Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

We demonstrate depth profiling of polymer materials by using large argon (Ar) cluster ion beams. In general, depth profiling with secondary ion mass spectrometry (SIMS) presents serious problems in organic materials, because the primary keV atomic ion beams often damage them and the molecular ion yields decrease with increasing incident ion fluence. Recently, we have found reduced damage of organic materials during sputtering with large gas cluster ions, and reported on the unique secondary ion emission of organic materials. Secondary ions from the polymer films were measured with a linear type time‐of‐flight (TOF) technique; the films were also etched with large Ar cluster ion beams. The mean cluster size of the primary ion beams was Ar₇₀₀ and incident energy was 5.5 keV. Although the primary ion fluence exceeded the static SIMS limit, the molecular ion intensities from the polymer films remained constant, indicating that irradiation with large Ar cluster ion beams rarely leads to damage accumulation on the surface of the films, and this characteristic is excellently suitable for SIMS depth profiling of organic materials. Copyright © 2009 John Wiley & Sons, Ltd.     

Strongly reduced fragmentation and soft emission processes in sputtered ion formation from amino acid films under large Ar(n)+ (n ≤ 2200) cluster ion bombardment

The analysis of organic and biological substances by secondary-ion mass spectrometry (SIMS) has greatly benefited from the use of cluster ions as primary bombarding species. Thereby, depth profiling and three-dimensional (3D) imaging of such systems became feasible. Large Ar(n)(+) cluster ions may constitute a further improvement in this direction. To explore this option, size-selected Ar(n)(+) cluster ions with 300 ≤ n ≤ 2200 (bombarding energies 5.5 and 11 keV) were used to investigate the emission of positive secondary ions from four amino acid specimens (arginine, glycine, phenylalanine, and tyrosine) by time-of-flight SIMS. For all cluster sizes, the protonated molecule of the respective amino acid is observed in the mass spectra. With increasing cluster size the number of fragment ions decreases strongly in relation to the intact molecules, to the extent that the fraction of fragment ions amounts to less than 10% in some cases. Such 'soft' emission processes also lead the ejection of dimers and even multimers of the amino acid molecules. In the case of the phenylalanine, secondary ion species composed of up to at least seven phenylalanine moieties were observed. Tentatively, the ionization probability of the emitted molecules is envisaged to depend on the presence of free protons in the emission zone. Their number can be expected to decrease concurrently with the decreasing amount of fragmentation for large Ar(n)(+) cluster ions (i.e. for low energies per cluster atom).     

Matrix‐free detection of intact ions from proteins in argon‐cluster secondary ion mass spectrometry

In the secondary ion mass spectrometry (SIMS) of organic substances, the molecular weight of the intact ions currently detectable is at best only as high as 1000 Da, which for all practical purposes prevents the technique from being applied to biomaterials of higher mass. We have developed SIMS instrumentation in which the primary ions were argon cluster ions having a kinetic energy per atom, controlled down to 1 eV. On applying this instrumentation to several peptides and proteins, the signal intensity of fragment ions was decreased by a factor of 10² when the kinetic energy per atom was decreased below 5 eV; moreover, intact ions of insulin (molecular weight (MW): 5808) and cytochrome C (MW: 12 327) were detected without using any matrix. These results indicate that fragmentation can be substantially suppressed without sacrificing the sputter yield of intact ions when the kinetic energy per atom is decreased to the level of the target's dissociation energy. This principle is fully applicable to other biomolecules, and it can thus be expected to contribute to applications of SIMS to biomaterials in the future. Copyright © 2009 John Wiley & Sons, Ltd.     

Retracted: Mass analysis by Ar‐GCIB‐dynamic SIMS for organic materials

Generally, dynamic secondary ion mass spectrometry (SIMS) has been mainly used as one of the most powerful tools for inorganic mass analysis. On the other hand, an Ar gas cluster ion beam (GCIB) has been developed and spread as a processing tool for surface flattening and also a projectile for time‐of‐flight (ToF) SIMS. In this study, we newly introduced an Ar‐GCIB as a primary ion source to a commercially available dynamic SIMS apparatus, and investigated mass spectra of amino acid films (such as Arginine and Glycine) and polymer films (Polyethylene: PE and Polypropylene: PP) as organic model samples. As a result, each characteristic fragment peak indicating the original molecular organic structure was observed in the acquired mass spectra. In addition, their own molecular ions of the amino acids were also clearly observed. Mass spectra of PE/PP blended‐polymer films acquired using Ar‐GCIB‐dynamic SIMS could be identified between pure PE and PE:PP = 1:3 mixture by applying principal component analysis (PCA).     

Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size‐selected Ar gas‐cluster ion projectiles

A size‐selected argon (Ar) gas‐cluster ion beam (GCIB) was applied to the secondary ion mass spectrometry (SIMS) of a 1,4‐didodecylbenzene (DDB) thin film. The samples were also analyzed by SIMS using an atomic Ar⁺ ion projectile and X‐ray photoelectron spectroscopy (XPS). Compared with those in the atomic‐Ar⁺ SIMS spectrum, the fragment species, including siloxane contaminants present on the sample surface, were enhanced several hundred times in the Ar gas‐cluster SIMS spectrum. XPS spectra during beam irradiation indicate that the Ar GCIB sputters contaminants on the surface more effectively than the atomic Ar⁺ ion beam. These results indicate that a large gas‐cluster projectile can sputter a much shallower volume of organic material than small projectiles, resulting in an extremely surface‐sensitive analysis of organic thin films. Copyright © 2010 John Wiley & Sons, Ltd.     

Neutral cesium deposition prior to SIMS analysis of inorganic and organic samples

The enhancement of negative secondary ions yields in SIMS by the use of electropositive primary ions is well known. In previous papers, the authors of this article have reported on the simultaneous use of primary ion bombardment coupled with neutral cesium deposition to optimize the useful yields of negative secondary ions in the steady‐state regime. For electronegative elements, total ionization was achieved while the gain for the other elements attained two orders of magnitude. In this paper, we study the enhancement of negative secondary ion yields in the pre‐equilibrium regime by depositing neutral cesium onto the sample surface prior to the SIMS analysis. The main areas of application of this technique lie in the field of secondary ion imaging of sample surfaces. Of particular interest is the analysis of organic and biological samples on the Cameca NanoSIMS50 instrument. Both inorganic and organic samples will be investigated in this paper. Copyright © 2010 John Wiley & Sons, Ltd.     

Method for improved secondary ion yields in cluster secondary ion mass spectrometry

A method to increase useful yields of organic molecules is investigated by cluster secondary ion mass spectrometry (SIMS). Glycerol drops were deposited onto various inkjet‐printed arrays and the organic molecules in the film were rapidly incorporated into the drop. The resulting glycerol/analyte drops were then probed with fullerene primary ions under dynamic SIMS conditions. High primary ion beam currents were shown to aid in the mixing of the glycerol drop, thus replenishing the probed area and sustaining high secondary ion yields. Integrated secondary ion signals for tetrabutylammonium iodide and cocaine in the glycerol drops were enhanced by more than a factor of 100 compared with an analogous area on the surface, and a factor of 1000 over the lifetime of the glycerol drop. Once the analyte of interest is incorporated into the glycerol microdrop, the solution chemistry can be tailored for enhanced secondary ion yields, with examples shown for cyclotrimethylenetrinitramine (RDX) chloride adduct formation. In addition, depositing localized glycerol drops may enhance analyte secondary ion count rates to high enough levels to allow for site‐specific chemical maps of molecules in complex matrices such as biological tissues. Published in 2010 by John Wiley & Sons, Ltd.     

Application of tandem analyser to SIMS studies of hydrocarbon polymers

The fragmentation of ions sputtered from the surface of low-density poly(ethylene) (LDPE) has been investigated by studying their collisionally activated dissociation (CAD) when incident upon a variety of target gases in the collision cell of a triple quadrupole SIMS instrument. It was found that heavier targets resulted in more extensive CAD than was observed with lighter targets but that sulphur hexafluoride is inefficient target because of the amount opf energy that is transferred to its vibrational modes of motion (rather than being available to induce fragmentation in the parent ion.) The behaviour observed for an oxygen target was quite different to that observed for other targets (at higher pressures). In general oxygen induced markedly greater fragmentation for the small parent ions but xenon was the preferred target for the larger parent ions. Fragmentation patterns could readily be assembled for all of the parent ions observed in the SIMS spectrum of LDPE using the CAD data. There are good indications that the data obtained may assist in indentification of ion structures and in elucidation of general rules governing the fragmentation of organic materials during SIMS. For example, LDPE fragment ions were found to obey quite strictly the Even Electron Rule, a well-known rule in mass spectrometry.     

Negative and positive secondary ion mass spectra of organic acids

Organic compounds can be ionized by sputtering the solid sample. The resulting negative and positive secondary ions provide mass spectra which characterize both the molecular weights and the structures of the compounds. Ionization occurs either by direct ejection of charged species from the solid into vacuum or by electron or proton transfer. The sputtered secondary ions dissociate unimolecularly to give fragment ions. These reactions are identical to those which occur when the secondary ions are independently generated by chemical ionization, selected by mass and dissociated in a high energy gas phase collision. The negative ion SIMS spectra show molecular ions (M^?.) or (M-H)^? ions as the dominant high mass species together with fragments due to decarboxylation, dehydration and losses of other simple molecules. Stronger acids show larger (M-H)^?/M^?.abundance ratios. The positive ion spectra are complementary and also useful in characterizing molecular structures. Attachment of cations to organic molecules (cationization) occurs much more readily than anion attachment and this makes negative SIMS spectra simpler than these positive ion counterparts.     

Cluster TOF‐SIMS imaging of human skin remains: analysis of a South‐Andean mummy sample

A skin sample from a South‐Andean mummy dating back from the XI^th century was analyzed using time‐of‐flight secondary ion mass spectrometry imaging using cluster primary ion beams (cluster‐TOF‐SIMS). For the first time on a mummy, skin dermis and epidermis could be chemically differentiated using mass spectrometry imaging. Differences in amino‐acid composition between keratin and collagen, the two major proteins of skin tissue, could indeed be exploited. A surprising lipid composition of hypodermis was also revealed and seems to result from fatty acids damage by bacteria. Using cluster‐TOF‐SIMS imaging skills, traces of bio‐mineralization could be identified at the micrometer scale, especially formation of calcium phosphate at the skin surface. Mineral deposits at the surface were characterized using both scanning electron microscopy (SEM) in combination with energy‐dispersive X‐ray spectroscopy and mass spectrometry imaging. The stratigraphy of such a sample was revealed for the first time using this technique. More precise molecular maps were also recorded at higher spatial resolution, below 1 µm. This was achieved using a non‐bunched mode of the primary ion source, while keeping intact the mass resolution thanks to a delayed extraction of the secondary ions. Details from biological structure as can be seen on SEM images are observable on chemical maps at this sub‐micrometer scale. Thus, this work illustrates the interesting possibilities of chemical imaging by cluster‐TOF‐SIMS concerning ancient biological tissues. Copyright © 2012 John Wiley & Sons, Ltd.     

Investigation of polymer thin films by use of Bi-cluster-ion-supported time of flight secondary ion mass spectrometry

The investigation and analysis of polymer thin films with Bi _n ⁺, n = 1–7 cluster ions has been demonstrated by means of static secondary ion mass spectrometry (SIMS). The highly specific signal enhancement of these primary ions combined with the individual fragmentation pattern of poly(4-vinylphenol) and poly(methyl methacrylate) is the basic principle for a modified approach of data reduction derived from the well-established g-SIMS procedure. Based on mass spectra, which correspond to different cluster ion sizes, not only a clear distinction between the two polymers is feasible but also a further simplification of the data can be demonstrated. It has been successfully proven that characteristic polymer-relevant species can be refined out of the large amount of unspecific and highly fragmented secondary ions, which are usually present in SIMS spectra. Therefore, a more precise and direct interpretation of complex organic fragments becomes feasible, which consequently enables the investigation of even more sophisticated samples.     

A two-point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects

Quantification of the composition of binary mixtures in secondary ion mass spectrometry (SIMS) is required in the analyses of technological materials from organic electronics to drug delivery systems. In some instances, it is found that there is a linear dependence between the composition, expressed as a ratio of component volumes, and the secondary ion intensities, expressed as a ratio of intensities of ions from each component. However, this ideal relationship fails in the presence of matrix effects and linearity is observed only over small compositional ranges, particularly in the dilute limits. In this paper, we assess an empirical method, which introduces a power law dependence between the intensity ratio and the volume fraction ratio. A previously published physical model of the organic matrix effect is employed to test the limits of the method and a mixed system of 3,3′-bis(9-carbazolyl) biphenyl and tris(2-phenylpyridinato)iridium (III) is used to demonstrate the method. This paper introduces a two-point calibration, which determines both the exponent in the power law and the sensitivity factor for the conversion of ion intensity ratio into volume fraction ratio. We demonstrate that this provides significantly improved accuracy, compared with a one-point calibration, over a wide compositional range in SIMS quantification and with a weak dependence on matrix effects. Because the method enables the use of clearly identifiable secondary ions for quantitative purposes and mitigates commonly observed matrix effects in organic materials, the two-point calibration method could be of significant benefit to SIMS analysts.     

Quantitative TOF-SIMS analysis of oligomeric degradation products at the surface of biodegradable poly(alpha-hydroxy acid)s

This paper reports the development of a new method for quantification of the hydrolytic surface degradation kinetics of biodegradable poly(alpha-hydroxy acid)s using time-of-flight secondary ion mass spectrometry (TOF-SIMS). We report results from static SIMS spectra of a series of poly(alpha-hydroxy acid)s including poly(glycolic acid), poly(L-lactic acid), and random poly(D,L-lactic acid-co-glycolic acid) hydrolyzed in various buffer systems. The distribution of the most intense peak intensities of ions generated in high mass range of the spectrum reflects the intact degradation products (oligomeric hydrolysis products) of each biodegradable polymer. First, a detailed analysis of the oligomeric ions is given based on rearrangement of the intact hydrolysis products. The pattern of ions can distinguish both degradation-generated intact oligomers and their fragment ion peaks with a variety of combinations of each repeat unit. Then, the integration and summation of the area of all ion peaks with the same number of repeat units is proposed as a measurement that provides a more accurate MW average than the typically used method which counts only the most intense peak. The multiple ion summation method described in this paper would be practical in the improvement of quantitative TOF-SIMS studies as a better data reduction method, especially in the surface degradation kinetics of biodegradable polymers.     

Massive cluster impact mass spectrometry: a new desorption method for the analysis of large biomolecules.

A new ion desorption method is described that utilizes a primary beam of massive, multiply charged cluster ions to generate secondary ions of peptides in a glycerol matrix. The massive cluster ion beam is generated via electrohydrodynamic emission using a 1.5 M solution of ammonium acetate in 30% aqueous glycerol. Negative ion spectra of peptides obtained using this technique show greatly decreased relative intensities for fragment ions and 'chemical noise' background when compared to spectra obtained using a xenon atom primary beam. The near absence of fragments derived from radiation damage to the sample solution is attributed to the impact of primary particles with energies less than 1 eV/nucleon.     

Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials,in‐vitro diagnostic and implant applications

Argon gas cluster ion beam sources are likely to become much more widely available on XPS and SIMS instruments in the next few years. Much attention has been devoted to their ability to depth profile organic materials with minimum damage. What has not been the focus of attention (possibly because it has been very difficult to measure) is the large ratio of sputter yield for organic materials compared with inorganic materials using these sources and the special opportunities this presents for studies of organic/inorganic interfaces. Traditional depth profiling by monatomic argon ions introduces significant damage into the organic overlayer, and because sputter rates in both organic and inorganic are similar for monatomic ions the interface is often ‘blurred’ due to knock‐on and other damage mechanisms. We have used a quartz crystal technique to measure the total sputter yield for argon cluster ions in a number of materials important in medical implants, biomaterials and diagnostic devices, including polymethyl methacrylate, collagen, hydroxyapatite, borosilicate glass, soda lime glass, silicon dioxide and the native oxides on titanium and stainless steel. These data fit a simple semi‐empirical equation very well, so that the total sputter yield can now be estimated for any of them for the entire range of cluster ion energy typical in XPS or SIMS. On the basis of our total sputter yield measurements, we discuss three useful ‘figures‐of‐merit’ for choosing the optimum cluster ion energy to use in depth profiling organic/inorganic samples. For highest selectivity in removing the organic but not the inorganic material the energy‐per‐atom in the cluster should be below 6 eV. A practical balance between selectivity and reasonably rapid depth profiling is achieved by choosing a cluster ion energy having between around 3 and 9 eV energy‐per‐atom. Copyright © 2013 John Wiley & Sons, Ltd.     

Interpretation of static secondary ion spectra

A model is presented in which electron impact (EI)/electronic excitation plays a pivotal role in the formation of secondary ions in the SIMS experiment, especially those originating from discrete molecular species. Positive ions are formed by electron loss whereas negative ions are formed by electron capture. Collisions of the new ions with the surface and with other species directly above the sample, along with metastable decay events, reduce the number of odd electron ions detected and produce the changes that make SIMS spectra so different from EI mass spectra. Primary support for this model is gathered from static SIMS spectra themselves, which can be rationalized to a large degree by assuming that the same rearrangement and fragmentation mechanisms that are invoked to explain EI mass spectra take place at the surface after kiloelectron‐volt ion impacts. The static secondary ion spectra of a variety of simple discrete molecular species, of simple hydrocarbons, of monofunctional organic species and of more complicated multifunctional organic species are analyzed in this way and the utility of this model is demonstrated. Copyright © 2004 John Wiley & Sons, Ltd.     

Analysis of thin films and molecular orientation using cluster SIMS

A study of phenylalanine films of different thicknesses from submonolayer to 55 nm on Si wafers has been made using Bi_n⁺ and C₆₀⁺ cluster primary ions in static SIMS. This shows that the effect of film thickness on ion yield is very similar for all primary ions, with an enhanced molecular yield at approximately 1 monolayer attributed to substrate backscattering. The static SIMS ion yields of phenylalanine at different thicknesses are, in principle, the equivalent of a static SIMS depth profile, without the complication of ion beam damage and roughness resulting from sputtering to the relevant thickness. Analyzing thin films of phenylalanine of different thicknesses allows an interpretation of molecular bonding to, and orientation on, the silicon substrate that is confirmed by XPS. The large crater size for cluster ions has interesting effects on the secondary ion intensities of both the overlayer and the substrate for monolayer and submonolayer quantities. This study expands the capability of SIMS for identification of the chemical structure of molecules at surfaces. © Crown copyright 2010.     

Comparative investigations of the secondary ion emission of metal complexes under MeV and keV ion bombardment

A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PDMS)/Y(SIMS) of 20 ionic and neutral metal complexes were determined. Both techniques generally provide both molecular and fragment ion information. Characteristic fragmentation patterns give useful data for structural characterization. Additionally, the stabilities of different secondary ion species were compared by their half-lives. Both PDMS and SIMS are very sensitive, yielding optimum spectra from total sample sizes as low as 5 nmol, and the sample consumption is negligible.     

中国典型超高硫煤有机相中分子氯存在的实验证据

运用,主性能静态二次离子质谱从中国贵州六枝超高硫无烟煤有机相中观测到分子氯（Cl2）的团簇负离子,从而首次获得分子氯在原煤中存在的实验证据。结合不久前从相同原煤有机相观测到元素硫（S8）的研究结果,表明易挥发性元素能够以其化学单质状态在原煤有机相中稳定存在;其来源可能与地球排气作用与原煤的富含纳米孔隙性质和化学还原微环境密切相关。