| Analysis of Mode Quality Factors for Equilateral Triangle Semiconductor Microlasers with Rough Sidewalls |
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| 作者姓名： | 黄永箴 国伟华 |
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| 作者单位： | [1]StateKeyLaboratoryonIntegratedOptoelectronics,InstituteofSemiconductor,ChineseAcademyofSciences,PoBox912,Beijing100083 [2]StateKeyLaboratoryonIntegratedOptoelectronics,InstituteofSemiconductor,ChineseAca |
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| 摘 要： | The eigenmode characteristics for equilateral triangle resonator (ETR) semiconductor microlasers are analysed by the finite-difference time-domain technique and the Pade approximation.The random Gaussian correlation function and sinusoidal function are used to model the side roughness of the ETR.The numerical results show that the roughness can cause the split of the degenerative modes,but the confined modes can still have a high quality factor.For the ETR with a 3μm side length and the sinusoidal fluctuation,we can have a quality factor of 800 for the fundamental mode in the wavelength of 1500nm,as the amplitude of roughness is 75nm.
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| 关 键 词： | 微型激光器 等边三角形半导体微激光器 模品质因子分析 |
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