The modulation effect of substrate doping on multi-node charge collection and single-event transient propagation in 90-nm bulk complementary metal-oxide semiconductor technology |
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| Authors: | Qin Jun-Rui Chen Shu-Ming Liu Bi-Wei Liu Zheng Liang Bin and Du Yan-Kang |
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| Affiliation: | School of Computer Science, National University of Defense Technology, Changsha 410073, China;School of Computer Science, National University of Defense Technology, Changsha 410073, China;School of Computer Science, National University of Defense Technology, Changsha 410073, China;School of Computer Science, National University of Defense Technology, Changsha 410073, China;School of Computer Science, National University of Defense Technology, Changsha 410073, China;School of Computer Science, National University of Defense Technology, Changsha 410073, China |
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| Abstract: | Variation of substrate background doping will affect the charge collection of active and passive MOSFETs in complementary metal-oxide semiconductor (CMOS) technologies, which are significant for charge sharing, thus affecting the propagated single event transient pulsewidths in circuits. The trends of charge collected by the drain of a positive channel metal-oxide semiconductor (PMOS) and an N metal-oxide semiconductor (NMOS) are opposite as the substrate doping increases. The PMOS source will inject carriers after strike and the amount of charge injected will increase as the substrate doping increases, whereas the source of the NMOS will mainly collect carriers and the source of the NMOS can also inject electrons when the substrate doping is light enough. Additionally, it indicates that substrate doping mainly affects the bipolar amplification component of a single-event transient current, and has little effect on the drift and diffusion. The change in substrate doping has a much greater effect on PMOS than on NMOS. |
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| Keywords: | substrate doping|charge collection|single event transient propagation|bipolar amplification |
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