| Field—ion microscopy observation of single—walled carbon nanotubes |
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| 引用本文： | 张兆祥,张耿民,杜民,金新喜,侯士敏,孙建平,顾镇南,赵兴钰,刘惟敏,吴锦雷,薛增泉.Field—ion microscopy observation of single—walled carbon nanotubes[J].中国物理 B,2002,11(8):804-808. |
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| 作者姓名： | 张兆祥 张耿民 杜民 金新喜 侯士敏 孙建平 顾镇南 赵兴钰 刘惟敏 吴锦雷 薛增泉 |
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| 作者单位： | (1)College of Chemistry and Molecular Engineering, Beijing University, Beijing 100871, China; (2)Department of Electronics, Beijing University, Beijing 100871, China |
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| 基金项目： | Project supported by the National Natural Science Foundation of China (Grant Nos 69890221, 69971003 and 60128101), the MOST of China (No 2001CB610503) and the Key Foundation for Science and Technology Research of Education Ministry (No 00005). |
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| 摘 要： | Field-ion microscopy(FIM),a tool for surface analysis with atomic resolution,has been employed to observe the end structure of single-walled carbon nanotubes(SWCNTs).FIM images revealed the existence of open SWCNT ends,Amorphous carbon atoms were also observed to occur around SWCNTs and traditional field evaporation failed to remove them.Heat treatment was found to be efficacious in altering the end structures of SWCNT bundles.Carbon and oxygen atoms released from heated tungsten filament are believed to be responsible for the decoration imposed on the SWCNT ends.
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| 关 键 词： | 碳纳米管 场离子显微镜 单壁观测 |
| 收稿时间： | 2001-12-23 |
Field-ion microscopy observation of single-walled carbon nanotubes |
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| Zhang Zhao-Xiang,Zhang Geng-Min,Du Min,Jin Xin-Xi,Hou Shi-Min,Sun Jian-Ping,Gu Zhen-Nan,Zhao Xing-Yu,Liu Wei-Min,Wu Jin-Lei and Xue Zeng-Quan.Field-ion microscopy observation of single-walled carbon nanotubes[J].Chinese Physics B,2002,11(8):804-808. |
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| Authors: | Zhang Zhao-Xiang Zhang Geng-Min Du Min Jin Xin-Xi Hou Shi-Min Sun Jian-Ping Gu Zhen-Nan Zhao Xing-Yu Liu Wei-Min Wu Jin-Lei and Xue Zeng-Quan |
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| Affiliation: | Department of Electronics, Beijing University, Beijing 100871, China; College of Chemistry and Molecular Engineering, Beijing University, Beijing 100871, China |
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| Abstract: | Field-ion microscopy (FIM), a tool for surface analysis with atomic resolution, has been employed to observe the end structure of single-walled carbon nanotubes (SWCNTs). FIM images revealed the existence of open SWCNT ends. Amorphous carbon atoms were also observed to occur around SWCNTs and traditional field evaporation failed to remove them. Heat treatment was found to be efficacious in altering the end structures of SWCNT bundles. Carbon and oxygen atoms released from heated tungsten filament are believed to be responsible for the decoration imposed on the SWCNT ends. |
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| Keywords: | field-ion microscopy carbon nanotubes |
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