Surface analysis of polymer materials by secondary ion mass spectrometry

Atomic as well as molecular secondary ions are emitted from the uppermost monolayer of a solid during ion bombardment. Mass analysis of these positive and negative secondary ions supplies detailed information on the chemical composition of the bombarded surface. High mass range (> 10,000 u), high mass resolution (m/Δm > 10,000), accurate mass determination (ppm range) and high sensitivity (ppm of a monolayer) are achieved by applying time-of-flight (TOF) mass analyzers. TOF-SIMS has been successfully applied to a wide variety of polymer materials, including polymer blends, chemically or plasma modified surfaces, and plasma polymerization layers. Detailed information on the composition of repeat units, endgroups, oligomer distributions, additives, as well as surface contaminants can be obtained. Basic concepts of TOF-SIMS will be described and typical analytical examples for the characterization of polymer materials will be presented.     

Surface analysis of polyethyleneterephthalate by ESCA and TOF-SIMS

PET (poly(ethylene-terephthalate)) samples provided by different suppliers were investigated with the surface-sensitive methods as electron spectroscopy for chemical analysis (ESCA) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Analysis by means of ESCA provides chemical information from a near-surface region of roughly 6 nm. Specific ESCA data on chemical shifts and on the ratio between oxygen and carbon are compared with corresponding values expected for the molecular structure of bulk PET. In addition, direct chemical information on the molecular structure at the PET surface (essentially from the first two monolayers) has been obtained by TOF-SIMS. Especially, positive and negative TOF-SIMS mass spectra were analyzed in detail and assigned with respect to characteristic polymer fragment ions. Several polymer additives as well as some contaminations present at the PET surfaces could be identified with TOF-SIMS. Dependent on the PET supplier, antioxidants and lubricants such as Irgafos 168, octylstearate, octylpalmitate, octylarachidate and PDMS (polydimethylsiloxane) found at the sample surfaces give typical positive and negative ion fragments.     

Structural effects in the analysis of supported lipid bilayers by time-of-flight secondary ion mass spectrometry

We contribute to the rapidly emerging interest in the application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for chemical analysis of biological materials by presenting a careful TOF-SIMS investigation of structurally different SiO2-supported phospholipid assemblies. Freeze-dried supported 1-oleoyl-2-palmitoyl-sn-glycero-3-phosphocholine (POPC) bilayers, Langmuir-Blodgett POPC monolayers, and disordered thick POPC films were investigated. Compared with the two latter structures, the supported bilayer showed a strong (5-10 times) enhancement in the yield of both the molecular and the dimer ion peaks of POPC, suggesting that the molecular peak may be used as a sensitive indicator for changes in the membrane structure and, in particular, an indicator for the presence of bilayer structures in, e.g., cell and tissue samples. The detection efficiency and the useful lateral resolution indicate that a lateral resolution of around 100 nm can be obtained on all structures by imaging the phosphocholine ion at 184 u using Bi3+ primary ions. For the chemically specific molecular peak at 760 u, the measured detection efficiencies correspond to a useful lateral resolution of around 2 microm for the bilayer structure. The results are discussed in relation to recent dynamic SIMS (nano-SIMS) analysis of freeze-dried supported lipid bilayers, displaying similar or higher lateral resolution, but which in contrast to TOF-SIMS requires isotopic labeling of the analyzed lipids.     

Improvement of biological time-of-flight-secondary ion mass spectrometry imaging with a bismuth cluster ion source

A new liquid metal ion gun (LMIG) filled with bismuth has been fitted to a time-of-flight-secondary ion mass spectrometer (TOF-SIMS). This source provides beams of Bi(n)q+ clusters with n = 1-7 and q = 1 and 2. The appropriate clusters have much better intensities and efficiencies than the Au3+ gold clusters recently used in TOF-SIMS imaging, and allow better lateral and mass resolution. The different beams delivered by this ion source have been tested for biological imaging of rat brain sections. The results show a great improvement of the imaging capabilities in terms of accessible mass range and useful lateral resolution. Secondary ion yields Y, disappearance cross sections sigma, efficiencies E = Y/sigma , and useful lateral resolutions deltaL have been compared using the different bismuth clusters, directly onto the surface of rat brain sections and for several positive and negative secondary ions with m/z ranging from 23 up to more than 750. The efficiency and the imaging capabilities of the different primary ions are compared by taking into account the primary ion current for reasonable acquisition times. The two best primary ions are Bi3+ and Bi5(2+). The Bi3+ ion beam has a current at least five times larger than Au3+ and therefore is an excellent beam for large-area imaging. Bi5(2+) ions exhibit large secondary ions yields and a reasonable intensity making them suitable for small-area images with an excellent sensitivity and a possible useful lateral resolution <400 nm.     

Comparative TOF-SIMS and MALDI TOF-MS analysis on different chromatographic planar substrates

A comparison is made between two high resolution, surface-based, mass spectrometric methods: time-of-flight secondary ion mass spectrometry (TOF-SIMS) and matrix-assisted laser desorption/ionisation mass spectrometry (MALDI TOF-MS) in indication of abietic and gibberellic acids molecular profiles on different chromatographic thin layers. The analytes were applied to silica gel chromatographic thin layers with SIMS on-line interfacing channel, monolithic silica gel ultra-thin layers, and thin layers specifically designed for direct Raman spectroscopic analysis. Two MALDI matrices were used in this research: ferulic acid and 2,5-dihydroxybenzoic acid. The silica gel SIMS-interfacing channel strongly supported formation of numerous different MALDI MS fragments with abietic and gibberellic acids, and ferulic acid matrix. The most intense fragments belonged to [M-OH](+) and [M](+) ions from ferulic acid. Intense conjugates were detected with gibberellic acid. The MALDI MS spectrum from the monolithic silica gel surface showed very low analyte signal intensity and it was not possible to obtain MALDI spectra from a Raman spectroscopy treated chromatographic layer. The MALDI TOF MS gibberellic acid fragmentation profile was shielded by the matrix used and was accompanied by poor analyte identification. The most useful TOF-SIMS analytical signal response was obtained from analytes separated on monolithic silica gel and a SIMS-interfacing modified silica gel surface. New horizons with nanostructured surfaces call for high resolution MS methods (which cannot readily be miniaturised like many optical and electrochemical methods) to be integrated in chip and nanoscale detection systems.     

Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS.

The technique of imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) and dual beam depth profiling has been used to study the composition of the surface of tabular silver halide microcrystals. Analysis of individual microcrystals with a size well below 1 microm from a given emulsion is possible. The method is successfully applied for the characterization of silver halide microcrystals with subpercent global iodide concentrations confined in surface layers with a thickness below 5 nm. The developed TOF-SIMS analytical procedure is explicitly demonstrated for the molecular imaging of adsorbed thiocyanate layers (SCN) at crystal surfaces of individual crystals and for the differentiation of iodide conversion layers synthesized with KI and with AgI micrates (nanocrystals with a size between 10 and 50 nm). It can be concluded that TOF-SIMS as a microanalytical, surface-sensitive technique has some unique properties over other analytical techniques for the study of complex structured surface layers of silver halide microcrystals. This offers valuable information to support the synthesis of future photographic emulsions.     

Evaluation of matrix-assisted laser desorption ionization mass spectrometry for polymer characterization

A protocol for the preparation of polymeric samples for time-of-flight matrix-assisted laser desorption ionization mass spectrometry (TOF-MALDI-MS) analysis was developed. Dithranol was identified as a good matrix for polystyrene (PS), and the addition of silver for cationization of molecules was determined to be necessary. Based on this preparative method, low molecular weight samples of other polymers [polyisoprene, polybutadiene, poly(ethylene oxide), poly(methyl methacrylate), and polydimethylsiloxane] were analyzed with molecular weights up to 49 ku. The effects of laser intensity were determined to influence the molecular weight distribution of intact oligomers, most significantly for low molecular weight polymers. Linear and reflectron modes of analysis were evaluated; better signal intensity and resolution were obtained in the reflectron mode. The TOF-MALDI-MS measurements are compared with time-of-flight secondary ion mass spectrometry (TOF-SIMS) and gel permeation chromatography (GPC) for the same polymers. The M _n values calculated by TOF-MALDI-MS consistently are higher than values calculated by TOF-SIMS for all classes of polymers with molecular weights up to 8 ku. The molecular weights of the PS calculated from TOF-MALDI-MS are in good agreement with GPC (±10%). The composition of the terminal group on a polymer chain may affect the ion yields. The ion yields of intact oligomers were evaluated as a function of end group composition for both TOF-MALDI-MS and TOF-SIMS. The slight disparity of results between TOF-SIMS and TOF-MALDI-MS for the perfluoroalkyl-terminated PS suggests that the oligomers are desorbed preferentially from the surface in the TOF-SIMS analysis, rather than having an increased ionization probability.     

Lipid cartography of atherosclerotic plaque by cluster-TOF-SIMS imaging

Several frozen vessels bearing atherosclerotic lesion were analysed by cluster TOF-SIMS (time-of-flight secondary ion mass spectrometry) to map their lipid (fatty acids, cholesterol, vitamin E, phosphatidic acids, phosphatidylinositols and triglycerides) content at a micrometric resolution.     

Resonance ionization mass spectrometry of ion beam sputtered neutrals for element- and isotope-selective analysis of plutonium in micro-particles

Micro-particles containing actinides are of interest for risk assessments of contaminated areas, nuclear forensic analyses, and IAEA as well as Euratom safeguards programs. For their analysis, secondary ion mass spectrometry (SIMS) has been established as the state-of-the-art standard technique. In the case of actinide mixtures within the particles, however, SIMS suffers from isobaric interferences (e.g., ²³⁸U/²³⁸Pu, ²⁴¹Am/²⁴¹Pu). This can be eliminated by applying resonance ionization mass spectrometry which is based on stepwise resonant excitation and ionization of atoms with laser light, followed by mass spectrometric detection of the produced ions, combining high elemental selectivity with the analysis of isotopic compositions. This paper describes the instrumental modifications for coupling a commercial time-of-flight (TOF)-SIMS apparatus with three-step resonant post-ionization of the sputtered neutrals using a high-repetition-rate (kHz) Nd:YAG laser pumped tunable titanium:sapphire laser system. Spatially resolved ion images obtained from actinide-containing particles in TOF-SIMS mode demonstrate the capability for isotopic and spatial resolution. Results from three-step resonant post-ionization of bulk Gd and Pu samples successfully demonstrate the high elemental selectivity of this process.     

Introduction to time-of-flight secondary ion mass spectrometry application in chromatographic analysis

New on-line analytical system coupling thin layer chromatography (TLC) and high selective identification unit-time of flight secondary ion mass spectrometry (TOF-SIMS) is introduced in this article. Chromatographic mixture separation and analyte surface deposition followed with surface TOF-SIMS analysis on-line allows to identify the analytes at trace and ultratrace levels. The selected analytes with different detectability and identification possibility were analysed in this hyphenated unit (Methyl Red indicator, Terpinolen and Giberrelic acid). Here, the chromatographic thin layer plays a universal role: separation unit, analyte depositing surface and TOF-SIMS interface, finally. Two depositing substrates and TOF-SIMS compatible interfaces were tested in above-mentioned interfacing unit: modified aluminium backed chromatographic thin layer and monolithic silica thin layer. The sets of positive and negative ions TOF-SIMS spectra obtained from different SIMS modes of analysis were used for analyte identification purposes. SIMS enables analyte detection with high mass resolution at the concentration level that is not achieved by other methods.     

Polyelectrolytes as new matrices for secondary ion mass spectrometry

Significant enhancements in ion yields in time-of-flight secondary ion mass spectrometry (TOF-SIMS) are observed when water-soluble analytes are mixed with a polyelectrolyte, e.g., poly(diallyldimethylammonium chloride) or poly(sodium 4-styrenesulfonate), and then deposited in the layer-by-layer method on a surface. This previously unobserved effect is demonstrated for 5-chloro-8-methoxyquinoline appended diaza-18-crown-6, 5-(2-aminoethoxy)methyl-5-chloro-8-methoxyquinoline appended diaza-18-crown-6, acridine, 9-anthracenecarboxylic acid, and ferrocenecarboxylic acid. By optical ellipsometry film thicknesses range from ca. 5-20 angstroms. X-ray photoelectron spectroscopy shows significantly less analyte in the polyelectrolyte-analyte films than in the neat analytes. However, TOF-SIMS generally shows significant enhancements in ion yields from the polyelectrolyte films compared with either the neat compounds or the compounds solubilized with acid or base and then dried on a surface. These significant enhancements in ion yields also appear to extend to analyte fragments and cationized molecular species. Some enhancement is also observed for dried droplets of analytes mixed with a polyelectrolyte on surfaces.     

Chemometric evaluation of time-of-flight secondary ion mass spectrometry data of minerals in the frame of future in situ analyses of cometary material by COSIMA onboard ROSETTA

Chemometric data evaluation methods for time-of-flight secondary ion mass spectrometry (TOF-SIMS) have been tested for the characterization and classification of minerals. Potential applications of these methods include the expected data from cometary material to be measured by the COSIMA instrument onboard the ESA mission ROSETTA in the year 2014. Samples of the minerals serpentine, enstatite, olivine, and talc have been used as proxies for minerals existing in extraterrestrial matter. High mass resolution TOF-SIMS data allow the selection of peaks from inorganic ions relevant for minerals. Multivariate cluster analysis of peak intensity data by principal components analysis and the new method CORICO showed a good separation of the mineral classes. Classification by k nearest-neighbor classification (KNN) or binary decision trees (CART method) results in more than 90% correct class assignments in a leave-one-out cross validation.     

Fluorescence, XPS, and TOF-SIMS surface chemical state image analysis of DNA microarrays

Performance improvements in DNA-modified surfaces required for microarray and biosensor applications rely on improved capabilities to accurately characterize the chemistry and structure of immobilized DNA molecules on micropatterned surfaces. Recent innovations in imaging X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) now permit more detailed studies of micropatterned surfaces. We have exploited the complementary information provided by imaging XPS and imaging TOF-SIMS to detail the chemical composition, spatial distribution, and hybridization efficiency of amine-terminated single-stranded DNA (ssDNA) bound to commercial polyacrylamide-based, amine-reactive microarray slides, immobilized in both macrospot and microarray diagnostic formats. Combinations of XPS imaging and small spot analysis were used to identify micropatterned DNA spots within printed DNA arrays on slide surfaces and quantify DNA elements within individual microarray spots for determination of probe immobilization and hybridization efficiencies. This represents the first report of imaging XPS of DNA immobilization and hybridization efficiencies for arrays fabricated on commercial microarray slides. Imaging TOF-SIMS provided distinct analytical data on the lateral distribution of DNA within single array microspots before and after target hybridization. Principal component analysis (PCA) applied to TOF-SIMS imaging datasets demonstrated that the combination of these two techniques provides information not readily observable in TOF-SIMS images alone, particularly in identifying species associated with array spot nonuniformities (e.g., "halo" or "donut" effects often observed in fluorescence images). Chemically specific spot images were compared to conventional fluorescence scanned images in microarrays to provide new information on spot-to-spot DNA variations that affect current diagnostic reliability, assay variance, and sensitivity.     

Orientation modulation of a synthetic polypeptide in self-assembled monolayers: a TOF-SIMS study

Structure and orientation of molecules are key properties of functionalized surfaces. Using time-of-flight secondary ion mass spectrometry (TOF-SIMS), here we investigate how to modulate these parameters upon the immobilization process varying the conditions of self-assembly. The molecule of interest, a template-assembled synthetic protein (TASP), consists of a central peptide ring with orthogonally arranged residues. Thioalkane chains allow the directed self-assembly of the molecule on a gold surface; four serine residues on the opposite side of the ring can be used as anchoring sites for various functional sensing molecules. The TASP conformation and its orientation in self-assembled monolayers (SAMs) play a central role for the accessibility of these serine residues. To study the influence of the self-assembly conditions, two series of samples were prepared. Pure TASP monolayers of different surface densities are compared to mixed TASP/alkanethiol monolayers prepared by sequential adsorption varying sequence and particular incubation times as well as by coadsorption modifying incubation times and TASP/alkanethiol mass ratios. Switching the TASP orientation from a state where the molecules are lying flat on the surface to an upright orientation turned out to be possible by inserting the TASP into a preformed alkanethiol monolayer of an appropriate surface density. This study demonstrates that TOF-SIMS is an excellent tool not only to investigate the surface composition, but also the molecular structure of functionalized surfaces.     

Variable alignment of high resolution data by cluster analysis

High resolution time-of-flight secondary ion mass spectrometry (HR TOF-SIMS) is a powerful surface analytical method. For complex samples, this technique may yield intricate spectra that are difficult to interpret visually. Chemometric methods are useful for data analysis. However, these methods require that spectra are represented in a matrix format. Variances in mass measurements caused by calibration or instrumental effects may present difficulties in properly aligning mass spectral peaks into the correct columns of the data matrix. Cluster analysis of resolution elements is proposed as an alternative approach to construct the data matrix. An automated method for optimizing the data alignment is presented and evaluated for standard steel samples.     

Time-of-flight secondary ion mass spectrometry (TOF-SIMS):--versatility in chemical and imaging surface analysis

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has emerged as one of the most important and versatile surface analytical techniques available for advanced materials research. This arises from its excellent mass resolution, sensitivity and high spatial resolution providing both chemical and distributional (laterally and depth) information for a wide variety of materials and applications. Understanding the various modes of operation and the information that each provides is crucial to the analyst in order to optimise the type of data that is obtained. New developments in primary ion sources and the application of multivariate analysis techniques, which can only extend the versatility and applicability of the technique, are also discussed.     

Reactive landing of peptide ions on self-assembled monolayer surfaces: an alternative approach for covalent immobilization of peptides on surfaces

Soft landing of mass-selected peptide ions onto reactive self-assembled monolayer surfaces (SAMs) was performed using a newly constructed ion deposition apparatus. SAM surfaces before and after soft landing were characterized ex situ using time-of-flight secondary-ion mass spectrometry (TOF-SIMS) and infrared reflection-absorption spectroscopy (IRRAS). We demonstrate that reactive landing (RL) results in efficient covalent linking of lysine-containing peptides onto the SAM of N-hydroxysuccinimidyl ester-terminated alkylthiol on gold (NHS-SAM). Systematic studies of the factors that affect the efficiency of RL revealed that the reaction takes place upon collision and is promoted by the kinetic energy of the ion. The efficiency of RL is maximized at ca. 40 eV collision energy. At high collision energies the RL efficiency decreases because of the competition with scattering of ions off the surface. The reaction yield is independent of the charge state of the projectile ions, suggesting that peptide ions undergo efficient neutralization upon collision. Chemical and physical properties of the SAM surface are also important factors that affect the outcome of RL. The presence of chemically reactive functional groups on the SAM surface significantly improves the reaction efficiency. RL of mass- and energy-selected peptide ions on surfaces provides a highly specific approach for covalent immobilization of biological molecules onto SAM surfaces.     

Quantitative TOF-SIMS analysis of oligomeric degradation products at the surface of biodegradable poly(alpha-hydroxy acid)s

This paper reports the development of a new method for quantification of the hydrolytic surface degradation kinetics of biodegradable poly(alpha-hydroxy acid)s using time-of-flight secondary ion mass spectrometry (TOF-SIMS). We report results from static SIMS spectra of a series of poly(alpha-hydroxy acid)s including poly(glycolic acid), poly(L-lactic acid), and random poly(D,L-lactic acid-co-glycolic acid) hydrolyzed in various buffer systems. The distribution of the most intense peak intensities of ions generated in high mass range of the spectrum reflects the intact degradation products (oligomeric hydrolysis products) of each biodegradable polymer. First, a detailed analysis of the oligomeric ions is given based on rearrangement of the intact hydrolysis products. The pattern of ions can distinguish both degradation-generated intact oligomers and their fragment ion peaks with a variety of combinations of each repeat unit. Then, the integration and summation of the area of all ion peaks with the same number of repeat units is proposed as a measurement that provides a more accurate MW average than the typically used method which counts only the most intense peak. The multiple ion summation method described in this paper would be practical in the improvement of quantitative TOF-SIMS studies as a better data reduction method, especially in the surface degradation kinetics of biodegradable polymers.     

Molecular weight evaluation of poly(dimethylsiloxane) on solid surfaces using silver deposition/TOF-SIMS.

Molecular ions include information about end groups, functional groups and molecular weight. A method for the direct detection of these in the high mass range (m/z > 1000) from poly(dimethylsiloxane) (PDMS) on a solid surface was investigated. It was found that a TOF-SIMS analysis of silver-deposited surfaces (silver deposition/TOF-SIMS) is useful for this purpose. Using the silver-deposition/TOF-SIMS method, silver-cationized quasi-molecular ions were clearly detected from PDMS on solid surfaces, and their structure and molecular weight were evaluated. In addition, their images were observed without the interference of deposited silver. By applying to the analysis of paint defects etc., it was confirmed that this technique is useful to analyze actual industrial materials. Silver-cationized ions were detected not only from PDMS, but also from other organic materials, such as lubricant additives and oils on solid surfaces. Therefore, the silver deposition/TOF-SIMS method was proved to be useful for the analysis of ultrathin substances on solid surfaces.     

Removal properties of diesel exhaust particles by a dielectric barrier discharge reactor

The removal properties of diesel exhaust particles (DEP) were investigated using an engine exhaust particle size spectrometer (EEPS), field emission-type scanning electron microscopy (FE-SEM) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). DEP were treated using a dielectric barrier discharge (DBD) reactor installed in the tail pipe of a diesel engine, and a model DBD reactor fed with DEP in the mixture of N(2) and O(2). When changing the experimental parameters of both the plasma conditions and the engine load conditions, we obtained characteristic information of DEP treated with plasma discharges from the particle diameter and the composition. In evaluating the model DBD reactor, it became clear that there were two types of plasma processes (reactions with active oxygen species to yield CO(2) and reactions with active nitrogen species to yield nitrogen containing compounds). Moreover, from the result of a TOF-SIMS analysis, the characteristic secondary ions, such as C(2)H(6)N(+), C(4)H(12)N(+), and C(10)H(20)N(2)(+), were strongly detected from the DEP surfaces during the plasma discharges. This indicates that the nitrogen contained hydrocarbons were generated by plasma reactions.