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Germanium PMOSFETs with Low-Temperature Si2H6 Passivation Featuring High Hole Mobility and Superior Negative Bias Temperature Instability
Authors:WANG Hong-Juan  HAN Gen-Quan  LIU yan  YAN Jing  ZHANG Chun-Fu  ZHANG Jin-Cheng  HAO Yue
Affiliation:[1]Key Laboratory of Optoelectronic Technology and Systems of the Ministry of Education, College of Optoelectronie Engineering, Chongqing University, Chongqing 400044 [2]Wide Bandgap Semiconductor Technology Disciplines State Key Laboratory, School of Microelectronics, Xidian University, Xi'an 710071
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