Simulation of the Adhesion of Particles to Surfaces

The removal of micrometer and submicrometer particles from dielectric and metal films represents a challenge in postchemical mechanical polishing cleaning. Proper modeling of the adhesive force between contaminant particles and these films is needed to develop optimal solutions to postchemical mechanical polishing cleaning. We have previously developed and experimentally validated a model to describe the adhesion between spherical particles and thin films. This simulation expands previous models to characterize the adhesive interaction between asymmetrical particles, characteristic of a polishing slurry, and various films. Our simulation accounts for the contact area between particles and substrates, as well as the morphology of the surfaces. Previous models fail to accurately describe the contact of asymmetrical particles interacting with surfaces. By properly accounting for nonideal and geometry and morphology, the simulation predicts a more accurate adhesive force than predictions based upon an ideal van der Waals model. The simulation is compared to experimental data taken for both semi-ideal particle-substrate systems (polystyrene latex spheres in contact with silicon films) and asymmetrical systems (alumina particles in contact with various films). Copyright 2001 Academic Press.     

Analysis of Contact Interactions between a Rough Deformable Colloid and a Smooth Substrate

A model was developed for the effect of van der Waals interactions between a rough, deformable, spherical colloid and a flat, smooth, hard surface in contact. The model demonstrates the significant effect of colloid roughness on removal force. Small changes in colloid roughness produce large changes in the predicted removal force. Several authors attribute discrepancies in the observed interaction force between particles and surfaces to colloid roughness, and our model supports their hypotheses. Experimental data documenting the force required to remove colloids of polystyrene latex from silica substrates in aqueous solution were collected during AFM studies of this system. When colloid roughness exists, as is the case in this work, our model bounds the observed removal force. The predicted range of removal forces is in better quantitative agreement with our removal force data than are forces predicted by classical DLVO theory. Copyright 2000 Academic Press.     

Specific and nonspecific interaction forces between Escherichia coli and silicon nitride, determined by poisson statistical analysis

The nature of the physical interactions between Escherichia coli JM109 and a model surface (silicon nitride) was investigated in water via atomic force microscopy (AFM). AFM force measurements on bacteria can represent the combined effects of van der Waals and electrostatic forces, hydrogen bonding, steric interactions, and perhaps ligand-receptor type bonds. It can be difficult to decouple these forces into their individual components since both specific (chemical or short-range forces such as hydrogen bonding) and nonspecific (long-range colloidal) forces may be present in the overall profiles. An analysis is presented based on the application of Poisson statistics to AFM adhesion data, to decouple the specific and nonspecific interactions. Comparisons with classical DLVO theory and a modified form of a van der Waals expression for rough surfaces were made in order to help explain the nature of the interactions. The only specific forces in the system were due to hydrogen bonding, which from the Poisson analysis were found to be -0.125 nN. The nonspecific forces of 0.155 nN represent an overall repulsive interaction. These nonspecific forces are comparable to the forces calculated from DLVO theory, in which electrostatic-double layer interactions are added to van der Waals attractions calculated at the distance of closest approach, as long as the van der Waals model for "rough" spherical surfaces is used. Calculated electrostatic-double layer and van der Waals interactions summed to 0.116 nN. In contrast, if the classic (i.e., smooth) sphere-sphere model was used to predict the van der Waals forces, the sum of electrostatic and van der Waals forces was -7.11 nN, which appears to be a large overprediction. The Poisson statistical analysis of adhesion forces may be very useful in applications of bacterial adhesion, because it represents an easy way to determine the magnitude of hydrogen bonding in a given system and it allows the fundamental forces to be easily broken into their components.     

Pull-off force measurements between rough surfaces by atomic force microscopy

Direct measurements of the pull-off (adhesion) forces between pharmaceutical particles (beclomethasone dipropionate, a peptide-type material, and lactose) with irregular geometry and rough polymeric surfaces (series of polypropylene coatings, polycarbonate, and acrylonitrile-butadiene-styrene) were carried out using the atomic force microscope. These measurements showed that roughness of the interacting surfaces is the significant factor affecting experimentally measured pull-off forces. A broad distribution of pull-off force values was noted in the measurements, caused by a varying adhesive contact area for a particle located on rough substrate. The possibility of multiple points of contact between irregularly shaped pharmaceutical particles and substrate surfaces is demonstrated with nanoindentations of the particle in a fluoro-polymer film. Force-distance curves showing the "sawtooth" pattern are additional evidence that particles make contact with substrates at more than one point. Reduced adhesion of 10- to 14-microm-diameter lactose and peptide material particles to the polypropylene coatings with a roughness of 194 nm was found in this study. Similar pull-off force versus roughness relationships are also reported for the model spherical particles, silanized glass particle with a size of 10 microm and polystyrene particle with a diameter of 9 microm, in contact with polypropylene coatings of varying roughness characteristics. It was found that the model recently proposed by Rabinovich et al. (J. Colloid Interface Sci. 232, 1-16 (2000)) closely predicts the pull-off forces for glass and lactose particles. On the other hand, the adhesion of the peptide material and polystyrene particle to polypropylene is underestimated by about an order of magnitude with the theoretical model, in which the interacting substrates are treated as rigid materials. The underestimate is attributed to the deformation of the peptide material and polystyrene particles.     

Stick slip contact mechanics between dissimilar materials: effect of charging and large friction

Measurements of the contact radius as a function of applied force between a mica surface and a silica surface (mica/silica) in air are reported. The load/unload results show that the contact radius generally increases with applied force. Because of the presence of charging due to contact electrification, both a short-range van der Waals adhesion force and longer-range electrostatic adhesive interaction contribute to the measured force. The results indicate that approximately 20% of the pull-off force is due to van der Waals forces. The contact radius versus applied force results can be fit to Johnson-Kendall-Roberts (JKR) theory by considering that only the short-range van der Waals forces contribute to the work of adhesion and subtracting a constant longer-range electrostatic force. Also, an additional and unexpected step function is superimposed on the contact radius versus applied force curve. Thus, the contact diameter increases in a stepped dependence with increasing force. The stepped contact behavior is seen only for increasing force and is not observed when symmetric mica/mica or silica/silica contacts are measured. In humid conditions, the contact diameter of the mica/silica contact increases monotonically with applied force. Friction forces between the surfaces are also measured and the shear stress of a mica/silica interface is 100 times greater than the shear stress of a mica/mica interface. This large shear stress retards the increase in contact area as the force is increased and leads to the observed stepped contact mechanics behavior.     

Controlling adhesion force by means of nanoscale surface roughness

Control of adhesion is a crucial aspect in the design of microelectromechanical and nanoelectromechanical devices. To understand the dependence of adhesion on nanometer-scale surface roughness, a roughness gradient has been employed. Monomodal roughness gradients were fabricated by means of silica nanoparticles (diameter ～12 nm) to produce substrates with varying nanoparticle density. Pull-off force measurements on the gradients were performed using (polyethylene) colloidal-probe microscopy under perfluorodecalin, in order to restrict interactions to van der Waals forces. The influence of normal load on pull-off forces was studied and the measured forces compared with existing Hamaker-approximation-based models. We observe that adhesion force reaches a minimum value at an optimum particle density on the gradient sample, where the mean particle spacing becomes comparable with the diameter of the contact area with the polyethylene sphere. We also observe that the effect on adhesion of increasing the normal load depends on the roughness of the surface.     

Numerical study on the adhesion and reentrainment of nondeformable particles on surfaces: the role of surface roughness and electrostatic forces

In this paper, the reentrainment of nanosized and microsized particles from rough walls under various electrostatic conditions and various hydrodynamic conditions (either in air or aqueous media) is numerically investigated. This issue arises in the general context of particulate fouling in industrial applications, which involves (among other phenomena) particle deposition and particle reentrainment. The deposition phenomenon has been studied previously and, in the present work, we focus our attention on resuspension. Once particles are deposited on a surface, the balance between hydrodynamic forces (which tend to move particles away from the surface) and adhesion forces (which maintain particles on the surface) can lead to particle removal. Adhesion forces are generally described using van der Waals attractive forces, but the limit of these models is that any dependence of adhesion forces on electrostatic forces (due to variations in pH or ionic strength) cannot be reproduced numerically. For this purpose, we develop a model of adhesion forces that is based on the DLVO (Derjaguin and Landau, Verwey and Overbeek) theory and which includes also the effect of surface roughness through the use of hemispherical asperities on the surface. We first highlight the effect of the curvature radius on adhesion forces. Then some numerical predictions of adhesion forces or adhesion energies are compared to experimental data. Finally, the overall effects of surface roughness and electrostatic forces are demonstrated with some applications of the complete reentrainment model in some simple test cases.     

Substrate Morphology and Particle Adhesion in Reacting Systems

This paper describes an effort to measure and model changes in the adhesion of micron-scale particles to substrates in systems in which chemical reactions are occurring. Contact interactions between polystyrene latex spheres and silicon substrates (with surface oxide) immersed in aqueous KNO(3) solutions were studied. Two important results were obtained. First, it was shown that the AFM can be employed to monitor, in situ, changes in adhesive interactions induced by surface chemical reactions in this system. Second, the morphology of the interacting surfaces plays a controlling role in particle adhesion. In particular, for this system, changes in roughness of the substrate changed the interaction force by nearly 90%. Copyright 2000 Academic Press.     

Ionic liquid nanotribology: stiction suppression and surface induced shear thinning

The friction and adhesion between pairs of materials (silica, alumina, and polytetrafluoroethylene) have been studied and interpreted in terms of the long-ranged interactions present. In ambient laboratory air, the interactions are dominated by van der Waals attraction and strong adhesion leading to significant frictional forces. In the presence of the ionic liquid (IL) ethylammonium nitrate (EAN) the van der Waals interaction is suppressed and the attractive/adhesive interactions which lead to "stiction" are removed, resulting in an at least a 10-fold reduction in the friction force at large applied loads. The friction coefficient for each system was determined; coefficients obtained in air were significantly larger than those obtained in the presence of EAN (which ranged between 0.1 and 0.25), and variation in the friction coefficients between systems was correlated with changes in surface roughness. As the viscosity of ILs can be relatively high, which has implications for the lubricating properties, the hydrodynamic forces between the surfaces have therefore also been studied. The linear increase in repulsive force with speed, expected from hydrodynamic interactions, is clearly observed, and these forces further inhibit the potential for stiction. Remarkably, the viscosity extracted from the data is dramatically reduced compared to the bulk value, indicative of a surface ordering effect which significantly reduces viscous losses.     

Adhesion models: from single to multiple asperity contacts

This review presents a summary of the current adhesion models available to date, between real rough surfaces, starting from single asperity models and expanding to multiple asperity contacts. The focus is made on multi-asperity contact interactions. Both van der Waals and contact mechanics approaches have been considered and relevant adhesion models are reviewed and discussed. The influence of the meniscus forces on adhesion has been considered, along with a summary of the various meniscus models. The effect of surface geometry, its topography and environmental conditions on meniscus action are also discussed along with its integration into multi-asperity adhesion models.     

Trajectory Analysis and Collision Efficiency during Microbubble Flotation

The hydrodynamic interaction between a rising bubble and a sedimenting particle during microbubble flotation is considered. The effects of attractive van der Waals forces and attractive or repulsive electrostatic forces are included. A mathematical model is presented which is used to perform a trajectory analysis and to calculate collision efficiencies between the bubble and particle. It is shown that collision efficiencies and the nature of the bubble-particle interactions are strongly dependent on the relative strengths of the van der Waals and electrostatic forces and on the lengthscales over which these forces act. It is demonstrated that optimal operating conditions can be suggested to achieve efficient microbubble flotation by correctly accounting for the interaction of van der Waals, electrostatic, and hydrodynamic forces. Copyright 1999 Academic Press.     

Adhesion between Nanoscale Rough Surfaces

In this investigation, the adhesion between particles and plates with root-mean-square, rms, surface roughness of 0.17-10.5 nm was measured by atomic force microscopy. Measurements obtained with particles both larger and smaller than the surface asperities are presented. Results indicate adhesion force decreases sharply with increasing surface roughness in the nanometer scale (<2 nm), followed by a gradual and slow decrease with further increase in roughness. Existing models were found to significantly underestimate adhesion force. Hence, a new model based on a geometry that considers both the height and breadth of asperities yielding an increased asperity radius compared to previous approaches, as detailed in Part I of this series, is applied using both van der Waals and elastic deformation/work of adhesion based approaches. For the system studied in this investigation, the adhesion forces predicted by the proposed model are considerably more accurate than those predicted by past models. Copyright 2000 Academic Press.     

Effect of depletion interactions on transport of colloidal particles in porous media

The influence of depletion interactions on the transport of micrometer-sized, negatively charged polystyrene latex particles through porous media was studied by analysis of particle breakthrough curves as a response to short-pulse particle injections to the inlet of a packed column of glass beads. The column outlet latex particle concentration profiles and the total amount of particles exiting the column were determined as a function of the concentration of small, silica nanoparticles in the solution and the bulk flow rate. Because of similar charges, the silica particles do not adsorb to either the latex particles or glass beads and thus induce an attractive depletion force between the latex particles and glass bead collectors. The total column outlet latex particle amount was calculated by integrating the measured breakthrough concentration curve and compared to the known amount of injected particles at the column inlet. It was found that the particle recovery was a decreasing function of the silica nanoparticle concentration and the carrier fluid residence time, and an increasing function of the velocity in the bed. In addition, removing the silica nanoparticles from the flowing solution caused a second outlet peak to appear, suggesting that some of the polystyrene particles were captured in secondary energy wells. The experimental data were interpreted using the predicted potential energy profile between a single particle and a glass bead, which was assumed to consist of electrostatic, van der Waals, and depletion components. The results indicate that secondary energy wells significantly affect particle transport behavior through porous media.     

Analytical Dispersion Force Calculations for Nontraditional Geometries

Presented in this paper are first-principle-based approximate macroscopic models of the van der Waals adhesion force for a variety of particle shapes interacting with an infinite cylinder. In particular, expressions for the van der Waals adhesion force and interaction energy are developed for a (1) spherical particle/infinite cylinder, (2) disk-like particle/infinite cylinder, (3) disk-like particle oriented edgewise to an infinite cylinder, and (4) a deformed slice/infinite cylinder. The models presented depict expected trends in the behavior of both the force of adhesion and the interaction energy between different geometric configurations. These results are also used to demonstrate the impact of contact time on the adhesion force for cylindrical fibers in contact with a disk-shaped particle. After long time intervals where the disk-like particles have remained in contact with the cylinder, the adhesion force may lead to significant deformation of the attached particle. Hence, the adhesion force for a fourth geometric set which represents the most likely scenario for attached particles with long contact times is developed. As will be shown, this scenario results in the highest values of adhesion force and interaction energy. Copyright 2000 Academic Press.     

Roughness models for particle adhesion

The effects of different surface roughness models on a previously developed van der Waals adhesion model were examined. The van der Waals adhesion model represented surface roughness with a distribution of hemispherical asperities. It was found that the constraints used to define the asperity distribution on the surface, which were determined from AFM scans, varied with scan size and thus were not constant for all surfaces examined. The greatest variation in these parameters occurred with materials that had large asperities or with materials where a large fraction of the surface was covered by asperities. These rough surfaces were modeled with fractals and also with a fast Fourier transform algorithm. When the model surfaces generated using the Fourier transforms are used in the adhesion model, the model accurately predicts the experimentally observed adhesion forces measured with the AFM.     

Interaction Forces between Hydrophobic and Hydrophilic Self-Assembled Monolayers

An investigation is presented of the interaction of charged self-assembled monolayers (SAMs) with a monoprotic ionizable acid functional group (-COOH) and uncharged SAMs with a methyl terminated functional group (-CH(3)). The strength of the interactions are determined using an atomic force microscope. For all electrolyte conditions investigated the interactions are not well described by a summation of van der Waals attractions and electrostatic repulsions in a manner suggesting that van der Waals attractions are screened. The repulsions are accurately described as corresponding to two surfaces of different charge interacting with surface charges that are independent of separation (i.e., the constant charge model). A small adhesion force was observed under all conditions and its magnitude increased with NaCl concentration. Copyright 2000 Academic Press.     

Effects of adsorbed water layer structure on adhesion force of silicon oxide nanoasperity contact in humid ambient

The origin of the large relative-humidity (RH) dependence of the adhesion force in the single-asperity contact between silicon oxide surfaces is elucidated. As RH increases, the adhesion force measured with an atomic force microscopy (AFM) initially increases, reaches a maximum, and then decreases at high RH. The capillary force alone cannot explain the observed magnitude of the RH dependence. The origin of the large RH dependence is due to the presence of an icelike structured water adsorbed at the silicon oxide surface at room temperature. A solid-adsorbate-solid model is developed calculating the contributions from capillary forces, van der Waals interactions, and the rupture of an ice-ice bridge at the center of the contact region. This model illustrates how the structure, thickness, and viscoelastic behavior of the adsorbed water layer influence the adhesion force of the silicon oxide nanoasperity contact.     

Manipulating forces between surfaces: applications in colloid science and biophysics

It is the forces between the microscopic constituents of materials which to a large extent determine the macroscopic properties. For example, it is the differences in bonding between the carbon atoms which determines the different physical properties of carbon and graphite. The same is true in colloidal systems. In colloidal systems, there are three common types of long-range interactions between particles: van der Waals forces, electrical double layer forces and steric forces. In this paper, examples as to how these forces can be modified and even manipulated will be given. To convincingly demonstrate these effects, it is necessary to measure these interaction forces. We have achieved this by using the principles of atomic force microscopy (AFM). The principle is simple, a small particle, 5-30 microm, is attached onto a small weak cantilever spring. The interaction between this particle and another particle or a surface is measured by monitoring the deflection of the spring as the two particles are moved together. In this paper, I shall give examples of direct measurements of van der Waals, electrical double layer and steric forces and show how they can be modified and how these modifications affect the properties of bulk suspensions. Similar principles are involved in the interactions of biological materials. However, nature is much cleverer than man such that many of the macromolecules on cell surfaces are able to specifically recognise only one other molecule. An example of this recognition-type interaction, namely, cholera toxin interacting with the glycolipid Gm1, will also be presented. Finally, the adhesion of cells to surfaces of different surface chemistries has been determined; this is of significance in many fields ranging from fouling of filtration membranes on the one hand to the biocompatibility of surgical implants on the other.     

Electro-dry-adhesion

This work presents novel conductive bioinspired dry adhesives with mushroom caps that enable the use of a synergistic combination of electrostatic and van der Waals forces (electro-dry-adhesion). An increase in shear adhesion bond strength of up to 2046% on a wide range of materials is measured when a maximum electrical field of 36.4 V μm(-1) is applied. A suction effect, due to the shape of the dry adhesive fibers, on overall adhesion was not noted for electro-dry-adhesives when testing was performed at both atmospheric and reduced pressure. Utilization of electrostatics to apply a preloading force to dry adhesive fiber arrays allows increased adhesion even after electrostatic force generation has been halted by ensuring the close contact necessary for van der Waals forces to be effective. A comparison is made between self-preloading of the electro-dry-adhesives and the direct application of a normal preloading pressure resulting in nearly the same shear bond strength with an applied voltage of 3.33 kV on the same sample.