| Abstract: | Ni_(0.7)Zn_(0.3)Fe_2O_4/Co_(0.8)Fe_(2.2)O_4(NZFO/CFO) multilayer films are fabricated on Si(100) substrates by the chemical solution deposition method.The microstructure and magnetic properties are systematically investigated.The results of field-emission scanning electronic microscopy show that the grain size of the NZFO/CFO multilayer film is quite uniform and the thickness is about 300 nm.The remanence enhancement effect of the NZFO/CFO multilayer film can be mainly attributed to the exchange coupling interaction between NZFO and CFO ferrite films,which is in favor of the design and fabrication of modern electronic devices. |
