Synchrotron X‐ray tests of an L‐shaped laterally graded multilayer mirror for the analyzer system of the ultra‐high‐resolution IXS spectrometer at NSLS‐II

Characterization and testing of an L‐shaped laterally graded multilayer mirror are presented. This mirror is designed as a two‐dimensional collimating optics for the analyzer system of the ultra‐high‐resolution inelastic X‐ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS‐II). The characterization includes point‐to‐point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). The synchrotron X‐ray test of the mirror was carried out reversely as a focusing device. The results show that the L‐shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS‐II.     

Microcrystallography using single‐bounce monocapillary optics

X‐ray microbeams have become increasingly valuable in protein crystallography. A number of synchrotron beamlines worldwide have adapted to handling smaller and more challenging samples by providing a combination of high‐precision sample‐positioning hardware, special visible‐light optics for sample visualization, and small‐diameter X‐ray beams with low background scatter. Most commonly, X‐ray microbeams with diameters ranging from 50 µm to 1 µm are produced by Kirkpatrick and Baez mirrors in combination with defining apertures and scatter guards. A simple alternative based on single‐bounce glass monocapillary X‐ray optics is presented. The basic capillary design considerations are discussed and a practical and robust implementation that capitalizes on existing beamline hardware is presented. A design for mounting the capillary is presented which eliminates parasitic scattering and reduces deformations of the optic to a degree suitable for use on next‐generation X‐ray sources. Comparison of diffraction data statistics for microcrystals using microbeam and conventional aperture‐collimated beam shows that capillary‐focused beam can deliver significant improvement. Statistics also confirm that the annular beam profile produced by the capillary optic does not impact data quality in an observable way. Examples are given of new structures recently solved using this technology. Single‐bounce monocapillary optics can offer an attractive alternative for retrofitting existing beamlines for microcrystallography.     

Performance of a collimating L‐shaped laterally graded multilayer mirror for the IXS analyzer system at NSLS‐II

The L‐shaped laterally graded multilayer mirror is a vital part of the ultrahigh‐energy and momentum‐resolution inelastic X‐ray scattering spectrometer at the National Synchrotron Light Source II. This mirror was designed and implemented as a two‐dimensional collimating optic for the analyzer system. Its performance was characterized using a secondary large‐divergence source at the 30‐ID beamline of the Advanced Photon Source, which yielded an integrated reflectivity of 47% and a collimated beam divergence of 78 µrad with a source size of 10 µm. Numerical simulations of the mirror performance in tandem with the analyzer crystal optics provided details on the acceptance sample volume in forward scattering and defined the technical requirements on the mirror stability and positioning precision. It was shown that the mirror spatial and angular stability must be in the range <8.4 µm and <21.4 µrad, respectively, for reliable operation of the analyzer.     

Phase‐space analysis and experimental results for secondary focusing at X‐ray beamlines

Micro‐focusing optical devices at synchrotron beamlines usually have a limited acceptance, but more flux can be intercepted if such optics are used to focus secondary sources created by the primary optics. Flux throughput can be maximized by placing the secondary focusing optics close to or exactly at the secondary source position. However, standard methods of beamline optics analysis, such as the lens equation or matching the mirror surface to an ellipse, work poorly when the source‐to‐optics distance is very short. In this paper the general characteristics of the focusing of beams with Gaussian profiles by a `thin lens' are analysed under the paraxial approximation in phase space, concluding that the focusing of a beam with a short source‐to‐optics distance is distinct from imaging the source; slope errors are successfully included in all the formulas so that they can be used to calculate beamline focusing with good accuracy. A method is also introduced to use the thin‐lens result to analyse the micro‐focusing produced by an elliptically bent trapezoid‐shaped Kirkpatrick–Baez mirror. The results of this analysis are in good agreement with ray‐tracing simulations and are confirmed by the experimental results of the secondary focusing at the 18‐ID Bio‐CAT beamline (at the APS). The result of secondary focusing carried out at 18‐ID using a single‐bounce capillary can also be explained using this phase‐space analysis. A discussion of the secondary focusing results is presented at the end of this paper.     

In situ removal of carbon contamination from optics in a vacuum ultraviolet and soft X‐ray undulator beamline using oxygen activated by zeroth‐order synchrotron radiation

Carbon contamination of optics is a serious issue in all soft X‐ray beamlines because it decreases the quality of experimental data, such as near‐edge X‐ray absorption fine structure, resonant photoemission and resonant soft X‐ray emission spectra in the carbon K‐edge region. Here an in situ method involving the use of oxygen activated by zeroth‐order synchrotron radiation was used to clean the optics in a vacuum ultraviolet and soft X‐ray undulator beamline, BL‐13A at the Photon Factory in Tsukuba, Japan. The carbon contamination of the optics was removed by exposing them to oxygen at a pressure of 10^?1–10^?4 Pa for 17–20 h and simultaneously irradiating them with zeroth‐order synchrotron radiation. After the cleaning, the decrease in the photon intensity in the carbon K‐edge region reduced to 2–5%. The base pressure of the beamline recovered to 10^?7–10^?8 Pa in one day without baking. The beamline can be used without additional commissioning.     

Development of variable‐magnification X‐ray Bragg optics

A novel X‐ray Bragg optics is proposed for variable‐magnification of an X‐ray beam. This X‐ray Bragg optics is composed of two magnifiers in a crossed arrangement, and the magnification factor, M, is controlled through the azimuth angle of each magnifier. The basic properties of the X‐ray optics such as the magnification factor, image transformation matrix and intrinsic acceptance angle are described based on the dynamical theory of X‐ray diffraction. The feasibility of the variable‐magnification X‐ray Bragg optics was verified at the vertical‐wiggler beamline BL‐14B of the Photon Factory. For X‐ray Bragg magnifiers, Si(220) crystals with an asymmetric angle of 14° were used. The magnification factor was calculated to be tunable between 0.1 and 10.0 at a wavelength of 0.112 nm. At various magnification factors (M≥ 1.0), X‐ray images of a nylon mesh were observed with an air‐cooled X‐ray CCD camera. Image deformation caused by the optics could be corrected by using a 2 × 2 transformation matrix and bilinear interpolation method. Not only absorption‐contrast but also edge‐contrast due to Fresnel diffraction was observed in the magnified images.     

On the use of clessidra prism arrays in long‐focal‐length X‐ray focusing

Clessidra (hour‐glass) X‐ray lenses have an overall shape of an old hour glass, in which two opposing larger triangular prisms are formed of smaller identical prisms or prism‐like objects. In these lenses, absorbing and otherwise optically inactive material was removed with a material‐removal strategy similar to that used by Fresnel in the lighthouse lens construction. It is verified that when the single prism rows are incoherently illuminated they can be operated as independent micro‐lenses with coinciding image positions for efficient X‐ray beam concentration. Experimental data for the line width and the refraction efficiency in one‐dimensional focusing are consistent with the expectations. Imperfections in the structures produced by state‐of‐the‐art deep X‐ray lithography directed only 35% of the incident intensity away from the image and widened it by just 10% to 125 µm. An array of micro‐lenses with easily feasible prism sizes is proposed as an efficient retrofit for the refocusing optics in an existing beamline, where it would provide seven‐fold flux enhancement.     

Finite‐element modelling of multilayer X‐ray optics

Multilayer optical elements for hard X‐rays are an attractive alternative to crystals whenever high photon flux and moderate energy resolution are required. Prediction of the temperature, strain and stress distribution in the multilayer optics is essential in designing the cooling scheme and optimizing geometrical parameters for multilayer optics. The finite‐element analysis (FEA) model of the multilayer optics is a well established tool for doing so. Multilayers used in X‐ray optics typically consist of hundreds of periods of two types of materials. The thickness of one period is a few nanometers. Most multilayers are coated on silicon substrates of typical size 60 mm × 60 mm × 100–300 mm. The high aspect ratio between the size of the optics and the thickness of the multilayer (10⁷) can lead to a huge number of elements for the finite‐element model. For instance, meshing by the size of the layers will require more than 10¹⁶ elements, which is an impossible task for present‐day computers. Conversely, meshing by the size of the substrate will produce a too high element shape ratio (element geometry width/height > 10⁶), which causes low solution accuracy; and the number of elements is still very large (10⁶). In this work, by use of ANSYS layer‐functioned elements, a thermal‐structural FEA model has been implemented for multilayer X‐ray optics. The possible number of layers that can be computed by presently available computers is increased considerably.     

Investigation of multilayer X‐ray optics for the 6 keV to 20 keV energy range

The X‐ray optics group at the Swiss Light Source in co‐operation with RIT (Rigaku Innovative Technologies) have investigated seven different multilayer samples. The goal was to find an ideal multilayer structure for the energy range between 6 keV and 20 keV in terms of energy resolution and reflectivity. Such multilayer structures deposited on substrates can be used as X‐ray monochromators or reflecting synchrotron mirrors. The measured reflectivities agree with the simulated ones. They cover a reflectivity range from 45% to 80% for energies between 6 keV and 10 keV, and 80% to 90% for energies between 10 keV and 20 keV. The experimentally measured energy resolution of the samples lies between 0.3% and 3.5%.     

Suppression of Bragg reflection glitches of a single‐crystal diamond anvil cell by a polycapillary half‐lens in high‐pressure XAFS spectroscopy

In combination with a single‐crystal diamond anvil cell (DAC), a polycapillary half‐lens (PHL) re‐focusing optics has been used to perform high‐pressure extended X‐ray absorption fine‐structure measurements. It is found that a large divergent X‐ray beam induced by the PHL leads the Bragg glitches from single‐crystal diamond to be broadened significantly and the intensity of the glitches to be reduced strongly so that most of the DAC glitches are efficiently suppressed. The remaining glitches can be easily removed by rotating the DAC by a few degrees with respect to the X‐ray beam. Accurate X‐ray absorption fine‐structure (XAFS) spectra of polycrystalline Ge powder with a glitch‐free energy range from ?200 to 800 eV relative to the Ge absorption edge are obtained using this method at high pressures up to 23.7 GPa, demonstrating the capability of PHL optics in eliminating the DAC glitches for high‐pressure XAFS experiments. This approach brings new possibilities to perform XAFS measurements using a DAC up to ultrahigh pressures.     

Versatility of a hard X‐ray Kirkpatrick–Baez focus characterized by ptychography

In the past decade Kirkpatrick–Baez (KB) mirrors have been established as powerful focusing systems in hard X‐ray microscopy applications. Here a ptychographic characterization of the KB focus in the dedicated nano‐imaging setup GINIX (Göttingen Instrument for Nano‐Imaging with X‐rays) at the P10 coherence beamline of the PETRA III synchrotron at HASLYLAB/DESY, Germany, is reported. More specifically, it is shown how aberrations in the KB beam, caused by imperfections in the height profile of the focusing mirrors, can be eliminated using a pinhole as a spatial filter near the focal plane. A combination of different pinhole sizes and illumination conditions of the KB setup makes the prepared optical setup well suited not only for high‐resolution ptychographic coherent X‐ray diffractive imaging but also for moderate‐resolution/large‐field‐of‐view propagation imaging in the divergent KB beam.     

Optical performance of materials for X‐ray refractive optics in the energy range 8–100 keV

A quantitative analysis of the crucial characteristics of currently used and promising materials for X‐ray refractive optics is performed in the extended energy range 8–100 keV. According to the examined parameters, beryllium is the material of choice for X‐ray compound refractive lenses (CRLs) in the energy range 8–25 keV. At higher energies the use of CRLs made of diamond and the cubic phase of boron nitride (c‐BN) is beneficial. It was demonstrated that the presence of the elements of the fourth (or higher) period has a fatal effect on the functional X‐ray properties even if low‐Z elements dominate in the compound, like in YB₆₆. Macroscopic properties are discussed: much higher melting points and thermal conductivities of C and c‐BN enable them to be used at the new generation of synchrotron radiation sources and X‐ray free‐electron lasers. The role of crystal and internal structure is discussed: materials with high density are preferable for refractive applications while less dense phases are suitable for X‐ray windows. Single‐crystal or amorphous glass‐like materials based on Li, Be, B or C that are free of diffuse scattering from grain boundaries, voids and inclusions are the best candidates for applications of highly coherent X‐ray beams.     

Protective radiolucent aluminium oxide coatings for beryllium X‐ray optics

Beryllium, being one of the most transparent materials to X‐ray radiation, has become the material of choice for X‐ray optics instrumentation at synchrotron radiation sources and free‐electron laser facilities. However, there are concerns due to its high toxicity and, consequently, there is a need for special safety regulations. The authors propose to apply protective coatings in order to seal off beryllium from the ambient atmosphere, thus preventing degradation processes providing additional protection for users and prolonging the service time of the optical elements. This paper presents durability test results for Be windows coated with atomic‐layer‐deposition alumina layers run at the European Synchrotron Radiation Facility. Expositions were performed under monochromatic, pink and white beams, establishing conditions that the samples could tolerate without radiation damage. X‐ray treatment was implemented in various environments, i.e. vacuum, helium, nitrogen, argon and dry air at different pressures. Post‐process analysis revealed their efficiency for monochromatic and pink beams.     

Characterization of germanium linear kinoform lenses at Diamond Light Source

The unprecedented brilliance achieved by third‐generation synchrotron sources and the availability of improved optics have opened up new opportunities for the study of materials at the micrometre and nanometre scale. Focusing the synchrotron radiation to smaller and smaller beams is having a huge impact on a wide research area at synchrotrons. The key to the exploitation of the improved sources is the development of novel optics that deliver narrow beams without loss of brilliance and coherence. Several types of synchrotron focusing optics are successfully fabricated using advanced miniaturization techniques. Kinoform refractive lenses are being developed for hard X‐ray beamlines, and the first test results at Diamond are discussed in this paper.     

Fresnel zone plate with apodized aperture for hard X‐ray Gaussian beam optics

Fresnel zone plates with apodized apertures [apodization FZPs (A‐FZPs)] have been developed to realise Gaussian beam optics in the hard X‐ray region. The designed zone depth of A‐FZPs gradually decreases from the center to peripheral regions. Such a zone structure forms a Gaussian‐like smooth‐shouldered aperture function which optically behaves as an apodization filter and produces a Gaussian‐like focusing spot profile. Optical properties of two types of A‐FZP, i.e. a circular type and a one‐dimensional type, have been evaluated by using a microbeam knife‐edge scan test, and have been carefully compared with those of normal FZP optics. Advantages of using A‐FZPs are introduced.     

An alternative scheme of angular‐dispersion analyzers for high‐resolution medium‐energy inelastic X‐ray scattering

The development of medium‐energy inelastic X‐ray scattering optics with meV and sub‐meV resolution has attracted considerable efforts in recent years. Meanwhile, there are also concerns or debates about the fundamental and feasibility of the involved schemes. Here the central optical component, the back‐reflection angular‐dispersion monochromator or analyzer, is analyzed. The results show that the multiple‐beam diffraction effect together with transmission‐induced absorption can noticeably reduce the diffraction efficiency, although it may not be a fatal threat. In order to improve the efficiency, a simple four‐bounce analyzer is proposed that completely avoids these two adverse effects. The new scheme is illustrated to be a feasible alternative approach for developing meV‐ to sub‐meV‐resolution inelastic X‐ray scattering spectroscopy.     

A soft X‐ray beamline for transmission X‐ray microscopy at ALBA

The MISTRAL beamline is one of the seven phase‐I beamlines at the ALBA synchrotron light source (Barcelona, Spain) that will be opened to users at the end of 2010. MISTRAL will be devoted to cryotomography in the water window and multi‐keV spectral regions for biological applications. The optics design consists of a plane‐grating monochromator that has been implemented using variable‐line‐spacing gratings to fulfil the requirements of X‐ray microscopy using a reflective condenser. For instance, a fixed‐focus condition independent of the included angle, constant magnification as well as coma and spherical aberration corrections are achieved with this system. The reported design is of wider use.     

Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts

The combination of a pn‐junction charge‐coupled device‐based pixel detector with a poly‐capillary X‐ray optics was installed and examined at the Helmholtz‐Zentrum Dresden‐Rossendorf. The set‐up is intended for particle‐induced X‐ray emission imaging to survey the trace elemental composition of flat/polished geological samples. In the standard configuration, a straight X‐ray optics (20 μm capillary diameter) is used to guide the emitted photons from the sample towards the detector with nearly 70 000 pixels. Their dimensions of 48 × 48 μm² are the main limitation of the lateral resolution. This limitation can be bypassed by applying a dedicated subpixel algorithm to recalculate the footprint of the photon's electron cloud in the detector. The lateral resolution is then mainly determined by the capillary's diameter. Nevertheless, images are still superimposed by the X‐ray optics pattern. The optics' capillaries are grouped in hexagonal bundles resulting in a reduced transmission of X‐rays in the boundary regions. This influence can be largely suppressed by combining a series of short measurements at slightly shifted positions using a precision stage and correcting the image data for this shifting. The use of a subpixel grid for the image reconstruction allows a further increase of the spatial resolution. This approach of image‐stacking and multiframe super‐resolution in combination with the subpixel correction algorithm is presented and illustrated with experimental data. Additionally, a flat‐field correction is shown to remove the remaining imaging inhomogeneity caused by non‐uniform X‐ray transmission. The described techniques can be used for all X‐ray spectrometry methods using an X‐ray camera to obtain high‐quality elemental images.     

Carbon contamination of soft X‐ray beamlines: dramatic anti‐reflection coating effects observed in the 1 keV photon energy region

Carbon contamination is a general problem of under‐vacuum optics submitted to high fluence. In soft X‐ray beamlines carbon deposit on optics is known to absorb and scatter radiation close to the C K‐edge (280 eV), forbidding effective measurements in this spectral region. Here the observation of strong reflectivity losses is reported related to carbon deposition at much higher energies around 1000 eV, where carbon absorptivity is small. It is shown that the observed effect can be modelled as a destructive interference from a homogeneous carbon thin film.