Modified Michelson interferometer for probing refractive index of birefringent crystal CSBN50

Based on the modified Michelson interferometer and phase analysis method, a high-accuracy method for probing the refractive index (RI) of transparent medium is proposed. The validated test was performed on a birefringent crystal CSBN50 with the estimated accuracy being up to 10⁻⁴. The ordinary and extraordinary refractive indices of CSBN50 at 632.8 nm are determined as n₀=2.32853±0.00016 and n_e=2.27664±0.00016, respectively.     

Broad band antireflection coating on zinc sulphide simultaneously effective in SWIR, MWIR and LWIR regions

In recent years multi-spectral imagery is steadily growing popularity. Multi-channel imaging which includes short-wave infrared (SWIR), mid-wave infrared (MWIR) and long-wave infrared (LWIR) systems are useful for threat detection, tracking, thermal signature detection and terrain analysis. In this paper, a broad band antireflection coating on ZnS substrate, simultaneously effective in SWIR, MWIR and LWIR is reported. The coating design approach was evolved using gradient index concept, where refractive index varies gradually from incident media to the ZnS (n = 2.2) substrate. The gradient index profile depicted by 4th degree polynomial n(t) = −0.45t⁴ + 1.9t³ − 2.7t² + 1.9t + 1,where n(t) is the refractive index at the distance t from ambient, and t is the thickness in micron. The profile is best approximated by eight discrete step index layers, whose first layer is thorium fluoride (n = 1.42; lowest index stable material available). Other seven layers are replaced by two equivalent layer system of real materials thorium fluoride and zinc sulphide. Final 15 layers design is deposited by e-beam evaporation. The maximum layer thickness was restricted around 0.7 μm to overcome the stress problem in the film. This 15 layers coating has shown average transmission 95% in 0.9–10.5 μm spectral band having peak 99% at 9 μm.     

Investigation on optical properties of Bi<Subscript>2.85</Subscript>La<Subscript>0.15</Subscript>TiNbO<Subscript>9</Subscript> thin films by prism coupling technique

Layered-perovskite ferroelectric Bi_2.85La_0.15TiNbO₉ (LBTN) optical waveguiding thin films were grown on fused silica substrates by pulsed laser deposition (PLD). X-ray diffraction (XRD) revealed that the film is highly (00l) textured. We observed sharp and distinct transverse electric (TE) and transverse magnetic (TM) multimodes and measured the refractive indices of LBTN thin films at 632.8 nm. The ordinary and extraordinary refractive indices were calculated to be n _TE=2.358 and n _TM=2.464, respectively. The film homogeneity and the film-substrate interface were analyzed using an improved version of the inverse Wentzel–Kramer–Brillouin (iWKB) method. The refractive index of the film remains constant at n ₀ within the waveguiding layer. The average transmittance of the film is 70% in the wavelength range of 400–1400 nm and the optical waveguiding properties were evaluated by the optical prism coupling method. Our results showed that the LBTN films are very good electro-optical active material.     

Effect of cadmium addition on the optical constants of thermally evaporated amorphous Se–S–Cd thin films

Se₇₅S_25−xCd_x is a promising ternary material, which has received considerable attention due to its applications in the fabrication of various solid state devices. These have distinct advantages, large packing density, mass replication, fast data rate, high signal-to-noise ratio and high immunity to defects. Measurements of optical constants (absorption coefficient, refractive index, extinction coefficient, real and imaginary part of the dielectric constant) have been made on Se₇₅S_25−xCd_x (where x = 0, 2, 4, 6 and 8) thin films of thickness 3000 Å as a function of photon energy in the wave length range 400–1000 nm. It has been found that the optical band gap and extinction coefficient increases while the value refractive index decreases on incorporation of cadmium in Se–S system. The results are interpreted in terms of the change in concentration of localized states due to the shift in Fermi level. Due to the large absorption coefficient and compositional dependence of reflectance, these materials may be suitable for optical disk material.     

Refractive index of standard oils as a function of wavelength and temperature

The refractive indices (n) of eight standard oils from Physikalisch Technische Bundesanstalt, Germany were determined with an accuracy of ±1×10⁻⁴ by using Abbe Refractometer. The measurements were performed at temperature 20°C in the spectral range 0.4–0.7 μm. The experimental data were fitted to the simple Cauchy dispersion formula and the results were found to be consistent within the limits of experimental error. In all cases, the refractive index decreased monotonically with increasing wavelength. The refractive indices (n) of these oils have been measured as a function of the temperature t (20°C up to 50°C) at λ=0.589 μm and were found to have linear temperature dependencies. The refractive indices of the studied oils and the uncertainty in their values are calculated at λ=0.589. The Lorentz–Lorenz (L–L) formula has been tested and it was found to be valid with a maximum deviation of 0.4% and was used to calculate the molecular polarizability θ.     

Automated interferometric technique for express analysis of the refractive indices in isotropic and anisotropic optical materials

This paper deals with the technique for the refractive index measurements based on the interferometry of a rotated parallel plate (IRPP). The device consists of the Michelson interferometer, the sample rotation system and the optoelectronic registration system. A refractive index of parallel plates is determined by their rotation through measuring simultaneously a shift of interference fringes. Although the IRPP technique is known from long ago [Shumate MS. Appl Opt 1966;5:327] several considerable improvements have been done in order to improve the accuracy of the method. The measuring process is completely automated. The method has been tested on the model crystals of the lithium niobate giving the magnitudes for ordinary and extraordinary refractive indices as n₀=2.2865±0.0007 and n_e=2.2034±0.0007. A considerable increase of accuracy is reached in our case by an automation of the measuring procedure, development of a new software as well as implementing the interferometric method for a precise determination of a sample zero position. The automated refractometer is offered for use in research laboratories and industry.     

Angular distribution of intensity of reflected radiation investigations of the influence of CO2 laser treatment on optical properties of hydrogenated amorphous silicon

Thin films of hydrogenated amorphous silicon (a-Si:H) were annealed using CO₂ laser radiation (λ=10.6 μm). Changes of optical properties of the treated a-Si:H were investigated using optical transmittance spectroscopy and the angular distribution of intensity of reflected radiation (ADIRR). The CO₂ laser annealing influences the spectral characteristics of the real part of refractive index n and absorption coefficient α of light in a-Si:H. This treatment increases the n and α values as well as the Urbach energy of a-Si:H. Simultaneously it decreases the optical energy gap of this material. The changes of optical parameters at the interfaces of a-Si:H–glass substrate and a-Si:H–air were established.     

Real-time measurement of glucose concentration and average refractive index using a laser interferometer

This study presents a non-destructive, highly precise optical metrology system for measuring the average refractive index of a liquid solution such that its glucose concentration can be derived. The metrology system is employed to measure the average refractive indices of samples with known glucose concentrations ranging from 0 to 200 g/l. By applying a regressional analysis technique to the experimental results, an analytical expression is derived to describe the relationship between the refractive index and the glucose concentration. An excellent agreement is observed between the experimentally determined values of the glucose concentration and the analytically derived results. For an assumed laser interferometer resolution of 1 nm, the measurement resolution of the proposed metrology system is found to be at least F=0.05 g/l, which is significantly better than that of F=2 g/l obtained using the polarimetric glucose sensor presented by Lo and Yu [A polarimetric glucose sensor using a liquid-crystal polarization modulator driven by a sinusoidal signal. Opt Commun, 2006; 259: 40–8].     

Nonlinear optical responses of Sudan IV doped liquid crystal by z-scan and moiré deflectometry techniques

The nonlinear optical properties of a nematic liquid crystal doped with an azo dye were investigated. The magnitude and the sign of the third-order nonlinear refractive index, n₂, were measured using both single-beam z-scan and moiré deflectometry techniques. The measurements were performed at 532 nm using a Nd:Yag CW laser. The positive sign showed that sample which was studied possess a self-focusing optical nonlinearity. Rather close agreement was found between the values for n₂ obtained by z-scan and by moiré deflectometry. The nonlinear refractive index was found to be in the order of 10^− 6 (cm²/W) and the nonlinear absorption coefficient to be β = 0.171 (cm/W).     

Electric and magnetic losses and gains in determining the sign of refractive index

Within the framework of classic electromagnetic theories, we have studied the sign of refractive index of optical medias with the emphases on the roles of the electric and magnetic losses and gains. Starting from the Maxwell equations for an isotropic and homogeneous media, we have derived the general form of the complex refractive index and its relation with the complex electric permittivity and magnetic permeability, i.e. , in which the intrinsic electric and magnetic losses and gains are included as the imaginary parts of the complex permittivity and permeability, respectively, as  = _r + i_i and μ = μ_r + iμ_i. The electric and magnetic losses are present in all passive materials, which correspond, respectively, to the positive imaginary permittivity and permeability _i > 0 and μ_i > 0. The electric and magnetic gains are present in materials where external pumping sources enable the light to be amplified instead of attenuated, which correspond, respectively, to the negative imaginary permittivity and permeability _i < 0 and μ_i < 0. We have analyzed and determined uniquely the sign of the refractive index, for all possible combinations of the four parameters _r, μ_r, _i, and μ_i, in light of the relativistic causality. A causal solution requires that the wave impedance be positive Re{Z} > 0. We illustrate the results for all cases in tables of the sign of refractive index. One of the most important messages from the sign tables is that, apart from the well-known case where simultaneously  < 0 and μ < 0, there are other possibilities for the refractive index to be negative n < 0, for example, for _r < 0, μ_r > 0, _i > 0, and μ_i > 0, the refractive index is negative n < 0 provided μ_i/_i > μ_r/_r.     

Effect of In-content on the optical properties of a-Se films

The optical transmission spectra of amorphous (a-) Se_1−xIn_x films, with x = 0.0, 0.05, 0.18 and 0.35, that prepared by thermal evaporation from their corresponding bulk ingots, are recorded over the spectral region of 500–2500 nm. A simple straight forward procedure proposed by Swanepeol has been applied to determine the two components of the complex refractive index (). The dispersion of is examined in terms of the Wemple and DiDomenico model and is discussed in terms of In-content. An estimation of various optical parameters such as, the optical energy gap (E_g = 1.96–1.33 eV), single oscillator energy (E_o = 3.95–3.16 eV), oscillator dispersion energy (E_d = 22.6–31.6 eV), lattice oscillator strength (E_l = 0.38–0.61 eV) and wavelength at zero material dispersion (λ_c = 2.0569–2.0879 μm) have been given and discussed in relation to the coordination number, hydrostatic density and formed chemical bonds that are introduced in the network of a-Se with the introduction of up to 35 at.% In.     

Structural and optical properties of In0.5Ga0.5As/GaAs quantum dots in an In0.1Ga0.9As well using repeated depositions of InAs/GaAs short-period superlattices for the application of optical communication

We report structural and optical properties of In_0.5Ga_0.5As/GaAs quantum dots (QDs) in a 100 Å-thick In_0.1Ga_0.9As well grown by repeated depositions of InAs/GaAs short-period superlattices with atomic force microscope, transmission electron microscope (TEM) and photoluminescence (PL) measurement. The QDs in an InGaAs well grown at 510 °C were studied as a function of n repeated deposition of 1 monolayer thick InAs and 1 monolayer thick GaAs for n=5–10. The heights, widths and densities of dots are in the range of 6–22.0 nm, 40–85 nm, and 1.6–1.1×10¹⁰/cm², respectively, as n changes from 5 to 10 with strong alignment along [1 −1 0] direction. Flat and pan-cake-like shape of the QDs in a well is found in TEM images. The bottoms of the QDs are located lower than the center of the InGaAs well. This reveals that there was intermixing—interdiffusion—of group III materials between the InGaAs QD and the InGaAs well during growth. All reported dots show strong 300 K-PL spectrum, and 1.276 μm (FWHM: 32.3 meV) of 300 K-PL peak was obtained in case of 7 periods of the QDs in a well, which is useful for the application to optical communications.     

An enhanced common path interference optic measurement system for refractive indices and thickness

This study proposes a common path interference optical system for the measurement of refractive indices and thickness of uniaxial crystal material. The measurement system comprises an accurate Mach–Zehnder laser interferometer, a single-axis rotary stepping motor, and a computer. The laser interferometer is composed of a single-frequency He–Ne laser, two-beam splitters and two reflectors. The Mach–Zehnder laser interferometer measures the optical length difference by using its linear measurement accuracy. The proposed solution procedure enables both the refractive indices and the thickness of the optical waveplate to be obtained. The proposed design differs from conventional designs in that it does not use a heterodyne modulator with a lock-in technique. It is shown that the refractive indices and thickness of the tested optical elements can be measured rapidly and accurately.     

Design, analysis and optimization of silicon-on-insulator photonic crystal dual band wavelength demultiplexer

A highly efficient photonic crystal dual band wavelength demultiplexer (DBWD) using silicon-on-insulator (SOI) substrates is proposed for demultiplexing two optical communication wavelengths, 1.31 μm and 1.55 μm. Demultiplexing of two wavelength channels is obtained by modifying the propagation properties of guided modes in two arms of Y type photonic crystal structure. Propagation characteristics of proposed DBWD are analyzed utilizing 3D finite difference time domain (FDTD) method. Enhancement in spectral response is further obtained by optimizing the Y junction of demultiplexer giving rise to high transmission and extinction ratio for the wavelengths, 1.31 μm and 1.55 μm. Hence it validates the efficiency of proposed optimized DBWD design for separating two optical communication wavelengths, 1.31 μm and 1.55 μm. Tolerance analysis was also performed to check the effect of variation of air hole radius, etch depth and refractive index on the transmission characteristics of the proposed design of SOI based photonic crystal DBWD.     

The Electric Dipole Moment of the CO2–CO van der Waals Complex

Radiofrequency transitions withinK= 2 asymmetry doublets have been observed for the CO₂–CO van der Waals complex. A Stark effect measurement on theJ= 2,K= 2 transition provides an electric dipole moment of μ = 0.2493(1) D. Combining this result with the permanent moment of CO, μ_CO= 0.1098 D, gives a change of moment on complex formation of Δμ = 0.140 D. The sign of Δμ is such that the CO end of the complex is more positive than CO₂. The origin of Δμ should not be attributed to any single mechanism, and several different contributions to Δμ are discussed.     

Manifestation of nano-sized effects in photoinduced nonlinear optics of CdI2–Cu layered single crystals

The infrared (IR) induced second harmonic generation in the thin CdI₂–Cu crystalline layers was discovered. With decreasing thickness of the CdI₂–Cu crystals up to several nanometers value of second-order nonlinear optical susceptibility d₁₄ (at wavelength λ=2.76 μm) for the output IR-induced SHG significantly increases. For the Cu content about 0.4% the output SHG signal achieves its maximum at the sample thickness below 2 nm. It is important that for the samples with larger film thickness the corresponding changes have substantially different properties. Limitation of the d₁₄ at the larger concentration is probably caused by formation of the Cu clusters limiting the enhancement of the hyperpolarizability for particular cluster as well as total nonlinear dielectric susceptibility.     

Properties of a Thin-Film Optical Waveguide Using Fluorinated Silicon Oxide and Organic Spin-on-Glass Films

A thin-film optical waveguide using a fluorinated silicon oxide (SiOF) as a core layer was investigated. An organic spin-on-glass (SOG) film was used for a cladding layer. The SiOF films were formed at 23°C by a liquid-phase deposition (LPD) technique using a supersaturated hydrofluosilicic acid (H₂SiF₆) aqueous solution. A thin-film optical waveguide structure for single mode was designed and fabricated, based on the dispersion properties of refractive indices for the LPD-SiOF and organic SOG films. The refractive indices at a wavelength of 632.8 nm were 1.430 and around 1.400 for the LPD-SiOF and organic SOG films, respectively. The thickness of LPD-SiOF films deposited was 1.18 μm. Thicknesses of cladding organic SOG films cured at 300 and 400°C were 1.28 and 1.31μm, respectively. The effective refractive indices for single mode were 1.4169 and 1.4158 at a wavelength of 632.8 nm for the cladding organic SOG films cured at 300 and 400°C, respectively, and differences between the measured and calculated incident angles were 0.84° and 1.29° for the cladding organic SOG films cured at these respective temperatures. A streak of guided-light was observed for the LPD-SiOF/SOG structure optical waveguide. The transmission loss was 7.6-7.9 dB/cm.     

A near-infrared zero-order achromatic retarder

Phase retarders normally show strong wavelength dependence. Achromatic retarders which exhibit nearly identical characteristics over a wide wavelength spectrum is used in polychromatic light. The present investigation deals with a technique to design and study the characteristics of an achromatic combination of birefringent plates in 800–2000 nm range. The retarder has been designed using calcite, crystalline quartz and ADP. The thicknesses of the plates are 19.38 μm, 446.14 μm and 12.57 μm respectively. The new arrangement of three birefringent plates proposed has the promise of producing a zero-order quarter wave achromatic combination with fairly good accuracy.     

Optical band gap and optical constants in a-Se80Te20−xPbx thin films

The optical constants (absorption coefficient, refractive index, extention coefficient, real and imaginary part of dielectric constant) have been studied for a-Se₈₀Te_20−xPb_x (where x = 0, 2, 6, 10) thin films as a function of photon energy in the wave length range (500–1000 nm). It has been found that the optical band gap increases while the refractive index and the extinction coefficient (k) decreases on incorporation of lead in Se–Te system. The value of absorption coefficient (α) and the extinction coefficient (k) increases, while the value of refractive index (n) decreases with incident photon energy. The results are interpreted in terms of the change in concentration of localized states due to the shift in fermi level.     

Dispersive optical constants of glassy AsSe1−xTex system

The compositional dependence of the optical constants, the refractive index n, and the absorption index k, of the AsSe_1−xTe_x thin films with 0<x<1.0 were determined in the spectral range of 400–2500 nm. The maximum value of the refractive index n, is shifted toward the long wavelength by increasing the Te content in the examined system. The values of the forbidden energy gap of the system have been determined and were correlated with the type and the amount of chemical bonds formed by the increasing Te content in the AsSe_1−xTe_x glassy system. The value of the dispersion energy E_d exhibits low value at the composition containing the same atomic percent of Se and Te.