微通道板增益疲劳机理研究

微通道板的增益疲劳是微通道板的主要问题之一，本文分析了微通道板的表面结构模型，同通道板活性表面上碱金属的逸出和碳的增加是导致微通道板的增益疲劳的主要原因，另外，探讨碱金属逸出的机理和碳污染的来源，介绍延长微通道板工作寿命的有效方法。     

微通道板防离子反馈膜新工艺

微通道板防离子反馈膜在三代象管中起到延长寿命的作用.本文叙述了微通道板防离子反馈膜的传统工艺和传统工艺对微通道板电性能的影响,提出了一种制备微通道板防离子反馈膜的新工艺.结果表明,新工艺没有给微通道板通道内表面带来碳污染,不影响微通道板电性能.     

微通道板电子透射膜工艺的AES研究

用冷基底溅射方法和静电贴膜方法分别在微通道板表面制备了电子透射膜,采用俄歇电子能谱(AES)研究了两种工艺制备的微通道板电子透射膜的薄膜成分,微通道板电子透射膜工艺失败微通道板通道表面的成分和通道内壁的成分随深度的变化. 结果表明,冷基底溅射方法制膜工艺的失败对MCP造成了严重的碳污染,污染的MCP不可回收;静电贴膜方法制膜工艺的失败对MCP通道表面没有明显影响,MCP可回收利用.     

微通道板离子阻挡膜对三代像管分辨率的影响

分析传统的微通道板离子阻挡膜对三代像管分辨率的影响，指出离子阻挡膜衰减碰撞通道壁的一次电子数及其工艺引起的通道内壁碳污染是导致带膜三代像管分辨率下降的主要原因，提出降低离子阻挡膜对三代像管分辨率影响的主要技术途径。     

微通道板显微结构缺陷及机理研究

采用实芯工艺制备了微通道板,利用光学显微镜、SEM、EDS对微通道板结构缺陷的显微形貌和成分进行了分析,采用线胀系数和粘度测定仪测试了微通道板玻璃材料的物理特性。分析了产生复丝分离、亮点、污染点等结构缺陷的主要工艺因素。结果表明:复丝分离是由于实体边玻璃的变形温度(TS)低所引起,复丝边界的亮点由夹杂物产生,夹杂物主要是由复丝的玻璃粉屑形成。由于复丝分离和夹杂物的存在,使得抛光时复丝边界引入CeO2,形成污染点。提出了通过选用变形温度为655℃实体边材料,减少复丝表面微米级污染物等方法减少结构缺陷。     

电子清刷对微通道板增益及输出信噪比的影响

电子清刷是微通道板生产流程中常用的除气方法,会引起微通道板其他性能参量的变化.为研究电子清刷对微通道板输出信噪比及增益的影响,根据信噪比及增益的定义讨论了微通道板性能参量的测试方法,研制了微通道板参量测试系统.应用微通道板参量测试系统对微通道板进行了电子清刷处理,测试清刷过程中不同阶段微通道板的信噪比及增益变化.实验表明:微通道板增益随清刷时间增加而降低,同时增益稳定性提高;电子清刷过程中微通道板的输出信号及噪音的变化率与微通道板增益的变化率基本相同,输出信噪比基本不变.增益变化是影响清刷过程中信号及噪音变化的主要因素,并且电子清刷对微通道板输出信噪比影响较小.     

含负折射率介质的一维光子晶体构成的相干热辐射源的辐射特性及控制

电子清刷是微通道板生产流程中常用的除气方法,会引起微通道板其他性能参量的变化.为研究电子清刷对微通道板输出信噪比及增益的影响,根据信噪比及增益的定义讨论了微通道板性能参量的测试方法,研制了微通道板参量测试系统.应用微通道板参量测试系统对微通道板进行了电子清刷处理,测试清刷过程中不同阶段微通道板的信噪比及增益变化.实验表明:微通道板增益随清刷时间增加而降低,同时增益稳定性提高;电子清刷过程中微通道板的输出信号及噪音的变化率与微通道板增益的变化率基本相同,输出信噪比基本不变.增益变化是影响清刷过程中信号及噪音变化的主要因素,并且电子清刷对微通道板输出信噪比影响较小.     

长寿命微通道板(L~2MCP)

长寿命微通道板是一种新型的微通道板。它的玻璃结构是按特殊配方制造的,适合于作高温处理。它具有优良的电特性。其特点是: 1.寿命长——通道的带电流和增益的电稳定性明显提高; 2.暗噪声优于标准微通道板; 3.比标准的微通道板更便于回收使用; 4.可在高温下真空烘烤,能使管子取得最佳的除气效果及更好的性能。室内微通道板电寿命试验表明,在三个独立的试验周期中,长寿命微通道板明显地比标准微通道板更稳定。美军夜视实验室已鉴定了两只用长寿命微通道板组装的管子,结论是:与标准微通道板的管子相比,此种微通道板的电子增益、带电流和暗噪声都比它好。     

多层倍增电极的微通道板

这种多层倍增电极的微通道板有两方面的改进,一是提高了微通道板的功能,二是容易加工。改进后的微通道板电子增强器是由分立的微通道板层叠积而成的。与常规的微通道板相比,新的微通道板容易制作,这是因为不需要通过腐蚀又细又深的孔以及拉制、捆绑、切割玻璃管等办法去获得微通道。微通道的曲度对减少不希望有的离子发射时需要的。此外,由于常规的微通道     

长寿命微通道板(L~2MCP~(TM))

长寿命微通道板是一种新型的微通道板。它的玻璃结构是按特殊配方制造的,适合于作高温处理。它具有优良的电特性。其特点是:1.寿命长——带电流和增益的电稳定性明显提高;2.与标准微通道板相比具有更优良的暗噪声;3.比标准微通道板回收利用率更高;4.可在高温下真空烘烤,使管子取得最佳除气效果和更好的性能。内部微通道板寿命试验表明,在三个独立的试验周期中,长寿命微通道板比我们的标准微通道板更稳定。美国陆军夜视实验室已鉴定了两只用长寿命微通道板组装的管子。结论是:与标准微通道板的管子相比,此种微通道板的电子增益、带电流和暗噪声都好。     

可剥离光学仪器镜头防护膜制备及性能分析

为避免闲置的光学仪器镜头受到微生物、雾气、油污的侵蚀,造成不必要的经济损失,以聚氯乙烯为主要原料,在设定温度搅拌条件下,加入抗氧剂、缓蚀剂和其他助剂,制备成新型可剥离防护膜.对膜的相关性能进行了分析,成膜稳定时间20 min,平均拉伸强度已达4.52 MPa,可以大面积揭剥.经环境试验证实能够达到防霉防盐雾的效果,进一步证明了该可剥离防护膜具有良好的性能.     

Kinetics of carbon nanopillar formation on a pyrolytic graphite surface during reactions induced by a focused electron beam

The results from a series of height measurements of carbon nanopillars formed during residual hydrocarbon deposition on a pyrographite surface by a focused electron beam in an SEM are presented. The high initial velocity of the pillars’ vertical growth can be explained by the dominant role of surface diffusion in the influx of molecules to the irradiated area. It is shown that progressive contamination of the substrate at distances up to several micrometers from the point of impact of the primary beam delays growth, and, in the case of long-time exposure, results in the evaporation of the pillars.     

Preventing carbon contamination of optical devices for X‐rays: the effect of oxygen on photon‐induced dissociation of CO on platinum

Platinum is one of the most common coatings used to optimize mirror reflectivity in soft X‐ray beamlines. Normal operation results in optics contamination by carbon‐based molecules present in the residual vacuum of the beamlines. The reflectivity reduction induced by a carbon layer at the mirror surface is a major problem in synchrotron radiation sources. A time‐dependent photoelectron spectroscopy study of the chemical reactions which take place at the Pt(111) surface under operating conditions is presented. It is shown that the carbon contamination layer growth can be stopped and reversed by low partial pressures of oxygen for optics operated in intense photon beams at liquid‐nitrogen temperature. For mirrors operated at room temperature the carbon contamination observed for equivalent partial pressures of CO is reduced and the effects of oxygen are observed on a long time scale.     

航天器表面环境散射返回流TPMC模拟

介绍试验粒子Monte Carlo(test particle Monte Carlo,TPMC)方法,并采用该方法对4种航天器表面出气分子形成的环境散射返回流进行数值模拟.其中,圆球出气表面的计算结果与已有的DSMC(direct simulation Monte Carlo)结果一致,验证了方法的正确性.此外,对不同出气和来流条件下圆形平板、凸半球和凹半球3种航天器简化表面出气分子形成的环境散射返回流进行计算,结果表明:出气表面外形是影响返回通量比的一个重要因素;圆形平板和凹半球出气表面的返回通量比远大于凸半球表面的;凹半球表面的出气分子会直接和出气表面碰撞形成直接流污染,且其量级远大于返回流污染.因此,在航天器设计中尽可能使用凸形表面作为敏感的出气表面可以有效降低出气分子污染.     

Forced vibration analysis of functionally graded carbon nanotube-reinforced composite plates using a numerical strategy

In this paper, the nonlinear forced vibration behavior of composite plates reinforced by carbon nanotubes is investigated by a numerical approach. The reinforcement is considered to be functionally graded (FG) in the thickness direction according to a micromechanical model. The first-order shear deformation theory and von Kármán-type kinematic relations are employed. The governing equations and the corresponding boundary conditions are derived with the use of Hamilton's principle. The generalized differential quadrature (GDQ) method is utilized to achieve a discretized set of nonlinear governing equations. A Galerkin-based scheme is then applied to obtain a time-varying set of ordinary differential equations of Duffing-type. Subsequently, a time periodic discretization is done and the frequency response of plates is determined via the pseudo-arc length continuation method. Selected numerical results are given for the effects of different parameters on the nonlinear forced vibration characteristics of uniformly distributed carbon nanotube- and FG carbon nanotube-reinforced composite plates. It is found that with the increase of CNT volume fraction, the flexural stiffness of plate increases; and hence its natural frequency gets larger. Moreover, it is observed that the distribution type of CNTs significantly affects the vibrational behavior of plate. The results also show that when the mid-plane of plate is CNT-rich, the natural frequency takes its minimum value and the hardening-type response of plate is intensified.     

Spectromicroscopic study of plasma-treatment effect on InP-substrate-based silicon nitride and silicon oxide patterns

Oxygen-plasma treatment was applied to silicon nitride and silicon oxide patterns on an InP substrate, and the effect was investigated by using scanning photoelectron microscopy. After the plasma treatment, the relative intensity of the carbon content was noticeably reduced on the surfaces of the patterns and the substrate, which indicates that the plasma treatment effectively removed the remaining carbon and made the patterns more resistant to carbon contamination. The oxygen-plasma treatment formed a thick oxidized surface on the InP substrate, which results in less occurrence of carbon contamination . PACS 68.37.Xy; 52.77.Bn; 85.40.-e     

Contaminants in suspended gold chains: an ab initio molecular dynamics study

Recently, we have proposed that the origin of anomalously long interatomic distances in suspended gold chains could be the result of carbon contamination during sample manipulation [Phys. Rev. Lett. 88, 076105 (2002)]]. More recently, however, other works have proposed that hydrogen instead of carbon should be the most probable contaminant. We report ab initio molecular dynamics results for different temperatures considering different possible contaminants. Our results show that at nonzero temperatures (more realistic to simulate the experimental conditions) hydrogen may be ruled out and carbon atoms remain the best candidate for contamination.     

Detection of Deposited Particles from the Backside of a Glass Plate

Microcontamination of product surfaces by deposited particles is an important problem in clean technologies. A most sensitive product to contamination by particles is a wafer during chip production. Therefore, methods for monitoring particle deposition on wafer surfaces have been developed in the last decade. A wafer with an unstructured and reflecting surface is inserted into the process equipment. After some time, depending on the process, this wafer is removed from the process equipment and is analysed with respect to the number of deposited particles using a wafer scanner. However, in situ particle detection in a process chamber is not possible with this technique. This would be possible if, instead of a monitor wafer, a transparent glass plate is mounted, e.g. in the housing of the process equipment. Then the illuminating and scattered light detection equipment can be mounted outside the process equipment. Since both the illuminating laser beam and the scattered light have to be transmitted through the glass plate, losses will occur, which will reduce the lower limit of detection with respect to particle size. In this article we estimate the detection possibilities theoretically and experimentally. A simple model based on Mie and vector scattering theory has been developed to describe the light-scattering behavior of a single spherical particle on a glass plate with random surface irregularities. The scattered light of individual particles of four particle sizes (1.03, 1.6, 2.92 and 4.23 μm) on the same glass surface and from the uncontaminated area of the glass plate was measured for unpolarized and normally incident light. The values of the scattered light from this model were compared with the experimental results. The comparison shows a reasonable agreement of the angular distribution of the scattered light. The developed model is used to predict the lower limit of detection for particles on a transparent surface. The theoretical estimations show that it should be possible to detect particles of a diameter down to 0.2 μm with the described measurement technique.     

A bistatic Doppler technique to measure forward scattering at large angles of incidence

We present a bistatic Doppler method to measure forward scatter at large angles of incidence. The Doppler shifted signal avoids contamination by the direct signal between antennae. We illuminated a small area on a rotating table with a 95-GHz transmitter pointed at 60-80° angles of incidence. The area velocity was nearly constant. The scattering media was crushed rock with root mean square (rms) height to wavelength ratio near unity. Although theory precludes Doppler shift for targets moving in the plane of bistatic collinear antennae, shifts occurred at the monostatic backscattering value predicted by twice the table velocity within the illuminated area. The Rayleigh distributions of the Doppler shifted signal, with increasing standard deviation and corresponding decreasing peak amplitude as angle of incidence increased, are expected for the unity ratio, and so verify that Doppler shifted forward scatter was measured. The increased standard deviation with increasing angle is expected because of the increased sensitivity to smaller slope facets of the rock. The reference signal recorded for a metal plate signal also verifies the bistatic Doppler shift and precludes contamination by multiply-reflected backscatter. Minor modifications will allow grazing angle behaviour to be approached. It appears that further theory is needed to understand the bistatic Doppler process.     

Contamination of holey/lacey carbon films in STEM

In many cases, the key to obtaining good TEM results is in the sample preparation itself. Even once a thin specimen is achieved, other factors determine how well the sample will behave in the microscope. One of the main hindrances to TEM and STEM-EELS analysis is the build up of carbon contamination on the sample under the electron beam. This process may occur due to the nature of the sample itself or the support grids or films on which the sample sits. Here, we investigate contamination on holey and lacey carbon films from three different suppliers. We find that all grids have a large amount of mobile hydrocarbon contamination on them, as well as other larger contaminant species on the surface. Even after a variety of cleaning routines, none of the films are clean enough for STEM-EELS experiments requiring long acquisition times.