A core level and valence band photoemission study of the (1 1 1) and ( ) surfaces of 3C–SiC

A core level and valence band photoemission study of thick 3C–SiC(1 1 1) and 3C–SiC( ) epilayers grown by sublimation epitaxy is reported. The as introduced samples show threefold 1×1 low-energy electron diffraction patterns. For the Si face and reconstructed surfaces develop after in situ heating to 1100°C and 1300°C, respectively. For the C face a 3×3 reconstruction form after heating to 980°C. A semiconducting behavior is observed for the and 3×3 reconstructed surfaces while the reconstruction show a Fermi edge and thus a metallic-like behavior. The surface state on the surface is investigated and found to have Λ₁ symmetry and a total band width of 0.10 eV within the first surface Brillouin zone. For the Si 2p and C 1s core levels binding energies and surface shifted components are extracted and compared to earlier reported results for 6H– and 4H–SiC.     

Ab initio investigation of the CdTe (001) surface

Based on first-principles density functional pseudopotential calculations, the CdTe (001) surface has been studied. Atomic configurations of different reconstructions are obtained with good accuracy. This reveals the efficiency of the force calculation for the surface relaxations. The surface energies were calculated on relaxed surface slabs as a function of the chemical potentials. The main result is that the energy of the Te-terminated dimerized surface with a (2 × 1) reconstruction is larger than the Cd-terminated c(2×2) reconstructed surface. This is in agreement with what was suspected by the equilibrium model introduced by F. Tinjod et al., which explains the formation of the quantum dots in CdTe/ZnTe superstructures.     

Hydrogen-induced reordering of the surface

Using elastic recoil detection analysis and low energy electron diffraction we have investigated the adsorption process of hydrogen on the surface. We find that (1) room temperature adsorption of atomic hydrogen induces a structure transformation from the to Si(111)-1 × 1-Ag(H) structures, (2) a saturation coverage of hydrogen is 1.5 monolayer, which almost coincides with the one on a clean 7 × 7 surface, and (3) thermal desorption of hydrogen from the ordered 1 × 1-Ag(H) surface results in the recovery of the original surface.     

Atomic and electronic structure of group-IV adsorbates on the GaAs(0 0 1)-(1 × 2) surface

Ab initio calculations, based on pseudopotentials and density functional theory, have been performed to investigate the atomic and electronic structure of the group-IV adsorbates (C, Si, Ge, Sn, and Pb) on the GaAs(0 0 1)-(1 × 2) surface considered in two different models: (i) non-segregated Ga-IV-capped structure and (ii) segregated structure in which the group-IV atoms occupying the second layer while the As atom floats to the surface. The non-segregated structure is energetically more favorable than the segregated structure for Sn and Pb, whereas it is the other way around for C, Si, and Ge.     

Structural properties of Cu clusters on Si(1 1 1):Cu2Si magic family

Basing on the results of the scanning tunneling microscopy (STM) observations and density functional theory (DFT) calculations, the structural model for the Cu magic clusters formed on Si(1 1 1)7 × 7 surface has been proposed. Using STM, composition of the Cu magic clusters has been evaluated from the quantitative analysis of the Cu and Si mass transport occurring during magic cluster converting into the Si(1 1 1)‘5.5 × 5.5’-Cu reconstruction upon annealing. Evaluation yields that Cu magic cluster accommodates 20 Cu atoms with 20 Si atoms being expelled from the corresponding 7 × 7 half unit cell (HUC). In order to fit these values, it has been suggested that the Cu magic clusters resemble fragments of the Cu₂Si-silicide monolayer incorporated into the rest-atom layer of the Si(1 1 1)7 × 7 HUCs. Using DFT calculations, stability of the nineteen models has been tested of which five models appeared to have formation energies lower than that of the original Si(1 1 1)7 × 7 surface. The three of five models having the lowest formation energies have been concluded to be the most plausible ones. They resemble well the evaluated composition and their counterparts are found in the experimental STM images.     

Origin of enhanced Ge interdiffusion at the initial stage of Ge deposition on Si(5 5 12)-2 × 1: Tensile stress induced by substrate chain structures

By combined investigation of STM and synchrotron PES on Ge/Si(5 5 12)-2 × 1 at 530 °C, it has been found that, in addition to the upward-relaxed surface Si atoms, a subsurface Si atom is also readily replaced by an arriving Ge atom at the initial adsorption stage. Such enhanced interdiffusion is due to a unique character of one-dimensional chain structures of the reconstructed substrate, such as π-bonded and honeycomb chains not existing on other low-index Si surfaces such as Si(001)-c(4 × 2) and Si(111)-7 × 7, applying a tensile surface stress to the neighbouring subsurface atoms. Interdiffusion of Ge having lower surface energy induces adsorption of the displaced Si atoms on the surface to form sawtooth-like facets composed of (113)/(335) and (113)/(112) with arriving Ge atoms until the surface is filled with those facets. Such displacive adsorption is the origin of high Si concentration of formed facets.     

HREELS and LEED studies on Cu deposited on 1 × 1 reconstructed α-Fe2O3(0001) surfaces

High-resolution electron energy-loss spectroscopy (HREELS), low-energy electron diffraction, and X-ray photoelectron spectroscopy have been used to study clean 825 K-preannealed α-Fe₂O₃-1 × 1 (haematite) surfaces, an α-Fe₂O₃-(0001)-1 × 1 surface reconstructed with Fe₃O₄(111)-1 × 1 and to study Cu deposited on room-temperature surfaces of those. Three pronounced losses, at 47.5, 55.5 and 78.0 meV, of the surface phonons for the clean α-Fe₂O₃(0001) were observed. By deposition of copper, Cu---O vibrational features observed by HREELS indicate formation of a Cu(I) state for the very low coverages. Increased submonoloayer amounts of Cu result in clustering of the copper, leading for both the α-Fe₂O₃(0001)-1 × 1 and the reconstructed composite substrate surfaces to Cu(111) epitaxial growth.     

STM study of SiC crystallite growth on vicinal Si(111) surfaces

The initial stage of epitaxial growth of cubic β-SiC on vicinal Si(111) misoriented towards the [112̄] direction is studied by scanning tunneling microscopy in ultra-high vacuum. The clean Si(111) surface contains terraces separated by groups of atomic steps. The separation between the atomic steps within a group is observed to be approximately equal to the length of the long axis of the Si(111)7 × 7 unit cell. We postulate that the SiC forms three-sided pyramids with surfaces of (110) orientation. The pyramids are located mostly at the step edges and are sharper than the end of the tip. This results in a series of identically shaped tip images located at the step edges, which display the structure of the tip.     

Two series of triple- and single-domain reconstructions induced by europium on vicinal Si(1 1 1) [ ]-miscut surface

The growth and properties of Eu-induced one-dimensional reconstructions on vicinal Si(1 1 1) surface miscut in the [ ] direction have been studied by low energy electron diffraction and scanning tunneling microscope in the submonolayer range. The focus has been attended to the formation of single-domain structures and the influence of preparation parameters on the domain orientation. We have found the critical conditions for the preparation of a variety of Eu-induced single-domain (n×2) and (n×1) structures. In addition, a new intermediate phase showing the 9×1 periodicity between 3×2 and 2×1 phases is detected.     

Observation of charge transfer states of F4-TCNQ on the 2-methylpropene chemisorbed Si(1 0 0)(2 × 1) surface

We have investigated the valence electronic states of 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F₄-TCNQ) on the 2-methylpropene chemisorbed Si(1 0 0)(2 × 1) surface using valence photoelectron spectroscopy. Since the electron affinity of condensed F₄-TCNQ is 5.24 eV and the energy from the valence band maximum of the 2-methylpropene saturated Si(1 0 0)(2 × 1) surface to the vacuum level is 4.1 eV, spontaneous charge transfer would be expected in the present system. At sub-monolayer coverage of F₄-TCNQ, characteristic peaks are observed at 1.1 and 2.5 eV below Fermi energy. The former peak is assigned to a singly occupied affinity level, and the latter is ascribed to a relaxed highest occupied molecular orbital of adsorbed F₄-TCNQ. The work function change is increased up to +1.3 eV as a function of F₄-TCNQ coverage. These results support the occurrence of charge transfer into F₄-TCNQ on the 2-methylpropene saturated Si(1 0 0)(2 × 1) surface.     

Au island growth on a Si(1 1 1) vicinal surface

Au island nucleation and growth on a Si(1 1 1) 7 × 7 vicinal surface was studied by means of scanning tunneling microscopy. The surface was prepared to have a regular array of step bunches. Growth temperature and Au coverage were varied in the 255-430 °C substrate temperature range and from 1 to 7 monolayers, respectively. Two kinds of islands are observed on the surface: Au-Si reconstructed islands on the terraces and three-dimensional (3D) islands along the step bunches. Focusing on the latter, the dependence of island density, size and position on substrate temperature and on Au coverage is investigated. At 340 °C and above, hemispherical 3D islands nucleate systematically on the step edges.     

Formation of a √3 × √3 surface on Si/Ge(1 1 1) studied by STM and LEED

We have performed a detailed study of the formation and the atomic structure of a √3 × √3 surface on Si/Ge(1 1 1) using both scanning tunneling microscopy (STM) and low energy electron diffraction (LEED). Both experimental methods confirm the presence of a √3 × √3 periodicity but unlike the Sn/Ge(1 1 1) and the Sn/Si(1 1 1) surfaces, the Si/Ge(1 1 1) surface is not well ordered. There is no long range order on the surface and the √3 × √3 reconstruction is made up of double rows of silicon atoms separated by disordered areas composed of germanium atoms.     

Multiple scattering calculations of step contrast in REM images of the Si(001) surface

Simulations of reflection electron microscopy (REM) images of both monolayer and bilayer steps on the bulk-terminated Si(001) surface, for the case when the primary electron beam azimuth is directed parallel to the line of the step, are presented. The simulations employ our previously reported theory of REM image formation which uses a 2D Bloch wave formulation of dynamical (multiple scattering) elastic RHEED theory to calculate diffracted amplitudes propagating from the surface. The only step contrast mechanism considered here is phase contrast and this is sufficient to produce the characteristic “black-white” appearance observed experimentally. Defocusing of the simulated images is also discussed.     

Adsorption of an organic zwitterion on a Si(1 1 1)-7 × 7 surface at room temperature

The couple sulfonato/Si(1 1 1)-7 × 7 leads to remarkable 2D chiral molecular assembly with a stability improved at room temperature. The voltage-dependency of the STM images has been experimentally investigated and the correlation between STM images and PDOS has been studied. The proposed empirical model of the adsorption of molecules on Si(1 1 1)-7 × 7 has been justified by the experimental and theoretical data.     

Growth of copper and palladium on α-Al2O3(0001)

Non-contact atomic force microscopy (NC-AFM) has been used to image the room-temperature growth of copper and palladium on the (1×1) and terminations of α-Al₂O₃(0001). Three-dimensional (3D) clusters of palladium are observed on both the (1×1) and the terminations, with 3D clusters of copper observed on the reconstructed surface. There is evidence of step-edge-dominated growth of palladium on the termination.     

Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

We report the first results from novel sub-Angstrom oscillation amplitude non-contact atomic force microscopy developed for lateral force gradient measurements. Quantitative lateral force gradients between a tungsten tip and Si(1 1 1)-(7 × 7) surface can be measured using this microscope. Simultaneous lateral force gradient and scanning tunnelling microscope images of single and multi atomic steps are obtained. In our measurement, tunnel current is used as feedback. The lateral stiffness contrast has been observed to be 2.5 N/m at single atomic step, in contrast to 13 N/m at multi atomic step on Si(1 1 1) surface. We also carried out a series of lateral stiffness-distance spectroscopy. We observed lateral stiffness-distance curves exhibit sharp increase in the stiffness as the sample is approached towards the surface. We usually observed positive stiffness and sometimes going into slightly negative region.     

Amorphization and recrystallization of ion implanted Si nanocrystals probed through their luminescence properties

In this paper the amorphization of Si nanocrystals (nc) by ion beam irradiation and the subsequent recrystallization are investigated in detail. The luminescence properties of Si nanocrystals embedded within a SiO₂ matrix are used as a probe of the damaging effects generated by high-energy ion beam irradiation. Samples have been irradiated with 2 MeV Si⁺ ions at different doses, in the range between 1×10⁹ and 1×10¹⁶ cm⁻². By increasing the ion dose, the nc-related photoluminescence (PL) strongly decreases after a critical dose value. It is shown that the lifetime quenching alone cannot quantitatively explain the much stronger PL drop, but the total number of emitting centers has to diminish too. Moreover, we studied the recovery of the amorphized Si nc by performing thermal annealings. It is demonstrated that the recovery of the PL properties of completely amorphized Si nc is characterized by a single activation energy, whose value is 3.4 eV. Actually, this energy is associated to the transition between the amorphous and the crystalline phases of each Si grain. The recrystallization kinetics of Si nanostructures is demonstrated to be very different from that of a bulk system.     

Surface states and annihilation characteristics of positrons trapped at reconstructed semiconductor surfaces

Positron probes of the Si(1 0 0) surface that plays a fundamental role in modern science and technology are capable to non-destructively provide information that is both unique to the probe and complimentary to that extracted using other more standard techniques. This paper presents a theoretical study of positron “image-potential” surface states and annihilation characteristics of surface trapped positrons at the Si(1 0 0) surface. Calculations are performed for the reconstructed Si(1 0 0)-p(2 × 2) surface using the modified superimposed-atom method to account for discrete-lattice effects, and the results are compared with those obtained for the non-reconstructed and reconstructed Si(1 0 0)-(2 × 1) and Si(1 1 1)-(7 × 7) surfaces. The effect of orientation-dependent variations of the atomic and electron densities on localization and extent of the positron surface state wave function at the semiconductor surface is explored. The positron surface state wave function is found to extend into the Si lattice in the regions where atoms are displaced from their ideal terminated positions due to the p(2 × 2) reconstruction. Estimates of the positron binding energy and positron annihilation characteristics reveal their sensitivity to the specific atomic structure of the topmost layers of Si. The observed sensitivity of annihilation probabilities to crystal face indicates that positron spectroscopy techniques could serve as an important surface diagnostic tool capable of distinguishing different semiconductor surfaces and defining their state of reconstruction.     

Distance dependence of noncontact-AFM image contrast on Si(111) × –Ag structure

Atomic resolution imaging of the Si(111) × R30°–Ag surface was investigated using a noncontact atomic force microscopy (NC-AFM) in ultrahigh vacuum. NC-AFM images showed three types of contrasts depending on the distance between an AFM tip and a sample surface. When the tip–sample distance was about 1–3 Å, the images showed the honeycomb arrangement with weak contrast. When the tip–sample distance was about 0–0.5 Å, the images showed the periodic structure composed of three bright spots with relatively strong contrast. On the other hand, the contrasts of images measured at the distance of 0.5–1 Å seemed to be composed of the above-mentioned two types of contrasts. By comparing the site of bright spots in the AFM images with honeycomb-chained trimer (HCT) model, we suggested the following models: when the tip is far from the sample surface, tip–sample interaction force contributing to imaging is dominated by physical bonding interaction such as Coulomb force and/or van der Waals (vdW) force between the tip apex Si atoms and Ag trimer on the sample surface. On the other hand, just before the contact, tip–sample interaction force contributing to imaging is dominated by chemical bonding such as the force due to hybridization between the dangling bond out of the tip apex Si atom and the orbit of Si–Ag covalent bond on the sample surface.     

Theoretical calculations of a square multilayer Bragg–Fresnel lens by quantum theory

A theoretical method based on the quantum scattering theory is presented to evaluate the performances of a two-dimensional (2-D) focusing square multilayer Bragg–Fresnel lens. The numerical application results of the square multilayer Bragg–Fresnel lens working at 0.7 nm wavelength (W/Si 25 periods with a double layer thickness of 5.38 nm, the size of the diffraction pattern is about 291×291 μm, the size of the center square in the diffraction pattern is 21.4×21.4 μm, and the size of the smallest square in the diffraction pattern is 0.39×0.39 μm) are given. Our theoretical results are compared with the experimental results of the linear Bragg–Fresnel lens reported by other researchers; an analysis and a discussion are carried out regarding the advantages of an optical system based on the 2-D focusing square multilayer Bragg–Fresnel lens, in contrast to a Kirkpatrick–Baez optical system on the basis of a two-linear Bragg–Fresnel lens.