On-line phase measuring profilometry based on a single frame of deformed pattern

Three frames of deformed patterns are needed at least in conventional Phase Measuring Profilometry (PMP). It is generally applied to the profile measurement of a static object. For on-line measurement, because of the moving object, it is difficult to capture three or more frames of deformed patterns that satisfy the requirement of PMP. A new method of on-line 3-D shape measurement through only one frame deformed pattern in PMP is presented. A static sinusoidal fringe is projected and any one frame of real-time deformed patterns is captured by CCD. N frames of sub-images are extracted from the captured deformed pattern. Improved Stoilov algorithm is proposed to get phase. Computer simulation and experimental results show its feasibility and affectivity to reconstruct a 3-D shape and the accuracy is higher than Fourier Transform Profilemetry (FTP) which is also a method that only needs one frame of deformed pattern.     

基于偏振位相调制的位相轮廓测量

本文介绍了一种用来测量三维物体面形的位相轮廓方法，它是通过将正弦光场投影到被测物面，该光场被物体表面调制后发生位相改变，利用偏振位相调制及位相检测算法计算物面的位相分布，再根据几何关系实现对物体三维形貌的测量。实验装置采用一种偏振位相调制的干涉光场投影装置对光场进行简便而精确的移相，采用ＣＣＤ摄像机记录畸变光场，并用计算机处理和显示测量结果。文中给出了有关实验结果。     

High precision phase measuring profilometry based on stereo microscope

A high-precision phase measuring profilometry (PMP) based on a stereo microscope is presented. A high-quality area modulation sinusoidal grating by a LED illumination is used to produce the high-quality sinusoidal fringes. Phase-shift technique is employed to get the phase distributions, and the 3D data could be reconstructed by the phase-height mapping algorithm easily. The accuracy depends on the field of view, which at a large magnification is below 1 μm. This setup will be promising for high accuracy measurement task.     

基于位相测量轮廓术的三维数字化仪的实验研究

介绍了基于位相测量轮廓术的三维数字化仪的原理和系统结构 ,阐述了一种有效的三维数字化方法。该方法具有精度高、速度快、可实现自动测量等特点。     

Optical three-dimensional sensing by phase measuring profilometry

The technique of phase-measuring profilometry is reviewed, whereby a sinusoidal grating structure is projected onto a diffuse three-dimensional surface, and the resulting deformed grating image is detected by a solid state array camera and processed by a microcomputer using interferometric phase measuring algorithms. The approach permits parallel acquisition and processing of large amounts of data with high accuracy and speed.Several systems are described, configured with telecentric laser light illumination or general white light diverging illumination, and capable of measurement from a single point of view or over full 360°. Each system consists of an optical projection assembly with phase-shifter, an imaging assembly with high density CCD camera and an IBM AT microcomputer with buffer and control cards.Applications to industrial inspection and medical diagnostics are presented.     

Phase measuring profilometry based on elliptically pattern grating

The present study proposes a new method for measuring the surface shape of an object using elliptically pattern grating projection. Based on phase measuring profilometry (PMP), elliptically pattern grating is projected on the surface of the object to measure its shape in 3D. The computing formula for solving the phase by the phase-shifting fringe method is derived, and the 3D shape formula for the altitude is reestablished. The error-contrastive analysis of the object's surface shape is re-established based on the proposed method and traditional PMP. The proposed method was shown to have a strong anti-noise ability and able to measure objects under high noise. More accurate measurement results were obtained by computer simulation and experiment to verify the feasibility of the proposed method.     

消除相位测量轮廓术中多路径效应的影响

提出了一种减小多路径效应带来的误差影响的方法,优化了相位测量轮廓术,利用亮度调制的差分图确定了受多路径效应影响大的区域,并根据相邻像素点的相位进行校正。实验表明,该方法有效地减小了相位误差,提高了三维测量的精度,校正后相位误差的均方根值比校正前减小了约57.3%。     

消除相位测量轮廓术中多路径效应的影响

提出了一种减小多路径效应带来的误差影响的方法,优化了相位测量轮廓术,利用亮度调制的差分图确定了受多路径效应影响大的区域,并根据相邻像素点的相位进行校正。实验表明,该方法有效地减小了相位误差,提高了三维测量的精度,校正后相位误差的均方根值比校正前减小了约57.3%。     

一种校正相位测量轮廓术量化误差的算法

为了减小相位测量轮廓术中因数字化设备内部结构的量化处理过程引起的相位量化误差,提高相位测量精度。针对相位测量精度要求较高且表面凹凸变化不大的被扫描物体提出了一种能够有效校正相位测量轮廓术量化误差的算法,测量相位中的每一个像素点利用其相邻像素点进行校正。实验结果显示,校正之后,相位量化误差标准差减小了41.38%,相位测量的精度得到了提高。     

相位测量轮廓术中结合几何标定的非线性校正（英）

提出了一种嵌入到常规几何标定过程中的非线性校正算法。该方法通过相位获取投影图案与拍摄图像对应点之间的亮度关系,进而确定系统的非线性亮度响应。该算法在几何标定进行的同时,无需调整系统设置或投影额外的结构光图案,直接导出用于非线性预补偿的灰度查找表。实验结果表明,校正后的相位误差比校正前减少了约95%。     

相位测量轮廓术中结合几何标定的非线性校正（英）

提出了一种嵌入到常规几何标定过程中的非线性校正算法。该方法通过相位获取投影图案与拍摄图像对应点之间的亮度关系,进而确定系统的非线性亮度响应。该算法在几何标定进行的同时,无需调整系统设置或投影额外的结构光图案,直接导出用于非线性预补偿的灰度查找表。实验结果表明,校正后的相位误差比校正前减少了约95%。     

Micro-phase measuring profilometry: Its sensitivity analysis and phase unwrapping

Global illumination affects shape measurement accuracy, and phase unwrapping is an important problem in phase measuring profilometry. In this paper, a micro-phase measuring profilometry is proposed to reduce the effects of global illumination. The wrapped phase error level of the proposed method is lower than that of the traditional micro-phase shifting method. First, a frequency selection rule is developed in combination with the micro-phase rule to design the frequencies of the proposed phase measuring profilometry. The frequency rule is obtained by analysing the uncertainty of the wrapped phase caused by intensity noise. Then, phase unwrapping is regarded as a congruence problem, and the closed-form robust Chinese remainder theorem algorithm is adopted to determine the correspondence. Finally, the comparative experiments are conducted on a projector-camera system. Experimental results show that the effects of global illumination can be effectively reduced with the proposed phase measuring profilometry, and the proposed frequency selection rule is valid. In addition, the performance of the robust Chinese remainder theorem in addressing the phase error is better than that of traditional Chinese remainder theorem. Furthermore, the unwrapping accuracy can nearly reach 100% if the frequency selection rule is satisfied. Otherwise, the performance degrades.     

抑制相位测量轮廓术饱和误差相位融合算法

在相位测量轮廓术中,由于被测物体表面反射率过大,导致照相机捕获的图像中部分像素点强度值超过照相机的最大量化值,即光强度饱和。分析了光强度饱和引起的相位误差,提出一种相位融合算法。该算法通过查找归一化后的最大调制强度,提取其对应的相位,并将该相位作为三维重建的最终相位。实验结果表明,在理想情况及测量系统存在Gamma畸变时该算法均能有效地修复饱和误差。当测量系统存在Gamma畸变时,校正后相位误差均方根值相对于传统技术减小了58.86%。     

位相测量轮廓术中的相位修正及系统标定的新方法

介绍了在位相测量轮廓术中的一种相位修正及系统参数标定的新方法。对参考面(标定面)上点的位置_相位关系进行全场拟合,并根据该相互关系对参考面相位进行修正,能够非常有效地去除相位误差;提出的参数标定方法能精确得到投影系统参数的组合。实验证明了此方法具有良好的实用性和测量精度。     

应用时域相位解包方法的三维形貌测量系统

设计一套基于时域相位解包方法的三维形貌测量系统 ,克服了传统解包方法中的误差传播效应 ,可以应用于复杂物体表面及复杂环境下的三维形貌测量。由计算机生成光栅并通过液晶投影仪投射到待测物体表面 ,用CCD摄像机采集图像并通过图像采集卡存贮到计算机中进行处理 ,实现了测量的自动化 ,完成一次高精度的测量仅需几秒钟时间。用两个特殊的人头像完成的实验证明了系统的优越性     

Gamma-distorted fringe image modeling and accurate gamma correction for fast phase measuring profilometry

In fast phase-measuring profilometry, phase error caused by gamma distortion is the dominant error source. Previous phase-error compensation or gamma correction methods require the projector to be focused for best performance. However, in practice, as digital projectors are built with large apertures, they cannot project ideal focused fringe images. In this Letter, a thorough theoretical model of the gamma-distorted fringe image is derived from an optical perspective, and a highly accurate and easy to implement gamma correction method is presented to reduce the obstinate phase error. With the proposed method, high measuring accuracy can be achieved with the conventional three-step phase-shifting algorithm. The validity of the technique is verified by experiments.     

基于数据配准提高光电经纬仪的测量精度

研究了目标相对于视场中存在相对运动时,光电经纬仪测量精度下降,且下降程度与目标相对运动速度的大小相关的现象。基于电视曝光原理分析了这种现象产生的原因,讨论了提高光电经纬仪事后处理精度的新方法。提出了基于目标脱靶量与编码器位置信息的数据配准方法,并对该算法实际操作的可行性进行了分析。实验结果表明,此算法可以使光电经纬仪测量精度改善20%～30%,即CCD像素分辨率从1/2提高到了1/3。     

Fourier transform profilometry based on defocusing

Sinusoidal fringe patterns are popularly used in conventional Fourier transform profilometry. There are numerous harmonics in the Fourier spectrum, so as to avoid spectrum overlapping; the maximum range of measurement is limited. The present paper studies FTP based on properly defocusing a binary square wave. There are only odd harmonics in the Fourier spectrum of a binary square wave, and the maximum range of measurement is expanded 1.5 times. Defocusing has a low-pass filtering effect and higher-order odd harmonics are suppressed. Therefore, the fundamental spectrum is easy to extract. The proposed method overcomes the filtering problem of conventional FTP. Measurement experiments show that the proposed method has a good measurement result and the measurement accuracy is improved.     

Surface profilometry based on polarization analysis

We report a novel algorithm for the analysis of interferometric images for surface profiling. The algorithm can be used with any interferometric system in which the two interfering beams are orthogonally polarized. The algorithm is based on a measurement of the polarization state and gives a unique value for the path difference that is not subject to the ambiguities associated with fringe counting or phase unwrapping. A detector array allows the polarization state and hence the height of every pixel in the image to be determined simultaneously. The concept is easily extended to enable one to obtain the profiles of moving surfaces from a single pulse of illumination.     

On-line beam diagnostics based on single-shot beam splitting phase retrieval

We propose a novel on-line beam diagnostic method based on single-shot beam splitting phase retrieval. The incident beam to be measured is diffracted into many replicas by a Dammann grating and then propagates through a weakly scattering phase plate with a known structure; the exiting beams propagate along their original direction and form an array of diffraction patterns on the detector plane. By applying the intensity of diffraction patterns into an iterative algorithm and calculating between the grating plane, weakly scattering plane, and detector plane, the complex field of the incident beam can be reconstructed rapidly; the feasibility of this method is verified experimentally with wavelengths of 1053 and 632.8 nm.