High-temperature current conduction through three kinds of Schottky diodes |
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| Authors: | Li Fei Zhang Xiao-Ling Duan Yi Xie Xue-Song Lü Chang-Zhi |
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| Affiliation: | Department of Electronic Information and Control
Engineering, Beijing University of Technology, Beijing
100124, China |
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| Abstract: | Fundamentals of the Schottky contacts and the
high-temperature current conduction through three kinds of Schottky
diodes are studied. N-Si Schottky diodes, GaN Schottky diodes and
AlGaN/GaN Schottky diodes are investigated by I--V--T
measurements ranging from 300 to 523~K. For these Schottky diodes, a
rise in temperature is accompanied with an increase in barrier
height and a reduction in ideality factor. Mechanisms are
suggested, including thermionic emission, field emission,
trap-assisted tunnelling and so on. The most remarkable finding in
the present paper is that these three kinds of Schottky diodes are
revealed to have different behaviours of high-temperature reverse
currents. For the n-Si Schottky diode, a rise in temperature is
accompanied by an increase in reverse current. The reverse current
of the GaN Schottky diode decreases first and then increases with
rising temperature. The AlGaN/GaN Schottky diode has a trend
opposite to that of the GaN Schottky diode, and the dominant
mechanisms are the effects of the piezoelectric polarization field and
variation of two-dimensional electron gas charge density. |
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| Keywords: | Schottky diodes Schottky barrier height ideality factor reverse current |
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