首页 | 官方网站   微博 | 高级检索  
     


INCREASING THE PHOTOLUMINESCENCE INTENSITY OF Ge ISLANDS BY CHEMICAL ETCHING
Authors:Gao Fei  Huang Chang-jun  Huang Da-ding  Li Jian-ping  Kong Mei-ying  Zeng Yi-ping  Li Jin-min and Lin Lan-ying
Affiliation:Department of Physics, Shaanxi Normal University, Xi'an 710062, China; State Key Laboratory of Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Materials Science Centre, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
Abstract:Self-assembled Ge islands were grown on Si(100) substrate by Si2H6-Ge molecular beam epitaxy. After being subjected to chemical etching, it is found that the photoluminescence from the etched Ge islands became more intense and shifted to the higher-energy side compared to that of the as-deposited Ge islands. This behaviour was explained by the effect of chemical etching on the morphology of the Ge islands. Our results demonstrate that chemical etching can be a way to change the luminescence property of the as-deposited islands.
Keywords:Ge islands  chemical etching  photoluminescence  Si2H6-Ge molecular beam epitaxy
点击此处可从《中国物理 B》浏览原始摘要信息
点击此处可从《中国物理 B》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号