GaN HEMT on silicon (001) substrate with noticeably better transport and electrical characteristics than previously reported. The heterostructure has been grown by molecular beam epitaxy. The 2D electron gas formed at the AlGaN/GaN interface exhibits a sheet carrier density of 8×1012 cm−2 and a Hall mobility of 1800 cm2/V s at room temperature. High electron mobility transistors with a gate length of 4 μm have been processed and DC characteristics have been achieved. A maximum drain current of more than 500 mA/mm and a transconductance gm of 120 mS/mm have been obtained. These results are promising and open the way for making efficient AlGaN/GaN HEMT devices on Si(001).  相似文献   

20.
The effect of Pr doping on structural properties and room temperature Raman spectroscopy measurements is investigated in manganites (Eu1−xPrx)0.6Sr0.4MnO3 (0≤x≤1.0) with fixed carrier concentration. The result of the Rietveld refinement of x-ray powder diffraction shows that these compounds crystallize in an orthorhombic distorted structure with a space group Pnma. It is evident that, with increasing Pr substitution, three types of orthorhombic structures can be distinguished. The phonon frequencies of the three main peaks, in room temperature Raman-scattering measurements, have been discussed together with their structural characteristics, such as bond-length, bond-angles, and the change of orthorhombic structure type. With the increase of Pr content, the mode at 491  cm−1 also shows a corresponding change. A step effect becomes evident, which seems to indicate the close dependence between the frequency shift of this mode and the change in crystal symmetry. This further supports the notion that the mode at 491  cm−1 is closely correlated with the Jahn–Teller distortion. Moreover, we have found that the lowest frequency peak (assigned as an A1g phonon mode) depends linearly on the tolerance factor t.  相似文献   

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