A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems

With the implementation of focused primary ion beams, secondary ion mass spectrometry (SIMS) has become a significant technique in the rapidly emerging field of mass spectral imaging in the biological sciences. Liquid metal ion guns (LMIG) offered the prospect of sub-100 nm spatial resolution, however this aspiration has yet to be reached for molecular imaging. This brief review shows that using LMIG the limitations of the static limit and low ionization probability will restrict useful imaging to around 2 μm spatial resolution with high-yield molecules. The only prospect of going beyond this in the absence of factors of 100 increase in ionization probability is to use polyatomic ion beams such as C₆₀⁺, for which bombardment induced damage is low. In these cases sub-micron imaging becomes possible, using voxels together with molecular depth profiling and 3D imaging. The discussion shows that conventional ToF-SIMS instrumentation then becomes a limitation in that the pulsed ion beam has a very low duty cycle which results in inordinately long analysis times, and pulsing the beam means that high-mass resolution and high spatial resolution are mutually incompatible. New instrumental configurations are described that allow the use of a dc ion beam and separate the mass spectrometry for the ion formation process. Early results from these instruments suggest that sub-micron analysis and imaging with high mass resolution and good ion yields are now realizable, although the low ion yield issue still needs to be solved.     

Etching Efficiency for Si and SiO2 by CF+x,F+, and C+ Ion Beams Extracted from CF4 Plasmas

Fluorocarbon (CF⁺ _x), fluorine (F⁺), and carbon (C⁺) ion beams with highcurrent density (50i<800 A/cm²) were irradiated to Si and SiO₂surfaces to investigate the influence of the ion species on the etchingefficiency. The ion beams were extracted from magnetized helicon-wave CF₄plasmas operated in pulsed modes. The CF⁺ ₃ beam had the largest etchingefficiency for Si at the same beam energy. When the same data weresummarized as a function of the momentum of the incident ion beam, thedifference in the etching efficiency became small, although the CF⁺ ₃ beamstill had a slightly larger etching efficiency. On the other hand, theetching efficiency for SiO₂ by the CF⁺ ₃ beam was larger than that by theother ion beams in the low-momentum region. In addition, in the low-momentumregion, the etching efficiency for SiO₂ by CF⁺ ₃ was larger than that forSi. These results suggest the high chemical reactivity of CF⁺ ₃ with SiO₂,leading to the high etching selectivity of SiO₂ over underlying Si in thefabrication of semiconductor devices.     

Nanotome cluster bombardment to recover spatial chemistry after preparation of biological samples for SIMS imaging

A C₆₀⁺ cluster ion projectile is employed for sputter cleaning biological surfaces to reveal spatio-chemical information obscured by contamination overlayers. This protocol is used as a supplemental sample preparation method for time of flight secondary ion mass spectrometry (ToF-SIMS) imaging of frozen and freeze-dried biological materials. Following the removal of nanometers of material from the surface using sputter cleaning, a frozen-patterned cholesterol film and a freeze-dried tissue sample were analyzed using ToF-SIMS imaging. In both experiments, the chemical information was maintained after the sputter dose, due to the minimal chemical damage caused by C₆₀⁺ bombardment. The damage to the surface produced by freeze-drying the tissue sample was found to have a greater effect on the loss of cholesterol signal than the sputter-induced damage. In addition to maintaining the chemical information, sputtering is not found to alter the spatial distribution of molecules on the surface. This approach removes artifacts that might obscure the surface chemistry of the sample and are common to many biological sample preparation schemes for ToF-SIMS imaging.     

Peptide structural analysis using continuous Ar cluster and C60 ion beams

A novel application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) with continuous Ar cluster beams to peptide analysis was investigated. In order to evaluate peptide structures, it is necessary to detect fragment ions related to multiple neighbouring amino acid residues. It is, however, difficult to detect these using conventional ToF-SIMS primary ion beams such as Bi cluster beams. Recently, C₆₀ and Ar cluster ion beams have been introduced to ToF-SIMS as primary ion beams and are expected to generate larger secondary ions than conventional ones. In this study, two sets of model peptides have been studied: (des-Tyr)-Leu-enkephalin and (des-Tyr)-Met-enkephalin (molecular weights are approximately 400 Da), and [Asn¹ Val⁵]-angiotensin II and [Val⁵]-angiotensin I (molecular weights are approximately 1,000 Da) in order to evaluate the usefulness of the large cluster ion beams for peptide structural analysis. As a result, by using the Ar cluster beams, peptide molecular ions and large fragment ions, which are not easily detected using conventional ToF-SIMS primary ion beams such as Bi₃ ⁺, are clearly detected. Since the large fragment ions indicating amino acid sequences of the peptides are detected by the large cluster beams, it is suggested that the Ar cluster and C₆₀ ion beams are useful for peptide structural analysis.     

Reactions of chlorofullerene C60Cl6 with N-substituted piperazines

It was shown for the first time that reactions of C₆₀ halides with aliphatic amines provide a facile route for the synthesis of aminofullerenes, valuable precursors for water-soluble cationic fullerene derivatives. Particularly, chlorofullerene C₆₀Cl₆ and N-substituted piperazines were investigated in this work. It was shown that substitution of chlorine atoms in C₆₀Cl₆ by amine groups is accompanied by partial elimination of addends from the fullerene cage that yields mixtures of di-, tetra- and, hexaaminofullerenes as the final products. Separation of these mixtures by column chromatography resulted in isolation of pure 1,4-diaminofullerenes; this procedure gives much higher and more reproducible yields of these compounds than direct oxidative photoaddition of secondary amines to C₆₀. ESI mass spectrometry and NMR spectroscopy data showed that hexaaminofullerene isomers are major components in inseparable mixtures of polyaddition products. Polyaminofullerenes were found to be readily soluble in aqueous acids; these solutions are unstable because of a facile substitution of protonated amine groups with hydroxyls. Nevertheless, the use of other amine substrates in the investigated reaction can potentially allow the preparation of more stable water-soluble cationic fullerene derivatives for biological studies.     

Are cluster ion analysis beams good choices for hydrogen depth profiling using time‐of‐flight secondary ion mass spectrometry?

For more than three decades, time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) has been used for elemental depth profiling. In recent years, cluster primary ion sources (principally, C₆₀⁺, Bi_n⁺, and Au_n⁺) have become widely available, and they can greatly enhance the signal intensity of molecular ions (10–1000 times). Understanding the performance of cluster ion analysis beams used in elemental depth profiling can greatly assist normal ToF‐SIMS users in choosing the optimal analysis beam for depth profiling work. Presently, however, the experimental data are lacking, and such choices are difficult to make. In this paper, hydrogen and deuterium depth profiling were studied using six different analysis beams—25 keV Bi⁺, Bi₃⁺, Bi₅⁺, 50 keV Bi₃²⁺, 10 keV C₆₀⁺, and 20 keV C₆₀²⁺. The effort shows that cluster primary ions do enhance H^? and D^? yields, but the enhancement is only about 1.5–4.0 times when compared to atomic Bi⁺ ions. Because the currents of atomic ion analysis beams are much stronger than the currents of cluster ion analysis beams for most commercial ToF‐SIMS instruments, the atomic ion analysis beams can provide the strongest H^? and D^? signal intensities, and may be the best choices for hydrogen and deuterium depth profiling. In addition, two representative nuclides, ³⁰Si and ¹⁸O, were also studied and yielded results similar to those of H^? and D^?. Copyright © 2011 John Wiley & Sons, Ltd.     

Polyatomic ions in inductively coupled plasma–mass spectrometry: Part II: Origins of N2H and HxCO ions using experimental measurements combined with calculated energies and structures

Several polyatomic ions in inductively coupled plasma–mass spectrometry are studied experimentally and by computational methods. Novel calculations based on spin-restricted open shell second order perturbation theory (ZAPT2) and coupled cluster (CCSD(T)) theory are performed to determine the energies, structures and partition functions of the ions. These values are combined with experimental data to evaluate a dissociation constant and gas kinetic temperature (T_gas) value. In our opinion, the resulting T_gas value can sometimes be interpreted to deduce the location where the polyatomic ion of interest is generated. The dissociation of N₂H⁺ to N₂⁺ leads to a calculated T_gas of 4550 to 4900 K, depending on the computational data used. The COH⁺ to CO⁺ system yields a similar temperature, which is not surprising considering the similar energies and structures of COH⁺ and N₂H⁺. The dissociation of H₂CO⁺ to HCO⁺ leads to a much lower T_gas (< 1000 to 2000 K). Finally, the dissociation of H₂COH⁺ to HCOH⁺ generates a T_gas value between those from the other H_xCO⁺ ions studied here. All of these measured T_gas values correspond to formation of extra polyatomic ion in the interface or extraction region. The computations reveal the existence of isomers such as HCO⁺ and COH⁺, and H₂CO⁺ and HCOH⁺, which have virtually the same m/z values and need to be considered in the interpretation of results.     

Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60–Ar cosputtering

Polymethylmethacrylate (PMMA) is widely used in various fields, including the semiconductor, biomaterial and microelectronic fields. Obtaining the correct depth profiles of PMMA is essential, especially when it is used as a thin-film. There have been many studies that have used earlier generation of cluster ion (SF₅⁺) as the sputtering source to profile PMMA films, but few reports have discussed the use of the more recently developed C₆₀⁺ in the PMMA sputtering process. In this study, X-ray photoelectron spectroscopy (XPS) and dynamic secondary ion mass spectroscopy (D-SIMS) were used concurrently to monitor the depth profiles of PMMA under C₆₀⁺ bombardment. Additionally, the cosputtering technique (C₆₀⁺ sputtering with auxiliary, low-kinetic-energy Ar⁺) was introduced to improve the analytical results. The proper cosputtering conditions could eliminate the signal enhancement near the interface that occurred with C₆₀⁺ sputtering and enhance the sputtering yield of the characteristic signals. Atomic force microscopy (AFM) was also used to measure the ion-induced topography. Furthermore, the effect of the specimen temperature on the PMMA depth profile was also examined. At higher temperatures (+120 °C), the depolymerization reaction that corresponded to main-chain scission dominated the sputtering process. At lower temperatures (−120 °C), the cross-linking mechanism was retarded significantly due to the immobilization of free radicals. Both the higher and lower sample temperatures were found to further improve the resulting depth profiles.     

Ion fractions of matrix elements and impurities in GaAs bombarded by O2+ primary ions

Summary Useful ion yields Y of secondary ion mass spectrometry (SIMS) analyses were measured for GaAs bombarded with O ₂ ⁺ primary ions at normal incidence. The useful ion yields of several analytes were found to decrease with increasing ionisation potentialE _i of the analytes far less drastically than reported in the literature. For valuesE _i lower than 8 eV only a slight decrease of Y with increasing ionisation potential is observed. The saturation of the useful ion yields at lower values of the ionisation potential is interpreted to result from very high ion fractions. If an ion fraction of unity is assumed for Ga the ion fractions of impurities withE _i lower than 8 eV would exceed 40%. For analytes withE _i higher than 8 eV the ion fraction decreases rapidly with increasing ionisation potential. A value of 8×10^–4 is estimated for the matrix element As (E _i= 9.81 eV).

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Ionenausbeuten von Matrixelementen und Dotierstoffen in GaAs unter O ₂ ⁺ -Primärionenbeschuß

     

复合催化剂上CO2加氢合成C2烃类

介绍了由CO₂+H₂合成C2⁺烃的几种复合催化剂体系的研究进展，比较和评价了复合催化剂体系的活性和选择性及对C2⁺烃类生成的影响。着重于复合催化剂体系对C4⁺烃的生成及产物分布的影响并简述反应机理。     

C2(X1Σg+)自由基与不饱和碳氢化合物反应的温度效应

运用脉冲激光光解-激光诱导荧光(PLP-LIF)的方法在293-573 K的温度范围内测量了C₂(X¹Σ_g⁺)自由基与不饱和碳氢化合物(C₂H₄和C₂H₂)气相反应的双分子反应速率常数. 获得的速率常数可以用Arrhenius 公式表达如下(单位: cm³·molecule^-1·s^-1): k(C₂H₄)=(1.16±0.10)×10^-10exp[(290.68±9.72)/T], k(C₂H₂)=(1.36±0.02)×10^-10exp[(263.85±7.60)/T], 误差为2σ. 由获得的双分子反应速率常数及其所呈现的负温度效应, 我们认为在293-573 K温度范围内C₂(X¹Σ_g⁺)自由基和不饱和碳氢化合物的反应遵循加成机理.     

Attempts for molecular depth profiling directly on a rat brain tissue section using fullerene and bismuth cluster ion beams

The capabilities of time of flight secondary ion mass spectrometry (TOF-SIMS) have been recently greatly improved with the arrival in this field of polyatomic ion sources. This technique is now able to map at the micron scale intact organic molecules in a range of a thousand Daltons or more, at the surface of tissue samples. Nevertheless, this remains a surface analysis technique, and three-dimensional information on the molecular composition of the sample could not be obtained due to the damage undergone by the organic molecules during their irradiation. The situation changed slightly with the low damage and low penetration depth of the C₆₀ fullerene ion beams. Recent promising studies have shown the possibility of organic molecular depth profiling using this kind of beams onto model samples. This possibility has been tried out directly onto a rat brain tissue section, which is the most commonly used biological tissue model in TOF-SIMS imaging method developments. The tissue surface has been sputtered with a 10 keV energy fullerene ion beam, and surface analyses were done with a 25 keV Bi₃⁺ ion beam at regular time intervals. The total depth which was analysed was more than two microns, with total primary ion doses of more than 10¹⁶ ions cm⁻². Although not in contradiction with results previously published but with much lower doses, it is found that the molecular damage remains too large, thus making molecular imaging very difficult. In addition, most of the lipids, which are usually the main observable molecules in TOF-SIMS, are concentrated close to the sample surface in the first hundreds of nanometers.     

Chemical discrimination of multilayered paint cross sections for potential forensic applications using time‐of‐flight secondary ion mass spectrometry

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) equipped with a bismuth imaging source and an argon gas cluster ion beam (GCIB) was used to image polished cross‐sections of four automotive multilayer paint samples. Secondary ion mass spectrometry chemical imaging of the individual layers was possible after a GCIB sputter ion dose of (7 × 10¹⁵) ions/cm² was applied for the removal of polishing residue, at which point the chemical composition of the individual clear coats could be distinguished using principal components analysis. For the differentiation of the four clear coat chemistries, only four secondary ion peaks were necessary; C₂H₅O⁺ (m/z 45.04), C₉H₉NO₂⁺ (m/z 163.09), and C₁₀H₁₁NO₂⁺ (m/z 177.10) that appeared to be fragments of the carbamate‐based clear coat, and C₇H₁₁⁺ (m/z 95.09) that was strongly associated with the polyurethane‐based clear coat. Clear identification of the four paint samples based on this short peak list highlights the strength of the SIMS technique as a potential forensic approach to discriminate automotive paints and suggests that many more variables could be included in the multivariate and statistical analysis to differentiate a wider range of clear coat chemistries.     

Deposition of Diamondlike Carbon Film and Mass Spectrometry Measurement in CH4/N2 RF Plasma

The deposition of diamondlike carbon (DLC) film and the measurements of ionic species by means of mass spectrometry were carried out in a CH₄/N₂ RF (13.56 MHz) plasma at 0.1 Torr. The film deposition rate greatly depended on both CH₄/N₂ composition ratio and RF power input. It was decreased monotonically as CH₄ content decreased in the plasma and then rapidly diminished to negligible amounts at a critical CH₄ content, which became large for higher RF power. The rate increased with increasing RF power, reaching a maximum value in 40% CH₄ plasma. The predominant ionic products in CH₄/N₂ plasma were NH⁺ ₄ and CH₄N⁺ ions, which were produced by reactions of hydrocarbon ions, such as CH⁺ ₃, CH⁺ ₂, CH⁺ ₅, and C₂H⁺ ₅ with NH₃ molecules in the plasma. It was speculated that the production of NH⁺ ₄ ion induced the decrease of C₂H⁺ ₅ ion density in the plasma, which caused a reduction in higher hydrocarbon ions densities and, accordingly, in film deposition rate. The N⁺ ₂ ion sputtering also plays a major role in a reduction of film deposition rate for relatively large RF powers. The incorporation of nitrogen atoms into the bonding network of the DLC film deposited was greatly suppressed at present gas pressure conditions.     

Parallel detection,quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60–Ar co-sputtering

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) using pulsed C₆₀⁺ primary ions is a promising technique for analyzing biological specimens with high surface sensitivities. With molecular secondary ions of high masses, multiple molecules can be identified simultaneously without prior separation or isotope labeling. Previous reports using the C₆₀⁺ primary ion have been based on static-SIMS, which makes depth profiling complicated. Therefore, a dynamic-SIMS technique is reported here. Mixed peptides in the cryoprotectant trehalose were used as a model for evaluating the parameters that lead to the parallel detection and quantification of biomaterials. Trehalose was mixed separately with different concentrations of peptides. The peptide secondary ion intensities (normalized with respect to those of trehalose) were directly proportional to their concentration in the matrix (0.01–2.5 mol%). Quantification curves for each peptide were generated by plotting the percentage of peptides in trehalose versus the normalized SIMS intensities. Using these curves, the parallel detection, identification, and quantification of multiple peptides was achieved. Low energy Ar⁺ was used to co-sputter and ionize the peptide-doped trehalose sample to suppress the carbon deposition associated with C₆₀⁺ bombardment, which suppressed the ion intensities during the depth profiling. This co-sputtering technique yielded steadier molecular ion intensities than when using a single C₆₀⁺ beam. In other words, co-sputtering is suitable for the depth profiling of thick specimens. In addition, the smoother surface generated by co-sputtering yielded greater depth resolution than C₆₀⁺ sputtering. Furthermore, because C₆₀⁺ is responsible for generating the molecular ions, the dosage of the auxiliary Ar⁺ does not significantly affect the quantification curves.     

Ion-exchange chromatography using vanadyl and vandate salts as mobile phases with indirect detection

Summary Vanadyl sulfate, VOSO₄, was characterized as the mobile phase for the ion exchange separation of Li⁺, Na⁺, NH ₄ ⁺ , and K⁺ using indirect photometric detection at 254 nm. Detection limits ranged from 0.2 ppm for Li⁺ to 1 ppm for K⁺. Indirect electrochemical detection of these separated cations by reduction of VO (II) to V³⁺ was compared to spectrophotometric detection. The potential of the vanadate species, HVO ₄ ^2– , for the separation of F^–, Cl^–, and SO ₄ ^2– , with indirect photometric detection was also demonstrated.     

A study of the analytical behaviour of selected psycho-active drugs using liquid chromatography, ion trap mass spectrometry, gas chromatography and polarography and the construction of an appropriate database for drug characterisation

This paper provides analytical chemical information on a range of psycho-active drugs. This analytical chemical information on liquid chromatography-electrospray ionisation-mass spectrometry (HPLC-ESI-MS), ion trap mass spectrometry (ESI-MSⁿ), gas chromatography-flame ionisation detection (GLC-FID) and polarographic behaviour is then incorporated into a database which is of use in drug characterisation. Application is found in the determination of selected drug compounds in hair samples.     

Charge compensation for imaging large insulating samples by using secondary ion tandem mass spectrometry

A charge compensation technique has been developed for secondary ion mass spectrometry and imaging of insulating samples as large as 1 cm² using a triple quadrupole-based microprobe. The microprobe secondary ion extraction field is synchronized with a periodic primary Cs⁺ beam to allow a sheetlike beam of 5-eV electrons to pass over the sample surface when the extraction field is zeroed. Electrons are attracted to, and neutralize, any points on the sample that have accumulated positive charge. Positive secondary ion images from Teflon®, a well-known insulator, illustrate the effectiveness of charge compensation. Locating and identifying analytes on dry filter paper by using tandem mass spectrometry are also demonstrated.     

Time of flight secondary ion mass spectrometric determination of molecular weight distributions of low polydispersity poly(dimethyl siloxane) with polyatomic primary ions

This work reports a comparison of oligomer and fragment ion intensities resulting from primary ion bombardment with several primary ion sources (Bi_n⁺, C₆₀⁺, and Cs⁺) at various energies in secondary ion mass spectrometry (SIMS). Although the use of polyatomic primary ions are of great interest due to increased secondary ion efficiency and yield, we demonstrate that monatomic primary ions result in increased oligomer ion yield for polymers prepared as submonolayer films on silver substrates. The enhancement of oligomer secondary ion yield with monatomic ions is evidence that monatomic primary ions have a shallower sampling depth than polyatomic ions, resulting from a collision cascade that is less energetic at the sample surface. The results are also consistent with a lower degree of fragmentation of the resultant secondary ions, which is observed when evaluating the fragmentation data and the spectral data.     

Ab initio investigations of the bound rovibrational levels of NeH 2 + , NeHD+, and NeD 2 +

Summary Bound rovibrational levels have been calculated for NeH ₂ ⁺ , NeHD⁺, and NeD ₂ ⁺ using three recent fits to an accurateab initio PES. The NeH ₂ ⁺ molecule behaves essentially as a linear molecule, the predicted rotational constant is 2.57 cm^–1. The fundamental frequencies are 811, 1189, and 1748 cm^–1 for the Ne-H ₂ ⁺ stretch, the Ne-H ₂ ⁺ bend and H ₂ ⁺ stretching modes, respectively.Dedicated to the 60th birthday of Prof. W. Kutzelnigg, Bochum