Observation of MWCNTs with low-energy electron point source microscope |
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| Authors: | Yu Jie Bai Xin Zhang Zhao-Xiang Zhang Geng-Min Guo Deng-Zhu and Xue Zeng-Quan |
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| Affiliation: | Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University,Beijing 100871, China |
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| Abstract: | The low-energy electron point source (LEEPS) microscope, which creates enlarged projection images with low-energy field emission electron beams, can be used to observe the projection image of
nano-scale samples and to characterize the coherence of the field emission beam. In this paper we report the design and test operation performance of a home-made LEEPS microscope. Multi-walled carbon
nanotubes (MWCNTs) synthesized by the CVD method were observed by LEEPS microscope using a conventional tungsten tip, and projection images with the magnification of up to 104 was obtained. The resolution of the acquired images is \sim10 nm. A higher resolution and a larger magnification can be expected when the AC magnetic field inside the equipment is shielded and the vibration of the instrument reduced. |
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| Keywords: | LEEPS microscope field emission carbon nanotube |
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