Photoplasticity of As2Se3 films investigated with combined nanoindentation and AFM methods

Thin As₂Se₃ amorphous chalcogenide films have been studied by nanoindentation and atomic force microscopy in darkness and under illumination by band-gap light. The combination of these two methods has been used to study the peculiarities of the photoplastic effect in amorphous semiconductors. It has been shown by multiple loading indentation experiments that a non-linear mechanism of the formation of the strain response is realized in the As₂Se₃ films subjected to the combined action of light and external mechanical loading. We have observed that light illumination alters the internal friction of the films and their shear modulus. These observations have been considered in the frame of the two-phase model of chalcogenide glasses. Some arguments in favor that the self-organization processes take place in the structure of irradiated film are given.     

Structural,optical and electrical properties of laser irradiated Pb doped Ga–Se chalcogenide thin films

Using the Transverse Electrical Excitation at Atmospheric Pressure (TEA) nitrogen laser, we had irradiated the amorphous thin films of Ga₁₀Se₈₁Pb₉ chalcogenide glass and the results have been discussed in terms of the structural aspects of Ga₁₀Se₈₁Pb₉ glass. The observed changes are associated with the interaction of the incident photon and the lone-pairs electrons which affects the band gap. The X-ray structural characterization revealed the amorphous nature of as prepared films and polycrystalline nature of the laser irradiated films. The optical band gap of these thin films is measured by using the absorption spectra as a function of photon energy in the wavelength region 400–1200 nm. It is found that the optical band gap decreases while the absorption coefficient increases with increasing the irradiation time. The decrease in the optical band gap has been explained on the basis of change in nature of films, from amorphous to polycrystalline state, with the increase in exposure time. The dc conductivities and activation energies of these thin films are measured in temperature range 303–403 K. It has been found that the activation energy in Ga₁₀Se₈₁Pb₉ chalcogenide thin films decreases whereas the dc conductivity increases at each temperature by increasing the irradiation time.     

Polarization-dependent laser-induced giant mass transport in glassy semiconductors

Direct experimental evidence of the validity of the two-phase model of chalcogenide glass has been obtained. It has been shown that the polarization-light irradiation of glassy semiconductor films induces giant mass transport in the direction perpendicular to the polarization of the incident light. It has been revealed that a surface relief appears in the irradiated films. The shape of the relief depends on the laser polarization state. A macroscopic model qualitatively describing the observed phenomenon is presented.     

Photoinduced changes in optical and contact properties of chalcogenide glasses

Photoinduced changes in optical and contact properties in thin films of glasses of As-Se and As-S systems are studied experimentally. The changes detected in the optical constants and parameters of the potential barrier at the interface between a metal and a chalcogenide vitreous semiconductor are explained by the rearrangement of the glass host under the action of radiation.     

Investigation of nonlinear optical parameters of zinc based amorphous chalcogenide films

Third order nonlinear optical properties of amorphous Zn_x–S_y–Se_100−x−y chalcogenide films have been investigated using single beam transmission z-scan technique at 1064 nm of Nd:YAG laser. Measurement of optical properties of amorphous Zn_x–S_y–Se_100−x−y chalcogenide films prepared by thermal evaporation technique has been made. X-ray diffraction patterns of chalcogenide films confirm the amorphous nature. Optical band gap (E_g) has been estimated using Tauc's plot method from transmission spectra that is found to decrease with increase in content due to valence band broadening and band tailing the system. Nonlinear refractive index (n₂), nonlinear absorption coefficient (β) and third order nonlinear susceptibility (χ³) of chalcogenide films have been estimated. Self-focusing effect has been observed in closed aperture and reverse saturable absorption in open aperture scheme. Limiting threshold and dynamic range have been calculated from optical limiting studies. The increase in nonlinearity with increase in Zn content has been observed that is understood to be due to decrease in band gap on Zn doping. High nonlinearity makes these films a potential candidate for waveguides, fibers and two photon absorption in optical limiters.     

An evidence for a microscopic phase separation in AsSeAg glasses revealed by thermal and structural investigations

Alternating Differential Scanning Calorimetric (ADSC) studies show that Se rich As₂₀Se_80-xAg_x (0 ≤ x ≤ 15) glasses exhibit two endothermic glass transitions and two exothermic crystallization peaks; the observed thermal behavior has been understood on the basis that As₂₀Se_80-xAg_x glasses are microscopically phase separated, containing Ag₂Se phases embedded in an As-Se backbone. With increasing silver concentration, the Ag₂Se phase percolates in the As-Se matrix, with a well-defined percolation threshold at x = 8. A signature of this percolation transition is shown up in the thermal behavior, as sudden jumps in the composition dependence of non-reversing enthalpy, ΔH_nr obtained at the second glass transition reaction. Scanning Electron Microscopic (SEM) studies also confirm the microscopic phase separation in these glasses. The super-ionic conduction observed earlier in these glasses at higher silver proportions, is likely to be associated with the silver phase percolation.     

Radiation-induced physical ageing of the structure of an arsenic–selenide glass

The effect of γ-irradiation (Co⁶⁰ sources) on 20 years stored As₁₀Se₉₀ glass is studied using high-resolution X-ray photoelectron spectroscopy (XPS) technique. It is shown that high-energy irradiation treatment stimulates studied chalcogenide glasses (ChG) towards a more thermodynamically equilibrium state which cannot be attained when making glass by the conventional melt-quenching method.     

Influence of gallium and alkali halide addition on the optical and thermo–mechanical properties of GeSe<Subscript>2</Subscript>-Ga<Subscript>2</Subscript>Se<Subscript>3</Subscript> glass

A systematic compositional study of a new family of chalcogenide glasses, transparent from the visible range up to 16 μm has been performed. Numerous glass forming regions were explored in the GeSe₂-Ga₂Se₃-MX system (MX = alkali halide) in order to understand the role of alkali halides and the effect of Ga substitution for Sb in the glass structure. To that avail, several ternary diagrams were investigated, and optical and thermo-mechanical measurements were performed. It is shown that the introduction of an alkali halide in the GeSe₂-Ga₂Se₃ glasses increased the band-gap energy E_g by stabilizing electrons from the lone pairs of selenium. However, the glass hardness was lowered due to a decrease in the glass network reticulation. The chemical resistance was studied in a glass containing high CsCl content. Significant corrosion occurred when the glass was exposed to hot water for several hours. There is a great deal of interest in these glasses for use in thermal imaging devices, as they permit the alignment of infrared optical systems with visible red light. Furthermore, the low cost of raw materials and the possibility of shaping these glasses into lenses by molding could extend their utilization from defense to civilian applications. PACS 61.43.Fs; 62.20.-x; 81.05.-t     

Optical properties of amorphous films

We have analyzed the optical properties of a-Ge_30-xSb_xS₇₀ chalcogenide glass films (x=0,10,20 and 30 at%); the chalcogenide films were prepared by vacuum thermal evaporation. The optical-absorption data indicate that the absorption mechanism is non-direct transition. We found that the optical band gap, E_opt, decreases from 2.04±0.01 to 1.74±0.01 eV, whereas the refractive index increases with increasing Sb content. Data are analyzed by the Wemple equation, which is based on the single-oscillator model.     

Second harmonic generation in thin Ge<Subscript>35</Subscript>Sb<Subscript>5</Subscript>S<Subscript>60</Subscript> films

Generation of the second optical harmonic is investigated in 250 to 1500-nm thick films of Ge₃₅Sb₅S₆₀ chalcogenide glass. It is shown that a decrease in quadratic optical susceptibility in thicker films can result from a decrease in the bulk contribution from the electric dipole to the susceptibility and can be used in nonlinear optical diagnostics of the films.     

Light-induced metastable defects in a-Se90X10 (X = Sb,In and Ag) thin films

Thin films of chalcogenide glasses in a binary system of Se₉₀X₁₀ (X = Sb, In and Ag) have been prepared by the vacuum evaporation technique. Thermally stimulated current measurements have been made to find out the trap density in these materials. To study light-induced defects in these materials, white light of intensity 1200 lux is shown on the amorphous films in vacuum for different exposure times. It is observed that the density of traps increases with exposure time, indicating the appearance of light-induced metastable defects in these materials.     

Characterization of pulsed laser deposited chalcogenide thin layers

In this work we report on pulsed laser deposition (PLD) of chalcogenide thin films from the systems (AsSe)_100−xAgI_x and (AsSe)_100−xAg_x for sensing applications. A KrF* excimer laser (λ = 248 nm; τ_FWHM = 25 ns) was used to ablate the targets that had been prepared from the synthesised chalcogenide materials. The films were deposited in either vacuum (4 × 10⁻⁴ Pa) or argon (5 Pa) on silicon and glass substrates kept at room temperature. The basic properties of the films, including their morphology, topography, structure, and composition were characterised by complementary techniques. Investigations by X-ray diffraction (XRD) confirmed the amorphous nature of the films, as no strong diffraction reflections were found. The film composition was studied by energy dispersive X-ray (EDX) spectroscopy. The morphology of the films investigated by scanning electron microscopy (SEM), revealed a particulate-covered homogeneous surface, typical of PLD. Topographical analyses by atomic force microscopy (AFM) showed that the particulate size was slightly larger in Ar than in vacuum. The uniform surface areas were rather smooth, with root mean square (rms) roughness increasing up to several nanometers with the AgI or Ag doping. Based upon the results from the comprehensive investigation of the basic properties of the chalcogenide films prepared by PLD and their dependence on the process parameters, samples with appropriate sorption properties can be selected for possible applications in cantilever gas sensors.     

Photo-induced effects on structural and optical properties of Ga15Se81Ag4 chalcogenide thin films

Thin films with thickness of 400 nm have been obtained from the Ga₁₅Se₈₁Ag₄ ternary chalcogenide glass prepared by the melt quenching technique. The behavior of several optical constants has been studied from absorption and reflection spectra as a function of photon energy in the wavelength region 400–1200 nm. The amorphous nature of the sample was examined by X-ray diffraction and non-isothermal DSC measurements. Thin films were illuminated by shining white light using 1500 W tungsten lamp with different exposure time. The ambient temperature during the illumination process was controlled and kept at 348 K, selected by DSC thermogram. Analysis of the optical absorption data shows that the rule of non-direct transition predominates. It is found that the optical band gap decreases by increasing the illumination time. It has also been observed that the value of absorption and extinction coefficients increases while the refractive index decreases by increasing the illumination time from 0 to 150 min. The decrease in optical band gap is explained on the basis of the change in nature of the films, from amorphous to crystalline state, with increase of the illumination time.     

Structural Modification of PECVD As50S50 Chalcogenide-Glass Films by Femtosecond Laser Radiation

A thin film of As₅₀S₅₀ chalcogenide glass modified by femtosecond laser radiation at a wavelength of 800 nm has been studied. The character of the modification has been analyzed by interferometry, atomic-force microscopy, and Raman spectroscopy. The relationship between a change in the refractive index upon the sample modification and structural changes in the glass network is determined.

     

Swift heavy ion irradiation-induced modifications of tris-(8-hydroxyquinoline)aluminum thin films

Tris-(8-hydroxyquinoline)aluminum (Alq₃), one of the most widely used light emitting and electron transport materials in organic luminescent devices, has been synthesized. Alq₃ thin films have been deposited by a thermal evaporation process on glass substrates. The effect of swift heavy ion (SHI) irradiation using 40 MeV Li³⁺ on the Alq₃ thin films has been studied by UV-visible, infrared, photoluminescence (PL) and time-resolved photoluminescence (TRPL) spectroscopy. From TRPL studies, it is found that the PL of Alq₃ thin films arises from two species corresponding to its two geometrical isomers, namely facial and meridional having two different life times. It is also confirmed that the PL and lifetimes of excitons decrease with the increase of ion fluences of SHI of 40 MeV Li³⁺, indicating a transfer of exciton energy to unstable cationic Alq₃ species generated by SHI irradiation.     

Characterisation of porous doped ZnO thin films deposited by spray pyrolysis technique

Al or Sn doped ZnO films were deposited by spray pyrolysis using aqueous solutions. The films were deposited on either indium tin oxide coated or bare glass substrates. ZnCl₂, AlCl₃ and SnCl₂ were used as precursors. The effect of ZnCl₂ molar concentration (0.1-0.3 M) and doping percentage (2-4% AlCl₃ or SnCl₂) have been investigated. The main goal of this work being to grow porous ZnO thin films, small temperature substrates (200-300 °C) have been used during the spray pyrolysis deposition. It is shown that, if the X-ray diffraction patterns correspond to ZnO, the films deposited onto bare glass substrate are only partly crystallized while those deposited onto ITO coated glass substrate exhibit better crystallization. The homogeneity of the films decreases when the molar concentration of the precursor increases, while the grain size and the porosity decrease when the Al doping increases. The optical study shows that band tails are present in the absorption spectrum of the films deposited onto bare glass substrate, which is typical of disordered materials. Even after annealing 4 h at 400 °C, the longitudinal resistivity of the films is quite high. This result is attributed to the grain boundary effect and the porosity of the films. Effectively, the presence of an important reflection in the IR region in samples annealed testifies of a high free-carriers density in the ZnO crystallites. Finally it is shown that when deposited in the same electrochemical conditions, the transmission of a polymer film onto the rough sprayed ZnO is smaller than that onto smooth sputtered ZnO.     

Thickness-dependent electrical and optical properties of Ge8Sb2Te11 thin films

The amorphous Ge₈Sb₂Te₁₁thin films with varying thickness are thermally deposited on well-cleaned glass substrate from its polycrystalline bulk. Absence of any sharp peak confirms the amorphous nature of deposited films. Thickness-dependent electrical and optical properties including dc-activation energy, sheet resistivity, optical band gap, band tailing parameter, etc. of Ge₈Sb₂Te₁₁thin films have been studied. The optical parameters have been calculated from transmission, reflection and absorbance data in the spectral range of 200–1100 nm. It has been found that optical band gap and band tailing parameter decreases with the increase in Ge₈Sb₂Te₁₁thin films thickness. The dc-activation energy and sheet resistivity decreases while the crystallization temperature of the amorphous Ge₈Sb₂Te₁₁ films increases with the increase in thickness of the films. The decrease of the sheet resistivity has been substantiated quantitatively using the classical size-effect theory. These results have been explained on the basis of rearrangements of defects and disorders in the amorphous chalcogenide system.     

Electrical properties of MWCNT-composite (Se80Te20)100−xAgx (0 ≤ x ≤ 4) chalcogenide glasses

This article describes the preparation of multi-walled carbon nanotube (MWCNT) chalcogenide glass composite by the melt-quenching technique. MWCNT composite (Se₈₀Te₂₀)_100?xAg_x (0 ≤ x ≤ 4) bulk samples are characterized by the XRD, SEM and EDX. The electrical measurements were carried out in the temperature range of the 308-388 K. Cole–Cole plot has been used to determine the electrical conductivity at room temperature. It has been observed that MWCNT chalcogenide composite have higher value of electrical conductivity than pure glass. The results have been discussed on the basis of increased ionic conductivity (Ag⁺ ions) in MWCNT doped (Se₈₀Te₂₀)_100?xAg_x (0 ≤ x ≤ 4) bulk samples.     

Optical investigation of vacuum evaporated Se80−xTe20Sbx (x = 0, 6, 12) amorphous thin films

Amorphous thin films of Se_80−xTe₂₀Sb_x (x = 0, 6, 12) chalcogenide glasses has been deposited onto pre-cleaned glass substrate using thermal evaporation technique under a vacuum of 10⁻⁵ Torr. The absorption and transmission spectra of these thin films have been recorded using UV spectrophotometer in the spectral range 400–2500 nm at room temperature. Swanepoel envelope method has been employed to obtain film thickness and optical constants such as refractive index, extinction coefficient and dielectric constant. The optical band gap of the samples has been calculated using Tauc relation. The study reveals that optical band gap decreases on increase in Sb content. This is due to decrease in average single bond energy calculated using chemical bond approach. The values of urbach energy has also been computed to support the above observation. Variation of refractive index has also been studies in terms of wavelength and energy using WDD model and values of single oscillator energy and dispersion energy has been obtained.