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Effect of alumina thickness on Al_2O_3/InP interface with post deposition annealing in oxygen ambient |
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| Authors: | Yang Zhuo Yang Jing-Zhi Huang Yong Zhang Kai Hao Yue |
| Abstract: | Al2O3, oxygen annealing, capacitance-voltage measurement, hysteresis curve |
| Keywords: | Al2O3 oxygen annealing capacitance-voltage measurement hysteresis curve |
| 本文献已被 CNKI 维普 等数据库收录！ | |
