Scanning Hall probe microscopy of vortex matter

Scanning Hall probe microscopy (SHPM) is a novel scanned probe magnetic imaging technique whereby the stray fields at the surface of a sample are mapped with a sub-micron semiconductor heterostructure Hall probe. In addition an integrated scanning tunnelling microscope (STM) or atomic force microscope (AFM) tip allows the simultaneous measurement of the sample topography, which can then be correlated with magnetic images. SHPM has several advantages over alternative methods; it is almost completely non-invasive, can be used over a very wide range of temperatures (0.3–300 K) and magnetic fields (0–7 T) and yields quantitative maps of the z-component of magnetic induction. The approach is particularly well suited to low temperature imaging of vortices in type II superconductors with very high signal:noise ratios and relatively high spatial resolution (>100 nm). This paper will introduce the design principles of SHPM including the choice of semiconductor heterostructure for different measurement conditions as well as surface tracking and scanning mechanisms. The full potential of the technique will be illustrated with results of vortex imaging studies of three distinct superconducting systems: (i) vortex chains in the “crossing lattices” regime of highly anisotropic cuprate superconductors, (ii) vortex–antivortex pairs spontaneously nucleated in ferromagnetic-superconductor hybrid structures, and (iii) vortices in the exotic p-wave superconductor Sr₂RuO₄ at milliKelvin temperatures.     

Analysis of the number of hydrogen bond groups of a multiwalled carbon nanotube probe tip for chemical force microscopy

In this paper, we describe a statistical method of quantification of the number of functional groups at the contact area of a probe tip for atomic force microscopy from the result of repetitive pull-off force measurements. We have investigated laboratory-made carbon nanotube (CNT) probe tips to apply them for chemical force microscopy because limited number of functional groups at the tip-end is expected. Using a CNT tip, we conducted repetitive pull-off force measurements against a self-assembled monolayer terminated with carboxyl group and analyzed them in terms of the number of hydrogen bond groups at the CNT tip. The elementary hydrogen bond rupture force quantum in n-decane medium was estimated to be 84.2 ± 0.5 pN in the present system. Thus it was revealed that only a couple of hydrogen bond groups of the CNT tip were participating in hydrogen bonding with the sample on an average in this experimental system.     

Experimental determination of ultra-sharp stray field distribution from a magnetic vortex core structure

The fine magnetic stray field from a vortex structure of micron-sized permalloy (Ni₈₀Fe₂₀) elements has been studied by high-resolution magnetic force microscopy. By systematically studying the width of the stray field gradient distribution at different tip-to-sample distances, we show that the half-width at half-maximum (HWHM) of the signal from vortex core can be as narrow as ∼21 nm at a closest tip-to-sample distance of 23 nm, even including the convolution effect of the finite size of the magnetic tip. a weak circular reverse component is found around the center of the magnetic vortex in the measured magnetic force microscope (MFM) signals, which can be attributed to the reverse magnetization around the vortex core. Successive micromagnetic and MFM imaging simulations show good agreements with our experimental results on the width of the stray field distribution.     

Observation of magnetic domain structure in Terfenol-D by scanning electron acoustic microscopy

The magnetic domain structure in oriented Tb_0.3Dy_0.7Fe_1.92 (Terfenol-D) is investigated by scanning electron acoustic microscopy (SEAM) in a wide frequency range from 75 to 530 kHz. Both secondary electron image and electron acoustic image can be obtained in situ simultaneously. By changing the modulation frequencies, the SEAM can be used as an effective nondestructive method to observe not only the surface topography and domain structure but also the subsurface domain structure and defects. The magnetic domain structure is verified by magnetic force microscopy (MFM). Furthermore, magnetic domains can be observed in both linear and nonlinear imaging modes by SEAM. The contributions to the image contrast are related to the signal generation through the piezomagnetic coupling mechanism, magnetostrictive coupling mechanism, and thermal-wave coupling mechanism.     

Nanoscale resistive switching in SrTiO3 thin films

The local conductivity of SrTiO₃ thin films epitaxially grown on SrRuO₃‐buffered SrTiO₃ single crystals has been investigated in detail with an atomic force microscope equipped with a conducting tip (LC‐AFM). These experiments demonstrate that the conductivity of SrTiO₃ thin films originates from nanoscale well‐conducting filaments connecting the surface to the SrRuO₃ bottom electrode. The electrical conduction of the filaments is shown to be reversibly modulated over several orders of magnitude by application of an appropriate electrical field. We analyze the resistive switching by addressing individual filaments with the AFM tip as well as by scanning areas up to the µm scale. Temperature dependent measurements reveal that resistive switching on a macroscopic scale can be traced down to the insulator‐to‐metal transition of the independently switchable filaments. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Tip-induced local anodic oxidation on p-GaAs surface with non-contact atomic force microscopy

Nano-sized oxide structures resulted from localized electrochemical oxidation induced by a negatively biased atomic force microscopy (AFM) tip operated with the non-contact mode were fabricated on p-GaAs(1 0 0) surface. The geometrical characteristics of the oxide patterns and their dependences on various fabrication parameters, e.g., the anodization time, the biased voltages, the tip scanning rates, as well as the formation mechanism and relevant growth kinetics are investigated. Results indicate that the height of the protruded oxide dots grow exponentially as a function of time in the initial stage of oxidation and soon reaches a maximum height depending linearly with the anodized voltages, in according with the behaviors predicted by space charge limited local oxidation mechanism. In addition, selective micro-Auger analysis of the anodized region reveals the formation of Ga(As)O_x, indicating the prominent role played by the field-induced nanometer-size water meniscus in producing the nanometer-scale oxide dots and bumps on p-GaAs(1 0 0) surface.     

Spin domain mapping of a CrO2 thin film using spin-polarized current microscopy

We investigate spin domain mapping of a CrO₂ thin film using spin-polarized current microscopy at room temperature, where conductive atomic force microscopy (CAFM) with a CrO₂-coated tip is used. The nanoscale spin domains of the CrO₂ thin film were crosschecked by magnetic force microscopy (MFM). Notably, the CAFM exhibits the spin domains of the CrO₂ thin film with higher resolution than the MFM, which may result from a local point contact between the nanoscale CrO₂-coated tip and surface of the CrO₂ thin film.     

Domain wall thickness variations of ferroelectric BaMgF4 single crystals in the tip fields of an atomic force microscope

The ferroelectric domain wall thickness of a fluoride BaMgF₄ single crystal was investigated by piezoresponse force microscopy. It was found that the domain wall thickness shows a strong spatial variation in the as‐grown crystal and the polarization reversal process. The original wall thickness is greater (about two to seven times) than that switched by the tip fields of the atomic force microscope. A significantly narrower domain wall was obtained in the higher tip‐field. The trapped defects at the domain wall play an important role in the spatial variation of the polarization width of 180° domain wall in the BaMgF₄ single crystal. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Ferromagnetism in MnxGe1−x films prepared by magnetron sputtering

Mn_xGe_1−x thin films were prepared by magnetron sputtering with a substrate temperature of 673 K and subsequently annealed at 873 K. The X-ray diffraction (XRD) measurements showed that all samples had a single Ge cubic structure. No films showed clear magnetic domain structure under a magnetic force microscope (MFM). Atom force microscope (AFM) measurements showed that the films had an uniform particle size distribution, and a columnar growth pattern. X-ray photoelectron spectroscopy (XPS) measurements indicated that the valences of both Mn and Ge atoms increase with the Mn concentration. The resistance decreased with increasing temperature, suggesting that the films were typical semiconductors. Magnetic measurements carried out using a Physical Property Measurement System (PPMS) showed that all samples exhibited ferromagnetism at room temperature. There was a small concentration of Mn₁₁Ge₈ in the films, but the ferromagnetism was mainly induced by Mn substitution for Ge site.     

Nanoindentation on carbon thin films obtained from a C60 ion beam

Raman spectra, atomic force microscope (AFM) images, hardness (H) and Young's modulus (E) measurements were carried out in order to characterize carbon thin films obtained from a C₆₀ ion beam on silicon substrates at different deposition energies (from 100 up to 500 eV). The mechanical properties were studied via the nanoindentation technique. It has been observed by Raman spectroscopy and AFM that the microstructure presents significant changes for films deposited at energies close to 300 eV. However, these remarkable changes have not been noticeable on the mechanical properties: apparently H and E increase with higher deposition energy up to ∼11 and ∼116 GPa, respectively. These values are underestimated if the influence of the film roughness is not taken into account.     

Exploring the facets of “soft crystals” using an Atomic Force Microscope

We obtained monocrystalline droplets in a thermotropic cubic phase, of approximate size 100μm, deposited on a flat surface. The facets of these soft crystals are explored using both an optical microscope and an AFM. The height of individual steps on the principal facets and the lateral distance between steps in vicinal facets are measured using AFM in imaging (tapping) mode. Moreover, the elastic modulus is measured locally, using the AFM tip (in contact mode) as a local rheological probe.     

Properties of ZnO thin films grown on Si substrates by photo-assisted MOCVD

ZnO thin films were grown on (1 0 0) p-Si substrates by Photo-assisted Metal Organic Chemical Vapor Deposition (PA-MOCVD) using diethylzinc (DEZn) and O₂ as source materials and tungsten-halogen lamp as a light source. The effects of tungsten-halogen lamp irradiation on the surface morphology, structural and optical properties of the deposited ZnO films have been investigated by means of atomic force microscope (AFM), X-ray diffraction and photoluminescence (PL) spectra measurements. Compared with the samples without irradiation, the several characteristics of ZnO films with irradiation are improved, including an improvement in the crystallinity of c-axis orientation, an increase in the grain size and an improvement in optical quality of ZnO films. These results indicated that light irradiation played an important role in the growth of ZnO films by PA-MOCVD.     

Conductive nanodots on the surface of irradiated CaF2

CaF₂(111) single crystal surfaces have been irradiated with fast heavy ions under oblique angles resulting in chains of nanosized hillocks. In order to characterize these nanodots with respect to their conductivity we have applied non‐contact atomic force microscopy using a magnetic tip. Measurements in ultra high vacuum as well as under ambient conditions reveal a clearly enhanced electromagnetic interaction between the magnetic tip and the nanodots. The dissipated energy per cycle is comparable to the value found for metals, indicating that the interaction of the ion with the target material leads to the creation of metallic Ca nanodots on the surface. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

A Thin Liquid Film and Its Effects in an Atomic Force Microscopy Measurement

Recently, it has been observed that a liquid film spreading on a sample surface will significantly distort atomic force microscopy （AFM） measurements. In order to elaborate on the effect, we establish an equation governing the deformation of liquid film under its interaction with the AFM tip and substrate. A key issue is the critical liquid bump height yoc, at which the liquid film jumps to contact the AFM tip. It is found that there are three distinct regimes in the variation of yoc with film thickness H, depending on Hamaker constants of tip, sample and liquid. Noticeably, there is a characteristic thickness H^＊ physically defining what a thin film is; namely, once the film thickness H is the same order as H^＊, the effect of film thickness should be taken into account. The value of H^＊ is dependent on Hamaker constants and liquid surface tension as well as tip radius.     

The role of copper ions on the structural and magnetic characteristics of MgZn ferrite nanoparticles and thin films

In this study Cu_xMg_0.5−xZn_0.5Fe₂O₄ (x=0-0.5) nanoparticles and thin films were prepared by sol-gel processing. The morphologies of nanoparticles were observed by transmission electron microscope (TEM). The Mössbauer spectroscopy (MS) was employed to determine the site preference of the constitutive elements. Magnetic dynamics of the nanoparticles was studied by the measurement of AC magnetic susceptibility versus temperature at different frequencies. The phenomenological Néel-Brown and Vogel-Fulcher models were employed to distinguish between interacting or non-interacting system. Results exhibited that there is strong interaction between fine particles. X-ray diffraction (XRD) patterns of the thin films indicate the formation of single-phase cubic spinel structure. Atomic force microscope (AFM) was employed to evaluate the surface morphologies of the prepared thin films. Vibrating sample magnetometer (VSM) was employed to probe magnetic properties of samples. It was found that with an increase in the amount of copper, the saturation of magnetization and initial permeability increase.     

A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer

A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample scanner, a calibrated homodyne laser interferometer and a commercial AFM head was developed for use in the nano-metrology field. The x and y position of the sample with respect to the tip are acquired by using the laser interferometer in the open-loop state, when each z data point of the AFM head is taken. The sample scanner, which has a motion amplifying mechanism was designed to move a sample up to 100 μm × 100 μm in orthogonal way, which means less crosstalk between axes. Moreover, the rotational errors between axes are measured to ensure the accuracy of the calibrated AFM within the full scanning range. The conventional homodyne laser interferometer was used to measure the x and y displacements of the sample and compensated via an X-ray interferometer to reduce the nonlinearity of the optical interferometer. The repeatability of the calibrated AFM was measured to sub-nanometers within a few hundred nanometers scanning range.     

Non-Contact to Contact Transition： Direct Measurements of Interaction Forces between a Solid Probe and a Planar Air-Water Interface

The interaction force between a solid probe and a planar air-water interface is measured by using an atomic force microscope. It is demonstrated that during the approach of the probe to the air-water interface, the force curves decline all the time due to the van der Waals attraction and induces a stable profile of water surface raised. When the tip approaches very close to the water surface, force curves jump suddenly, reflecting the complex behaviour of the unstable water surface. With a theoretical analysis we conclude that before the tip touches water surface, two water profiles appear, one stable and the other unstable. Then, with further approaching, the tip touches water surface and the non-contact to contact transition occurs.     

Characterization of CdTe films with in situ CdCl2 treatment grown by a simple vapor phase deposition technique

A unique vapor phase deposition (VPD) technique was designed and built to achieve in situ CdCl₂ treatment of CdTe film. The substrate temperature was 400 °C, and the temperature of CdTe mixture with CdCl₂ source was 500 °C. The structural and morphological properties of CdTe have been studied as a function of wt.% CdCl₂ concentration by using X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), scanning electron microscopy (SEM) and atomic force microscopy (AFM). XRD measurements show that the presence of CdCl₂ vapor induces (1 1 1)-oriented growth in the CdTe film. SEM measurements have shown enhance growth of grains, in the presence of CdCl₂. From AFM the roughness of the films showed a heavy dependence on CdCl₂ concentration. In the presence of 4% CdCl₂ concentration, the CdTe films roughness has a root mean square (rms) value of about 275 Å. This value is about 831 Å for the non-treated CdTe films.     

Physical bounds of metallic nanofingers obtained by mechano-chemical atomic force microscope nanolithography

To obtain metallic nanofingers applicable in surface acoustic wave (SAW) sensors, a mechano-chemical atomic force microscope (AFM) nanolithography on a metallic thin film (50 nm in thickness)/piezoelectric substrate covered by a spin-coated polymeric mask layer (50-60 nm in thickness) was implemented. The effective shape of cross-section of the before and after etching grooves have been determined by using the AFM tip deconvolution surface analysis, structure factor, and power spectral density analyses. The wet-etching process improved the shape and aspect ratio (height/width) of the grooves and also smoothed the surface within them. We have shown that the relaxed surface tension of the polymeric mask layer resulted in a down limitation in width and length of the lithographed nanofingers. The surface tension of the mask layer can be changed by altering the initial concentration of the polymer in the deposition process. As the surface tension reduced, the down limitation decreased. In fact, an extrapolation of the analyzed statistical data has indicated that by decreasing the surface tension from 39 to 10 nN/nm, the minimum obtainable width and length of the metallic nanofingers was changed from about 55 nm and 2 μm to 15 nm and 0.44 μm, respectively. Using the extrapolation’s results, we have shown that the future SAW sensors buildable by this nanolithography method possess a practical bound in their synchronous frequency (∼58 GHz), mass sensitivity (∼6125 MHz-mm²/ng), and the limit of mass resolution (∼4.88 × 10⁻¹⁰ ng/mm²).     

Study of Schottky contact between Au and NiO nanowire by conductive atomic force microscopy (C-AFM): The case of surface states

In this work, NiO nanowires have been synthesized by a hydrothermal reaction of NiCl₂ with Na₂C₂O₄ in the presence of ethylene glycol at 180 °C for 12 h, then calcinated at 400 °C for 2 h. The NiO nanowires were analyzed by means of scanning electron microscope (SEM), atomic force microscope (AFM), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). The resulting current–voltage (I–V) characteristics of the NiO nanowires exhibited a clear rectifying behavior. This rectify behavior was attributed to the formation of a Schottky contact between Au coated atomic force microscopy (AFM) tip and NiO nanowires (nano-M/SC) which was dominated by the surface states in NiO itself. Photo-assisted conductive AFM (PC-AFM) was used to demonstrate how the I–V characteristics are influenced by the surface states. Our I–V results also showed that the nano-M/SCs had a good photoelectric switching effect at reverse bias.