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1.
通过赝火花强流脉冲电子束对酸敏变色片和单晶硅的轰击试验,结合束流自箍缩效应进行理论计算,对赝火花脉冲电子束传输中束斑的变形进行了研究与分析. 结果表明椭圆形轰击束斑是由通过旁路电容的瞬态电流产生的方位角磁场所引起的,并且提出了解决束斑变形的有效方法. 关键词: 脉冲电子束 赝火花放电 束斑 自箍缩效应  相似文献   

2.
Injections of nonrelativistic electron beams from an infinite conductor have been simulated by using a two-dimensional electrostatic particle code to study the spacecraft charging potential. The simulations show that the conductor charging potential at the end of simulations does not vary with the beam density when the beam density exceeds four times the ambient density. The reflection coefficient, which determines a percentage of incident electrons reflected by the conductor, increases the charging potential. To charge the conductor to the beam energy, the reflection coefficient needs to be about 0.5. The results are applied to explain the spacecraft charging potential measured during the SEPAC (Space Experiments with Particle Accelerators) experiments from Spacelab 1  相似文献   

3.
Novel electron-optical components and concepts aiming at improving the throughput and extending the applications of a low energy electron microscope (LEEM) have been developed. An immersion magnetic objective lens can substantially reduce e-e interactions and the associated blur, as electrons do not form a sharp crossover in the back-focal plane. The resulting limited field of view of the immersion objective lens in mirror mode can be eliminated by immersing the cathode of the electron gun in a magnetic field. A dual illumination beam approach is used to mitigate the charging effects when the LEEM is used to image insulating surfaces. The negative charging effect, created by a partially absorbed mirror beam, is compensated by the positive charging effect of the secondary beam with an electron yield exceeding 1. On substrates illuminated with a tilted beam near glancing incidence, large shadows are formed on even the smallest topographic features, easing their detection. On magnetic substrates, the magnetic flux leaking above the surface can be detected with tilted illumination and used to image domain walls with high contrast.  相似文献   

4.
The results of modeling the dynamic charging processes that arise when ferroelectrics are under the action of an electron beam in a scanning electron microscope are presented. Implementation of the model is based on simultaneous solution of the continuity equation and Poisson equation with allowance for the radiation-stimulated intrinsic conductivity of the irradiated sample and with an initial charge distribution determined using the Monte Carlo method. The multidimensional boundary evolutionary problem is solved using grid methods. The model permits one to study the dynamics of the process of the electron-beam-induced charging of ferroelectrics. Estimates for the values of fields generated by charges accumulated during the irradiation process are presented for a set of modeling parameters corresponding to physical data obtained in experimental observations of the polarization switch for a ferroelectric lithium niobate crystal.  相似文献   

5.
研究了强流(~129 nA)、 高能(1 500~1 900 eV)电子束在大角度(9°)弯曲宏观石英管中的导向效应。 实验分别测量了入射流强及能量对出射电子角分布值(FWHM)和传输效率的影响。 实验观察到出射电子角分布FWHM随着入射电子流强和入射电子能量增加变化均不明显; 发现电子传输效率随入射流强增加而增加, 但随入射能量增加而减小, 这与高电荷态离子导向中离子传输效率随入射能量增加而增加的现象相反。 分析发现, 与高电荷态离子导向机制不同, 电子束导向并非是由电子在石英管内壁的自组织充电过程引起的, 而是入射电子与管内壁弹性和非弹性散射碰撞共同作用的结果。 By using an incident electron beam with the high current and high energy, the guiding effect of the bended macroscopic quartz tube for the electron beam has been investigated. The angular distributions of outgoing electrons depending on the current and energy of incident electrons were measured. The dependences of electron transmitted fraction on energy and current of incident electrons are also shown. As the incident electron energy increasing, the electron transmitted fraction increases, but it decreases while the incident electron current increasing. The results have been compared with the present data. This work presents, the process of guiding electrons is essentially different from that of guiding highly charged ions, the guiding electron beam was caused by both elastic and inelastic collisions between electrons and inner walls of quartz tube, rather than self organized charging effect on the surface of inner wall of quartz tube.  相似文献   

6.
Dynamic secondary ion mass spectroscopy (SIMS) analysis of soft materials such as polymer or biomaterial is one of challenging subjects due to the charge up effect brought from the irradiation of a primary ion beam, hampering the collection of secondary ions. Conventional methods against the charging up are the electron beam irradiation for charge compensation and surface coating with metal, normally gold. Those methods require a compromise analytical condition, reducing the primary ion beam current to suppress the range of the charging, which degrading the performances of the SIMS analyses. We have proposed that a thicker conductive layer, capable of delocalizing the charge onto the surface, should be put on a soft insulator sample to avoid charging up. The depth profile of the hair sample coated wholly with a polythiophen-based conducting polymer was successfully measured in longer time without any charging up even in the maximum current of the oxygen primary ion beam (O2+: 7.5 keV, 400 nA) or using an electron beam compensation system. Thus, the proposed method coating with a conductive organic polymer against the charging issue would be expected as a breakthrough on SIMS analysis.  相似文献   

7.
The relationship between microscopic parameters and polymer charging caused by defocused electron beam irradiation is investigated using a dynamic scattering-transport model. The dynamic charging process of an irradiated polymer using a defocused 30 keV electron beam is conducted. In this study, the space charge distribution with a 30 keV non-penetrating e-beam is negative and supported by some existing experimental data. The internal potential is negative, but relatively high near the surface, and it decreases to a maximum negative value at z = 6 μm and finally tend to 0 at the bottom of film. The leakage current and the surface potential behave similarly, and the secondary electron and leakage currents follow the charging equilibrium condition. The surface potential decreases with increasing beam current density, trap concentration, capture cross section, film thickness and electron–hole recombination rate, but with decreasing electron mobility and electron energy. The total charge density increases with increasing beam current density, trap concentration, capture cross section, film thickness and electron–hole recombination rate, but with decreasing electron mobility and electron energy. This study shows a comprehensive analysis of microscopic factors of surface charging characteristics in an electron-based surface microscopy and analysis.  相似文献   

8.
The ultrahigh charging of dust particles in a plasma under exposure to an electron beam with an energy up to 25 keV and the formation of a flux of fast ions coming from the plasma and accelerating in the strong field of negatively charged particles are considered. Particles containing tritium or deuterium atoms are considered as targets. The calculated rates of thermonuclear fusion reactions in strongly charged particles under exposure to accelerated plasma ions are presented. The neutron generation rate in reactions with accelerated deuterium and tritium ions has been calculated for these targets. The neutron yield has been calculated when varying the plasma-forming gas pressure, the plasma density, the target diameter, and the beam electron current density. Deuterium and tritium-containing particles are shown to be the most promising plasmaforming gas–target material pair for the creation of a compact gas-discharge neutron source based on the ultrahigh charging of dust particles by beam electrons with an energy up to 25 keV.  相似文献   

9.
The cardinal characteristics of the charging of dielectric and ungrounded metal targets within radiation by medium-energy electrons (0.5–10 keV) have been studied theoretically and experimentally as a function of the angle of incidence of the electron beam. The coefficients of electron emissions and the second critical energy of primary (radiating) electrons, E 2C , have been determined as a function of the angle of incidence α when the targets are not being charged.  相似文献   

10.
A new modeling approach has been developed to assist in the SIMS analysis of insulating samples. This approach provides information on the charging phenomena occurring when electron and positive primary ion beams impact a low conductivity material held at a high positive potential. The concept of effective leakage resistance aids in the understanding of the dynamic electrical properties of an insulating sample under dynamic analysis conditions. Modeling of steady state electron beam charge compensation involves investigation of electron injection and charge drift. Using a Monte Carlo program to simulate electron injection and dc conduction calculations to predict charge drift, detailed information regarding charging phenomena can be determined.  相似文献   

11.
The surface discharges observed at rf windows and vacuum circuit breakers (VCBs) are one of the difficulties faced when developing high-power rf windows or compact VCBs. The surface discharge is considered to take place due to the release of the surface charges. Despite the importance of the surface charging/discharging, these phenomena have not been well evaluated. In this paper, the surface charges are estimated using the multipulse method, where electron beam irradiates a sample up to the saturation condition of surface charges. The amount of surface charges on alumina and TiN coated alumina are compared and the charging mechanism is discussed.  相似文献   

12.
In a study by AES of the surfaces of single crystal magnesium oxide and magnesium after various stages of oxidation, it has been shown that Auger energy shifts are produced by surface charging. Recognition of the charging effects has enabled the peak in the low energy spectrum of magnesium oxide crystal to be assigned. The low energy secondary electron spectra of both MgO crystal and oxidised magnesium are complicated by the presence of extra features which arise from diffraction of true secondary electrons, and in particular for oxidised magnesium a cross-transition occurring at the metal-oxide interface. Oxidation studies of sodium also reveal transitions arising from a similar process.  相似文献   

13.
Time dependent LEED intensities have been observed for a NiO(100)-Cl surface. Measurements of this effect as a function of temperature, beam current and beam energy are reported. Associated observations of the current to ground and the electron loss spectrum are used to suggest that electron trapping is occurring in the crystal surface due to the adsorbed Cl. Excitation from these trapped states could result in decaying LEED beam intensities.  相似文献   

14.
电子辐照下聚合物介质深层充电现象研究   总被引:1,自引:0,他引:1       下载免费PDF全文
空间辐射环境中,聚合物介质的深层充放电效应是威胁航天器安全的重要因素之一.文中在Chudleigh和von Berlepsch所发展的电位衰减模型基础上引入传输电流项,考虑了电子入射引起的感应电导率和感应电场的影响,提出了新的分析研究介质材料深层充电规律和特征的模型.通过该模型,分析了不同辐射条件下介质的表面电位、内部电荷与电场分布的变化,并设计实验及援引其他实验数据对模型分析结果进行验证.分析和实验结果表明,聚合物介质在深层充电过程中的平衡电位随着入射电子束流强度和介质电阻率的增加而增大,决定深层充电平 关键词: 深层充电 电荷传输模型 电子束 聚合物  相似文献   

15.
The charge accumulation in an insulating material under an electron beam bombardment exerts a significant influence to scanning electron microscopic imaging. This work investigates the charging formation process by a self-consistent Monte Carlo simulation of charge production and transportation based on a charge dynamics model. The charging effect in a semi-infinite SiO2 bulk and SiO2 trapezoidal lines on a SiO2 or Si substrate has been studied. We used two methods to calculate the spatial distributions of electric potential and electric field for two different systems respectively: the image charge method was used to deal with a semi-infinite bulk, and, random walk method to solve the Poisson equation for a complex geometric structure. The dynamic charging behavior depending on irradiation time has been investigated for SiO2. The simulated CD-SEM images of SiO2 trapezoidal lines with charging effect included were compared well with experimental results, showing the contrast change of SEM image along with scanning frames due to charging.  相似文献   

16.
We clarify the transient and equilibrium charging characteristics of grounded dielectrics due to low-energy defocused electron beam irradiation by a three-dimensional self-consistent simulation model. The model incorporates the electron scattering, transport and trapping. Results show that some electrons can arrive at the grounded substrate due to the internal field and density gradient, forming the leakage current. The transient charging process tends to equilibrium as the surface potential decreases and the leakage electron current increases. The positive and negative space charges are distributed alternately along the beam incident direction. In the equilibrium state, the surface potential and leakage electron current decrease to stable values with increasing film thickness and the trap density, but with decreasing electron mobility. Moreover, the surface potential of the dielectric thin film exhibits a maximum negative value with variation of the beam energy; for example, under the condition of the film thicknesses 0.5 μm and 2 μm, the maximum negative values of surface potentials are -13 V and -98 V in beam energies 2 keV and 3.5 keV, respectively. However, for the thick film, the surface potential decreases with the increase in beam energy.  相似文献   

17.
A scanning electron microscope (SEM) is employed to investigate the temperature effect on the charging behaviour of alkali-silicate glasses under electron beam irradiation using electrostatic influence method (EIM). A modified special arrangement adapted to the SEM allows to study charging mechanisms and charge transport characteristics of these glasses using the simultaneous measurement of displacement and leakage currents. The trapping process during continuous electron irradiation can be directly determined by the EIM. The experimental results reveal that the charging ability of glasses decreases with increasing temperature. The variation of charge process has been confirmed by measuring the surface potential in response to the sample temperature. In this report, we introduce also the secondary electron emission (SEE) yield. It was found the strong dependence of the SEE yield on the temperature variation. The higher is the temperature and the lower is the SEE yield. The trapping ability is analyzed taking into account the regulation mechanisms involved under electron irradiation.  相似文献   

18.
Low Energy Electron Diffraction (LEED) has been used to study the surface structures of thin films of molecular crystals. The samples were grown epitaxially on metal single crystal substrates at low temperatures. Both Pt(111) and Ag(111) surfaces were used as substrates in order to identify the influence of the substrate on molecular film structure. Previous observations of ice (0001) and naphthalene (001) surfaces on films grown on Pt(111) substrates [Surface Sci. 55 (1976) 413], were confirmed using the Ag(111) substrate. The NH3(111) and benzene (111) surfaces were also studied on films grown on either substrate. All observed molecular crystal surfaces showed no evidence of surface reconstruction. To minimize sample charging and electron beam induced damage, LEED experiments were performed on samples of thickness less than 10?102 nm, with low energy electron exposures less than 1 C cm?2. The maximum thickness and exposure values were characteristic of the particular molecular crystal. The relationship between the structure of the initial adsorbed monolayer and the molecular crystal orientation is discussed.  相似文献   

19.
Internal charging has been indicated as the cause of many satellite anomalies. In some cases, it has been argued that internal charging has caused satellite system failures. It may be possible to predict the occurrence of an internal charging threat in the future but that does not remove the necessity to know what the environmental threat may be. The existence, for many years now, of energetic electron and internal charging measurements in the inner magnetosphere provides the ability to identify the threat levels and generate internal charging specifications. The specifications must embody the worst-case environments that can be expected from magnetic storms and extreme solar/interplanetary conditions. Internal-charging environment specifications are needed by satellite manufacturers for setting design requirements for their systems. The specifications are also required for defining the worst-case energetic electron flux levels and total fluence levels from events. These are used for electron beam testing to verify that critical systems are immune to internal charging, for performing tests on subsystems, and for use in anomaly investigation programs. Data from the GOES, LANL, and CRRES satellites were used to develop preliminary internal-charging environment specifications for some commonly used orbits such as geosynchronous and Molniya or high earth orbits (HEO), and they are discussed. A specification is also given for a highly elliptical equatorial orbit that is used for lunar-transfer orbital maneuvers. The preliminary environments were used to estimate the shielding required to reduce worst-case electron fluxes to safe levels for these orbits  相似文献   

20.
Using an electron beam, spontaneous polarization on the surface of +Z cuts of lithium niobate crystals of various compositions is switched. Domains 100–200 nm in size are formed in a thin surface layer, with the thickness dependent on the primary-electron energy. The sizes of segments, on which submicron domains are formed, exceed the sizes of the irradiation region. The distributions of domains on the surface in crystals of various compositions are different and depend on the method of moving the electron beam and irradiation conditions. The results are discussed in the context of notions on the charging of dielectric materials by the electron beam. It is assumed that the spontaneous polarization in the surface layer of +Z cuts of lithium niobates is switched by the field of a double layer of charges formed as a result of the charging process near the surface.  相似文献   

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