Magnetic force microscopy signal of flux line above a semi-infinite type II-superconductor

We have examined a single flux line in the semi-infinite type-II superconductor. The stray magnetic field of the flux line has been calculated. We have found that the vertical force exerted on a magnetic force microscopy (MFM) tip from the flux line is measurable by currently existing MFM. Two types of magnetic tips were taken into consideration, solid and thin film tips. For example, with a Cobalt film of the thickness of 100 nm and 30 nm on a tip, we found a vertical force of 4*10^–10 N and 1.5*10^–10 N, respectively. The lateral force exerted on a tip by the flux line was also calculated. The lateral force must be small enough to prevent the flux line from becoming depinned.     

交变力磁力显微镜动态成像技术的研究

近年来磁力显微镜(magnetic force microscopy,MFM)对动态磁场信号的测量与分析由于其特殊的工业要求和重要用途而受到广泛关注,本文旨在利用交变磁力对磁性探针的周期性调制发展一种交变力磁力显微镜技术,为磁信息存储工业等重要领域关键技术的发展提供新型的有力的工具.与目前标准MFM采用的设计思路不同,本文的关键在于合理利用MFM频率调制机理,优化设计MFM磁性探针,并且引入动态信号处理模块,实现对交变磁场信号的MFM成像.为达到这些目的,需要从理论上研究MFM探针的频率调制机理,并由实验上设计出动态信号提取模块,二者相辅结合优化设计出具有动态信号测试和分析能力的交变力磁力显微镜技术,由此来测量和解释纳米尺度磁畴结构.     

Magnetic properties of single biogenic magnetite nanoparticles

Biogenic magnetite nanoparticles (MNP) extracted from the magnetotactic bacterium Magnetospirillum gryphiswaldense MSR-1 have been systematically studied by atomic force microscopy (AFM) and magnetic force microscopy (MFM). Isolated single MNP and chains of MNP were obtained from diluted MNP aqueous suspension dried on mica surfaces in a homogeneous in-plane magnetic field. The size of the MNP was determined by employing AFM tip deconvolution procedures. The obtained result has been confirmed by scanning electronic microscopy. Magnetic properties of isolated single MNP and chains of MNP in remanence and in the presence of external magnetic fields were investigated by MFM. In particular, the magnetization reversal of a two-particle chain has been revealed and the dipolar interaction between the MNP is estimated. The change in the magnetic contrast on application of an external magnetic field is consistent with the hysteresis curve obtained by cantilever magnetometry.     

Spin domain mapping of a CrO2 thin film using spin-polarized current microscopy

We investigate spin domain mapping of a CrO₂ thin film using spin-polarized current microscopy at room temperature, where conductive atomic force microscopy (CAFM) with a CrO₂-coated tip is used. The nanoscale spin domains of the CrO₂ thin film were crosschecked by magnetic force microscopy (MFM). Notably, the CAFM exhibits the spin domains of the CrO₂ thin film with higher resolution than the MFM, which may result from a local point contact between the nanoscale CrO₂-coated tip and surface of the CrO₂ thin film.     

Magnetization reversal of ferromagnetic nanoparticles under inhomogeneous magnetic field

We investigated remagnetization processes in ferromagnetic nanoparticles under inhomogeneous magnetic field induced by the tip of magnetic force microscope (MFM) in both theoretical and empirical ways. Systematic MFM observations were carried out on arrays of submicron-sized elliptical ferromagnetic particles of Co and FeCr with different sizes and periods. It clearly reveals the distribution of remanent magnetization and processes of local remagnetization of individual ferromagnetic particles. Modeling of remagnetization processes in ferromagnetic nanoparticles under magnetic field induced by MFM probe was performed on the base of Landau–Lifshitz–Gilbert equation for magnetization. MFM-induced inhomogeneous magnetic field is very effective to control the magnetic state of individual ferromagnetic nanoparticles as well as to create different distribution of magnetic field in array of ferromagnetic nanoparticles.     

Local observation of reverse-domain superconductivity in a superconductor-ferromagnet hybrid

Nanoscale magnetic and superconducting properties of the superconductor-ferromagnet Nb/PbFe12O19 hybrid were studied as a function of applied magnetic fields. Low-temperature scanning laser microscopy (LTSLM) together with transport measurements were carried out in order to reveal local variations of superconductivity induced by the magnetic field template produced by the ferromagnetic substrate. Room temperature magnetic force microscopy (MFM) was performed and magnetization curves were taken at room and low temperature to investigate the magnetic properties of the hybrid. Comparative analysis of the LTSLM and the MFM images has convincingly demonstrated the presence of the reverse-domain superconductivity.     

Atomic spin-sensitive dissipation on magnetic surfaces

We identify the mechanism of energy dissipation relevant to spin-sensitive nanomechanics including the recently introduced magnetic exchange force microscopy, where oscillating magnetic tips approach surface atomic spins. The tip-surface exchange couples spin and atom coordinates, leading to a spin-phonon problem with Caldeira-Leggett-type dissipation. In the overdamped regime, that can lead to a hysteretic flip of the local spin with a large spin-dependent dissipation, even down to the very low experimental tip oscillation frequencies, describing recent observations for Fe tips on NiO. A phase transition to an underdamped regime with dramatic drop of magnetic tip dissipation should in principle be possible by tuning tip-surface distance.     

MFM study of magnetic vortex cores in circular permalloy dots: behavior in external field

In a circular dot of permalloy with an appropriate size, a vortex structure with perpendicular (turned-up) magnetization at the core is realized. The existence of the perpendicular magnetization spot has been confirmed and the direction of the magnetization, up or down, has been determined by magnetic force microscopy (MFM) for permalloy dots with the diameter of 0.1–1 μm. The switching field of turned-up magnetization is determined by applying external fields perpendicularly and in tilted directions to the plane. By comparing the MFM results and the magnetization curves measured by a SQUID magnetometer, the switching process of turned-up magnetization is argued.     

Micromagnetic study of effect of tip-coating microstructure on the resolution of magnetic force microscopy

The properties of a magnetic force microscopy (MFM) tip are very important for high-resolution magnetic imaging. In this work, micromagnetic models of tips are set up to study the effect of tip-coating microstructure, especially the randomness of anisotropy on tip edge and tip end, on the resolution of MFM. The effective coating height and the resolution potential of tips with various microstructures and magnetic properties have been characterized by investigating the obtained signals from high-density continuous granular thin film disk media with a bit size of 8×16 nm² and bit-patterned media with a pattern period p of 50 nm. The magnetic moment distribution at the tip end should be perpendicular to the sample to realize a ‘magnetically sharp’ tip, which explains further the improved resolution in the recent experimental reports. Tips with well-controlled grain structure and magnetic anisotropy of coating materials can be applied to both high-density thin film disk media and bit-patterned media.     

In situ magnetic hysteresis measurement of magnetic tips in magnetic force microscope

In situ magnetic hysteresis measurements of magnetic tips in a magnetic force microscope (MFM) are demonstrated using alternating gradient force magnetometry. The measured magnetic moments of MFM tips are estimated in the range from 10⁻⁶ to 10⁻⁵ emu by this technique and the whole MFM tips in cantilevers are considered to be measured from the value of measured magnetic moments. The relationship between the magnetic hysteresis loops of MFM tips and those of coated magnetic films is discussed.     

Experimental determination of ultra-sharp stray field distribution from a magnetic vortex core structure

The fine magnetic stray field from a vortex structure of micron-sized permalloy (Ni₈₀Fe₂₀) elements has been studied by high-resolution magnetic force microscopy. By systematically studying the width of the stray field gradient distribution at different tip-to-sample distances, we show that the half-width at half-maximum (HWHM) of the signal from vortex core can be as narrow as ∼21 nm at a closest tip-to-sample distance of 23 nm, even including the convolution effect of the finite size of the magnetic tip. a weak circular reverse component is found around the center of the magnetic vortex in the measured magnetic force microscope (MFM) signals, which can be attributed to the reverse magnetization around the vortex core. Successive micromagnetic and MFM imaging simulations show good agreements with our experimental results on the width of the stray field distribution.     

Towards a quantitative analysis of magnetic force microscopy data matrices

Fast and efficient software tools previously developed in image processing were adapted to the analysis of raw datasets consisting of multiple stacks of images taken on a sample interacting with a measuring instrument and submitted to the effect of an external parameter. Magnetic force microscopy (MFM), a follow-up of atomic force microscopy (AFM), was selected as a first testbed example. In MFM, a specifically developed ferromagnetic scanning tip probes the stray magnetic field generated from a ferromagnetic specimen. Raw scanning probe images taken on soft patterned magnetic materials and continuous thin films were used, together with synthetic patterns exploited to assess the absolute performance ability of the proposed texture analysis tools. In this case, the parameter affecting the sample-instrument interaction is the applied magnetic field. The application discussed here is just one among the many possible, including, e.g., real-time microscopy images (both optical and electronic) taken during heat treatments, phase transformations and so on. Basically any image exhibiting a texture with a characteristic spatial or angular dependence could be processed by the proposed method. Standard imaging tools such as texture mapping and novel data representation schemes such as texture analysis, feature extraction and classification are discussed. A magnetic texture stability diagram will be presented as an original output of the entropic analysis on MFM datasets.     

Characterization of high‐density bit‐patterned media using ultra‐high resolution magnetic force microscopy

Bit‐patterned media at one terabit‐per‐square‐inch (Tb/in²) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Stability of the magnetic domain structure of nanoparticle thin films against external fields

We investigate the effect of external magnetic fields on the magnetic structure of thin films from magnetic nanoparticles (MNP) with dipolar interaction. Such fields are present, for example, if samples are scanned with magnetic probes. Numerical simulations and experimental magnetic force microscopy (MFM) studies are presented. Numerically, we have calculated the magnetization pattern of single-layer and multilayer MNP thin films. The calculations show that unperturbed single-layer MNP films have an in-plane orientation of the magnetization with a flux-closure-domain pattern. An external field generated by a point dipole above the film induces locally an out-of-plane configuration of the magnetization. In the corresponding MFM images, the domain pattern in the film is erased and a stripe-like contrast enhancement at the edges appears. Multilayer films are found to be more robust against external fields than monolayers.     

Demonstration of ultra-high-resolution MFM images using Co90Fe10-coated CNT probes

We demonstrate ultra-high-resolution magnetic force microscopy images of perpendicular magnetic storage media using carbon nanotube probes coated by ferromagnetic Co₉₀Fe₁₀ films (20, 30, 40, and 50 nm). By optimizing ferromagnetic film thickness (effective tip diameter), we obtained best magnetic domain image with an 40 nm-Co₉₀Fe₁₀-coated tip (50 nm tip diameter) about a lateral detect density of 1200 k flux per inch on perpendicular magnetic storage medium, one of the highest resolutions in MFM imaging reported for this material system and structure. The observed dependence of tip dimension on signal contrast and image resolution was successfully explained by a theoretical analysis indicating that the signal contrast, along with the physical probe-tip dimension, should be taken into account to design magnetic probes tips for high-resolution magnetic force microscopy.     

Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

A near-field scanning microwave microscope (NSMM) incorporating an atomic force microscope (AFM) probe tip was used for the direct imaging of magnetic domains of a hard disk under an external magnetic field. We directly imaged the magnetic domain changes by measuring the change of reflection coefficient S₁₁ of the NSMM at an operating frequency near 4.4 GHz. Comparison was made to the magnetic force microscope (MFM) image. Using the AFM probe tip coupled to the tuning fork distance control system enabled nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitative measurement of magnetic domains with nano-scale resolution and high sensitivity.     

Force spectroscopy in noncontact mode

We have analyzed the possibility of using noncontact scanning force microscopy (NCAFM) to detect variations in surface composition, i.e., to detect a ‘spectroscopic image' of the sample. This ability stems from the fact that the long-range forces, acting between the AFM tip and sample, depend on the composition of the AFM tip and sample. The long-range force can be magnetic, electrostatic, or van der Waals forces. Detection of the first two forces is presently used in scanning force microscopy technique, but van der Waals forces have not been used. We demonstrate that the recovery of spectroscopic image has a unique solution. Furthermore, the spectroscopic resolution can be as good as lateral one.     

Magnetic force microscopy of GaAs:Mn ferromagnetic semiconductors

The dependence of magnetic properties of GaAs:Mn and MnAs epitaxial films grown on GaAs (001) by laser ablation of Mn and undoped GaAs in a hydrogen atmosphere under the growth conditions has been studied by magnetic force microscopy (MFM). Magnetic probe calibration for quantitative MFM measurements was performed by scanning across the slit of the magnetic-head of a tape recorder through which controlled direct current was passed. The dipole approximation was used to describe the magnetic properties of the MFM probe. Nonuniformity of the magnetization of GaAs:Mn films related to the formation of MnAs nanoinclusions, which are ferromagnetic at 300 K, has been observed. The typical scales of the spatial nonuniformity of the magnetization of GaAs:Mn films were varied from 270 to 550 nm depending on the film-growth conditions. The MnAs phase was identified by MFM measurements at an elevated temperature (up to 80°N).     

Description of force surfaces in atomic force microscopy with allowance for the mobility of the lattice atoms

The surfaces of constant force and the profiles of the horizontal component of the force during scanning of the tip of an atomic force microscope above the surface of a close-packed lattice in the contact mode are calculated taking account of the mobility of the lattice atoms. It is shown that when the mobility is taken into account, the previously observed discontinuities on the surface of constant force arise at smaller scanning forces on the tip above the surface than in the immobile-atom approximation. The force surfaces arising when scanning above vacancies are obtained. The possibility of using atomic force microscopy data for diagnostics of point defects on a solid surface is discussed.     

Is MFM really useful?

The ill-posed linear inverse problems, characterised by Fredholm integral equations of the first kind, are encountered in many areas of science and technology. This type of problems present some loss of information under the inversion process. The loss of information often makes the inversion process very difficult. Magnetic force microscopy (MFM) is a technique where problems related to loss of information occur. Work is presented here to understand what can be measured by the magnetic force microscope. A simple model is constructed, where the magnetic tip is approximated by a point dipole. Given the force F() acting on the dipole tip, we attempt to determine the magnetization distributlon in a thin ferromagnetic film, M(). This calculation should be interesting due to the rapidiy growing interest in magnetic thin films and magnetic multilayers. Received 3 December 2001 and Received in final form 11 March 2002