Atomic and nanostructures of monolayer c(2 × 2)NiN on Cu(0 0 1)

Structures of monolayer nickel nitride (NiN) on Cu(0 0 1) surface are studied by X-ray photoelectron spectroscopy (XPS), low energy electron diffraction (LEED) and scanning tunneling microscopy (STM). Formations of Ni–N chemical bonds and NiN monolayer at the surface are confirmed by XPS on the N-adsorbed Cu(0 0 1) surfaces after Ni deposition and subsequent annealing to 670 K. A c(2 × 2) structure is always observed in the LEED patterns, which is a quite contrast to the (2 × 2)p4g structure observed usually at the N-adsorbed Ni(0 0 1) surface. Atomic images by STM indicate the mixture of Ni–N and Cu–N structures at the surface. Density of the trenches on the N-saturated surface decreases and the grid pattern on partially N-covered surfaces becomes disordered with increasing the Ni coverage. These results are attributed to the decrease of the surface compressive stress at the N-adsorbed Cu surface by mixing Ni atoms.     

Strained c(4 × 2) CoO(1 0 0)-like monolayer on Pd(1 0 0): Experiment and theory

We report on an interface-stabilized strained c(4 × 2) phase formed by cobalt oxide on Pd(1 0 0). The structural details and electronic properties of this oxide monolayer are elucidated by combination of scanning tunneling microscopy data, high resolution electron energy loss spectroscopy measurements and density functional theory. The c(4 × 2) periodicity is shown to arise from a rhombic array of Co vacancies, which form in a pseudomorphic CoO(1 0 0) monolayer to partially compensate for the compressive strain associated with the large lattice mismatch (～9.5%) between cobalt monoxide and the substrate. Deviation from the perfect 1:1 stoichiometry thus appears to offer a common and stable mechanism for strain release in Pd(1 0 0) supported monolayers of transition metal rocksalt monoxides of the first transition series, as very similar metal-deficient c(4 × 2) structures have been previously found for nickel and manganese oxides on the same substrate.     

Structure determination of the Cu(0 0 1)–c(4 × 4)-Sn surface by low-energy electron diffraction

Low-energy electron diffraction (LEED) have been used to determine the Cu(0 0 1)–c(4 × 4)-Sn structure formed at 300 K. It is demonstrated that a structural model suggested by scanning tunneling microscopy observations is correct: The model consists of one substitutional Sn atom and four Sn adatoms in the unit cell. Optimum parameters of the determined c(4 × 4) structure reveal that Sn adatoms laterally are displaced by 0.30 Å away from ideal fourfold-hollow sites along the 〈100〉 directions. It is proposed that such displacements of the Sn adatoms cause the formation of a network of octagonal rings on Cu(0 0 1). The substitutional Sn atom is located at each center of the octagonal rings. The formation conditions of the network are discussed.     

Chemical properties of structurally well-defined PdRu/Ru(0 0 0 1) surface alloys – Interaction with CO

The chemical properties of structurally well-defined PdRu/Ru(0 0 0 1) monolayer surface alloys [H. Hartmann, T. Diemant, A. Bergbeiter, J. Bansmann, H.E. Hoster, R.J. Behm, Surf. Sci. in press, doi:10.1016/j.sucs.2008.10.055.] and a Pd monolayer on Ru(0 0 0 1) were studied by temperature programmed desorption and infrared reflection absorption spectroscopy using CO as probe molecule. IR experiments on the PdRu/Ru(0 0 0 1) surface alloys demonstrate that CO adsorption on Ru sites resembles that on pure Ru(0 0 0 1) (on-top adsorption), while adsorption on the Pd sites occurs on both multifold coordinated and on-top sites, similar to CO on Pd(1 1 1). A significant destabilization of CO adsorption on Pd sites for both, surface alloys and the Pd monolayer film, compared to pure Pd(1 1 1) surfaces is attributed to a combination of geometric strain and vertical electronic ligand effects; an additional variation in the CO adsorption bond strength in the surface alloys is attributed to changes in the neighboring surface atom shell (lateral ligand effects). The chemical modifications introduced by PdRu surface alloy formation are compared with findings for deuterium adsorption on the same surface alloys; effects of the two-dimensional (2D) distribution of surface atoms are illustrated by comparison with CO adsorption on PtRu/Ru(0 0 0 1) surface alloys, where in contrast to the pronounced 2D phase segregation in PdRu/Ru(0 0 0 1) the surface atoms are essentially randomly distributed.     

Surface X-ray diffraction analysis of Fe nanostructured films grown on c(2 × 2)-N/Cu(100)

We report the results of a Surface X-Ray Diffraction (SXRD) study of Fe nanostructured films deposited on c(2 × 2)-N/Cu(100) at room temperature (RT), with Fe coverage Θ_Fe = 0.5 ML and Θ_Fe = 1 ML. The c(2 × 2)-N/Cu(100) surface is an example of self-organised system, that can be used for growth of arrays of metal nano-islands and organic molecules assemblies. We chose two different values of N coverage, Θ_N = 0.3 ML and Θ_N = 0.5 ML, the second value corresponding to N saturation. We monitored the presence of surface diffraction peaks in hk scans and we performed Crystal Truncation Rods (CTR) analysis with ROD fitting programme. In the case of Θ_N = 0.5 ML, i.e. at saturation coverage, the CTR could be fitted with one surface domain with p4gm(2 × 2) symmetry. In the surface cell adopted, N atoms occupy four-fold hollow sites, with Fe (intermixed with Cu) giving rise to a “clock” reconstruction previously observed on iron nitride films obtained by co-deposition and annealing. This result is an indirect confirmation of N surface segregation on top of the Fe films, occurring during the growth at RT. When subsaturation N coverage (Θ_N = 0.3 ML) is used as a substrate for Fe deposition, the best results could be obtained with a model where two surface domains are present: the first one corresponds to a surface cell with Fe sitting in four-fold hollow sites on bare Cu areas, with possible interdiffusion in the second lattice. The second domain is assigned to growth of Fe on the N-covered square islands occurring once the bare Cu areas are fully covered. The SXRD analysis on N-covered surface domains shows that the mechanism of reconstruction and of N segregation on top layer is already active at RT for all N-coverage values.     

Growth of 〈1 0 0〉 directed ADP crystal with slotted ampoule

Good quality ammonium dihydrogen phosphate single crystals have been grown by: (i) Sankaranarayanan–Ramasamy (SR) method and (ii) SR method with slotted ampoule. The grown crystals were subjected to UV–Vis spectroscopy, high-resolution X-ray diffractometer, dielectric, piezoelectric and laser damage threshold studies. Compared to the (1 0 0) plane of the conventional method grown ADP crystal and 〈1 0 0〉 directed SR method grown ADP crystal, the crystal grown by SR method with slotted ampoule has higher growth rate, higher optical transparency, high crystalline perfection, low dielectric loss, high piezoelectric charge coefficient and high laser damage threshold due to diffusion of segregated impurities away from the growing crystal in the slotted ampoule growth.     

Topmost-surface-sensitive Si-2p photoelectron spectra of clean Si(1 0 0)-2 × 1 measured with photoelectron Auger coincidence spectroscopy

Topmost-surface-sensitive Si-2p photoelectron spectra of a clean Si(1 0 0)-2 × 1 surface have been measured using Si-2p photoelectron Si-L₂₃VV Auger coincidence spectroscopy (Si-2p–Si-L₂₃VV PEACS). The escape depth of the PEACS electrons is estimated to be ～1.2 Å. The results support the assignments of the Si up-atoms, the Si down-atoms, the Si 2nd-layer, and the Si bulk proposed in previous researches. The Si-2p component with a binding energy of ?0.23 eV relative to the bulk Si-2p_3/2 peak, is shown to originate mainly from the topmost surface. Site selectivity of PEACS is indicated to be achieved to some degree by carefully selecting the kinetic energy of the Auger electrons. Since PEACS can be applied to any surface, the present study opens a new approach to identify PES components.     

First principles total energy calculations of the adsorption of germane and digermane on Si(0 0 1)-c(2 × 4)

First principles total energy studies are performed to investigate the energetics, and the atomic structure of the adsorption of germane (GeH₄), and digermane (Ge₂H₆) on the Si(0 0 1)-c(2 × 4) surface. It has been observed experimentally that adsorption of Ge₂H₆ is a dissociative process, which first yields GeH₃ and then GeH₂ fragments as products. We first study the adsorption of GeH₂ considering two different models; the intra-row and the on-dimer geometries. Our results show that the on-dimer site is more stable than the intra-row geometry by 0.44 eV. This is not a surprise since in the absence of H atoms, adsorption in the on-dimer site leaves no dangling bonds. In contrast, when the GeH₂ fragment is considered together with two H atoms, the intra-row geometry is favored energetically as compared with the on-dimer site, in good agreement with experiment. Similar results have been previously obtained for the adsorption of SiH₂ on Si(0 0 1). Digermane adsorption is explored according to two different geometries. In the first one, we have considered the adsorption as two GeH₃ fragments, while in the second, we have considered the adsorption as two GeH₂ fragments plus 2 H fragments. In good agreement with experiments, it is found that the latter geometry is energetically more favorable.     

Structural,electronic and energetic properties of water adsorbed on β-Si3N4 (0 0 0 1) surface: First-principles calculations

Structural, energetic and electronic properties of water molecules adsorbed on β-Si₃N₄ (0 0 0 1) surface, at various coverages, are investigated using density functional theory. At low coverages (θ ? 0.5), it is found that all H₂O molecules undergo spontaneous dissociation forming hydroxyl (OH) and imino (NH) groups where the reactive sites are identified, a result shown for the first time using ab initio theory. For higher coverages (θ > 0.5), only partial dissociation takes place where some of the molecules stay intact being bound via H-bond in good agreement with experimental findings. The driving force for the water dissociation has been identified to be dangling bonds on lower coordinated N and Si surface atoms showing that not all surface atoms are reactive corroborating with previous experimental findings.     

On the superconductivity and structural properties of YBa2Cu3 − xCdxO7 − y

A series of superconducting cuprates with the nominal composition YBa₂Cu_3 − xCd_xO_7 − yand the effect of Cd substitution on Cu sites in this compound is presented. X-ray powder diffraction patterns for these cadmium cuprates with reduced diamagnetism indicate an orthorhombic unit cell like-perovskite structure for (0 ≤ x ≤ 0.15), while for higher Cd concentration, i.e.x = 1.0 the material is polyphasic. The observed superconducting transition temperature of the samples is nearly the same ([formula] K), except for (x = 1.0) whereT_cdrops to 72 K and a transition from metallic to semiconducting behavior of the normal state of the resistivity is observed. Such a decrease inT_cfor higher Cd concentration could be attributed to the presence of the green phase in this composition.     

The γ-Fe formation in epitaxial Cu(0 0 1)/Fe(0 0 1) thin films by the solid-state synthesis: Structural and magnetic features

The γ-Fe formation in epitaxial Cu(0 0 1)/Fe(0 0 1) bilayers with the annealing temperature increasing has been studied. Using Mössbauer spectroscopy, X-ray diffraction, and magnetic analysis, structural and chemical characterization of the interface between cooper and iron layers has been performed. After annealing at 850 °C and subsequent cooling to room temperature, paramagnetic γ-Fe(0 0 1) precipitates with an average size of 30 nm coherent to a Cu(0 0 1) matrix form. Conditions of intermixing and the γ-Fe formation at the Cu/Fe interface are explained in terms of the solid-state synthesis in thin films. Specific features of the martensitic transition γ↔α are discussed.     

Electronic property and structure of double-doping Y1−2xPrxCaxBa2Cu3O7−δ with 0 ⩽ x ⩽ 0.14

Equal amount Pr and Ca double-doping Y_1?2xPr_xCa_xBa₂Cu₃O_7?δ with 0 ? x ? 0.14 have been investigated by X-ray diffraction, resistivity, and X-ray photoemission spectroscopy (XPS). The deviation of the linearly decreasing of T_c vs. x curve was observed when x < 0.10. The resistivity and the temperature coefficient of resistivity also exhibit abnormal behaviors around x = 0.10. It is revealed that the conductivity behavior of Y_1?2xPr_xCa_xBa₂Cu₃O_7?δ with low Pr content (x < 0.10) is different from that of the relative high Pr content (x > 0.10), which suggests a change of Pr valence with the Pr content. XPS measurement shows that the relative amount of Pr³⁺ and Pr⁴⁺ is closely related to the total Pr content x. The valence of Pr is close to +3 when x < 0.10 and increases towards +4 when x > 0.10, which implies a different mechanism for depression of superconductivity of Pr content x < 0.10 from that of Pr content x > 0.10 in Pr doping Y-123.     

Reversible and irreversible reactions of three oxygen precursors on InAs(0 0 1)-(4 × 2)/c(8 × 2)

The substrate reactions of three common oxygen sources for gate oxide deposition on the group III rich InAs(0 0 1)-(4 × 2)/c(8 × 2) surface are compared: water, hydrogen peroxide (HOOH), and isopropyl alcohol (IPA). Scanning tunneling microscopy reveals that surface atom displacement occurs in all cases, but via different mechanisms for each oxygen precursor. The reactions are examined as a function of post-deposition annealing temperature. Water reaction shows displacement of surface As atoms, but it does not fully oxidize the As; the reaction is reversed by high temperature (450 °C) annealing. Exposure to IPA and subsequent low-temperature annealing (100 °C) show the preferential reaction on the row features of InAs(0 0 1)-(4 × 2)/c(8 × 2), but higher temperature anneals result in permanent surface atom displacement/etching. Etching of the substrate is observed with HOOH exposure for all annealing temperatures. While nearly all oxidation reactions on group IV semiconductors are irreversible, the group III rich surface of InAs(0 0 1) shows that oxidation displacement reactions can be reversible at low temperature, thereby providing a mechanism of self-healing during oxidation reactions.     

Ferromagnetism in Zn1−xCrxTe (x = 0.05, 0.15) films grown on GaAs(1 0 0) substrate

Zn_1−xCr_xTe (x = 0.05, 0.15) films were grown on GaAs(1 0 0) substrate by thermal evaporation method. X-ray diffraction analysis showed the presence of ZnCrTe phase without any secondary phase. The surface was analyzed by high resolution magnetic force microscope and profile measurements showed orientation of magnetic domains in the range of 0.5–2 nm with increase of Cr content. Magnetic moment–magnetic field measurements showed a characteristic hysteresis loop even at room temperature. The Curie temperature was estimated to be greater than 300 K. From the electron spin resonance spectra, the valence state of Cr in ZnTe was found to be +2 with d² electronic configuration. Hall effect study was done at room temperature and the result showed the presence of p-type charge carriers and hole concentration was found to increase from 5.95 × 10¹² to 6.7 × 10¹² m⁻³ when Cr content increases. We deduce the origin of ferromagnetic behavior based on the observed experimental results.     

α-Sexithiophene on Cu(1 1 0) and Cu(1 1 0)-(2 × 1)O: An STM and NEXAFS study

The adsorption of α-sexithiophene (6T) on Cu(1 1 0), Cu(1 1 0)-(2 × 1)O and the mesoscopically patterned Cu-O striped surface have been studied by STM (scanning tunnelling microscopy), XPS (X-ray photoelectron spectroscopy) and NEXAFS (near edge X-ray absorption fine structure). The molecular resolution of the STM allowed to determine the orientation and local order of the molecules in the submonolayer and monolayer regime. It is shown that the 6T molecules align with their long molecular axis along the densely packed copper rows on Cu(1 1 0) and along the Cu-O rows on the Cu(1 1 0)-(2 × 1)O surface. On the striped phase with alternating copper and Cu-O regions the molecules adsorb first on the Cu regions and after complete filling of these regions, on the Cu-O. The orientation is the same on both areas as on the respective pristine surfaces with the only exception that the molecules reorient by 90° if the width of the copper regions is smaller than the molecular length. The NEXAFS measurements allowed for a determination of the adsorption geometry of the molecules: while 6T lies flat on the surface on clean copper, the molecular planes are inclined with an angle as high as 39° with respect to the substrate on (2 × 1)O. For the latter, this inclination angle is 4° higher than in the bulk crystal structure of 6T observed for thicker films to release stress and allow commensurability with the substrate lattice, while for the former it is a result of the aromatic system bonding to the Cu(1 1 0) surface, as confirmed by XPS.     

H/D Isotope Effect in the Conductivity of CaZr1 – xScxO3 – α in Reducing Atmospheres

Physics of the Solid State - The ionic (proton and deuteron) conductivity of the system CaZr1&nbsp;–&nbsp;xScxO3&nbsp;–&nbsp;α (x = 0.03–0.20) is studied...     

H adsorption at Ag/Si interfaces in epitaxially grown Ag(1 1 1) films on Si(1 1 1)7 × 7 substrates

The interaction of atomic H with Ag(1 1 1)/Si(1 1 1)7 × 7 surfaces was studied by thermal desorption (TD) spectroscopy and scanning tunneling microscopy (STM) at room temperature. TD spectroscopy revealed an intense peak from mono H–Si bonds, even though the Si surface was covered by the Ag atoms. This peak was not observed from Ag-coated SiO₂/Si substrates. STM observation showed no clear change of the Ag surface morphology resulting from H exposure. All these results indicate that the atomic H adsorbs at neither the Ag surfaces nor Ag bulk sites, but at the Ag/Si interface by diffusing through the Ag film.