原子力显微镜及其对DNA大分子的应用研究

详细讨论了原子力显微镜的基本原理和针尖－样品间相互作用力，大量实验结果表明，ＡＦＭ这个高分辨成像技术对ＤＮＡ大分子进行应用研究是非常适合的，同时我们也讨论了样品制备方法的改进、成像模式和环境选择等因素对ＤＮＡ大分子ＡＦＭ结果的影响以及ＡＦＭ在ＤＮＡ分子结构研究中的一些局限性。     

Electrical Scanning Probe Microscopy: Investigating the Inner Workings of Electronic and Optoelectronic Devices

Semiconductor electronic and optoelectronic devices such as transistors, lasers, modulators, and detectors are critical to the contemporary computing and communications infrastructure. These devices have been optimized for efficiency in power consumption and speed of response. There are gaps in the detailed understanding of the internal operation of these devices. Experimental electrical and optical methods have allowed comprehensive elaboration of input–output characteristics, but do not give spatially resolved information about currents, carriers, and potentials on the nanometer scale relevant to quantum heterostructure device operation. In response, electrical scanning probe techniques have been developed and deployed to observe experimentally, with nanometric spatial resolution, two-dimensional profiles of the electrical resistance, capacitance, potential, and free carrier distribution, within actively driven devices. Experimental configurations for the most prevalent electrical probing techniques based on atomic force microscopy are illustrated with considerations for practical implementation. Interpretation of the measured quantities are presented and calibrated, demonstrating that internal quantities of device operation can be uncovered. Several application areas are examined: spreading resistance and capacitance characterization of free carriers in III-V device structures; acquisition of electric potential and field distributions of semiconductor lasers, nanocrystals, and thin films; scanning voltage analysis on diode lasers—the direct observation of the internal manifestations of current blocking breakdown in a buried heterostructure laser, the effect of current spreading inside actively biased ridge waveguide lasers, anomalously high series resistance encountered in ridge lasers—as well as in CMOS transistors; and free-carrier measurement of working lasers with scanning differential spreading techniques. Applications to emerging fields of nanotechnology and nanoelectronics are suggested.     

Near-Field Scanning Optical Microscopy Combined with a Tapping Mode Atomic Force Microscope

Tapping mode atomic force microscopy is used to control the tip-sample distance in near field scanning optical microscopy (NSOM), which gives both topographic and near-field images simultaneously. The evanescent waves are scattered by a vibrating silicon-nitride tip in the proximity of sample surfaces and are detected through a microscope objective. This NSOM allows the observation of opaque samples with reflection illumination. A glass grating of 1-μm pitch and an InP grating of 0.5-μm pitch are observed with a lateral resolution of 100 nm.Presented at 1996 International Workshop on Interferometry (IWI ‘96), August 27-29, Saitama, Japan     

原子力显微镜用于软X射线接触成像的研究

论述了在接触显微成像技术中，后续放大设备对分辨率的影响，并用实验方法比较了采用光学显微镜和原子力显微镜阅读并放大显微图的结果，表明采用原子力显微镜放大显微图是一种较为理想的方法。     

原子力与光子扫描隧道组合显微镜

介绍了超高分辨光于扫描隧遭显微镜（PSTM）的计冗历程,为解决第一代（单光束照明）光千扫捕隧逼显傲镜中存在人为假象和样品光学图像与形貌图像难于分离两个难题,用“对称双光束照明方法消假象,用原子力与光子扫描隧道组合显微镜（AF／PSTM）图像分解方法分离样品光学透过率、折射率与形貌图像。研制成功新一代原子力与光子扫描隧道组合显微镜（AF／PSTM）样机。该样机在一次扫描中已获得两幅原子力显微镜图像（形貌与相位）和两幅光学图像（透过率和折射率）,有效地减少了假象,分解了样品光学折射率、透过率与形貌图像。     

原子力显微镜的研究型教学实验设计探讨

介绍了原子力显微镜的基本工作原理及其应用,阐述了在大学物理实验课程中开设原子力显微镜有关实验的必要性和重要意义,结合在教学和科研方面的经验,指出了在大学物理实验课中开设原子力显微镜有关实验的设计。最后,以分析半导体薄膜的形貌特性为例,探讨了原子力显微镜在大学物理实验课中的具体应用。     

羧甲基茯苓多糖结构的红外光谱表征与原子力显微镜观测

用傅里叶变换红外光谱对羧甲基茯苓多糖(carboxymethylpachymaran, CMP)的结构进行了表征,用原子力显微镜(atomic force microscopy, AFM)对不同溶液环境下CMP的形态变化进行了观测。结果表明：经过羧甲基修饰,茯苓多糖在水中的溶解性显著增加,890 cm-1处的β-D-葡聚糖特征吸收峰明显减弱,1 333 cm-1处出现次甲基振动吸收峰,1 606 cm-1处出现CO非对称伸缩振动吸收峰,表明羧甲基化成功;原子力显微镜分析表明：在不同溶液条件下,CMP分子以不同形态存在,多糖溶液的浓度、离子强度及溶剂的物化特性均能对CMP的分子链构象及链间相互作用形式产生影响,推测可能与CMP分子内、分子间的氢键缔合及静电作用有关,CMP分子与云母基底间的吸附及静电作用也会对CMP的分子链构象及图像质量产生影响。     

基于迁移学习的原子力显微镜成像恢复方法

受限于探针针尖结构尺寸,用原子力显微镜进行微纳测量时会产生图像边缘失真.提出了一种基于迁移学习的原子力显微镜成像恢复方法,通过迁移学习训练源模型和靶模型实现一维栅格成像恢复.该方法采用数学形态法中的腐蚀算法生成栅格点云数据,通过U-Net网络源模型从点云中提取针尖卷积效应的特征向量,将权重参数迁移至U-Net网络靶模型,靶模型在自适应正则化方法下进行监督学习.实验结果表明,该方法能有效恢复一维栅格的原子力显微镜测量图像,提高横向分辨力,可用于纳米栅格的线宽检测上.     

原子力显微镜

研制成功了一台使用光学偏转法检测的原子力显微镜，通过对云母、光栅、光盘等样品的观测证明仪器达到原子分辨率，最大扫描范围可达７μｍ×７μｍ。文中将对这台原子力显微镜的原理、结构及一些应用结果进行讨论。     

Measuring depths of sub-micron tracks in a CR-39 detector from replicas using Atomic Force Microscopy

One of the challenging tasks in the application of solid-state nuclear track detectors (SSNTDs) is the measurement of the depth of the tracks, in particular, the shallow ones resulting from short etching periods. In the present work, a method is proposed to prepare replicas of tracks from particles in the CR-39 SSNTDs and to measure their heights using atomic force microscopy (AFM). After irradiation, the detectors were etched in a 6.25 N aqueous solution of NaOH maintained at 70 °C. The etched detectors were immersed into a beaker of the replicating fluid, which was placed in a water bath under ultrasonic vibration and maintained at room temperature to facilitate the filling of the etched tracks with the replicating fluid. As an example of application, these results have been used to derive a V function for the CR-39 detectors used in the present study (for the specified etching conditions).     

利用原子力显微镜研究在单分子水平上DNA与组蛋白的相互作用

核小体是DNA被压缩成染色质的第一级压缩结构. 为了更深刻描述DNA与组蛋白的相互作用,利用透析方法将DNA和组蛋白构建成核小体,并且应用原子力显微镜进行单分子水平上的观察. 实验结果表明利用透析方法得到了核小体的“串珠型排列”,并且对在两种不同的结合条件下DNA与组蛋白的相互作用进行了观察和比较.     

Optimization of Measurement of the Interaction Force Vector in Atomic Force Microscopy

Technical Physics - The optimization of measurements of three spatial components of the probe–sample interaction force and the corresponding “ideal cantilever” displacement vector...     

Probing Chemical and Mechanical Nanodomains in Copolymer Nanorods with Correlative Atomic Force Microscopy—Nano‐correscopy

The interplay between size, shape, mechanical properties, and surface chemistry of nanoparticles orchestrates cellular internalization, toxicity, circulation time, and biodistribution. Therefore, the safety of nanoparticles hinges on our ability to quantify nanoscale physicochemical characteristics. Current characterization tools, due to their limited resolution, are unable to map these properties correlatively at nanoscale. An innovative use of atomic force microscopy‐based techniques, namely nano‐correscopy, overcomes this limitation and offers multiprobe capability to map mechanical (viscous and elastic) and chemical domains of nanoparticles correlatively. The strengths of this approach are demonstrated using polymer composite nanorods: m‐PEG‐PLGA ((m‐PEG–methoxy‐poly (ethylene glycol)‐b‐poly (lactic‐co‐glycolic) acid). Precise distribution of PLGA (monomers of lactide and glycolide) and poly(ethylene glycol) (PEG) polymer across nanorods is identified. The hydrophobic lactide component is found predominantly at the apex, while hydrophilic glycolide and PEG assembled at the body of the nanorods and correlate with a gradient of nanomechanical properties. New knowledge of how both nanochemical domains and nanomechanical properties are distributed across the nanorod will allow elucidating the interactions of nanorods with the proteins and biomolecules in the future, which will directly influence the fate of nanorods in vivo and will guide new synthesis methods.     

Growth of InGaAs-capped InAs quantum dots characterized by Atomic Force Microscope and Scanning Electron Microscope

Atomic force microscopy (AFM) is typically used to measure the quantum dot shape and density formed by lattice mismatched epitaxial growth such as InAs on GaAs. However, AFM images are distorted when two dots are situated in juxtaposition with a distance less than the AFM tip width. Scanning electron Microscope (SEM) is much better in distinguishing the dot density but not the dot height. Through these measurements of the growth of In_xGa_1-xAs cap layer on InAs quantum dots, it was observed that the InGaAs layer neither covered the InAs quantum dots and wetting layer uniformly nor 100% phase separates into InAs and GaAs grown on InAs quantum dots and wetting layer, respectively.     

点衍射干涉术在扫描力显微镜中的应用

目前在扫描力显微镜中经常用到的氮化硅三角形探针本身可以作为一个基于点微射干涉的微干涉元件。本文讨论了一种根据这一原理设计的用于扫描力显微镜的干涉光探针，它利用微探针表面几何反身波与后向点衍射波之间的干涉来检测微探针的形变，其纵向分辨率达到０．０１ｎｍ。     

在单细胞水平上基于拉曼光谱和原子力显微镜研究不同地区PM2.5的毒理效应

PM2.5作为一种重要的空气污染物,研究不同地区PM2.5对人体细胞的损伤异同具有重要意义。本实验以人肺癌细胞为研究对象,分别经过3个不同地区PM2.5日均量暴露2 h,采用拉曼光谱仪和原子力显微镜对活性单细胞的光谱、形貌和生物力学指标进行检测,通过酶联免疫反应检测细胞产生的发炎因子浓度。统计分析表明：PM2.5暴露后细胞拉曼峰1 002.97,1 127.29,1 172.83和1 338.1 cm-1强度变大;细胞伪足收缩或残缺,细胞核区变高;苏州地区PM2.5暴露后细胞黏滞功变小,弹性能变大;细胞产生发炎响应。发现经不同地区PM2.5暴露后,单细胞光学和力学信息发生了各异的改变,因此单细胞水平上研究不同地区PM2.5的毒理效应,为空气污染治理、肺部疾病防控提供数据支撑。     

A Thin Liquid Film and Its Effects in an Atomic Force Microscopy Measurement

Recently, it has been observed that a liquid film spreading on a sample surface will significantly distort atomic force microscopy （AFM） measurements. In order to elaborate on the effect, we establish an equation governing the deformation of liquid film under its interaction with the AFM tip and substrate. A key issue is the critical liquid bump height yoc, at which the liquid film jumps to contact the AFM tip. It is found that there are three distinct regimes in the variation of yoc with film thickness H, depending on Hamaker constants of tip, sample and liquid. Noticeably, there is a characteristic thickness H^＊ physically defining what a thin film is; namely, once the film thickness H is the same order as H^＊, the effect of film thickness should be taken into account. The value of H^＊ is dependent on Hamaker constants and liquid surface tension as well as tip radius.     

The Colloidal Probe Technique and its Application to Adhesion Force Measurements

Knowledge of the interaction forces between colloidal particles and surfaces is a precondition for understanding the stability of dispersed systems and adhesion phenomena. One of the methods available for direct measurement of surface forces is the atomic force microscope (AFM). Based on this method the so called “colloidal probe technique” was developed more than 10 years ago. Using a micron‐sized particle glued to the end of an AFM cantilever as the force sensor, this technique is predestined for the study of colloidal interactions. In this review we describe the colloidal probe technique and give an overview of its application in the field of adhesion forces.     

Near-field optical imaging using force detection with new tip-electrode geometry

We propose a new tip-electrode geometry to detect an (optical) evanescent field using noncontact atomic force microscopy. Using a semi-transparent metal electrode on the prism surface, the force sensitivity due to evanescent field in new tip-electrode geometry was enhanced by a factor of about 1000, comparing with that in old tip-electrode geometry where electrode was located behind the prism. Furthermore, this tip-electrode geometry avoids the electrostatic field caused by the residual charges and contact-electrified charges near the prism surface, which affects the force sensitivity due to evanescent field. We demonstrated the high resolution imaging of the evanescent field on the Au film with 15-nm (λ/33) lateral resolution.