电感耦合等离子体质谱法测定人促红素注射剂中13种杂质元素

建立了电感耦合等离子体质谱法测定人促红素注射剂中Cd、Hg、Pb、As、Co、V、Ni、Sb、Mo、Cu、Cr、Al、Fe共13种杂质元素含量。以Sc、In、Ge为内标,采用ICP-MS法测定,等离子体射频功率为1 549 W,载气流量为1.12L/min。Al、Fe质量浓度在0～50 ng/mL范围内、其余11种元素质量浓度在0～10 ng/mL范围内线性关系良好,相关系数均不小于0.999,样品加标平均回收率为81.5%～118.0%,测定结果的相对标准偏差为1.10%～2.82%(n=6),各元素检出限为0.001 5～1.148 8 ng/g。不同厂家的人促红素注射剂中13种杂质元素的含量均符合ICH规定。该方法准确性好,灵敏度高,可同时测定多种元素,适用于人促红素注射剂中杂质元素的质量控制。     

电感耦合等离子体发射光谱法同时测定工业盐中的11种元素

建立了电感耦合等离子体发射光谱法测定工业盐中的硅、钙、镁、铁、钾、铝、钡、锶、锰、铅和镍11种杂质元素的含量。采用硝酸溶液、氢氟酸溶液和水溶解样品,采用耐氢氟酸惰性进样系统直接进样。在最佳实验工作条件下,11种杂质元素在各自的检测范围内线性关系良好,相关系数均大于0.999,方法的检出限为0.01～4.00 ng/mL。测定结果的相对标准偏差为2.35%～8.72%(n=11),样品加标回收率为88.6%～105.1%。该方法操作简便,测定结果准确、可靠,稳定性好,适用于工业盐中11种杂质元素的测定。     

电感耦合等离子体质谱法检测氧化镓中杂质元素

建立了电感耦合等离子体质谱法(ICP-MS)测定氧化镓中杂质元素的检测方法,采用微波消解技术溶样,以5 ng/mL Rh为内标补偿校正镓基体的抑制效应,采用碰撞室技术(CCT)消除多元素分子离子的干扰.方法的检出限为0.10～1.0 ng/mL,加标回收率在85%～110%之间,RSD为0.6%～7.1%.该方法能满足99.95%～99.995%氧化镓中杂质元素的分析要求.     

微波消解电感耦合等离子体质谱法测定UHMWPE中铝、钙、钛

建立微波消解样品、电感耦合等离子体质谱（ICP-MS）法同时检测外科植入物用超高分子量聚乙烯（UHMWPE）中铝、钙、钛3种杂质元素的分析方法。取0.50 g样品，加入5 mL硝酸和1 mL过氧化氢，于180℃微波消解15 min，以钪（45Sc）为内标，用ICP-MS法同时测定外科植入物用UHMWPE中杂质元素铝、钙、钛的含量。该方法对铝、钙、钛元素的测定具有良好的线性关系，相关系数均不小于0.999 6，检出限为0.10～0.14 mg/kg，样品测定结果的相对标准偏差为1.2%～3.6%(n=7)，样品加标回收率为97.3%～101.3%。该方法适用于测定UHMWPE中杂质元素含量。     

ICP-MS测定二十碳五烯酸中的4种元素含量

建立电感耦合等离子体质谱(ICP-MS)法测定二十碳五烯酸中砷(As)、镉(Cd)、汞(Hg)、铅(Pb)4种元素杂质的分析方法。样品经湿法消解后,采用ICP-MS法测定上述4种元素。通过在线加入内标钪(Sc)、锗(Ge)、铑(Rh)元素的方法来校正基体效应和信号漂移。4种元素线性关系均良好,相关系数r>0.999,各元素的平均回收率为99.0%～119.2%(n=9),4种金属元素的方法检出限为0.51～3.17 ng·g^-1。该方法准确、稳定,可用于二十碳五烯酸中元素杂质的含量测定,并为二十碳五烯酸的标准完善、质量提高提供参考依据。     

电感耦合等离子体质谱法测定多西他赛注射液中17种元素

建立电感耦合等离子体质谱（ICP-MS）法测定多西他赛注射液中17种元素（Al、As、Ba、Cd、Co、Cr、Cu、Fe、Hg、Li、Mn、Ni、Pb、Sb、Tl、V、Zn）。采用浓硝酸与过氧化氢作为消解液，经微波消解处理样品后，用ICP-MS法进行测定。Hg质量浓度在0.05～4 ng/mL范围内、其余16种元素质量浓度在0.5～40 ng/mL范围内线性关系良好，相关系数均大于0.999，各元素的检出限为0.000 5～0.6 mg/kg，样品加标回收率为92.2%～108.8%，测定结果的相对标准偏差为1.1%～2.8%。该方法操作简便，线性范围宽，分析速度快，灵敏度高，可同时测定多种元素，适用于多西他赛注射液中多种元素的测定。     

电感耦合等离子体-质谱法测定高纯ZnS粉末中痕量金属杂质

建立了用电感耦合等离子体-质谱(ICP-MS)法测定高纯ZnS粉末中Mg、Al、Mn、Ni等11种痕量金属杂质含量的方法。样品溶解后可直接进样分析。加标回收率为89%~120%。各金属杂质均为10 ng/mL的混合标准溶液平行7次进样的相对标准偏差均小于5%。方法能够满足纯度在99.99%~99.999%范围的ZnS样品中杂质测定的需要。     

ICP-MS法测定磁致冷材料-钆硅锗系合金中Mo、 Mn、 Al、 V、 Ni、 Cu、 Ga、 Fe

建立了ICP-MS法测定磁致冷材料-钆硅锗系合金中Mo、 Mn、 Al、 V、 Ni、 Cu、 Ga、 Fe八种痕量杂质元素的方法, 并对ICP-MS工作参数及条件进行了优化. 方法的检出限为0.1～0.6 ng/mL, 测定下限为0.5～3 ng/mL, 回收率在95.5%～109%, 相对标准偏差(n=11)为1.3%～7.6%. 采用该方法对磁致冷材料-钆硅锗系合金实际样品进行了分析, 结果表明精密度和准确度均满足痕量分析的要求.     

电感耦合等离子体质谱法测定太阳能级多晶硅中杂质元素

多晶硅样品经氢氟酸和硝酸混合酸消解,采用电感耦合等离子体质谱法测定所得样品溶液中23种杂质元素的含量。通过调整分辨率来调整多原子离子对部分被测元素的干扰。方法的检出限(3s)在0.3～19.7ng.g-1之间。方法用于太阳能级多晶硅样品中23种元素的测定,回收率在85.2%～111%之间,相对标准偏差(n=11)在0.9%～4.6%之间。     

微波消解-电感耦合等离子体质谱（ICP-MS）法测定硅石中5种杂质元素

采用微波消解溶解样品,建立ICP-MS法测定硅石中锰、铜、钒、钛、铬5种杂质元素的方法。探讨了溶解样品及消除干扰的最佳方式,选用Sc(10μg/L)为内标,动态反应池(DRC)模式进行测定。方法检出限为0.1mg/kg(~(51)V)～1.66mg/kg(~(47)Ti),加标回收率在88.6%～109%,相对标准偏差均小于3%。方法快速准确,精密度好,检出限低,适合硅石中5种杂质元素的测定。     

高频燃烧红外吸收光谱法测定高纯铝粉中碳含量

高纯铝粉在粉末冶金领域应用广泛,其碳含量的高低对材质的物理性能有较大影响,研究快速准确测定高纯铝粉中碳含量方法具有实际意义.采用高频感应燃烧红外碳硫仪测定高纯铝粉中碳含量,优化实验条件,建立高纯铝粉中碳含量测定的高频燃烧红外吸收光谱法.实验表明,称取0.1 g试样,在1980 W分析功率下,按照2.4:0.2:0.2质...     

ICP-MS 法测定高纯氧化铕中稀土杂质的研究

深入考察了ＩＣＰ－ＭＳ法测定高纯氧化铕时基体对稀土杂质测定的影响,研究了Ｐ５０７萃淋树脂分离大量基体Ｅｕ２Ｏ３的实验条件,建立了采用内标补偿直接测定大部分稀土杂质和经Ｐ５０７萃淋树脂分离基体后测定被干扰离子Ｔｍ相结合的高纯Ｅｕ２Ｏ３中稀土杂质的ＩＣＰ－ＭＳ分析方法。方法检出限为０．００５～０．０２１μｇ／Ｌ,加标回收率为８４％～１１２％。ＲＳＤ为１．４％～８．１％。本法适用于质量分数为９９．９９％～９９．９９９９％的高纯Ｅｕ２Ｏ３中稀土杂质的分析。     

高纯氧化铕中微量稀土杂质的化学光谱测定

将高纯Ｅｕ２Ｏ２通过Ｐ５０７萃淋树脂分离富集，分离掉大量基体Ｅｕ２Ｏ３剩下微量稀土杂质用碳粉吸附，加ＫＢＨ４作载体进行光谱测定，本方法可测定９９．９９９９％，纯度的Ｅｕ２Ｏ３中微量稀土杂质。     

电感耦合等离子体质谱法测定高纯氯化铷中27种元素

采用电感耦合等离子体质谱(ICP-MS)法检测高纯氯化铷中27种痕量杂质元素含量,对仪器参数进行优化,选择Be、Sc、Y、Rh、In、Re的混合内标校正仪器的信号漂移和基体效应.在一定浓度范围内,各元素浓度与信号强度呈良好的线性关系,相关系数为0.9863～1.0000,方法的检出限为0.003～0.66ng/mL.各...     

电感耦合等离子体光谱法测定高纯镓中的痕量元素

比较了乙醚和甲基异丁基酮（MIBK）两种萃取剂对高纯镓中基体与杂质的分离效果。选择MIBK作为萃取剂,将高纯镓中的基体元素镓萃入有机相,绝大多数金属杂质则留在水相中,用电感耦合等离子体发射光谱法测定了水溶液中 的14种痕量元素。方法的加标回收率为805－110％,检出限在0.001-0.075ug/mL之间。     

Determination of rare earth impurities in high purity europium oxide by inductively coupled plasma-mass spectrometry and evaluation of concentration values for europium oxide standard material

Direct determinations of 13 rare earth elements (La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er, Yb, Lu and Y) in high purity europium oxide by inductively coupled plasma mass spectrometry (ICP-MS) have been reported. The operating parameters of the instrument were optimized and the spectral interferences and the matrix effects were investigated. Using Ga or Rh as the internal standard can eliminate most of the matrix effects. The detection limits (3 sigma, n=10, integral time=1s) are 0.013-0.085 ng mL(-1) and the reproducibility (n=11) is 0.9-3%. The recoveries of spiking samples are 80-108%. Europium oxide standard material was made and its concentration values were evaluated by various techniques from 10 collaborating laboratories. By comparison of the results of ICP-MS with the results of other techniques, we have validated that ICP-MS is an accurate and reliable technique for analysis of ultratrace impurities in high purity rare earth matrix.     

Direct determination of trace rare earth elements in high purity Y2O3 using fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry with slurry sampling

A new method for the determination of trace amounts of 14 rare earth elements in high purity Y₂O₃ using fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry with slurry sampling was developed. A polytetrafluoroethylene (PTFE) emulsion was used as a fluorinating reagent to promote the vaporization of the analytes from graphite furnace. The main factors affecting analytical signals were investigated systematically. The interference of matrix could be minimized in the presence of PTFE. Under optimum conditions, the detection limits for rare earth elements were 0.032 ng～2.52 ng and the relative standard deviations were in the range of 1.4% to 4.3%. The proposed method was applied to the direct analysis of high purity Y₂O₃ powder with satisfactory results.     

In-situ vaporization and matrix removal for the determination of rare earth impurities in zirconium dioxide by electrothermal vaporization inductively coupled plasma atomic emission spectrometry

A novel method for the determination of trace rare earth impurities in ZrO₂ powder has been developed based on electrothermal vaporization inductively coupled plasma atomic emission spectrometry. A polytetrafluoroethylene slurry was used as a fluorinating reagent to convert both the matrix (Zr) and the analytes (rare earth elements) into fluorides with different volatilities at a high temperature in a graphite furnace. The more volatile ZrF₄ was removed in-situ by selective vaporization prior to the determination of the analytes, removing matrix spectral interferences. Under optimum operating conditions, the absolute detection limits of the analytes varied from 0.04 ng (Yb) to 0.50 ng (Pr) with relative standard deviations less than 5%. The recommended approach has been successfully applied to the determination of trace rare earth impurities (La, Pr, Eu, Gd, Ho and Yb) in ZrO₂ powder and the results were in good agreement with those obtained by pneumatic nebulization inductively coupled plasma atomic emission spectrometry after the separation of the matrix using a solvent extraction procedure.     

Spectrographic Determination of Eleven Trace Impurities in High Purity Cadmium

Abstract

Eleven trace impurities are determined in high purity cadmium by employing d. c. arc emission spectrographic technique. Cadmium ie converted t o its oxide and ground with high purity conducting graphite powder which acts as a buffer. Forty milligrammes of the above mixture is excited in a d. c. arc set at 12 amperes. The spectra of the sample and synthetic standards are photographed on a Jarrell-Ash 3.4 meter Ebert plane grating spectrograph in the region 2175 - 3425 A using a 1200 lines per mm grating in the first order. The detection limits obtained range from 1 to 10 ppm for different elements. The average coefficient of variation ranges from 8.0 to 15.7% for the impurities.     

Determination of rare earth impurities in high purity gadolinium oxide by inductively coupled plasma mass spectrometry after 2-ethylhexylhydrogen-ethylhexy phosphonate extraction chromatographic separation

A method was developed for the determination of rare earth impurities in high purity Gd(2)O(3) by inductively coupled plasma mass spectrometry (ICP-MS). The matrix suppression effect of Gd(2)O(3) on signals of rare earth impurities was compensated for by Re internal standardization. The spectra overlap interferences from GdH, GdO, GdOH(n) (n=1-3) on Tb, Tm, Yb and Lu were eliminated by 2-thylhexylhydrogen-2-ethylhexy phosphonate (EHEHP) extraction chromatographic separation. The detection limits for REEs were 0.005-0.017 ng ml(-1) in solution and 0.002-0.05 mug g(-1) in solid. Recoveries of spiked sample for REEs were from 88 to 121% with the precision of 1.0-7.5% RSD. Determination of trace REEs in two Gd(2)O(3) samples were performed. The method can be applied to analysis of 99.99-99.9999% high purity Gd(2)O(3).