共查询到20条相似文献,搜索用时 11 毫秒
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I. Farella A. Valentini N. Cioffi L. Torsi 《Applied Physics A: Materials Science & Processing》2005,80(4):791-795
The morphological (TEM) and chemical (XPS, ARXPS) characterizations of fluoropolymer films modified with palladium particles (CFx(Pd)) are reported in this article. The films, which have different levels of metal content, have been deposited by ion beam co-sputtering a Teflon target and a palladium one. Composite films with a thickness of a few nanometers have also been deposited and analyzed. For all degrees of thickness, the analyses show the fluoropolymer nature of the hosting material, the nanoscopic character of metal domains, and their uniform distribution in the polymer matrix. The likely application of this ion sputter-deposited material in the sensor field has also been preliminary tested. PACS 81.05.Qk; 82.35.Np; 81.15.Cd; 79.60.Fr; 07.07.Df 相似文献
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M.A. Nitti A. Valentini G.S. Senesi G. Ventruti E. Nappi G. Casamassima 《Applied Physics A: Materials Science & Processing》2005,80(8):1789-1791
Stoichiometric CsI thin films were deposited by Ar ion-beam sputtering of a CsI target at room temperature. The sputtered 100-nm thick CsI films obtained were characterized by X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), atomic force microscopy (AFM) and quantum efficiency (QE) measurements. As it was expected, the chemical, morphological, crystalline and photo-emissive properties of CsI films obtained depended on the deposition parameters. Comparison with results obtained for evaporated CsI films indicated that surface morphology, i.e., the effective photo-emissive surface area, is one of the important parameters in influencing the QE . PACS 81.15.-z; 79.60.Dp; 68.37.Ps 相似文献
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I. P. Soshnikov G. É. Cirlin V. G. Dubrovskiĭ A. V. Veretekha A. G. Gladyshev V. M. Ustinov 《Physics of the Solid State》2006,48(4):786-791
The possibility is demonstrated of fabricating arrays of cone-shaped GaAs nanowhiskers with a surface number density of up to 109 cm-2, a characteristic height ranging from 300 to 10000 nm, and a transverse size of approximately 200 nm at the base and from 200 to 10 nm or smaller at the top. The characteristic height of GaAs nanowhiskers varies in direct proportion to the effective thickness of the deposited material layer and in inverse proportion to the transverse nanowhisker size at the top. The growth of GaAs nanowhiskers is studied as a function of the deposition rate, the temperature, and the crystallographic orientation of the substrate. From an analysis of the obtained dependences of the nanowhisker size on these parameters, it is concluded that GaAs nanowhiskers are formed through the diffusion mechanism. 相似文献
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In this paper, InN thin films were deposited on Si (1 0 0) and K9 glass by reactive direct current magnetron sputtering. The target was In metal with the purity of 99.999% and the gases were Ar (99.999%) and N2 (99.999%). The properties of InN thin films were studied. Scanning electron microscopy (SEM) shows that the film surface is very rough and energy dispersive X-ray spectroscopy (EDX) shows that the film contains In, N and very little O. X-ray diffraction (XRD) and Raman scattering reveal that the film mainly contains hexagonal InN. The four-probe measurement shows that InN film is conductive. The transmission measurement demonstrates that the transmission of InN deposited on K9 glass is as low as 0.5% from 400 nm to 800 nm. 相似文献
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Molecular dynamics (MD) simulation and experimental methods are used to study the deposition mechanism of ionic beam sputtering (IBS), including the effects of incident energy, incident angle and deposition temperature on the growth process of nickel nanofilms. According to the simulation, the results showed that increasing the temperature of substrate decreases the surface roughness, average grain size and density. Increasing the incident angle increases the surface roughness and the average grain size of thin film, while decreasing its density. In addition, increasing the incident energy decreases the surface roughness and the average grain size of thin film, while increasing its density. For the cases of simulation, with the substrate temperature of 500 K, normal incident angle and 14.6 × 10−17 J are appropriate, in order to obtain a smoother surface, a small grain size and a higher density of thin film. From the experimental results, the surface roughness of thin film deposited on the substrates of Si(1 0 0) and indium tin oxide (ITO) decreases with the increasing sputtering power, while the thickness of thin film shows an approximately linear increase with the increase of sputtering power. 相似文献
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Liang-Chiun Chao Yu-Ren Shih Yao-Kai Li Jun-Wei Chen Jiun-De Wu Ching-Hwa Ho 《Applied Surface Science》2010,256(13):4153-8926
Nitrogen-doped ZnO thin films have been prepared by reactive ion beam sputtering deposition utilizing a capillaritron ion source. X-ray diffraction (XRD) analysis of the as-deposited film exhibits a single strong ZnO (002) diffraction peak centred at 34.40°. Post-growth annealing causes increase of grain size and decrease of c-axis lattice constant. Micro-Raman spectroscopy analysis of the as-deposited film shows strong nitrogen-related local vibration mode at 275, 582, 640 and 720 cm−1, whereas the E2 mode of ZnO at 436 cm−1 can barely be identified. Annealing at 500-800 °C causes decrease of 275, 582, 640 and 720 cm−1 and increase of 436 cm−1 intensity, indicating out-diffusion of nitrogen and improvement of ZnO crystalline quality. Unlike un-doped ZnO, the surface roughness of nitrogen-doped ZnO deteriorates after annealing, which is also attributed to the out-diffusion of nitrogen. A nitrogen concentration of ∼1021/cm3 was observed while type conversion from n-type to p-type was not achieved, which is likely due to the formation of ZnI-NO or (N2)O that act as donor/double donors. 相似文献
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Self-assembled Ge nanodots with areal number density up to 2.33×1010 cm-2 and aspect ratio larger than 0.12 are prepared by ion beam sputtering deposition. The dot density, a function of deposition rate and Ge coverage, is observed to be limited mainly by the transformation from two-dimensional precursors to three-dimensional islands, and to be associated with the adatom behaviors of attachment and detachment from the islands. An unusual increasing temperature dependence of nanodot density is also revealed when a high ion energy is employed in sputtering deposition, and is shown to be related to the breaking down of the superstrained wetting layer. This result is attributed to the interaction between energetic atoms and the growth surface, which mediates the island nucleation. 相似文献
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Using molecular-dynamics simulation, we study the scattering and penetration of normally incident hyperthermal (5–400 eV) Ne, Ar, and Xe atoms off a Cu crystal. We find that between 80% and 98% of the incident energy is deposited in the solid; the fraction depends primarily on the projectile mass, and — for not too low energies — only slightly on the bombarding energy. At low energy, the major part of the non-deposited energy is carried away by the reflected projectile. At energies above the sputter threshold, an increasingly important contribution of between 2% and 6% of the incident energy is carried away by sputtered particles. These results compare well with experiment. Electronic inelastic losses show only little influence on this behaviour. We demonstrate that the inclusion of a realistic attractive interaction between the projectile and the target atoms influences the energy deposition considerably at energies below around 100 eV. 相似文献
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ABSTRACTBased on magnetron sputtering deposition technology, titanium (Ti) thin films are deposited on silicon (Si) substrate using different preparation conditions such as sputtering power and pressure. The influence of altering these conditions on deposition rate and microstructure is studied. The results show that sputtering power significantly affects the rate of deposition and the resistivity. The deposition rate of the Ti thin film increases when the resistivity decreases under sputtering powers of 150–225?W with a pressure of 0.8?Pa and Argon (Ar) flux of 80 sccm. As sputtering power was increased further (from 225 to 250?W), the deposition rate reduced and the resistivity augmented. Pressure also has influence on the deposition rate and resistivity – when pressure increases from 0.6 to 0.8?Pa, the deposition rate escalates while the resistivity reduces; when the pressure is raised from 0.8 to 1.0?Pa with Ar flux of 100 sccm, the deposition rate decreases and resistivity increases. The surface chemical compositions and the structures of the Ti film were studied by using X-ray photoelectron spectroscopy (XPS) and X-ray diffractometer (XRD). Observing the cross-section of the thin-film samples produced by scanning electron microscope (SEM) reveals the influence of the preparation conditions used on the microstructure and confirms the influence of sputtering power and pressure on the resistivity. 相似文献
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A mathematical model of a coating that grows during magnetron deposition is formulated and examined. The effect of the main
technological and kinetic parameters on the coating growth dynamics is investigated. 相似文献
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The time variations of the discharge voltage and YBaCuO film deposition rate in an on-axis magnetron sputterer are studied. In the case of an YBaCuO ceramic target, the discharge voltage and the rate of superconducting phase deposition decrease with time, exponentially approaching a quasi-steady regime. At a pressure of 100 Pa, a decrease in the magnetic field induction near the target from 1200 to 600 G leads to a rise in the discharge voltage by 25–30% and increases the deposition rate more than twofold. The deposited films offer high electrophysical parameters, as demonstrated with a high-frequency circuit: the intrinsic Q factor of the circuit at 64.5 MHz is found to be 2.7 × 105. 相似文献
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I.?Lon?arevi? Z. M.?Jak?i? S. B.?Vrhovac Lj.?Budinski-Petkovi? 《The European Physical Journal B - Condensed Matter and Complex Systems》2010,73(3):439-445
Random sequential adsorption with diffusional relaxation of extended objects
both on a one-dimensional and planar triangular lattice is studied numerically
by means of Monte Carlo simulations. We focus our attention on the behavior of
the coverage θ(t) as a function of time. Our results indicate that the
lattice dimensionality plays an important role in the present model.
For deposition of k-mers on 1D lattice with diffusional relaxation, we found
that the growth of the coverage θ(t) above the jamming limit to the
closest packing limit θCPL is described by the pattern
θCPL-θ(t) ∝Eβ[-(t/τ)β], where Eβ
denotes the Mittag-Leffler function of order β∈(0,1). In the case of
deposition of extended lattice shapes in 2D, we found that after the initial
“jamming", a stretched exponential growth of the coverage θ(t) towards
the closest packing limit θCPL occurs, i.e., θCPL -
θ(t) ∝exp [-(t/τ)β]. For both cases we observe that: (i)
dependence of the relaxation time τ on the diffusion probability Pdif
is consistent with a simple power-law, i.e., τ∝Pdif
-δ;
(ii) parameter β depends on the object size in 1D and on the particle
shape in 2D. 相似文献
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I. P. Soshnikov P. Yu. Belyavskii I. V. Shtrom K. P. Kotlyar V. V. Lysak D. A. Kudryashov S. I. Pavlov A. V. Nashchekin G. E. Cirlin 《Physics of the Solid State》2016,58(12):2401-2405
We report the possibility of autocatalytic synthesis of highly crystalline perfect CdTe nanowires by magnetron presputtering deposition through the windows in ultrathin layers of SiO2. The photoluminescence spectra of obtained CdTe nanowires exhibit an emission band in the 1.4–1.7 eV region, indicating crystalline perfection of the nanowires. 相似文献