Influence of primary ion species on the secondary cluster ion emission process from SAMs of hexadecanethiol on gold

In order to investigate the secondary cluster ion emission process of organo-metallic compounds under keV ion bombardment, self-assembled monolayers (SAMs) of alkanethiols on gold are ideal model systems. In this experimental study, we focussed on the influence of the primary ion species on the emission processes of gold-alkanethiolate cluster ions from a hexadecanethiol SAM on gold. For this purpose, we carried out time-of-flight secondary ion mass spectrometry (TOF-SIMS) measurements using the following primary ion species and acceleration voltages: Ar⁺, Xe⁺, SF₅⁺ (10 kV), Bi⁺, Bi₃⁺(25 kV), Bi₃²⁺, Bi₅²⁺, Bi₇²⁺ (25 kV).It is well known that molecular ions M⁻ and gold-alkanethiolate cluster ions Au_xM_y⁻ with M = S-(CH₂)₁₅-CH₃, x − 3 ≤ y ≤ x + 1, x, y > 0, show intense peaks in negative mass spectra. We derived yields Y_SI exemplarily for the molecular ions M⁻ and the gold-hexadecanethiolate cluster ions Au_y+1M_y⁻ up to y = 8 and found an exponentially decreasing behaviour for increasing y-values for the cluster ions.In contrast to the well-known increase in secondary ion yield for molecular secondary ions when moving from lighter to heavier (e.g. Ar⁺ to Xe⁺) or from monoatomic to polyatomic (e.g. Xe⁺ to SF₅⁺) primary ions, we find a distinctly different behaviour for the secondary cluster ions. For polyatomic primary ions, there is a decrease in secondary ion yield for the gold-hexadecanethiolate clusters whereas the relative decrease of the secondary ion yield ξ_Y with increasing y remains almost constant for all investigated primary ions.     

Comparison of secondary ion intensity enhancement from polymers on silicon and silver substrates by using Au-TOF-SIMS

The usefulness of the usage of cluster primary ion source together with an Ag substrate and detection of Ag cationized molecular ions was studied from the standpoint to realize high sensitivity TOF-SIMS analysis of organic materials. Although secondary ions from polymer thin films on a Si substrate can be detected in a higher sensitivity with Au₃⁺ cluster primary ion compared with Ga⁺ ion bombardment, it was clearly observed that the secondary ion intensities from samples on an Ag substrate showed quite a different tendency from that on Si. When monoatomic primary ions, e.g., Au⁺ and Ga⁺, were used for the measurement of the sample on an Ag substrate, [M+Ag]⁺ ions (M corresponds to polyethylene glycol molecule) were detected in a high sensitivity. On the contrary, when Au₃⁺ was used, no intensity enhancement of [M+Ag]⁺ ions was observed. The acceleration energy dependence of the detected secondary ions implies the different ionization mechanisms on the different substrates.     

X-ray absorption near edge structure (XANES) for KCl

The cluster calculations of K and L_2,3 edge XANES of K and Cl in KCl within the multiple scattering theory formalism using nonlocal HF potentials with abd without consideration of core hole field were performed. For K spectra the influence of the core hole potential is rather weak and the results are similar to those obtained with Xα potentials. For L_2,3 spectra, particularly for that of K⁺, core hole field leads to a radical redistribution of oscillator strength caused mainly by the spatial rearrangement of d like states. Calculated XANES curves show good over-all agreement with the experimental spectra (the L_2,3 absorption of K⁺ in KCl was measured using the synchrotron radiation of the USSR Academy of Sciences storage ring VEPP-2M in Novosibirsk).     

Secondary ion emission under the bombardment of Si by multiply charged Si q+ ions

The spectra of secondary ion emission under the bombardment of a B-doped Si target by multiply charged Si ^q+ ions (q = 1?C5) have been studied in the energy range of 1 to 10 keV per unit of charge. A multifold increase in the yield of secondary cluster Sk _n ⁺ ions, multiply charged Si ^q/+ ion (q = 1?C3), and H⁺, C⁺, B⁺, Si₂N⁺, Si₂O⁺ is observed as the charge of the multiply charged ions increases. The increase in the yield of secondary ions with increasing charge of the multiply charged-ion charge is most significant for ions with relatively high ionization potentials.     

Secondary ion emission from a GaAs single crystal upon bombardment with Bi<Stack> <Subscript> <Emphasis Type="Italic">m</Emphasis> </Subscript> <Superscript>+</Superscript> </Stack> cluster ions

Secondary-ion mass spectra and energy distributions upon bombarding a gallium arsenide single crystal using Bi_m⁺(m = 1–5) cluster ions with energies of 2–12 keV are investigated. The gallium cluster ion yield grew nonadditively with the number of atoms in the cluster projectiles. A quasi-thermal component found in the energy spectra of secondary Ga⁺ and Ga₂⁺ ions is indicative of the occurrence of the thermal spike mode upon cluster ion bombardment. The quasi-thermal component in the yield of atomic Ga⁺ ions upon bombardment with Bi₂⁺–Bi₅⁺–ions is 35–75%.     

Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

We investigated the enhancement of the secondary ion intensity in the TOF-SIMS spectra obtained by Au⁺ and Au₃⁺ bombardment in comparison with Ga⁺ excitation using polymer samples with different molecular weight distributions. Since the polymer samples used in this experiment have a wide molecular weight distribution, the advantages of the gold cluster primary ion source over monoatomic ion could accurately be evaluated. It was observed that the degree of fragmentation decreased by the usage of cluster primary ion beam compared with monoatomic ion beam, which was observed as a shift of the intensity distribution in the spectra. It was also found out that the mass effect of Au⁺ and Ga⁺ as monoatomic primary ion, resulted in about 10-60 times of enhancement for both samples with different molecular distributions. On the other hand, the Au₃⁺ bombardment caused intensity enhancement about 100-2600 compared with Ga⁺ bombardment, depending on the mass range of the detected secondary ion species. The cluster primary ion effect of Au₃⁺, compared with Au⁺, therefore, was estimated to be about 10-45.     

Monoatomic and cluster beam effect on ToF-SIMS spectra of self-assembled monolayers on gold

Self-assembled monolayers represent well-defined systems that is a good model surface to study the effect of primary ion beams used in secondary ion mass spectrometry. The effect of polyatomic primary beams on both aliphatic and aromatic self-assembled monolayers has been studied. In particular, we analysed the variation of the relative secondary ion yield of both substrate metal-cluster (Au_n⁻) in comparison with the molecular ions (M⁻) and clusters (M_xAu_y⁻) by using Bi⁺, Bi₃⁺, Bi₅⁺ beams. Moreover, the differences in the secondary ion generation efficiency are discussed. The main effect of the cluster beams is related to an increased formation of low-mass fragments and to the enhancement of the substrate related gold-clusters. The results show that, at variance of many other cases, the static SIMS of self-assembled monolayers does not benefit of the use of polyatomic primary ions.     

Secondary ion mass spectra of alkali halides

Mass spectra of positive and negative secondary ions from various alkali halides have been measured in the Manitoba time-of-flight mass spectrometer. The ions were produced by Cs⁺ and K⁺ bombardment at primary ion energies of 3 to 19 keV for the positive spectra, and 11 to 28 keV for the negative spectra. The ions measured were those emitted within a time interval ～ 20 ns after the primary ion impact. The secondary ion yields are strongly dependent on the sample composition and treatment; prior irradiation may change the yield by an order of magnitude or more. The secondary ion yields also depend strongly on the energy loss of the primary ion, but the ratio of yields of different cluster ions from a given target is almost independent of this parameter. The results appear to be consistent with models in which the clusters are ejected directly from the target, but do not determine whether or not they possess the original surface structure. The results may also be described by a recombination model if the recombination is essentially complete.     

Indium sputtering upon bombardment with cluster ions

A surface-ionization method is developed for measuring the integral yields of neutral particles sputtered under the effect of ion bombardment. An investigation is performed to compare the integral yield of particles sputtered upon bombarding indium with Bi _m ⁺ cluster ions (m = 1?C7) in the energy range of 2?C10 keV and the secondary ion emission under bombardment with Bi _m ⁺ cluster ions (m = 1?C5) in the energy range of 6?C18 keV. A nonadditive increase in the indium sputtering coefficient is observed with an increasing number of atoms in the bombarding clusters.     

Photoelectron spectroscopy of size-selected cluster ions using synchrotron radiation

A new experimental setup for photoelectron spectroscopy of size-selected cluster ions using synchrotron VUV radiation as generated by the Swiss Light Source is presented. An intense positively charged cluster ion beam is produced in a high-intensity magnetron sputter source. The clusters are subsequently mass selected in a sector magnet. To maximize the residence time of the cluster ions in the ionization region of the velocity map imaging spectrometer, the cluster ion beam is decelerated where it crosses the light beam. First experiments on (MoO₃) _n ⁺ (n = 69 and 59) cluster cations show that the approach is capable of delivering photoelectron spectra of size-selected transition metal cluster ions.     

Mössbauer study of Na0.82Co0.99Fe0.01O2

We studied by Mössbauer spectroscopy the Na_0.82CoO₂ compound using 1% ⁵⁷Fe as a local probe which substitutes for the Co ions. Mössbauer spectra at T=300 K revealed two sites which correspond to Fe³⁺ and Fe⁴⁺. The existence of two distinct values of the quadrupole splitting instead of a continuous distribution should be related with the charge ordering of Co⁺³, Co⁺⁴ ions and ion ordering of Na(1) and Na(2). Below T=10 K part of the spectrum area, corresponding to Fe⁴⁺ and all of Fe³⁺, displays broad magnetically split spectra arising either from short-range magnetic correlations or from slow electronic spin relaxation.     

Analysis of TOF-SIMS spectra from fullerene compounds

We analyzed TOF-SIMS spectra obtained from three different size of fullerenes (C₆₀, C₇₀ and C₈₄) by using Ga⁺, Au⁺ and Au₃⁺ primary ion beams and investigated the fragmentation patterns, the enhancement of secondary ion yields and the restraint of fragmentation by using cluster primary ion beams compared with monoatomic primary ion beams. In the TOS-SIMS spectra from C₇₀ and C₈₄, it was found that a fragment ion, identified as C₆₀⁺ (m/z = 720), showed a relatively high intensity compared with that of other fragment ions related to C₂ depletion. It was also found that the Au₃⁺ bombardment caused intensity enhancement of intact molecules (C₆₀⁺, C₇₀⁺ and C₈₄⁺) and restrained the fragmentation due to C₂ depletion.     

Probing electronic and structural properties of the reduced [2Fe−2S] cluster by orientation-selective1H ENDOR spectroscopy: Adrenodoxin versus rieske iron-sulfur protein

The¹H electron-nuclear double resonance (ENDOR) spectra in frozen buffer solutions of the reduced [2Fe?2S] clusters in adrenodoxin (Adx) and in the “Rieske” iron-sulfur protein (ISP) from the bovine mitochondrial bc1 complex were measured at low temperatures (5–20 K) and analyzed by spectra reconstruction. A single paramagnetic species with iron valence states (II) and (III) connected uniquely to the cluster irons was found in both proteins. For Adx, the experimental spectra from 23 field positions across the nearly axial (g _max=2.0241,g _int=1.9347, andg _min=1.9331) electron paramagnetic resonance (EPR) spectrum were analyzed. Four larger hyperfine couplings were assigned to the cysteine β-protons near the Fe(III) ion. Transfer into the crystal structure showed that the Fe(III) ion was coordinated to the residues Cys55 and Cys92. The spin density was estimated as +1.60 for the Fe(III) and ?0.6 for the Fe(II) ion, respectively. Theg-tensor direction with respect to the cluster showed strong similarities with the earlier assignment inArthospira platensis ferredoxin (Canne C., Ebelshauser M., Gay E., Shergill J.K., Cammack R., Kappl R., Hüttermann J.: J. Biol. Inorg. Chem. 5, 514, 2000). An Adx mutant (T54A) exhibiting a change (70 mV) in redox potential showed no significant influence at the [2Fe?2S] cluster. The Rieske ISP was subjected to the same analysis. The ENDOR spectra from 35 field positions across the rhombic (g _max=2.028,g _int=1.891, andg _min=1.757) EPR spectrum were simulated. Three major proton contributions were identified from the orientation behavior. Two were assigned to cysteine β-protons and one to a β-proton of His141. In contrast to Adx, the direction of theg _max-component was found to lie roughly in the FeS-core plane and the largest proton coupling occurred alongg _int. The spin population was estimated as about +1.6 for the oxidized and ?0.55 for the reduced iron.     

UV laser induced desorption of CsI and RbI ion clusters

Experimental results of laser sputtering of cesium and rubidium iodide secondary ions are presented. A TOF mass spectrometer, operating in linear mode, continuous extraction for positive or negative ions, was used for the analysis of (CsI)_nCs⁺, (CsI)_nI⁻, (RbI)_nRb⁺ and (RbI)_nI⁻ ion emission as a function of the laser irradiance. Experimental data show that the cluster ion emission yields decrease exponentially with n, for all the laser irradiances applied. Theoretical analysis of the clusters structure was performed using density functional theory at the B3LYP/LACV3P level, for the positive and negative cluster series. A quasi-equilibrium evolution of the clusters is proposed to extract a parameter characteristic of the cluster recombination process: the effective temperature. The hypothesis of the atomic species’ recombination (during the expansion of a high density highly ionized cloud) leading to cluster formation is confirmed to some extent in a second set of experiments: the UV laser ablation of a mixed and non-mixed cesium iodide and potassium bromide targets. These experiments show that the emission yields contain contributions from both the recombination process and from the sample stoichiometry, even for high laser irradiances.     

Study of the formation and unimolecular fragmentation of Si<Subscript><Emphasis Type="Italic">n</Emphasis></Subscript>O<Stack><Subscript><Emphasis Type="Italic">m</Emphasis></Subscript><Superscript>+</Superscript></Stack> clusters under ion bombardment

The dependences of the emission and fragmentation of clusters sputtered by Xe⁺ ions from the surface of Si _n O _m ⁺ on the oxygen pressure near the bombarded surface are studied using secondary ion mass spectrometry. It is shown that the process of Si _n O _m ⁺ cluster formation under ion bombardment can be described within the framework of the mechanism of combinatorial synthesis by taking into account the mutual reversibility of the reactions of formation and unimolecular decay.     

MCsn cluster formation on organic surfaces: A novel way to depth-profile organics?

In this work, we investigated the bombardment of polymer surfaces (PC, PMMA) with very low energy (250 eV) Cs⁺ ions.In the positive mode, we observed many cations combining a molecular fragment of the polymer (M) with two Cs atoms, similar to the well-known MCs₂⁺ clusters commonly observed in inorganic depth profiling with Cs. For example, Cs₂COOH⁺ or Cs₂C₆H₅O⁺ were measured on PC and Cs₂CH₃O⁺ or Cs₂C₄H₅O₂⁺ were measured on PMMA. In fact, most of the polymer characteristic fragments measured in negative spectra also appear in the positive spectra, combined with two Cs atoms. It is remarkable that stable negative ions tend to combine not with one Cs, but with two Cs atoms to create the MCs₂⁺ cluster.This effect is, to some extent, similar to the well-known cationisation of polymers (with Ag or Au) although here few clusters with only one Cs atom are detected (MCs⁺ clusters), like in classical cationisation. The most abundant clusters are the MCs₂⁺ clusters, but heavier clusters (MCs₃⁺, MCs₄⁺ and above) are also measured with high yields in the spectrum.Surprisingly, some of those MCs₂⁺ clusters were still detected even after a very long sputtering fluence (above 10¹⁷ ions/cm²), proving that some molecular depth profiling is also possible in this “Cs₂-cationisation” mode. In other words, this work could open the way to an extension of the MCs_n⁺ cluster analysis, commonly used in inorganic depth profiling, to the in-depth molecular analysis of organic layers.     

Gas-phase vibrational spectroscopy and ab initio calculations of Rb(H2O)n and Rb(H2O)nAr cluster ions

The competition between ion–water electrostatic interactions and water–water hydrogen bonding in cluster ions depends on several factors, including charge density of the ion and temperature of the system. Infrared photodissociation spectra of Rb⁺(H₂O)_n=2–5 and Rb⁺(H₂O)_n=1–5Ar are presented here and compared to previous experiments involving potassium and cesium. The temperature, or internal energy, of hydrated rubidium cluster ions is controlled by varying the evaporative path available for cluster formation. Warmer clusters (with effective temperatures of 250–500 K) are formed by the evaporation of water, while colder clusters (40–120 K) can be formed by argon evaporation. Colder cluster ions tend to favor conformers with more hydrogen bonds compared to those cluster ions at warmer temperatures. Previous work from this laboratory has shown significant and dramatic differences between the spectra of hydrated potassium and cesium ions. With a charge density intermediate between that of K⁺ and Cs⁺, Rb⁺ plays an important role in bridging the gap in our previous studies.     

Characterization of ion species of silicon oxide films using positive and negative secondary ion mass spectra

Secondary ion species of silicon oxide films have been investigated using time-of-flight secondary ion mass spectrometry (TOF-SIMS). Characterization of thermally grown SiO₂ films on silicon has been performed. A diagram showing secondary ion spectra of SiO₂ films in both positive and negative polarities indicates the pattern of change in polarities and intensities of ion species from SiO⁺ to Si₅O₁₁⁻. The ions mostly change from positive to negative polarity between Si_nO_2n−1 and Si_nO_2n. Ion peaks with the strongest intensities in the respective cluster ions correspond to the Si_nO_2n+1 negative ion. Intensities of ion species of Si_nO_2n+2 appear negligibly small. Ion species of Si₃O⁺, Si₃O₂⁺ and Si₃O₃⁺ have been found at the interface between silicon and SiO₂ films. The intensity patterns of these ion species compared to those of SiO₂ films indicate that most of these species are not emitted from the SiO₂ films, but likely from the SiO structures.     

23Na NMR in the relaxor ferroelectric Na1/2Bi1/2TiO3

The ²³Na NMR spectra of a Na_1/2Bi_1/2TiO₃ crystal are studied at frequencies of 79.4 and 15.7 MHz in the temperature range 150–720 K. It is revealed that, at all temperatures, the crystal contains regions with a nearly cubic matrix and polar clusters. The temperature dependence of the local distortion of the Na environment in the clusters is determined. The dynamics of the reorientation of the local cluster polarization in the tetragonal and trigonal NBT phases is analyzed.     

Enhancement of radiative electron rearrangement in Si by He+ bombardment

The first multiple ionization peak in the radiative electron rearrangement (RER) satellite sequence shows an order of magnitude enhancement relative to Kα_1,2 radiation in He⁺ induced spectra compared to H⁺ or e^? induced X-ray spectra of Si. This enhancement supports the RER model which requires that the rearrangement decay increases proportionally with the first Kα_1,2 satellite decay.